| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/02/2002 | EP1168558A2 Digital distance relay |
| 01/02/2002 | EP1168369A2 Synchronous semiconductor memory device |
| 01/02/2002 | EP1168181A2 IC, IC-mounted electronic device, debugging method and IC debugger |
| 01/02/2002 | EP1168053A1 Liquid crystal display and its inspecting method |
| 01/02/2002 | EP1167988A1 Rechargeable battery pack |
| 01/02/2002 | EP1167987A1 Battery capacity calculating method and device therefor |
| 01/02/2002 | EP1167986A2 Open cable locating for sheathed cables |
| 01/02/2002 | EP1167981A1 Method of operating a measurement instrument using a spreadsheet program |
| 01/02/2002 | EP1166428A1 Monitoring internal parameters of electrical motor systems |
| 01/02/2002 | EP1166275A1 Device for weighting the cell resistances in a magnetoresistive memory |
| 01/02/2002 | EP1166274A1 Device for weighting the cell resistances in a magnetoresistive memory |
| 01/02/2002 | EP1166138A1 A method and apparatus for determining the state of charge of a battery |
| 01/02/2002 | EP1166137A1 Integrated circuit testing device with dual purpose analog and digital channels |
| 01/02/2002 | EP1166136A1 Simulator cart |
| 01/02/2002 | EP1166134A1 Method for monitoring a substantially direct current flow in a load |
| 01/02/2002 | EP1166049A1 Identifiable electric component, method of identification and evaluation device |
| 01/02/2002 | EP0932904B1 Overvoltage detection circuit for test mode selection |
| 01/02/2002 | EP0664925B1 Interconnection structure for integrated circuits and method for making same |
| 01/02/2002 | EP0565866B1 Large-scale integrated circuit device |
| 01/02/2002 | CN2469578Y Power source connector with ground warning component |
| 01/02/2002 | CN2469464Y Testing instrument for preheating time of light source filament |
| 01/02/2002 | CN2469463Y On-line monitoring device for partial discharging of current mutual inductor and voltage inductor |
| 01/02/2002 | CN2469462Y Arrangement for testing and alarming electric faults |
| 01/02/2002 | CN2469458Y Leakage recording instrument |
| 01/02/2002 | CN1329787A Method and circuit configuration for determining the reliability performance of connection cables in a switching device |
| 01/02/2002 | CN1329769A A system and method for monitoring and warning regarding presence of manually and temporarily fitted ground cnnectors on high voltage conductors, as well as warning device |
| 01/02/2002 | CN1329749A A method and apparatus for transport and tracking of electronic component |
| 01/02/2002 | CN1329463A Load control type exciter |
| 01/02/2002 | CN1329255A Chargeable cell test loop contact resistance monitoring method |
| 01/02/2002 | CN1329254A Method and equipment for testing semiconductor device |
| 01/02/2002 | CN1329253A High-voltage fault discharge on-line monitoring system |
| 01/02/2002 | CN1077322C Method for estimating discharge capbility of zinc oxide powder element, method of screening element and systems for carrying out these methods |
| 01/02/2002 | CN1077259C Process and device for contactless electronic control of flow of water |
| 01/01/2002 | US6336199 Computer-readable recording medium storing a method of masking or modifying output events of bi-directional signals in an event-format test pattern file for a semiconductor integrated circuit |
| 01/01/2002 | US6336198 Chip testing system |
| 01/01/2002 | US6336088 Method and apparatus for synchronizing independently executing test lists for design verification |
| 01/01/2002 | US6335887 Semiconductor memory device allowing switching of word configuration |
| 01/01/2002 | US6335645 Semiconductor integrated circuit having built-in self-test circuit |
| 01/01/2002 | US6335631 Induction machine asymmetry detection instrument and method |
| 01/01/2002 | US6335630 Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona charge |
| 01/01/2002 | US6335629 Test fixture having an opening for exposing the back of a semiconductor chip and testing module comprising the same |
| 01/01/2002 | US6335628 Wafer probe station for low-current measurements |
| 01/01/2002 | US6335627 Apparatus and method for testing an electronics package substrate |
| 01/01/2002 | US6335616 Ringing preventive circuit, device under test board, pin electronics card, and semiconductor device |
| 01/01/2002 | US6335611 Current monitoring circuit for secondary battery |
| 01/01/2002 | US6335608 Fault protection circuitry for motor controllers |
| 01/01/2002 | US6335210 Baseplate for chip burn-in and/of testing, and method thereof |
| 01/01/2002 | US6334247 High density integrated circuit apparatus, test probe and methods of use thereof |
| 01/01/2002 | CA2223221C Circuit for easily testing a logic circuit having a number of input-output pins by scan path |
| 12/27/2001 | WO2001098901A2 Method and device for optimising a test programme |
| 12/27/2001 | WO2001098793A2 Systems for testing integraged circuits during burn-in |
| 12/27/2001 | WO2001098788A2 Diagnosting reliability of vias by e-beam probing |
| 12/27/2001 | WO2001069272A3 Device and method for monitoring a capacitor bushing |
| 12/27/2001 | US20010056559 Accelerating scan test by re-using response data as stimulus data |
| 12/27/2001 | US20010056340 CDM simulator for testing electrical devices |
| 12/27/2001 | US20010055905 TAB, probe card, TAB handler and method for measuring IC chip |
| 12/27/2001 | US20010055902 Socket for electrical parts and method of assembling same |
| 12/27/2001 | US20010055900 Contact pin |
| 12/27/2001 | US20010055417 Electronic assembly video inspection system |
| 12/27/2001 | US20010055415 Pattern inspection method and pattern inspection device |
| 12/27/2001 | US20010055331 Multi-pair gigabit ethernet transceiver |
| 12/27/2001 | US20010055229 Semiconductor memory device and testing system and testing method |
| 12/27/2001 | US20010055226 Semiconductor integrated circuit device allowing accurate evaluation of access time of memory core contained therein and access time evaluating method |
| 12/27/2001 | US20010054911 Resolver, resolver fault detection circuit, and resolver fault detection method |
| 12/27/2001 | US20010054909 Integrated circuit device having a burn-in mode for which entry into and exit from can be controlled |
| 12/27/2001 | US20010054908 Method and apparatus for capacitively testing a semiconductor die |
| 12/27/2001 | US20010054905 Probe card assembly and kit |
| 12/27/2001 | US20010054904 Monitoring resistor element and measuring method of relative preciseness of resistor elements |
| 12/27/2001 | US20010054902 Method and device for detecting and locating insulation/isolation defects between conductors |
| 12/27/2001 | US20010054899 Electronic battery tester |
| 12/27/2001 | US20010054893 Contact arm and electronic device testing apparatus using the same |
| 12/27/2001 | US20010054892 Inspection stage |
| 12/27/2001 | US20010054891 Tray transfer arm, electronic component testing apparatus and tray transfer method |
| 12/27/2001 | US20010054890 Alternator testing method and system using ripple detection |
| 12/27/2001 | US20010054879 Method to determine capacity of a battery |
| 12/27/2001 | US20010054710 System and method for inspecting semiconductor device |
| 12/27/2001 | US20010054709 Chemically synthesized and assembled electronic devices |
| 12/27/2001 | US20010054691 Optical system for scanning microscope |
| 12/27/2001 | US20010054510 Integrated microcontact pin and method for manufacturing the same |
| 12/27/2001 | CA2409411A1 Diagnosting reliability of vias by e-beam probing |
| 12/26/2001 | CN2468059Y IC delivering device for IC test processor |
| 12/26/2001 | CN2468058Y Liquid crystal display module detecting apparatus |
| 12/26/2001 | CN1328644A Probe card for probing wafers with raised contact elements |
| 12/26/2001 | CN1328262A Electric service life monitor system for contact of breaker |
| 12/26/2001 | CN1076684C Side stand for two-wheel cycles |
| 12/25/2001 | US6334200 Testable integrated circuit, integrated circuit design-for-testability method, and computer-readable medium storing a program for implementing the design-for-testability method |
| 12/25/2001 | US6334199 Method of generating test patterns for a logic circuit, a system performing the method, and a computer readable medium instructing the system to perform the method |
| 12/25/2001 | US6334198 Method and arrangement for controlling multiply-activated test access port control modules |
| 12/25/2001 | US6334181 DSP with wait state registers having at least two portions |
| 12/25/2001 | US6334100 Method and apparatus for electronic circuit model correction |
| 12/25/2001 | US6333888 Semiconductor memory device |
| 12/25/2001 | US6333880 Semiconductor memory device capable of detecting high-voltage test command signal |
| 12/25/2001 | US6333879 Semiconductor device operable in a plurality of test operation modes |
| 12/25/2001 | US6333858 Carrier module |
| 12/25/2001 | US6333715 Partial discharge detector of gas-insulated apparatus |
| 12/25/2001 | US6333680 Method and system for characterizing coupling capacitance between integrated circuit interconnects |
| 12/25/2001 | US6333646 Abnormal clock detector and abnormal clock detecting apparatus |
| 12/25/2001 | US6333638 Semiconductor test apparatus and test method using the same |
| 12/25/2001 | US6333637 Electronic card assembly fixture |
| 12/25/2001 | US6333635 Probe card for testing an integrated circuit chip |