| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 11/07/2001 | EP1152536A1 System and method for maintaining lock of a phase locked loop feedback during clock halt |
| 11/07/2001 | EP1152530A1 Circuit for providing a logical output signal in accordance with crossing points of differential signals |
| 11/07/2001 | EP1152250A2 Integrated circuit having power supply voltage monitor |
| 11/07/2001 | EP1152249A1 Device and method for detecting an interruption in the charging line between a generator and a battery of a vehicle |
| 11/07/2001 | EP1152246A1 Circuit for detecting electrical signals at a predetermined frequency |
| 11/07/2001 | EP1151540A1 Built-in self test for integrated digital-to-analog converters |
| 11/07/2001 | EP1151389A1 A method enabling communication between an electronic device and a battery, an apparatus comprising an electronic device and a battery, and a battery enabling communication |
| 11/07/2001 | EP1151314A1 Imaging using spatial frequency filtering and masking |
| 11/07/2001 | EP1151313A1 Device for controlling a storage battery condition |
| 11/07/2001 | EP1151312A1 Analog clock module |
| 11/07/2001 | EP1151311A1 System for testing real and simulated versions of an integrated circuit |
| 11/07/2001 | EP1151308A1 Coupling and centering system, particularly for aligning printed circuits in testing procedures |
| 11/07/2001 | EP0719417B1 Field transmitter built-in test equipment |
| 11/07/2001 | CN2458634Y Remote transmitting display device for fault of ultrhigh-voltage transmission line |
| 11/07/2001 | CN2458633Y Measuring device for interface card |
| 11/07/2001 | CN2458631Y Insulation detector for electric power DC operating power supply |
| 11/07/2001 | CN1321320A Method of testing memory |
| 11/07/2001 | CN1320987A Electronic interconnecting device for high-speed signal and data transmission |
| 11/07/2001 | CN1320986A Electronic interconnecting device for high-speed signal and data transmission |
| 11/07/2001 | CN1320824A Power-supply current measuring unit for semiconductor testing system |
| 11/07/2001 | CN1320823A Data failure storage compression of semiconductor testing system |
| 11/06/2001 | US6314550 Cascaded programming with multiple-purpose pins |
| 11/06/2001 | US6314540 Partitioned pseudo-random logic test for improved manufacturability of semiconductor chips |
| 11/06/2001 | US6314539 Boundary-scan register cell with bypass circuit |
| 11/06/2001 | US6314538 Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuit |
| 11/06/2001 | US6314537 Command generator having single-input to multi-output converter |
| 11/06/2001 | US6314536 Memory testing apparatus |
| 11/06/2001 | US6314389 Time-domain circuit modeller |
| 11/06/2001 | US6314332 Multiple semiconductor test system for testing a plurality of different semiconductor types |
| 11/06/2001 | US6314201 Automatic X-ray determination of solder joint and view delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography |
| 11/06/2001 | US6314036 Method and apparatus for efficiently testing RAMBUS memory devices |
| 11/06/2001 | US6314035 Semiconductor memory device capable of manifesting a short-circuit failure associated with column select line |
| 11/06/2001 | US6314034 Application specific event based semiconductor memory test system |
| 11/06/2001 | US6314018 Integrated memory with at least two plate segments |
| 11/06/2001 | US6313832 Remaining battery capacity display device |
| 11/06/2001 | US6313750 Measuring cell voltages of a fuel cell stack |
| 11/06/2001 | US6313741 Fault detection circuit for sensors |
| 11/06/2001 | US6313690 Semiconductor switching device with leakage current detecting junction |
| 11/06/2001 | US6313683 Method of providing clock signals to load circuits in an ASIC device |
| 11/06/2001 | US6313681 Variable delay circuit |
| 11/06/2001 | US6313676 Synchronous type semiconductor integrated circuit having a delay monitor controlled by a delay control signal obtained in a delay measuring mode |
| 11/06/2001 | US6313658 Device and method for isolating a short-circuited integrated circuit (IC) from other IC's on a semiconductor wafer |
| 11/06/2001 | US6313657 IC testing apparatus and testing method using same |
| 11/06/2001 | US6313656 Method of testing leakage current at a contact-making point in an integrated circuit by determining a potential at the contact-making point |
| 11/06/2001 | US6313655 Semiconductor component and method for testing and operating a semiconductor component |
| 11/06/2001 | US6313654 Device testing apparatus and test method |
| 11/06/2001 | US6313653 IC chip tester with heating element for preventing condensation |
| 11/06/2001 | US6313652 Test and burn-in apparatus, in-line system using the test and burn-in apparatus, and test method using the in-line system |
| 11/06/2001 | US6313651 Carrier and system for testing bumped semiconductor components |
| 11/06/2001 | US6313649 Wafer probe station having environment control enclosure |
| 11/06/2001 | US6313641 Method and system for detecting arcing faults and testing such system |
| 11/06/2001 | US6313640 System and method for diagnosing and measuring partial discharge |
| 11/06/2001 | US6313637 Voltage detecting device for set battery |
| 11/06/2001 | US6313611 Low power indication circuit for lead acid battery pack |
| 11/06/2001 | US6313609 Determining battery capacity using one or more applications of a constant power load |
| 11/06/2001 | US6313608 Method and apparatus for charging a battery |
| 11/06/2001 | US6313607 Method and apparatus for evaluating stored charge in an electrochemical cell or battery |
| 11/06/2001 | US6313606 Method and apparatus for detecting battery capacity |
| 11/06/2001 | US6313442 Portable heating tent and method for testing telecommunications equipment |
| 11/06/2001 | US6313411 Wafer level contact sheet and method of assembly |
| 11/06/2001 | US6312964 Circuit, structure and method of testing a semiconductor, such as an integrated circuit |
| 11/06/2001 | CA2330524C Battery with tester label and method for producing it |
| 11/01/2001 | WO2001082665A1 Laminate with inside layer circuit used for multilayer printed circuit board for high frequency circuit, and method and device for measuring circuit impedance of the laminate with inside layer circuit |
| 11/01/2001 | WO2001082415A1 Lga package socket |
| 11/01/2001 | WO2001082364A1 Semiconductor device inspection system |
| 11/01/2001 | WO2001082209A1 Apparatus and method for validating wiring diagrams and creating wire lists |
| 11/01/2001 | WO2001082081A2 Capturing of a register value to another clock domain |
| 11/01/2001 | WO2001081937A2 Electronic circuit device with a short circuit switch and method of testing such a device |
| 11/01/2001 | WO2001081936A1 Method and apparatus for testing circuit |
| 11/01/2001 | WO2001081935A1 System configuration and methods for on-the-fly testing of integrated circuits |
| 11/01/2001 | WO2001081934A1 Insulation tester for squirrel cage rotors |
| 11/01/2001 | WO2001081933A2 Method and system for detecting defects in cellular transmission equipment |
| 11/01/2001 | WO2001029971A3 Built-in self test for integrated digital-to-analog converters |
| 11/01/2001 | WO2001029970A3 Test circuit for integrated analog-to-digital converters |
| 11/01/2001 | WO2000028340A8 Analog clock module |
| 11/01/2001 | US20010037482 Cyclic redundancy checking of a field programmable gate array having an SRAM memory architecture |
| 11/01/2001 | US20010037480 Dual mode test access port method and apparatus |
| 11/01/2001 | US20010037479 Selectable dual mode test access port method and apparatus |
| 11/01/2001 | US20010037477 Enhanced embedded logic analyzer |
| 11/01/2001 | US20010036048 Ground fault interrupter |
| 11/01/2001 | US20010035834 Apparatus and method including an efficient data transfer for analog to digital converter testing |
| 11/01/2001 | US20010035819 Apparatus for displaying electrical measurement of distributor of motor vehicle |
| 11/01/2001 | US20010035783 Scan flip-flop circuit having scan logic output terminal dedicated to scan test |
| 11/01/2001 | US20010035767 Deformable liquid crystal sensing head |
| 11/01/2001 | US20010035766 IC test device and method |
| 11/01/2001 | US20010035765 Multiplex voltage measurement apparatus |
| 11/01/2001 | US20010035762 Integrated circuit device and semiconductor wafer having test circuit therein |
| 11/01/2001 | US20010035761 Checker head and a method of manufacturing the same |
| 11/01/2001 | US20010035759 Method and device for semiconductor testing using electrically conductive adhesives |
| 11/01/2001 | US20010035756 Method and apparatus for measurement of electrochemical cell and battery impedances |
| 11/01/2001 | US20010035748 Thermal modulation system and method for locating a circuit defect |
| 11/01/2001 | US20010035739 Method for determining the state of charge and loading capacity of an electrical storage battery |
| 11/01/2001 | US20010035738 Method for determining the state of charge of lead-acid rechargeable batteries |
| 11/01/2001 | US20010035737 Method of replacing secondary battery |
| 11/01/2001 | US20010035688 Motor coil-shorting detecting unit |
| 11/01/2001 | US20010035682 Integrated circuit having power supply voltage monitor |
| 11/01/2001 | US20010035525 Semiconductor device having a test pattern same as conductive pattern to be tested and method for testing semiconductor device for short-circuit |
| 11/01/2001 | US20010035196 Removal deposits with air vibration |
| 11/01/2001 | US20010035058 Environmental test chamber and a carrier for use therein |
| 11/01/2001 | EP1145442A3 Test circuit for integrated analog-to-digital converters |