| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 12/13/2001 | US20010050936 Logic determination device for semiconductor integrated device and logic determination method |
| 12/13/2001 | US20010050871 Semiconductor memory integrated circuit |
| 12/13/2001 | US20010050861 Nonvolatile semiconductor storage device and test method therefor |
| 12/13/2001 | US20010050578 Semiconductor apparatus |
| 12/13/2001 | US20010050577 TFT and reliability evaluation method thereof |
| 12/13/2001 | US20010050575 Method and system of testing a chip |
| 12/13/2001 | US20010050573 Chip-on-chip testing using bist |
| 12/13/2001 | US20010050572 Printed circuit board testing apparatus |
| 12/13/2001 | US20010050570 Method of forming an apparatus configured to engage an electrically conductive pad on a semiconductive substrate and a method of engaging electrically conductive pads on a semiconductive substrate |
| 12/13/2001 | US20010050569 Apparatus and method of inspecting semiconductor integrated circuit |
| 12/13/2001 | US20010050568 Flexible conductive structures and method |
| 12/13/2001 | US20010050567 Segmented architecture for wafer test & burn-in |
| 12/13/2001 | US20010050566 Printed circuit board for use in the testing of electrical components and method for producing it |
| 12/13/2001 | US20010050565 Multi-point probe |
| 12/13/2001 | US20010050561 Capacity testing method and arrangement |
| 12/13/2001 | US20010050550 High frequency component, communication apparatus, and method for measuring characteristics of high frequency component |
| 12/13/2001 | US20010050427 Test soket of semiconductor device |
| 12/13/2001 | US20010050177 Connection structure of coaxial cable to electric circuit substrate |
| 12/13/2001 | DE10114001A1 Power supply amperometry unit for semiconductor examination system, includes integrator to integrate output signal of voltage amplifier, whose output signal is converted into digital signal, after predetermined time |
| 12/13/2001 | DE10059667A1 Semiconductor memory device has word configuration selection stage that selects word configuration for normal mode from number of configurations if deactivated test mode signal input |
| 12/13/2001 | DE10027978A1 System testing device, includes interface to enable bidirectional data communications between the central data memory and the tested system |
| 12/13/2001 | DE10027042A1 Method and device for measuring high frequencies in electrical components has a centering/clamping device moving downwards using a ram to pick up a component on a vacuum holder from a centering opening and to center it |
| 12/13/2001 | DE10026275A1 Verfahren zum Testen einer Vielzahl von Wortleitungen einer Halbleiterspeicheranordnung A method for testing a plurality of word lines of a semiconductor memory arrangement |
| 12/13/2001 | DE10023093A1 Verfahren zur Weichendiagnose und Weichendiagnoseeinrichtung Method for Railway switches and turnouts diagnostic device |
| 12/13/2001 | CA2411349A1 Process for the electromagnetic modelling of electronic components and systems |
| 12/12/2001 | EP1162645A2 Specimen inspection instrument |
| 12/12/2001 | EP1162472A2 Automatic test pattern generation for functional register transfer level circuits using assignment decision diagrams |
| 12/12/2001 | EP1162471A1 Measuring instrument with multiple signal terminals shared in multiple operation modes |
| 12/12/2001 | EP1162469A2 Current monitoring and latchup detection circuit and method |
| 12/12/2001 | EP1161787A1 Energy gauge |
| 12/12/2001 | EP0933785B1 Semiconductor device and power supply current detecting method |
| 12/12/2001 | EP0741915A4 Battery with strength indicator |
| 12/12/2001 | EP0642134B1 Test of a static random access memory |
| 12/12/2001 | CN2465191Y Horizontal rod type prober tester |
| 12/12/2001 | CN1326604A Method and device for detecting disconnection of fuse |
| 12/12/2001 | CN1326550A Battery pack having state charging indicator |
| 12/12/2001 | CN1076118C Electric switch with current protection for remote station and portable local device interface |
| 12/12/2001 | CN1076100C Peak voltage and peak slope detector for battery charger circuit |
| 12/11/2001 | US6330703 Method and circuit for determining the power consumption requirements for a semiconductor logic circuit and designing the circuit accordingly |
| 12/11/2001 | US6330698 Method for making a digital circuit testable via scan test |
| 12/11/2001 | US6330697 Apparatus and method for performing a defect leakage screen test for memory devices |
| 12/11/2001 | US6330681 Method and apparatus for controlling power level during BIST |
| 12/11/2001 | US6330164 Interconnect assemblies and methods including ancillary electronic component connected in immediate proximity of semiconductor device |
| 12/11/2001 | US6330140 Method of and circuit for testing an electrical actuator drive stage |
| 12/11/2001 | US6329892 Low profile, current-driven relay for integrated circuit tester |
| 12/11/2001 | US6329856 Method and apparatus for tracking and controlling voltage and current transitions |
| 12/11/2001 | US6329833 System and method for automatically measuring input voltage levels for integrated circuits |
| 12/11/2001 | US6329831 Method and apparatus for reliability testing of integrated circuit structures and devices |
| 12/11/2001 | US6329830 Screen display for automated verification and repair station |
| 12/11/2001 | US6329828 Method and apparatus for capacitively testing a semiconductor die |
| 12/11/2001 | US6329826 Method and apparatus for inspecting integrated circuit pattern |
| 12/11/2001 | US6329824 Method of measuring resonant frequency of a resonator and coupling degree of two resonators |
| 12/11/2001 | US6329823 Process for monitoring the residual charge and capacity of a battery |
| 12/11/2001 | US6329822 Periodic automatic self-test system and methodology |
| 12/11/2001 | US6329793 Method and apparatus for charging a battery |
| 12/11/2001 | US6329792 Device and system for management of battery back up power source |
| 12/11/2001 | US6329754 Diagnostic system for a ballast of a high-pressure gas discharge lamp for a motor vehicle |
| 12/11/2001 | US6329670 Conductive material for integrated circuit fabrication |
| 12/11/2001 | US6329669 Semiconductor device able to test changeover circuit which switches connection between terminals |
| 12/11/2001 | US6329637 Method and process of contract to a heat softened solder ball array |
| 12/11/2001 | US6329212 Process for exposing for analysis the back side of a semiconductor die mounted in a package |
| 12/06/2001 | WO2001093423A1 Variable delay circuit and semiconductor circuit test device |
| 12/06/2001 | WO2001093365A1 Battery quality monitoring method |
| 12/06/2001 | WO2001092905A1 A relay test device |
| 12/06/2001 | WO2001092904A2 Ate timing measurement unit and method |
| 12/06/2001 | WO2001092903A2 Method and apparatus for maximizing test coverage |
| 12/06/2001 | WO2001092902A1 Data carrier module having indication means for indicating the result of a test operation |
| 12/06/2001 | WO2001092898A2 Measurement method and device, in particular for the high-frequency measurement of electric components |
| 12/06/2001 | WO2001092897A2 Systems and methods employing micro-fabricated field emission devices to sense and control potential differences between a space object and its space plasma environment, to emit charge from a space object, and in use with an electrodynamic tether to adjust an orbit of an orbiting space object |
| 12/06/2001 | WO2001054056A3 Chipcard circuit with monitored access to the test mode |
| 12/06/2001 | WO2001030048A3 Notification of low-battery in a wireless network |
| 12/06/2001 | WO2001004641A3 Wafer level burn-in and electrical test system and method |
| 12/06/2001 | US20010049807 Address generator of dynamic memory testing circuit and address generating method thereof |
| 12/06/2001 | US20010049806 Testable ic having analog and digital circuits |
| 12/06/2001 | US20010049805 Circuit, system and method for arranging data output by semicomductor testers to packet-based devices under test |
| 12/06/2001 | US20010049803 Microprocessor internally provided with test circuit |
| 12/06/2001 | US20010049802 Fault analyzing system, method for pursuing fault origin and information storage medium for storing computer program representative of the method |
| 12/06/2001 | US20010049208 Anisotropically conductive sheet and connector |
| 12/06/2001 | US20010048634 Synchronous semiconductor memory device |
| 12/06/2001 | US20010048623 Semiconductor memory device having a circuit for fast operation |
| 12/06/2001 | US20010048621 Method for testing a multiplicity of word lines of a semiconductor memory configuration |
| 12/06/2001 | US20010048527 Semiconductor test apparatus |
| 12/06/2001 | US20010048367 System and method for diagnosing fault conditions associated with powering an electrical load |
| 12/06/2001 | US20010048317 Compare path bandwidth control for high performance automatic test systems |
| 12/06/2001 | US20010048314 Component holder for testing devices and component holder system microlithography |
| 12/06/2001 | US20010048310 Motor insulation fault detection by sensing ground leak current |
| 12/06/2001 | US20010048309 Interface for cable testing |
| 12/06/2001 | US20010048307 Multiplex voltage measurement apparatus |
| 12/06/2001 | US20010048305 Method for determining sources of interference |
| 12/06/2001 | US20010048300 Ringing preventive circuit, device under test board, pin electronics card, and semiconductor device |
| 12/06/2001 | US20010048153 Method and apparatus for testing bumped die |
| 12/06/2001 | US20010048110 Device for inspecting element substrates and method of inspection using this device |
| 12/06/2001 | US20010048075 Particle beam apparatus |
| 12/06/2001 | DE10026162A1 Method for quality control of photovoltaic cells and modules, measures two current-voltage characteristic curves with different but equal spectral radiation intensities using one characteristic curve to verify peak performance |
| 12/06/2001 | DE10025751A1 Verfahren zum Untersuchen einer leiterplatte an einem vorbestimmten Bereich der Leiterplatte und Vorrichtung zum Durchführen des Verfahrens A method of inspecting a circuit board in a predetermined area of the printed circuit board and device for carrying out the method |
| 12/06/2001 | DE10025274A1 Verfahren zur Überwachung der Steuerspannung eines elektromagnetischen Schaltgeräts Method for monitoring the control voltage of the electromagnetic switching device |
| 12/05/2001 | EP1161043A2 Signal type identification |
| 12/05/2001 | EP1160825A1 Particle beam apparatus |
| 12/05/2001 | EP1160580A1 Circuit for detecting a malfunction |
| 12/05/2001 | EP1160579A1 Containment device for burn-in boards, for testing integrated circuits and the like |