| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/17/2001 | CN1317698A Detector for magnetic field |
| 10/17/2001 | CN1317697A Method and device for detecting zero-line deficiency of three-phase circuit |
| 10/17/2001 | CN1317696A AC method and device for measuring insulation resistance |
| 10/17/2001 | CN1073235C Appts. and method for testing stator |
| 10/17/2001 | CA2305477A1 Non-contact photothermal radiometric metrologies and instrumentation for characterization of semiconductor wafers, devices and non electronic materials |
| 10/16/2001 | US6304989 Built-in spare row and column replacement analysis system for embedded memories |
| 10/16/2001 | US6304987 Integrated test circuit |
| 10/16/2001 | US6304947 Optimized memory organization in a multi-channel architecture |
| 10/16/2001 | US6304839 Universal power simulator |
| 10/16/2001 | US6304837 Automated test vector generation and verification |
| 10/16/2001 | US6304779 Method and system for providing a warning of a remaining energy level of a battery pack in a defibrillator |
| 10/16/2001 | US6304471 System and method for assessing a capacity of a backup battery and power plant incorporating the same |
| 10/16/2001 | US6304189 Method for detecting malfunctions of a first relay |
| 10/16/2001 | US6304119 Timing generating apparatus with self-calibrating capability |
| 10/16/2001 | US6304114 Mode setting determination signal generation circuit |
| 10/16/2001 | US6304099 Method and structure for dynamic in-system programming |
| 10/16/2001 | US6304097 System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances |
| 10/16/2001 | US6304095 Semiconductor measurement instrument with the capability to dynamically change examination criteria |
| 10/16/2001 | US6304093 transportation and active temperature control of integrated circuits for test |
| 10/16/2001 | US6304092 Self-aligning docking assembly for semiconductor tester |
| 10/16/2001 | US6304089 Parallel termination apparatus and method for ground-check monitors |
| 10/16/2001 | US6304088 Voltage monitor circuit with adjustable hysteresis using a single comparator |
| 10/16/2001 | US6304087 Apparatus for calibrating electronic battery tester |
| 10/16/2001 | US6304073 IC testing apparatus |
| 10/16/2001 | US6304069 Low power consumption multiple power supply semiconductor device and signal level converting method thereof |
| 10/16/2001 | US6304062 Shunt resistance device for monitoring battery state of charge |
| 10/16/2001 | US6304061 Method of controlling charging and discharging |
| 10/16/2001 | US6303996 High performance sub-system design and assembly |
| 10/16/2001 | US6303993 Method and apparatus for testing bumped die |
| 10/16/2001 | US6303399 Method of sample preparation for electron microscopy |
| 10/16/2001 | US6303398 Method and system of managing wafers in a semiconductor device production facility |
| 10/16/2001 | US6303396 Substrate removal as a function of resistance at the back side of a semiconductor device |
| 10/16/2001 | US6302725 Self-latching terminal strip |
| 10/16/2001 | US6301907 Refrigeration system for cooling chips in test |
| 10/16/2001 | CA2251443C Faulty filter detection technique |
| 10/16/2001 | CA2200729C Lan tester |
| 10/11/2001 | WO2001075775A2 Arc fault current interrupter testing device |
| 10/11/2001 | WO2001075463A1 Method for analyzing failure of semiconductor integrated circuit and failure |
| 10/11/2001 | WO2001075462A1 Sensor array and method for detecting the condition of a transistor in a sensor array |
| 10/11/2001 | WO2001075461A1 Tester, testing unit and method of manufacturing tester |
| 10/11/2001 | WO2001075460A1 A method and an apparatus for measuring the performance of antennas, mobile phones and other wireless terminals |
| 10/11/2001 | WO2001075431A1 Current measuring apparatus for battery |
| 10/11/2001 | WO2001059466A8 Testing arrangement and testing method |
| 10/11/2001 | WO2001027761A3 Circuit cell for test pattern generation and test pattern compression |
| 10/11/2001 | US20010029601 Semiconductor device analyzer, method for analyzing/manufacturing semiconductor device, and storage medium storing program for analyzing semiconductor device |
| 10/11/2001 | US20010029600 Storage media being readable by a computer, and a method for designing a semiconductor integrated circuit device |
| 10/11/2001 | US20010029593 Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuit |
| 10/11/2001 | US20010029436 Semiconductor electrical characteristics evaluation apparatus and semiconductor electrical characteristics evaluation method |
| 10/11/2001 | US20010029433 Detection of arcing faults using bifurcated wiring system |
| 10/11/2001 | US20010028583 Semiconductor memory device having data parallel/serial conversion function and capable of efficiently performing operational test |
| 10/11/2001 | US20010028454 Optical inspection of laser vias |
| 10/11/2001 | US20010028262 Time interval measurement system incorporating a linear ramp generation circuit |
| 10/11/2001 | US20010028256 Diagnostic apparatus for electronics circuit and diagnostic method using same |
| 10/11/2001 | US20010028255 Measuring apparatus for semiconductor device |
| 10/11/2001 | US20010028254 Test device for flat electronic assemblies |
| 10/11/2001 | US20010028251 Timing calibration apparatus and method in a semiconductor integrated circuit tester |
| 10/11/2001 | US20010028250 Conductivity testing method for a sub-harness and a sub-harness manufacturing apparatus |
| 10/11/2001 | US20010028243 PLL semiconductor device with testability, and method and apparatus for testing same |
| 10/11/2001 | US20010028238 Method and device for judging the condition of secondary batteries and method for regenerating secondary batteries |
| 10/11/2001 | US20010028111 Contact device and method of manufacturing the same |
| 10/11/2001 | US20010027907 Apparatus for determining failure of electomagnetic clutch |
| 10/11/2001 | DE10115572A1 Semiconductor test system with a facility for error data storage in compressed form |
| 10/11/2001 | DE10110576A1 Einbetten dynamischer Schaltkreise in eine statische Umgebung Embed dynamic circuits in a static environment |
| 10/11/2001 | DE10017265A1 Detection method for ground line, involves assigning trust degree to error direction data in every protection device such that trust degree is taken into consideration when fault location is determined |
| 10/11/2001 | DE10016719A1 Integrierter Speicher und Verfahren zur Funktionsprüfung von Speicherzellen eines integrierten Speichers Integrated memory and method for functional testing of memory cells of an integrated memory |
| 10/11/2001 | DE10016557A1 Cable fault locating device generates spark between contacts of main switch when fault is located to send current through electrode, resistor, pulse capacitor and decoupling and record fault in memory |
| 10/11/2001 | CA2343483A1 Circuit breaker with multiple test switch assembly |
| 10/10/2001 | EP1143457A2 Semiconductor memory device and testing system and testing method |
| 10/10/2001 | EP1143456A2 Integrated memory and method for verifying the function of memory cells of an integrated memory |
| 10/10/2001 | EP1143256A2 Test device for the functional testing of a semiconductor chip |
| 10/10/2001 | EP1143255A2 Fast signal selector |
| 10/10/2001 | EP1143254A1 Earth wiring diagnosis in circuit modules with multiple earth connection, particularly for electronic units on board motor vehicles |
| 10/10/2001 | EP1142073A1 Self-balancing ionizer monitor |
| 10/10/2001 | EP1141736A1 Pattern generator for a packet-based memory tester |
| 10/10/2001 | EP1141735A2 Test method and assembly including a test die for testing a semiconductor product die |
| 10/10/2001 | EP1141733A1 Test chamber |
| 10/10/2001 | EP0844946B1 System for checking the resistance of a load connected to a transformer |
| 10/10/2001 | CN2453555Y Device for showing quantity of electric charge in cell |
| 10/10/2001 | CN2453454Y Printed circuit plate programmed control prob positioning device |
| 10/10/2001 | CN2453453Y Anti-theft and alrming devicefor agricultural power line |
| 10/10/2001 | CN2453452Y Cable detecting instrument |
| 10/10/2001 | CN2453451Y Clamping wire type line fault indicator |
| 10/10/2001 | CN2453450Y Networked device for detecting little earthing current |
| 10/10/2001 | CN1317224A Interconnect assembly for printed circuit boards and manufacturing method thereof |
| 10/10/2001 | CN1317089A Battery voltage detector |
| 10/10/2001 | CN1317083A Method for measuring tunnelling current between elongate conductors |
| 10/10/2001 | CN1316772A Delay time insertion based on event testing system |
| 10/10/2001 | CN1316771A Reflection interference type longitudinal electric field detector for electro-optical organic material |
| 10/10/2001 | CN1316740A Software drive its integral circuit detection mode switched method and device |
| 10/10/2001 | CN1316715A Analytical method for testing software tool |
| 10/10/2001 | CN1316650A Device for testing chip with the help of printed circuit board |
| 10/10/2001 | CN1316613A Sunlight simulator with pulsive xenon lamp and three-freedom paraboloid for scattered reflection |
| 10/09/2001 | US6301688 Insertion of test points in RTL designs |
| 10/09/2001 | US6301687 Method for verification of combinational circuits using a filtering oriented approach |
| 10/09/2001 | US6301685 Error propagation path extraction system, error propagation path extraction method, and recording medium recording error propagation path extraction control program |
| 10/09/2001 | US6301571 Method for interacting with a test subject with respect to knowledge and functionality |
| 10/09/2001 | US6301517 Automated test position monitoring and notification system |
| 10/09/2001 | US6301182 Semiconductor memory device |
| 10/09/2001 | US6301171 Semiconductor memory device capable of reducing data test time in pipeline |
| 10/09/2001 | US6301168 CMOS cell and circuit design for improved IDDQ testing |