| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 12/25/2001 | US6333633 Method for inspecting a flexible printed circuit |
| 12/25/2001 | US6333625 Fault localizing and identifying device for electric systems |
| 12/25/2001 | CA2231893C Inspecting system for welding apparatus |
| 12/20/2001 | WO2001097354A1 Computer-implemented system and method for evaluating the diagnostic state of a component |
| 12/20/2001 | WO2001097340A2 Apparatus and method for producing an ion channel microprobe |
| 12/20/2001 | WO2001097231A1 Fail analyzer |
| 12/20/2001 | WO2001096894A1 Compliant probe apparatus |
| 12/20/2001 | WO2001096893A1 Apparatus for controlling semiconductor chip characteristics |
| 12/20/2001 | WO2001096892A1 Semiconductor testing apparatus, and its monitor device |
| 12/20/2001 | WO2001096891A1 Device and method for inspecting circuit board |
| 12/20/2001 | WO2001096890A1 Device and method for inspection |
| 12/20/2001 | WO2001096889A1 Method for detecting resistive faults |
| 12/20/2001 | WO2001096887A2 Method for measuring fault locations in high frequency cables and lines |
| 12/20/2001 | WO2001096885A1 Connector apparatus |
| 12/20/2001 | WO2001096839A1 Optical inspection system |
| 12/20/2001 | WO2001056033A3 Intermediate storage device |
| 12/20/2001 | WO2001054248A3 System and method accommodating more than one battery within an electronic device |
| 12/20/2001 | WO2001048493A3 Low power scan flipflop |
| 12/20/2001 | US20010054166 LSI having a built-in self-test circuit |
| 12/20/2001 | US20010054164 Semiconductor memory device allowing mounting of built-in self test circuit without addition of interface specification |
| 12/20/2001 | US20010053960 Adjustment method for reducing channel skew of test system |
| 12/20/2001 | US20010053628 Socket for electrical parts |
| 12/20/2001 | US20010053170 Semiconductor device test apparatus |
| 12/20/2001 | US20010053102 Device with integrated SRAM memory and method of testing such a device |
| 12/20/2001 | US20010052788 Array substrate inspection method |
| 12/20/2001 | US20010052787 Method and apparatus for die testing on wafer |
| 12/20/2001 | US20010052783 Device for measurement and analysis of electrical signals of an integrated circuit component |
| 12/20/2001 | US20010052782 BGA on-board tester |
| 12/20/2001 | US20010052781 Method of inspecting pattern and inspecting instrument |
| 12/20/2001 | US20010052778 Device for detecting and locating insulation defects |
| 12/20/2001 | US20010052777 Diagnostic circuit for measuring the resistance and the leakage current of at least one firing cap of a motor vehicle occupant protection system, and a motor vehicle occupant protection system including the diagnostic circuit |
| 12/20/2001 | US20010052767 Sorting control method of tested electric device |
| 12/20/2001 | US20010052766 Apparatus for simulating electrical components |
| 12/20/2001 | US20010052622 Microwave transistor subjected to burn-in testing |
| 12/20/2001 | DE10129282A1 Integrated circuit modules connection method involves connecting interlocking edge, by aligning teeth and recesses of edge of integrated circuit with adjacent edge |
| 12/20/2001 | DE10107441A1 Determining characteristics of frequency translation devices by extracting expressions from reflection responses including variations in sum and difference signal components |
| 12/20/2001 | DE10036140C1 Non-destructive read-out of MRAM memory cells involves normalizing actual cell resistance, comparing normalized and normal resistance values, detecting content from the result |
| 12/20/2001 | DE10030021A1 Test device for linear scanning of pole faces in voice coil motor (VCM) system in disk drive, determines magnetic flow density of individual pole faces of VCM system, based on voltage induced in coil |
| 12/20/2001 | DE10028765A1 Device for potential misalignment recognition of potential collecting point in car has control apparatus which controls energy supply of electrical loads which is connected in electrically conducting fashion |
| 12/20/2001 | DE10024476A1 Vorrichtung zum Testen einer elektrischen Schaltung An apparatus for testing an electrical circuit |
| 12/20/2001 | CA2412358A1 Apparatus and method for producing an ion channel microprobe |
| 12/19/2001 | EP1164700A1 Data flow synchronization |
| 12/19/2001 | EP1164682A2 Battery charging/discharging apparatus and battery charging/discharging method |
| 12/19/2001 | EP1164589A1 Storage device having an error correction function |
| 12/19/2001 | EP1164381A2 Integrated circuit with a test fucntion and test arrangement for testing an integrated circuit |
| 12/19/2001 | EP1163680A1 Device and method for carrying out the built-in self-test of an electronic circuit |
| 12/19/2001 | EP1163532A1 Method for identifying the condition of an energy accumulator |
| 12/19/2001 | EP1163354A1 Compositions and methods for helper-free production of recombinant adeno-associated viruses |
| 12/19/2001 | EP1068540B1 Battery parameter measurement |
| 12/19/2001 | EP0918714B1 Method and apparatus for loading electronic components |
| 12/19/2001 | EP0891558B1 Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system |
| 12/19/2001 | EP0878763B1 Means for virtual deskewing of high/intermediate/low DUT data |
| 12/19/2001 | EP0862115B1 Trigger sequencing controller |
| 12/19/2001 | EP0839325B1 Measuring circuit for detecting and locating incursions of water in pipe or cable installations |
| 12/19/2001 | EP0764829B1 Transition detection circuit |
| 12/19/2001 | EP0569354B1 Battery with strength indicator |
| 12/19/2001 | CN2466669Y Multifunctional electric cable failure detector |
| 12/19/2001 | CN2466668Y Electric wire break alarm device |
| 12/19/2001 | CN2466667Y Theftproof alarm device for power line |
| 12/19/2001 | CN2466661Y Probe type testing device |
| 12/19/2001 | CN1327595A Method for testing a memory array and with a fault response signal signaling mode based on memory |
| 12/19/2001 | CN1327564A Modelling electrical characteristics of thin film transistors |
| 12/19/2001 | CN1076479C Electronic circuit compositing flipelop with master and slave and its method of testing |
| 12/19/2001 | CN1076478C Partial discharge measuring device |
| 12/18/2001 | US6332201 Test results checking via predictive-reactive emulation |
| 12/18/2001 | US6332113 Electronic battery tester |
| 12/18/2001 | US6332032 Method for generating test files from scanned test vector pattern drawings |
| 12/18/2001 | US6331958 Semiconductor memory device having data parallel/serial conversion function and capable of efficiently performing operational test |
| 12/18/2001 | US6331941 Short circuit detection method and apparatus and motor drive incorporating same |
| 12/18/2001 | US6331783 Circuit and method for improved test and calibration in automated test equipment |
| 12/18/2001 | US6331782 Method and apparatus for wireless testing of integrated circuits |
| 12/18/2001 | US6331779 Method and apparatus for testing frequency-dependent electrical circuits |
| 12/18/2001 | US6331770 Application specific event based semiconductor test system |
| 12/18/2001 | US6331762 Energy management system for automotive vehicle |
| 12/18/2001 | US6331118 Electrode spacing conversion adaptor |
| 12/18/2001 | CA2298338C A cable testing apparatus |
| 12/18/2001 | CA2126296C Diagnostic circuit and method for amperometrically determining the current passing through a sensor |
| 12/16/2001 | CA2350718A1 Method and apparatus for opto-electronic built-in test |
| 12/13/2001 | WO2001095326A2 System and method for terminal short detection |
| 12/13/2001 | WO2001095238A2 Chip design verifying and chip testing apparatus and method |
| 12/13/2001 | WO2001094962A1 Device for judging life of auxiliary battery |
| 12/13/2001 | WO2001094961A1 Method for demonstrating the dependence of a signal based on another signal |
| 12/13/2001 | WO2001094960A1 Tool for automatic testability analysis |
| 12/13/2001 | WO2001094959A2 System and method for diagnosing fault conditions associated with powering an electrical load |
| 12/13/2001 | WO2001094958A2 Process for the electromagnetic modelling of electronic components and systems |
| 12/13/2001 | WO2001094955A2 Scanning electro-optic near field device and method of scanning |
| 12/13/2001 | WO2001094930A1 A microprocessor-based hand-held battery tester system |
| 12/13/2001 | WO2001094927A1 Method and apparatus for measuring electron injection energy barrier at interface between metal and organic material |
| 12/13/2001 | WO2001039254A3 Continuous application and decompression of test patterns to a circuit-under-test |
| 12/13/2001 | WO2001035051A3 X-ray tomography bga (ball grid array) inspections |
| 12/13/2001 | WO2001031718A3 Shunt resistance device for monitoring battery state of charge |
| 12/13/2001 | WO2000016510A9 Signal conversion for fault isolation |
| 12/13/2001 | US20010052116 Method for the analysis of a test software tool |
| 12/13/2001 | US20010052097 Method and apparatus for testing semiconductor devices |
| 12/13/2001 | US20010052096 Low power scan flipflop |
| 12/13/2001 | US20010052095 Mechanism and display for boundary-scan debugging information |
| 12/13/2001 | US20010052094 Modifying circuit designs running from both edges of clock to run from positive designs running from both edges of clock to run from positive edge |
| 12/13/2001 | US20010052093 Memory testing method and memory testing apparatus |
| 12/13/2001 | US20010052090 Storage device having an error correction function |
| 12/13/2001 | US20010051404 Semiconductor device with test circuit |