| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 11/15/2001 | US20010042233 Circuit and method for testing an integrated circuit |
| 11/15/2001 | US20010042232 System and method for testing devices sensitive to magnetic fields |
| 11/15/2001 | US20010042231 Memory testing apparatus and method |
| 11/15/2001 | US20010042065 Appearance inspection apparatus and appearance inspection method |
| 11/15/2001 | US20010041967 Semiconductor device testing apparatus and method for testing semiconductor device |
| 11/15/2001 | US20010040798 Distributed emergency lighting system having self-testing and diagnostic capabilities |
| 11/15/2001 | US20010040464 Electric contact device for testing semiconductor device |
| 11/15/2001 | US20010040463 Conductive bump array contactors having an ejector and methods of testing using same |
| 11/15/2001 | US20010040462 Semiconductor element testing carrier using a membrane contactor and a semiconductor element testing method and apparatus using such a carrier |
| 11/15/2001 | US20010040461 Wafer probe station having environment control enclosure |
| 11/15/2001 | US20010040459 Method of diagnosing partial discharge in gas-insulated apparatus and partial discharge diagnosing syatem for carrying out the same |
| 11/15/2001 | US20010040458 Arc fault circuit detector device detecting pulse width modulation of arc noise |
| 11/15/2001 | US20010040456 Method and apparatus for detecting line-shorts by potential and temperature distribution |
| 11/15/2001 | US20010040453 Method and apparatus for testing solar panel, manufacturing method for manufacturing the solar panel, method and apparatus for inspecting solar panel generating system, insulation resistance measuring apparatus, and withstand voltage tester |
| 11/15/2001 | US20010040443 Method of correcting battery remaining capacity |
| 11/15/2001 | US20010040327 Holding apparatus |
| 11/15/2001 | US20010040297 Multiple line grid for use in a packaging of a testing application |
| 11/15/2001 | US20010040259 Semiconductor device and method of manufacturing the same |
| 11/15/2001 | US20010039729 Method of aligning features in a multi-layer electrical connective device |
| 11/15/2001 | DE10123154A1 Halbleitervorrichtungs-Prüfvorrichtung und Verfahren zum Prüfen einer Halbleitervorrichtung The semiconductor device testing apparatus and method for testing a semiconductor device |
| 11/15/2001 | DE10022624A1 Test device for functional test of electrical circuits in vehicles has electrical connection points for connection to points on vehicle for connecting voltage source and loads during operation |
| 11/15/2001 | DE10016453A1 In-circuit test adaptors, includes double sleeve with optimal test spring contacts through which the test terminals of a PCB is directly connected to a test system |
| 11/15/2001 | CA2406619A1 Method and circuit for testing dc parameters of circuit input and output nodes |
| 11/15/2001 | CA2308820A1 Wireless radio frequency technique design and method for testing of integrated circuits and wafers |
| 11/14/2001 | EP1154479A2 Multiple line grid for use in a packaging or a testing application |
| 11/14/2001 | EP1154275A2 Bga on-board tester |
| 11/14/2001 | EP1153465A1 Method and apparatus for monitoring and maintaining a plurality of batteries using a fuzzy logic |
| 11/14/2001 | EP1153431A1 Method and apparatus for cooling backside optically probed integrated circuits |
| 11/14/2001 | EP1153360A1 In-line programming system and method |
| 11/14/2001 | EP1153348A1 On-chip debug system |
| 11/14/2001 | EP1153311A1 Method and apparatus for determining characteristic parameters of a charge storage device |
| 11/14/2001 | EP1153310A1 Method for determining a state of charge of a battery |
| 11/14/2001 | EP1153309A1 Method for the verification of the polarity, presence, alignment of components and short circuits on a printed circuit board |
| 11/14/2001 | EP1153308A1 Partial discharge site location system for determining the position of faults in a high voltage cable |
| 11/14/2001 | EP1153307A1 Apparatus for diagnosing and indicating operational failure in automobiles |
| 11/14/2001 | EP1153305A1 Current measuring device and corresponding method |
| 11/14/2001 | EP0928486B1 Device and method for testing integrated circuit dice in an integrated circuit module |
| 11/14/2001 | EP0845131B1 Electronic diagnostic system |
| 11/14/2001 | EP0767918B1 Shield integrity monitor |
| 11/14/2001 | EP0723161B1 Trouble monitor device for bridge circuit |
| 11/14/2001 | CN2459670Y Collective and distributive type electric power fault wave recording device |
| 11/14/2001 | CN2459669Y Single-wire hanging bag type small current grounding fault indicator |
| 11/14/2001 | CN2459668Y Industrial frequency like online resistance measuring instrument |
| 11/14/2001 | CN2459667Y Fault detector for three-phase ac voltage |
| 11/14/2001 | CN1322298A Method and apparatus for determining battery properties from complex impedance/admittance |
| 11/14/2001 | CN1322039A Electronic interconnected adapter for high-speed signal and data transfer |
| 11/14/2001 | CN1322029A Method for replacing secondary cell |
| 11/14/2001 | CN1321892A Specific purpose semiconductor memory testing system based on event |
| 11/14/2001 | CN1321891A Semiconductor testing system for failure detection |
| 11/13/2001 | US6317860 Electronic design automation tool for display of design profile |
| 11/13/2001 | US6317853 Apparatus for making test data and method thereof |
| 11/13/2001 | US6317851 Memory test circuit and a semiconductor integrated circuit into which the memory test circuit is incorporated |
| 11/13/2001 | US6317697 Battery life determination apparatus and battery life determination method |
| 11/13/2001 | US6317647 Aligner |
| 11/13/2001 | US6317373 Semiconductor memory device having a test mode and semiconductor testing method utilizing the same |
| 11/13/2001 | US6317372 Semiconductor memory device equipped with serial/parallel conversion circuitry for testing memory cells |
| 11/13/2001 | US6317368 Semiconductor integrated circuit device tested in batches |
| 11/13/2001 | US6317366 Dynamic random access memory |
| 11/13/2001 | US6316959 Semiconductor circuit having scan path circuit |
| 11/13/2001 | US6316955 Photoelectric conversion integrated circuit device |
| 11/13/2001 | US6316954 High performance test interface |
| 11/13/2001 | US6316953 Contact type prober automatic alignment |
| 11/13/2001 | US6316952 Flexible conductive structures and method |
| 11/13/2001 | US6316951 Inspection unit of a connector inspection apparatus |
| 11/13/2001 | US6316950 Method and apparatus for imaging semiconductor devices |
| 11/13/2001 | US6316949 Apparatus and method for testing electric conductivity of circuit path ways on circuit board |
| 11/13/2001 | US6316933 Test bus circuit and associated method |
| 11/13/2001 | US6316929 Frequency measurement test circuit and semiconductor integrated circuit having the same |
| 11/13/2001 | US6316915 Charge/discharge protection circuit and battery pack having the charge/discharge protection circuit |
| 11/13/2001 | US6316914 Testing parallel strings of storage batteries |
| 11/13/2001 | US6316913 Low dissipation system and method for determining battery capacity and battery plant incorporating the same |
| 11/13/2001 | US6316909 Electronic device, control method for electronic device, recharge-rate estimating method for secondary battery, and charging control method for secondary battery |
| 11/13/2001 | US6315574 Method for real-time in-line testing of semiconductor wafers |
| 11/08/2001 | WO2001084600A1 Process perturbation to measured-modeled method for semiconductor device technology modeling |
| 11/08/2001 | WO2001084576A1 Wire test method and apparatus |
| 11/08/2001 | WO2001084467A1 EMBEDDING PARASITIC MODEL FOR Pi-FET LAYOUTS |
| 11/08/2001 | WO2001084466A1 Hybrid, non linear, large signal microwave/millimeter wave model |
| 11/08/2001 | WO2001084465A1 Semi-physical modeling of hemt dc-to-high frequency electrothermal characteristics |
| 11/08/2001 | WO2001084464A1 S-parameter microscopy for semiconductor devices |
| 11/08/2001 | WO2001084381A1 Semi-physical modeling of hemt high frequency noise equivalent circuit models |
| 11/08/2001 | WO2001084170A2 Source synchronous link integrity validation |
| 11/08/2001 | WO2001084169A1 System and method for on-line impulse frequency response analysis |
| 11/08/2001 | WO2001084168A1 System and method for off-line impulse frequency response analysis test |
| 11/08/2001 | WO2001042803A3 Bit fail map compression with fail signature analysis |
| 11/08/2001 | WO2000033027A9 An apparatus and method to transport, inspect and measure objects and surface details at high speeds |
| 11/08/2001 | US20010039646 Structure having multiple levels of programmable integrated circuits for interconnecting electronic components |
| 11/08/2001 | US20010039634 Method of reducing test time for NVM cell-based FPGAs |
| 11/08/2001 | US20010039486 Circuit board and system for testing the same |
| 11/08/2001 | US20010039485 Semiconductor device test system and test method |
| 11/08/2001 | US20010039128 Method of connecting IC package to IC contactor with weaker force and IC contactor for such method |
| 11/08/2001 | US20010039065 Testing system for evaluating integrated circuits, a burn-in testing system, and a method for testing an integrated circuit |
| 11/08/2001 | US20010038341 Circuit for detecting electrical signals at a given frequency |
| 11/08/2001 | US20010038295 Rambus handler |
| 11/08/2001 | US20010038290 System and method for off-line impulse frequency response analysis test |
| 11/08/2001 | US20010038289 Automatic circuit breaker detector |
| 11/08/2001 | DE10120631A1 Cooling system for burn-in unit e.g. for manufacture of semiconductor chips, has component being tested mounted on burn-in board and positioned within burn-in chamber |
| 11/08/2001 | DE10118139A1 Semiconductor test system, has electronic pin cards each provided with calibration pin units which serve as test devices which are applied with sample or strobe signal based on stored event data |
| 11/08/2001 | DE10106801A1 Schwingungsmessverfahren und Frequenzmessvorrichtung Vibration measurement methods and frequency measuring device |
| 11/08/2001 | DE10021994A1 Arrangement for determining the pipe/ground potential on cathodically protected pipelines comprises measuring value receivers for acquiring measured and reference values for the pipe/ground potential |
| 11/08/2001 | DE10021602A1 Vorrichtung und Verfahren zur Erkennung einer Unterbrechung in der Ladeleitung zwischen einen Generator und einer elektrischen Batterie in einem Kraftfahrzeug Apparatus and method for detecting a break in the charging line between a generator and an electric battery in a motor vehicle |