| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 11/27/2001 | US6323668 IC testing device |
| 11/27/2001 | US6323667 Contact probe unit |
| 11/27/2001 | US6323666 Apparatus and method for testing test burn-in board and device under test, and test burn-in board handler |
| 11/27/2001 | US6323665 Apparatus capable of high power dissipation during burn-in of a device under test |
| 11/27/2001 | US6323664 Semiconductor memory device capable of accurately testing for defective memory cells at a wafer level |
| 11/27/2001 | US6323663 Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method |
| 11/27/2001 | US6323658 Method of conducting broadband impedance response tests to predict stator winding failure |
| 11/27/2001 | US6323657 Conductor tester |
| 11/27/2001 | US6323656 Wiring harness diagnostic system |
| 11/27/2001 | US6323655 Method and device for detecting partial discharges |
| 11/27/2001 | US6323654 Method and apparatus for remotely changing signal characteristics of a signal generator |
| 11/27/2001 | US6323652 Electrical testing device |
| 11/27/2001 | US6323651 Diagnostic trailer center device |
| 11/27/2001 | US6323650 Electronic battery tester |
| 11/27/2001 | US6323639 Powering dies on a semiconductor wafer through wafer scribe line areas |
| 11/27/2001 | US6323620 Electric power system using an electric power storing secondary battery effective for load leveling |
| 11/27/2001 | US6323556 Interconnect structure of semiconductor device |
| 11/27/2001 | US6323505 Failure analysis apparatus of semiconductor integrated circuits and methods thereof |
| 11/27/2001 | US6322433 Grinding chip |
| 11/27/2001 | US6322384 Electrical socket apparatus |
| 11/27/2001 | CA2241326C Machine for the electric test of printed circuits with adjustable position of the sound needles |
| 11/27/2001 | CA2143364C Field ground fault detector and field ground fault relay for detecting ground fault corresponding to dc component extracted from ground fault current |
| 11/22/2001 | WO2001089279A1 Apparatus and method for verifying axially leaded circuit components |
| 11/22/2001 | WO2001089052A1 Circuit breaker remote service system |
| 11/22/2001 | WO2001088976A2 Wireless radio frequency testing methode of integrated circuits and wafers |
| 11/22/2001 | WO2001088560A1 Arrangement for detecting malfunction |
| 11/22/2001 | WO2001088559A1 Device for testing an electric circuit |
| 11/22/2001 | WO2001088558A1 Detection of damage to the insulation of electric components |
| 11/22/2001 | WO2001088556A1 Method and apparatus for circuit board continuity test, tool for continuity test, and recording medium |
| 11/22/2001 | WO2001088551A1 Probe card and method of producing the same |
| 11/22/2001 | US20010044702 Device for testing and calibrating the oscillation frequency of an integrated oscillator |
| 11/22/2001 | US20010044226 Contact pin assembly, contact pin assembly manufacturing method, contact pin assembling structure, contact pin assembling structure manufacturing method, and socket for electrical parts |
| 11/22/2001 | US20010044162 Method and apparatus for fabricating electronic device |
| 11/22/2001 | US20010043567 Efficient full duplex simultaneous message transfer |
| 11/22/2001 | US20010043498 Integrated memory and method for checking the operation of memory cells in an integrated memory |
| 11/22/2001 | US20010043143 Method and apparatus for early detection of reliability degradation of electronic devices |
| 11/22/2001 | US20010043079 Screening of semiconductor integrated circuit devices |
| 11/22/2001 | US20010043078 Test configuration for the functional testing of a semiconductor chip |
| 11/22/2001 | US20010043076 Method and apparatus for testing semiconductor devices |
| 11/22/2001 | US20010043075 Apparatus for inspecting IC wafer |
| 11/22/2001 | US20010043063 System for inspecting a replaceable part in an electronic device |
| 11/22/2001 | US20010043054 Method and apparatus for detecting a disconnection in the charge line between a generator and an electric battery in a motor vehicle |
| 11/22/2001 | US20010042868 Conductive material for integrated circuit fabrication |
| 11/22/2001 | DE10123582A1 Specimen pattern generator for semiconductor testing system of semiconductor memory components |
| 11/22/2001 | DE10121298A1 Flash memory testing process using data erasing and new data writing en block, or block per block |
| 11/22/2001 | DE10101899A1 Method for testing semiconductor components, especially fast memory chips, accurately determines rising or falling flanks in a test signal to measure phase differences relative to a synchronizing clock signal |
| 11/22/2001 | DE10023595A1 Tragbare Miniatur-EMV-Kammer für den Einsatz im Mobilfunkbereich Portable Miniature EMC chamber for use in mobile communications |
| 11/22/2001 | DE10023102A1 Bi-directional interface for reception and transmission of data bits between RAM and processor, has reception probe circuits that generate signals enabling connection between clock signal source and transmission probe circuits |
| 11/21/2001 | EP1156342A1 Dry load test apparatus |
| 11/21/2001 | EP1156341A2 Method for correcting frequency- and length-dependent line attenuation for tdr-measurements carried out on high-frequency cables |
| 11/21/2001 | EP1156340A2 Portable miniature EMC chamber for use in the field of mobile radios |
| 11/21/2001 | EP1155519A1 Electro-optic interface system and method of operation |
| 11/21/2001 | EP1155337A1 Non-linear light-emitting load current control |
| 11/21/2001 | EP1155336A1 Glass fiber, current sensor and method |
| 11/21/2001 | EP1155331A1 Text probe interface assembly and manufacture method |
| 11/21/2001 | EP0919099B1 Circuit for motion estimation in digitised video sequence encoders |
| 11/21/2001 | EP0671011B1 A method and a device for determining the distance from a measuring station to a fault on a transmission line |
| 11/21/2001 | CN2461031Y 电子定时器 Electronic timers |
| 11/21/2001 | CN2461005Y Device for on-line measuring DC transmission earth pole |
| 11/21/2001 | CN1322957A Multiplex transmission voltage measuring equipment |
| 11/21/2001 | CN1322505A Multi-belt female assembly for fastening apparatus capable of rearranging fastening |
| 11/21/2001 | CN1075340C Apparatus for taking out and storing semiconductor device trays |
| 11/21/2001 | CN1075281C Variable speed controller for AC motor |
| 11/20/2001 | US6321369 Interface for compiling project variations in electronic design environments |
| 11/20/2001 | US6321368 LSI layout designing apparatus, computer-implemented method of designing LSI layout and computer readable storage medium |
| 11/20/2001 | US6321364 Method for designing integrated circuit device based on maximum load capacity |
| 11/20/2001 | US6321355 Semiconductor integrated circuit and method of testing the same |
| 11/20/2001 | US6321353 Intelligent binning for electrically repairable semiconductor chips |
| 11/20/2001 | US6321352 Integrated circuit tester having a disk drive per channel |
| 11/20/2001 | US6321291 Method of measuring the speed of a memory unit in an integrated circuit |
| 11/20/2001 | US6321185 Estimation system of LSI power consumption |
| 11/20/2001 | US6320812 Error catch RAM for memory tester has SDRAM memory sets configurable for size and speed |
| 11/20/2001 | US6320805 Semiconductor device with external pins |
| 11/20/2001 | US6320804 Integrated semiconductor memory with a memory unit a memory unit for storing addresses of defective memory cells |
| 11/20/2001 | US6320803 Method and apparatus for improving the testing, yield and performance of very large scale integrated circuits |
| 11/20/2001 | US6320528 Built-in self test for integrated digital-to-analog converters |
| 11/20/2001 | US6320439 Method and circuit of soft start and of power monitor for IC with multiple supplies |
| 11/20/2001 | US6320419 Non-latency affected contention prevention during scan-based test |
| 11/20/2001 | US6320404 Defective power source detection method and apparatus of power source supply system |
| 11/20/2001 | US6320403 Method of determining the doping concentration and defect profile across a surface of a processed semiconductor material |
| 11/20/2001 | US6320402 Parallel inspection of semiconductor wafers by a plurality of different inspection stations to maximize throughput |
| 11/20/2001 | US6320400 Method and system for selectively disconnecting a redundant power distribution network to indentify a site of a short |
| 11/20/2001 | US6320399 Measuring method for detecting a short-circuit between the turns of a coil integrated on a chip, and integrated circuit structure adapted to such a measuring method |
| 11/20/2001 | US6320397 Molded plastic carrier for testing semiconductor dice |
| 11/20/2001 | US6320396 Parasitic MIM structural spot analysis method for semiconductor device and parasitic MIM structure spot analysis method for silicon semiconductor device |
| 11/20/2001 | US6320391 Interconnection device for low and high current stress electromigration and correlation study |
| 11/20/2001 | US6320390 Probe for fault actuation devices |
| 11/20/2001 | US6320389 Electric leak detecting apparatus for electric motorcars |
| 11/20/2001 | US6320370 Circuit with improved dynamic response for measuring current in pulse width modulated amplifiers |
| 11/20/2001 | US6320368 Method for determining the drive capability of a driver circuit of an integrated circuit |
| 11/20/2001 | US6320354 Method and apparatus for battery charging |
| 11/20/2001 | US6320201 Semiconductor reliability test chip |
| 11/20/2001 | US6320179 Device noise measurement system |
| 11/20/2001 | US6319737 Method and apparatus for characterizing a semiconductor device |
| 11/16/2001 | CA2308841A1 Block heater alarm |
| 11/15/2001 | WO2001086660A1 Integrated circuit containing sram memory and method of testing same |
| 11/15/2001 | WO2001086314A2 Method and circuit for testing dc parameters of circuit input and output nodes |
| 11/15/2001 | WO2001086313A1 Apparatus and method for self testing programmable logic arrays |
| 11/15/2001 | WO2001086312A1 Wide-bandwidth coaxial probe |
| 11/15/2001 | WO2001085523A1 Method for diagnosing switch points and a switch point diagnostic device |