| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/05/2001 | EP1160577A2 Prober and probe method |
| 12/05/2001 | EP1160576A2 Contact probe and fabrication method thereof |
| 12/05/2001 | EP1159630A1 Distributed interface for parallel testing of multiple devices using a single tester channel |
| 12/05/2001 | EP1159629A1 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses |
| 12/05/2001 | EP1159628A1 Method for testing integrated circuits with memory element access |
| 12/05/2001 | EP1159625A1 Device for detecting impedance disturbance points in symmetrical data transmission lines |
| 12/05/2001 | EP0699999B1 Memory architecture for automatic test equipment using vector module table |
| 12/05/2001 | EP0628832B1 Integrated circuit with register stages |
| 12/05/2001 | CN2463956Y Wafer sorting device for wafer tester |
| 12/05/2001 | CN2463840Y Battery survey monitor |
| 12/05/2001 | CN2463839Y Charged intelligent detector for high tension transmission line insulator |
| 12/05/2001 | CN2463838Y Telephone line and power line lapping fault detecting device |
| 12/05/2001 | CN2463837Y Earth leakage detector |
| 12/05/2001 | CN1325610A Vertically actuated BGA socket |
| 12/05/2001 | CN1325551A Method and apparatus for measuring complex impedance of cells and batteries |
| 12/05/2001 | CN1075912C Power control apparatus suitable for use in radio communication device |
| 12/04/2001 | US6327687 Test pattern compression for an integrated circuit test environment |
| 12/04/2001 | US6327686 Method for analyzing manufacturing test pattern coverage of critical delay circuit paths |
| 12/04/2001 | US6327685 Logic built-in self test |
| 12/04/2001 | US6327684 Method of testing at-speed circuits having asynchronous clocks and controller for use therewith |
| 12/04/2001 | US6327683 Device scan testing |
| 12/04/2001 | US6327678 Skew adjusting method in IC testing apparatus and pseudo device for use in the method |
| 12/04/2001 | US6327556 AT-speed computer model testing methods |
| 12/04/2001 | US6327545 Method and apparatus for board model correction |
| 12/04/2001 | US6327544 Automatic storage of a trigger definition in a signal measurement system |
| 12/04/2001 | US6327394 Apparatus and method for deriving temporal delays in integrated circuits |
| 12/04/2001 | US6327224 On-chip method for measuring access time and data-pin spread |
| 12/04/2001 | US6327217 Variable latency buffer circuits, latency determination circuits and methods of operation thereof |
| 12/04/2001 | US6327198 Semiconductor memory device having a test mode setting circuit |
| 12/04/2001 | US6326801 Wafer of semiconductor material with dies, probe areas and leads |
| 12/04/2001 | US6326800 Self-adjusting burn-in test |
| 12/04/2001 | US6326798 Electric beam tester and image processing apparatus |
| 12/04/2001 | US6326797 Apparatus and method for evaluating printed circuit board assembly manufacturing processes |
| 12/04/2001 | US6326793 Method and apparatus for testing frequency-dependent electrical circuits |
| 12/04/2001 | US6326792 Method and apparatus for lifetime prediction of dielectric breakdown |
| 12/04/2001 | US6326732 Apparatus and method for non-contact stress evaluation of wafer gate dielectric reliability |
| 12/04/2001 | US6326688 Socket for semiconductor devices |
| 12/04/2001 | US6326560 Adapter for a ball grid array device |
| 12/04/2001 | US6326245 Method and apparatus for fabricating electronic device |
| 12/04/2001 | US6325662 Apparatus for testing IC chips using a sliding springy mechanism which exerts a nearly constant force apparatus |
| 11/29/2001 | WO2001091435A1 Arrangement with a mobile phone |
| 11/29/2001 | WO2001091053A1 Method for examining a pre-determined area of a printed circuit board and device for carrying out said method |
| 11/29/2001 | WO2001090834A2 System for regulating the temperature of ic-chips with a fluid whose temperature is controlled quickly by a slow response cooler and a fast response heater |
| 11/29/2001 | WO2001090768A2 Method and apparatus for testing source synchronous integrated circuits |
| 11/29/2001 | WO2001090766A2 System for regulating the temperature of ic-chips with a fluid which is heated and cooled as a function of the fluid temperatures to and from heat exchangers for the ic-chips |
| 11/29/2001 | WO2001090765A1 A circuit for measuring absolute spread in capacitors implemented in planary technology |
| 11/29/2001 | WO2001090764A1 Method and apparatus for in-circuit impedance measurement |
| 11/29/2001 | WO2001090710A1 Thermocouple passing through encapsulant of integrated circuit |
| 11/29/2001 | US20010047500 Semiconductor device testing apparatus |
| 11/29/2001 | US20010047499 Boundary scan test cell circuit |
| 11/29/2001 | US20010047498 Adapting scan architectures for low power operation |
| 11/29/2001 | US20010046168 Structures for wafer level test and burn -in |
| 11/29/2001 | US20010046153 Semiconductor integrated circuit |
| 11/29/2001 | US20010045998 Active-matrix substrate and inspecting method thereof |
| 11/29/2001 | US20010045841 Semiconductor integrated circuit, test method for the same, and recording device and communication equipment having the same |
| 11/29/2001 | US20010045840 Electronic circuit device with a short circuit switch and method of testing such a device |
| 11/29/2001 | US20010045839 Verification of PWB electrical parameters |
| 11/29/2001 | US20010045838 Conductive bump array contactors having an ejector and methods of testing using same |
| 11/29/2001 | US20010045837 Method of determining a resonant frequency of a mechanical device |
| 11/29/2001 | US20010045833 Diagnostic tester for multi-ballast lighting fixture |
| 11/29/2001 | US20010045780 Battery communication system |
| 11/29/2001 | US20010045636 Semiconductor integrated circuit package, semiconductor apparatus provided with a plurality of semiconductor integrated circuit packages, method of inspecting semiconductor integrated circuit package and method of fabricating semiconductor integrated circuit |
| 11/29/2001 | US20010045581 Semiconductor device |
| 11/29/2001 | US20010045570 Semiconductor storage device having burn-in mode |
| 11/29/2001 | US20010045011 Method of positioning a conductive element in a laminated electrical device |
| 11/29/2001 | DE10120080A1 Event-based semiconductor test system for testing semiconductor components, has controller that regulates overall system activity and supplies test programs with event time control data to event memory |
| 11/29/2001 | DE10111030A1 Test pattern and strobe signal generator used in semiconductor test system, has delay insertion unit that inserts delay to time control data of specified event and duplicating unit for time control and event data |
| 11/29/2001 | DE10024875A1 Bauteilhalter für Testvorrichtungen und Bauteilhaltersystem Component holder for test equipment and component holder system |
| 11/29/2001 | DE10024809A1 Electrical component insulation damage detection method, has test space filled with test gas having reduced breakdown voltage defined by test container surrounding tested component |
| 11/28/2001 | EP1158306A2 Detecting method for detecting internal state of a rechargeable battery, detecting device for practicing said detecting method, and instrument provided with said detecting device |
| 11/28/2001 | EP1158305A1 System integrated on a chip of semiconductor material |
| 11/28/2001 | EP1158303A1 A circuit for measuring absolute spread in capacitors implemented in planary technology |
| 11/28/2001 | EP1158302A2 Method and apparatus for probing a conductor of an array of closely-spaced conductors |
| 11/28/2001 | EP1158294A1 A method and apparatus for inspecting printed wiring boards |
| 11/28/2001 | EP1157279A1 Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment |
| 11/28/2001 | EP1157278A1 A method and integrated circuit arranged for feeding a test forcing pattern on a single shared pin of the circuit |
| 11/28/2001 | EP0948793B1 High-speed test system for a memory device |
| 11/28/2001 | EP0946973B1 Integrated circuit tray with flexural bearings |
| 11/28/2001 | CN2462421Y Improved display testing device |
| 11/28/2001 | CN1324108A Multiple line grid for application of packaging or testing |
| 11/28/2001 | CN1324107A Cooling system of aging device |
| 11/28/2001 | CN1323990A Semiconductor testing system based on specific application affairs |
| 11/28/2001 | CN1323989A Storage terminal calibration data based on affairs testing system for nonvolatile memory |
| 11/28/2001 | CN1075680C Electronic apparatus having function of displaying battery residual quantity and method for displaying said quantity |
| 11/27/2001 | US6324678 Method and system for creating and validating low level description of electronic design |
| 11/27/2001 | US6324666 Memory test device and method capable of achieving fast memory test without increasing chip pin number |
| 11/27/2001 | US6324665 Event based fault diagnosis |
| 11/27/2001 | US6324664 Means for testing dynamic integrated circuits |
| 11/27/2001 | US6324663 System and method to test internal PCI agents |
| 11/27/2001 | US6324662 TAP and linking module for scan access of multiple cores with IEEE 1149.1 test access ports |
| 11/27/2001 | US6324614 Tap with scannable control circuit for selecting first test data register in tap or second test data register in tap linking module for scanning data |
| 11/27/2001 | US6324486 Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time |
| 11/27/2001 | US6324485 Application specific automated test equipment system for testing integrated circuit devices in a native environment |
| 11/27/2001 | US6324484 Self-testable spacecraft for self-testing analog functions |
| 11/27/2001 | US6324168 Method and system for computer network link with undefined termination condition |
| 11/27/2001 | US6324125 Pulse width detection |
| 11/27/2001 | US6324042 Electronic load for the testing of electrochemical energy conversion devices |
| 11/27/2001 | US6323694 Differential comparator with a programmable voltage offset for use in an automatic tester |
| 11/27/2001 | US6323670 PCB adapter for IC chip failure analysis |
| 11/27/2001 | US6323669 Apparatus and method for a contact test between an integrated circuit device an a socket |