| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/09/2001 | US6301166 Parallel tester capable of high speed plural parallel test |
| 10/09/2001 | US6301165 Apparatus and method for detecting faulty of cells in a semiconductor memory device |
| 10/09/2001 | US6300791 Signature generator circuit |
| 10/09/2001 | US6300786 Wafer test method with probe card having on-board multiplex circuitry for expanding tester resources |
| 10/09/2001 | US6300785 Contact-less probe of semiconductor wafers |
| 10/09/2001 | US6300784 IC socket |
| 10/09/2001 | US6300780 High density integrated circuit apparatus, test probe and methods of use thereof |
| 10/09/2001 | US6300779 Semiconductor device evaluation apparatus and semiconductor device evaluation program product |
| 10/09/2001 | US6300774 Withstand voltage testing apparatus and automatic testing method thereof |
| 10/09/2001 | US6300772 Automated test system and method for device having circuit and ground connections |
| 10/09/2001 | US6300771 Electrical inspection device for detecting a latent defect |
| 10/09/2001 | US6300770 Host register interface testing on bit stream based systems |
| 10/09/2001 | US6300769 Fast comparator suitable for BIST and BISR applications |
| 10/09/2001 | US6300768 Method of diagnosing partial discharge in gas-insulated apparatus and partial discharge diagnosing system for carrying out the same |
| 10/09/2001 | US6300767 System and apparatus for predicting failure in insulated systems |
| 10/09/2001 | US6300766 Apparatus sensitive to arc amplitude for envelope detection of low current arcs |
| 10/09/2001 | US6300765 System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances |
| 10/09/2001 | US6300764 Apparatus and method for performing built-in testing of a squib fire network |
| 10/09/2001 | US6300763 Method of calculating dynamic state-of-charge within a battery |
| 10/09/2001 | US6300584 Loading/unloading control apparatus of semiconductor device and control method thereof |
| 10/09/2001 | US6300577 Film carrier and method of burn-in testing |
| 10/09/2001 | US6300148 Semiconductor structure with a backside protective layer and backside probes and a method for constructing the structure |
| 10/09/2001 | US6300145 Ion implantation and laser anneal to create n-doped structures in silicon |
| 10/09/2001 | US6298715 Scanning force microscope probe cantilever with reflective structure |
| 10/09/2001 | US6298709 Sensor device |
| 10/09/2001 | CA2278704C Power supply monitoring ic and battery pack |
| 10/09/2001 | CA2265232C Fault indicator providing contact closure and light indication on fault detection |
| 10/09/2001 | CA2208994C Cable partial discharge location pointer |
| 10/04/2001 | WO2001073929A2 Apparatus for reducing power supply noise in an integrated circuit |
| 10/04/2001 | WO2001073912A1 Apparatus for the detection and early warning of electrical arcing fault |
| 10/04/2001 | WO2001073459A2 System and method for testing signal interconnections using built-in self test |
| 10/04/2001 | WO2001073458A1 Apparatus for processing and sorting semiconductor devices received in trays |
| 10/04/2001 | WO2001073457A2 Controllable and testable oscillator apparatus for an integrated circuit |
| 10/04/2001 | WO2001048471A8 Electro-optic system controller and method of operation |
| 10/04/2001 | US20010027549 Method and apparatus for testing the timing of integrated circuits |
| 10/04/2001 | US20010027548 Interchangeable FPGA-Gate array |
| 10/04/2001 | US20010027547 Automated system for estimating ring oscillator reliability and testing AC response and method of operation thereof |
| 10/04/2001 | US20010027545 Circuit and method, for storing data prior to and after determining failure |
| 10/04/2001 | US20010027539 Test pattern selection apparatus for selecting test pattern from a plurality of check patterns |
| 10/04/2001 | US20010027516 Squence control circuit |
| 10/04/2001 | US20010027386 Time-domain circuit modeller |
| 10/04/2001 | US20010027053 Electrical contact method and apparatus in semiconductor device inspection equipment |
| 10/04/2001 | US20010027046 Socket for electric part |
| 10/04/2001 | US20010026576 Method for determining the temperature of a semiconductor chip and semiconductor chip with temperature measuring configuration |
| 10/04/2001 | US20010026572 Method and apparatus for measuring a semiconductor laser device |
| 10/04/2001 | US20010026226 CMOS low battery voltage detector |
| 10/04/2001 | US20010026173 Integrated circuit with actuation circuit for actuating a driver circuit |
| 10/04/2001 | US20010026172 Embedding of dynamic circuits in a static environment |
| 10/04/2001 | US20010026168 Tester for semiconductor device |
| 10/04/2001 | US20010026167 Compliant contactor for testing semiconductors |
| 10/04/2001 | US20010026166 Probe contactor and production method thereof |
| 10/04/2001 | US20010026161 Cell voltage measuring device for cell module |
| 10/04/2001 | US20010026152 Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewith |
| 10/04/2001 | US20010026147 Charging and discharging control circuit and charging type power supply device |
| 10/04/2001 | US20010025967 Semiconductor device |
| 10/04/2001 | US20010025957 Socket used for semiconductor device and testing system connected to socket through dual-transmission lines |
| 10/04/2001 | US20010025735 Automotive passenger restraint and protection apparatus |
| 10/04/2001 | EP1139497A2 Electronic interconnect device for high speed signal and data transmission, and adapter usable therewith |
| 10/04/2001 | EP1139220A2 Obtaining and exporting on-chip data processor trace and timing information |
| 10/04/2001 | EP1139108A2 Scan interface with TDM feature for permitting signal overlay |
| 10/04/2001 | EP1139090A2 Leaded integrated circuit inspection system |
| 10/04/2001 | EP1139016A2 Infrared enhanced pulsed solar simulator |
| 10/04/2001 | EP1138089A1 Organic electroluminescent device |
| 10/04/2001 | EP1137953A1 A tester interface system for current drive mode memory device |
| 10/04/2001 | EP1137952A1 Boundary scan method for terminating or modifying integrated circuit operating modes |
| 10/04/2001 | EP1137951A1 Scanning single electron transistor microscope for imaging ambient temperature objects |
| 10/04/2001 | EP0885397B1 Probe for fault actuation devices |
| 10/04/2001 | DE19581762C2 Timing correction circuit for semiconductor testing set |
| 10/04/2001 | DE10044264A1 Device for detection of circuit faults, such as short-circuits and earthing, in motor vehicle sensors where sensors are used in pairs and their output compared in order to detect a defect |
| 10/04/2001 | DE10014914A1 Verfahren zur Herstellung und Überprüfung von Strukturen elektronischer Schaltungen in einem Halbleitersubstrat Process for the preparation and verification of structures of electronic circuits in a semiconductor substrate, |
| 10/04/2001 | DE10014388A1 Conducting memory device burn-in process enabling electrical characteristics of memory device to be stabilised - involves applying reference potential, second voltage to voltage connections, varying control voltage between reference potential and operating voltage |
| 10/04/2001 | DE10013671A1 Verfahren zur Ermittlung von Teilentladungen verursachenden Störquellen einer aus mehreren separaten Leitern bestehenden vergossenen Leiterstruktur Procedure for the determination of partial discharges causing interference sources a cast made up of separate ladders ladder structure |
| 10/04/2001 | DE10012068A1 Monitoring of a capacitor bushing to detect faults, by comparison of the quotient of electrical measurements with a characterizing value, with any deviation indicating a fault, the invention being independent of operating voltage |
| 10/04/2001 | CA2400745A1 Apparatus for the detection and early warning of electrical arcing fault |
| 10/03/2001 | CN2452144Y Special equipment for sorting batterys |
| 10/03/2001 | CN2452031Y Touch type detecting apparatus for luminous diode |
| 10/03/2001 | CN2452030Y Electrical insulator testing instrument |
| 10/03/2001 | CN2452029Y Fast device for testing lines |
| 10/03/2001 | CN2452028Y Simple earth leakage protector detecting instrument |
| 10/03/2001 | CN1316056A Method and arrangement for checking cable connections |
| 10/03/2001 | CN1072406C Method and apparatus for battery charging |
| 10/03/2001 | CN1072399C Mode detecting and testing system and method thereof |
| 10/03/2001 | CN1072362C Manufacturing defect analyzer with improved fault detecting coverage |
| 10/03/2001 | CN1072361C Abnormality detection apparatus and abnormality detection method |
| 10/03/2001 | CN1072360C Deterioration diagnosis method and device of electrical machine and apparatus |
| 10/02/2001 | US6298465 Skew calibration means and a method of skew calibration |
| 10/02/2001 | US6298458 System and method for manufacturing test of a physical layer transceiver |
| 10/02/2001 | US6298453 Method of determining signal delay of a resource in a reconfigurable system having multiple resources |
| 10/02/2001 | US6298452 Hardware test coverage using inter-chip event filtering in multi-chip simulations |
| 10/02/2001 | US6298319 Incremental compilation of electronic design for work group |
| 10/02/2001 | US6298001 Semiconductor memory device enabling direct current voltage test in package status |
| 10/02/2001 | US6297999 Semiconductor memory device and method for setting stress voltage |
| 10/02/2001 | US6297995 Circuit configuration with a temperature-dependent semiconductor component test and repair logic circuit |
| 10/02/2001 | US6297742 Machine monitor with status indicator |
| 10/02/2001 | US6297662 Semiconductor device |
| 10/02/2001 | US6297659 Test system for testing semiconductor device |
| 10/02/2001 | US6297656 Probe-test method and prober |
| 10/02/2001 | US6297654 Test socket and method for testing an IC device in a dead bug orientation |
| 10/02/2001 | US6297652 Electric resistance measuring apparatus and method for circuit board |
| 10/02/2001 | US6297651 Electro-optic sampling probe having unit for adjusting quantity of light incident on electro-optic sampling optical system module |