| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/25/2001 | DE10018206A1 Error simulation method for testing electrical assembly e.g. microcomputer, involves detecting effect of assigned error incident on operating sequences of component at one measurement location |
| 10/25/2001 | DE10018173A1 Verfahren zum Prüfen der Funktionsfähigkeit einer Leiterplatte mit programmiertem Mikrocomputer einer elektrischen Steuer-oder Regeleinrichtung A method for testing the functionality of a circuit board with programmed microcomputer an electric control or regulating device |
| 10/25/2001 | DE10016530C1 Test head handling device, has base frame provided with chassis open on side facing handler for fitting around its outside in docking position |
| 10/25/2001 | DE10004315A1 Burn-in test board handler for integrated circuits, mounts IC on burn in test board which is short tested by burn in board checker before burn in test |
| 10/25/2001 | CA2406371A1 Electromigration early failure distribution in submicron interconnects |
| 10/24/2001 | EP1148340A2 All digital built-in self-test circuit for phase-locked loops |
| 10/24/2001 | EP1147648A2 A portable multi-band communication device, and a method for determining a charge consumption thereof |
| 10/24/2001 | EP1147638A2 Method for localizing a cable in a data transmission network |
| 10/24/2001 | EP1147591A1 Systems for configuring and delivering power |
| 10/24/2001 | EP1147470A1 Integrated circuit tester with real time branching |
| 10/24/2001 | EP1147301A1 Method and device in vehicle control system, and system for error diagnostics in vehicle |
| 10/24/2001 | EP0927359B1 Circuit to measure resistance and leakage |
| 10/24/2001 | CN2456349Y Earthed monitoring instruments |
| 10/24/2001 | CN2456178Y Resistor loader |
| 10/24/2001 | CN2456177Y Motor speed regulationg and reversion tester |
| 10/24/2001 | CN2456176Y Circuit breaker online monitor |
| 10/24/2001 | CN2456175Y Instrument for testing corona discharge of electric appliance and flyback transformer |
| 10/24/2001 | CN2456174Y Instrument for showing transformer principle and characteristics |
| 10/24/2001 | CN1319274A Battery monitor and battery device |
| 10/24/2001 | CN1319189A Signalling system |
| 10/24/2001 | CN1318871A Cell set |
| 10/24/2001 | CN1073757C DC brushless fan checking circuit |
| 10/24/2001 | CN1073703C Trace input device with remaining power informing function and method therefor |
| 10/23/2001 | US6308300 Test generation for analog circuits using partitioning and inverted system simulation |
| 10/23/2001 | US6308293 Fault diagnosis apparatus and recording medium with a fault diagnosis program recorded thereon |
| 10/23/2001 | US6308292 File driven mask insertion for automatic test equipment test pattern generation |
| 10/23/2001 | US6308291 Method for testing an electronic circuit |
| 10/23/2001 | US6308290 Look ahead scan chain diagnostic method |
| 10/23/2001 | US6308140 Motor condition and performance analyzer |
| 10/23/2001 | US6307905 Switching noise reduction in a multi-clock domain transceiver |
| 10/23/2001 | US6307796 Dynamic random access memory |
| 10/23/2001 | US6307778 Non volatile memory with detection of short circuits between word lines |
| 10/23/2001 | US6307664 Thermochromic game piece |
| 10/23/2001 | US6307605 Liquid crystal display and battery label including a liquid crystal display |
| 10/23/2001 | US6307479 Running indicator for integrated circuit package |
| 10/23/2001 | US6307391 Pivoting springy mechanism that opens and closes pressed electrical contacts with a force which is nearly constant over a range of closed positions |
| 10/23/2001 | US6307390 Aligner and method for inspecting semiconductor wafer using shell |
| 10/23/2001 | US6307389 Test device for flat electronic assemblies |
| 10/23/2001 | US6307388 Electromechanical apparatus for testing IC chips using first and second sets of substrates which are pressed together |
| 10/23/2001 | US6307387 Membrane probing system with local contact scrub |
| 10/23/2001 | US6307386 Modular mechanical fixturing and automated handling of printed circuit assemblies on automated test equipment |
| 10/23/2001 | US6307383 Flyback transformer and yoke tester |
| 10/23/2001 | US6307379 Rapid determination of present and potential battery capacity |
| 10/23/2001 | US6307378 Method and apparatus for measurement of electrochemical cell and battery impedances |
| 10/23/2001 | US6307377 Battery charge determination |
| 10/23/2001 | US6307376 Fault detection system and method for solenoid controlled actuators of a transmission system |
| 10/23/2001 | US6307351 Device and method for determining state of charge |
| 10/23/2001 | US6307349 Battery pack having memory |
| 10/23/2001 | US6307171 Method for sorting integrated circuit devices |
| 10/23/2001 | US6307161 Partially-overcoated elongate contact structures |
| 10/23/2001 | US6305969 Electrical continuity checker for connector |
| 10/23/2001 | US6305230 Connector and probing system |
| 10/18/2001 | WO2001077700A1 A method and apparatus for testing digital circuitry |
| 10/18/2001 | WO2001077698A2 Power line testing device with signal generator and signal detector |
| 10/18/2001 | WO2001077697A2 Electrical and electro-mechanical test method and apparatus |
| 10/18/2001 | WO2001076914A2 Sound absorber, especially for motor vehicles, and a method for producing a sound absorber |
| 10/18/2001 | WO2001041190A3 A method for measuring stress induced leakage current and gate dielectric integrity using corona discharge |
| 10/18/2001 | US20010032329 Storage media being readable by a computer, and a method for designing a semiconductor integrated circuit device |
| 10/18/2001 | US20010031575 High density interconnection test connector especially for verification of integrated circuits |
| 10/18/2001 | US20010031508 Method and apparatus for evaluating a known good die using both wire bond and flip-chip interconnects |
| 10/18/2001 | US20010031507 Method and device for adapting/tuning signal transit times on line systems or networks between integrated circuits |
| 10/18/2001 | US20010031040 Line test apparatus with vibratory element |
| 10/18/2001 | US20010030981 157 nm laser system and method for multi-layer semiconductor failure analysis |
| 10/18/2001 | US20010030568 Integrated device with operativity testing |
| 10/18/2001 | US20010030553 Method and apparatus for inspecting semiconductor device |
| 10/18/2001 | US20010030552 Conductive material for integrated circuit fabrication |
| 10/18/2001 | US20010030550 Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate |
| 10/18/2001 | US20010030548 Method and apparatus for capacitively testing a semiconductor die |
| 10/18/2001 | US20010030537 Magnetic field detection device |
| 10/18/2001 | EP1145283A3 A method for measuring stress induced leakage current and gate dielectric integrity using corona discharge |
| 10/18/2001 | DE10118141A1 Semiconductor device test system has modular units connected via tester bus to main computer |
| 10/18/2001 | DE10116380A1 Semiconductor testing system, has electronic pin stage for supplying test pattern to tested semiconductor and detecting corresponding signal response |
| 10/18/2001 | DE10062081A1 Integrated circuit with device for simultaneously testing number of output signals, uses coincidence circuit to test whether number of output signals concur with one another |
| 10/17/2001 | EP1146707A1 Digital modulation signal generator |
| 10/17/2001 | EP1146641A1 Automatic test equipment for semiconductor device |
| 10/17/2001 | EP1146424A2 Method for testing the operation of a circuit board with programmable microcomputer of an electric control device |
| 10/17/2001 | EP1146346A1 Magnetic field detection device |
| 10/17/2001 | EP1146345A1 Multiplex voltage measurement apparatus |
| 10/17/2001 | EP1146344A1 Multiplex voltage measurement apparatus |
| 10/17/2001 | EP1146343A1 Adapting Scan-BIST architectures for low power operation |
| 10/17/2001 | EP1146342A2 High frequency electronic module and test method thereof |
| 10/17/2001 | EP1145612A2 Method for mounting an electronic component |
| 10/17/2001 | EP1145515A1 Trellis decoder with correction of pair swaps, for use in gigabit ethernet transceivers |
| 10/17/2001 | EP1145511A2 Equalizer for multi-pair gigabit ethernet |
| 10/17/2001 | EP1145442A2 Test circuit for integrated analog-to-digital converters |
| 10/17/2001 | EP1145433A2 Serial switch driver architecture for automatic test equipment |
| 10/17/2001 | EP1145355A1 Method and arrangement for measuring current on a storage battery cell |
| 10/17/2001 | EP1145303A1 Method and device for optically monitoring processes for manufacturing microstructured surfaces in the production of semiconductors |
| 10/17/2001 | EP1145283A2 A method for measuring stress induced leakage current and gate dielectric integrity using corona discharge |
| 10/17/2001 | EP1145281A2 Modelling electrical characteristics of thin film transistors |
| 10/17/2001 | EP1145262A1 Vibro-acoustic signature treatment process in high-voltage electromechanical switching system |
| 10/17/2001 | EP1145033A2 Apparatus having a single sensor for locating a concealed conductor energized by an alternating electric field |
| 10/17/2001 | EP1145024A2 Dynamic register with iddq testing capability |
| 10/17/2001 | EP1145018A2 Test head manipulator |
| 10/17/2001 | EP0751397B1 Test mode setting circuit of test circuit for semiconductor memory |
| 10/17/2001 | EP0610886B1 Microcomputer for IC card |
| 10/17/2001 | CN2454883Y Four-end standard capacitor and standard metering device for standard consumption of four-end capacitor |
| 10/17/2001 | CN2454782Y Communication cable hinder detection instrument |
| 10/17/2001 | CN2454781Y Temporary ground-wire management device |
| 10/17/2001 | CN1317797A Self-detecting of magnetic-resistance memory array |