| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 11/01/2001 | CA2376651A1 Insulation tester for squirrel cage rotors |
| 10/31/2001 | EP1150224A2 Testing simulated chips |
| 10/31/2001 | EP1150132A1 Method of replacing secondary battery |
| 10/31/2001 | EP1150131A1 Method for determining the state of the charge and the capacity of an electric storage battery |
| 10/31/2001 | EP1150130A2 A system and method for multiple cycle capture of chip state |
| 10/31/2001 | EP1150128A1 Inspection apparatus |
| 10/31/2001 | EP1150127A2 Method for determining a unique solution for FET equivalent circuit model parameters |
| 10/31/2001 | EP1149744A2 Anti-theft battery |
| 10/31/2001 | EP1149454A1 A method and an apparatus for identifying a battery |
| 10/31/2001 | EP1149385A1 Ic test software system for mapping logical functional test data of logic integrated circuits to physical representation |
| 10/31/2001 | EP1149384A1 Method for functionally testing memory cells of an integrated semiconductor memory |
| 10/31/2001 | EP1149299A1 Rapid determination of present and potential battery capacity |
| 10/31/2001 | EP1149298A1 Automatic test equipment using sigma delta modulation to create reference levels |
| 10/31/2001 | EP1149297A1 A scan test point observation system and method |
| 10/31/2001 | EP1149296A1 Testing electrical circuits |
| 10/31/2001 | EP1149295A1 Control device for controlling applications which are crucial to safety |
| 10/31/2001 | EP1149294A1 Algorithmic pattern generator for integrated circuit tester |
| 10/31/2001 | EP1149293A1 Integrated circuit tester having pattern generator controlled data bus |
| 10/31/2001 | EP1149292A1 Device for testing cables that are provided with plug connectors |
| 10/31/2001 | DE10120088A1 Method and appliance for monitoring breaks in contact between brushes and slipring employing square wave monitoring signal |
| 10/31/2001 | DE10118772A1 Testing and monitoring shunt connection freedom in functional protective earth systems and TN-S supply networks by using inductive couplings to connect signal generator and measuring device |
| 10/31/2001 | DE10116349A1 Vorrichtung und Verfahren zum Prüfen von Halbleitervorrichtungen Apparatus and method for testing semiconductor devices |
| 10/31/2001 | DE10103879A1 Vorrichtung und Verfahren zur Jittermessung Apparatus and method for jitter measurement |
| 10/31/2001 | DE10021161A1 Verfahren zur Ermittlung des Ladezustands und der Belastbarkeit eines elektrischen Akkumulators A method for determining the charge state and the strength of an electric accumulator |
| 10/31/2001 | DE10019860C1 Apparatus for testing cable structures using a programmable control computer |
| 10/31/2001 | DE10019612A1 Diagnostic method for MOSFET, involves determining overload or short circuit of MOSFETs by evaluating voltage state of MOSFETs during switching off cycle |
| 10/31/2001 | CN2457748Y Detector for charging and discharging state of accumulator |
| 10/31/2001 | CN2457708Y Dry resistant power consumption resistor box |
| 10/31/2001 | CN2457614Y Detector for battery capacity |
| 10/31/2001 | CN2457613Y Automatic test clamp |
| 10/31/2001 | CN2457612Y Anti-theft alarm for three phase power lines in farm field |
| 10/31/2001 | CN2457611Y Intelligent flaw detector for group of lines |
| 10/31/2001 | CN2457610Y Failure state detector for coal mine flame-proof electric equipment |
| 10/31/2001 | CN2457607Y Test pencil |
| 10/31/2001 | CN1320286A Method for judging state of secondary cell and device for judging state thereof, and method for regenerating secondary cell |
| 10/31/2001 | CN1320215A Low redegsign application-specific module |
| 10/31/2001 | CN1320214A Circuit configuration with a scan path that can be dactivated |
| 10/31/2001 | CN1320063A Electronic compound handle |
| 10/31/2001 | CN1319930A Recharge/discharge control circuit and rechargeable power supply equipment |
| 10/31/2001 | CN1319764A Check clamp for electric distribution |
| 10/31/2001 | CN1074132C 电机测试装置 Motor test equipment |
| 10/31/2001 | CN1074131C Method for insulatino inspecting and ground protecting for winding of dc motor armature |
| 10/30/2001 | US6311318 Design for test area optimization algorithm |
| 10/30/2001 | US6311317 Pre-synthesis test point insertion |
| 10/30/2001 | US6311309 Methods and apparatus for simulating a portion of a circuit design |
| 10/30/2001 | US6311303 Monitor port with selectable trace support |
| 10/30/2001 | US6311302 Method and arrangement for hierarchical control of multiple test access port control modules |
| 10/30/2001 | US6311301 System for efficient utilization of multiple test systems |
| 10/30/2001 | US6311300 Semiconductor testing apparatus for testing semiconductor device including built in self test circuit |
| 10/30/2001 | US6311295 System and method for testing a clock signal |
| 10/30/2001 | US6311264 Digital signal processor with wait state register |
| 10/30/2001 | US6311147 Integrated circuit power net analysis |
| 10/30/2001 | US6311080 Method for detecting full charge state of battery |
| 10/30/2001 | US6310834 Electronic apparatus with ultrasonic motor as driving source |
| 10/30/2001 | US6310826 Semiconductor device having a test circuit |
| 10/30/2001 | US6310812 Integrated memory having memory cells and reference cells |
| 10/30/2001 | US6310807 Semiconductor integrated circuit device including tester circuit for defective memory cell replacement |
| 10/30/2001 | US6310557 Circuit and device to detect grounding problems in electrical soldering irons |
| 10/30/2001 | US6310507 Timing generation circuit for electro-optic sampling oscilloscope |
| 10/30/2001 | US6310487 Semiconductor integrated circuit and testing method thereof |
| 10/30/2001 | US6310486 Integrated test cell |
| 10/30/2001 | US6310485 Integrated circuit device having a burn-in mode for which entry into and exit from can be controlled |
| 10/30/2001 | US6310484 Semiconductor test interconnect with variable flexure contacts |
| 10/30/2001 | US6310481 Electronic battery tester |
| 10/30/2001 | US6310463 Secondary battery cell protection circuit |
| 10/30/2001 | US6310462 Residual capacity measurement system for battery |
| 10/30/2001 | US6308430 Examination of insulation displacement connection |
| 10/30/2001 | CA2265228C Fault indicator providing contact closure on fault detection |
| 10/27/2001 | CA2344793A1 Inspection apparatus |
| 10/27/2001 | CA2307172A1 Arc fault circuit detector device detecting pulse width modulation of arc noise |
| 10/25/2001 | WO2001080305A2 Electromigration early failure distribution in submicron interconnects |
| 10/25/2001 | WO2001080275A1 Short and break tester probe for plasma display pannel |
| 10/25/2001 | WO2001079871A1 Method and device for testing cable trees |
| 10/25/2001 | WO2001079868A2 System for measuring signal path resistance for an integrated circuit tester interconnect structure |
| 10/25/2001 | WO2001079863A2 Method and apparatus for testing signal paths between an integrated circuit wafer and a wafer tester |
| 10/25/2001 | WO2001079824A1 Method and apparatus for testing commutators |
| 10/25/2001 | US20010034866 Algorithmic test pattern generator, with built-in-self-test (BIST) capabilities, for functional testing of a circuit |
| 10/25/2001 | US20010034865 Method and apparatus for testing semiconductor devices using an actual board-type product |
| 10/25/2001 | US20010034864 Memory LSI failure analysis apparatus and analysis method thereof |
| 10/25/2001 | US20010034595 Timing verifying method |
| 10/25/2001 | US20010034593 Adaptable circuit blocks for use in multi-block chip design |
| 10/25/2001 | US20010034541 Method for monitoring end of life for battery |
| 10/25/2001 | US20010034216 Determination of transmitter distortion |
| 10/25/2001 | US20010034150 Socket for electric part |
| 10/25/2001 | US20010034070 Apparatus and method for testing fuses |
| 10/25/2001 | US20010033598 Semiconductor wirebond machine leadframe thermal map system |
| 10/25/2001 | US20010033518 Method for carrying out a burn-in process for electrically stressing a semiconductor memory |
| 10/25/2001 | US20010033195 Semiconductor integrated circuit |
| 10/25/2001 | US20010033183 Method and apparatus for wafer-level burn-in and testing of integrated circuits |
| 10/25/2001 | US20010033182 Semiconductor device testing apparatus and test method therefor |
| 10/25/2001 | US20010033181 Method and apparatus for testing semiconductor devices using the back side of a circuit board |
| 10/25/2001 | US20010033179 Method and apparatus for handling electronic devices |
| 10/25/2001 | US20010033177 Circuit configuration for measuring the capacitance of structures in an integrated circuit |
| 10/25/2001 | US20010033176 Method and apparatus for identification of the disconnection of a protection device |
| 10/25/2001 | US20010033171 Current measuring apparatus for battery |
| 10/25/2001 | US20010033170 Method for measuring fitness for use of a storage battery subject to electric loading |
| 10/25/2001 | US20010033169 System and method for determining battery state-of-health |
| 10/25/2001 | US20010033010 Semiconductor device tester and method of testing semiconductor device |
| 10/25/2001 | DE10029835C1 Integrated circuit with test facility has test switch closed by applied test signal to allow test voltage to be applied to irreversible programmable switches |
| 10/25/2001 | DE10019430A1 Cable sheath fault location method uses trace wire loop is not affected by stray impedances |