| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/10/2002 | WO2002003053A1 Method for fast and accurate determination of the minority carrier diffusion length from simultaneously measured surface photovoltages |
| 01/10/2002 | WO2001036990A3 Wafer level interposer |
| 01/10/2002 | US20020004929 Method of designing a layout of an LSI chip, and a computer product |
| 01/10/2002 | US20020004923 Integrated circuit |
| 01/10/2002 | US20020004919 Method for locating functional mistakes in digital circuit designs |
| 01/10/2002 | US20020004918 Method for the preparation and execution of a self-test procedure and associated self-test generating method |
| 01/10/2002 | US20020004715 Electric wiring simulation device and recording medium recording simulation program for electric wiring simulation device |
| 01/10/2002 | US20020004709 Test system and test method for testing the operability of test samples |
| 01/10/2002 | US20020004320 Attaratus for socketably receiving interconnection elements of an electronic component |
| 01/10/2002 | US20020003731 Memory testing method |
| 01/10/2002 | US20020003730 Semiconductor memory device allowing switching of word configuration |
| 01/10/2002 | US20020003433 Method and apparatus for testing semiconductor devices |
| 01/10/2002 | US20020003432 Semiconductor wafer test and burn-in |
| 01/10/2002 | US20020003431 Method and device for supporting flip chip circuitry in analysis |
| 01/10/2002 | US20020003430 A method and system for processing integrated circuits |
| 01/10/2002 | US20020003428 Method and apparatus for collecting light from an array of light emitting devices |
| 01/10/2002 | US20020003425 Apparatus and method for testing fuses |
| 01/10/2002 | US20020003423 Modular battery tester |
| 01/10/2002 | US20020003037 Temperature-controlled chuck with recovery of circulating temperature control fluid |
| 01/10/2002 | DE10125345A1 Planarization mechanism for test contact system, includes distance sensor which detects the gap between the contact substrate and a semiconductor wafer or a reference plate |
| 01/10/2002 | DE10032080A1 Test control method for electrical component, involves temporarily connecting test control device to bus structure to identify vehicle and determine if correct voltage supply components are mounted and that they are operating correctly |
| 01/09/2002 | EP1170810A2 Alternate fuel gauge for an alkali metal electrochemical cell |
| 01/09/2002 | EP1170666A2 On-line fault tolerant operation via incremental reconfiguration of field programmable gate arrays |
| 01/09/2002 | EP1170596A2 Method and apparatus for measuring photoelectric conversion characteristics |
| 01/09/2002 | CN2470840Y Testing device of electric motor |
| 01/09/2002 | CN2470839Y Electric-line identifying device |
| 01/09/2002 | CN2470838Y Insulated charged detecting-sampling protector of high-voltage electric equipment |
| 01/09/2002 | CN2470837Y Quick-acting detection instrument of drive-tube of stylus printer |
| 01/09/2002 | CN1330439A Digital Distance relay |
| 01/09/2002 | CN1330435A Connecting component and its assembling mechanism |
| 01/09/2002 | CN1330431A Connecting mechanism for coaxial of circuit substrate |
| 01/09/2002 | CN1330427A Accumulator charge-discharge device and charge-discharge method |
| 01/09/2002 | CN1330401A Integrated micro-contact pin and production method thereof |
| 01/09/2002 | CN1330273A Multiple testing end signal for testing system based on event |
| 01/09/2002 | CN1077690C Process for determining the state of charge of accumulator and method for determining gradul aged of accumulator |
| 01/09/2002 | CN1077689C Testing unit for connector testing |
| 01/08/2002 | USRE37500 System for partitioning and testing submodule circuits of an integrated circuit |
| 01/08/2002 | US6338154 Apparatus and method for generating addresses in a built-in self memory testing circuit |
| 01/08/2002 | US6338148 Real-time test controller |
| 01/08/2002 | US6338029 Method for determining when an electric motor is acceptable |
| 01/08/2002 | US6337819 Semiconductor device having on-chip terminal with voltage to be measured in test |
| 01/08/2002 | US6337814 Semiconductor memory device having reference potential generating circuit |
| 01/08/2002 | US6337622 DSRC car-mounted equipment |
| 01/08/2002 | US6337577 Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources |
| 01/08/2002 | US6337576 Wafer-level burn-in |
| 01/08/2002 | US6337575 Methods of testing integrated circuitry, methods of forming tester substrates, and circuitry testing substrates |
| 01/08/2002 | US6337574 Method and apparatus for testing bumped die |
| 01/08/2002 | US6337573 Contact test circuit |
| 01/08/2002 | US6337571 Ultra-high-frequency current probe in surface-mount form factor |
| 01/08/2002 | US6337218 Method to test devices on high performance ULSI wafers |
| 01/08/2002 | US6336817 Element enabling electrical or electronic test assemblies to be achieved |
| 01/08/2002 | US6336669 Parallel aligning quick disconnect articulated chuck apparatus and method |
| 01/08/2002 | US6336269 Method of fabricating an interconnection element |
| 01/08/2002 | CA2249951C Method and device for detecting a state of charge of a battery assembly, and battery assembly charge and discharge control device |
| 01/08/2002 | CA2141420C Detecting faults in power lines |
| 01/03/2002 | WO2002001841A1 Apparatus and method for testing telephone jacks |
| 01/03/2002 | WO2002001719A2 Method and apparatus for testing high performance circuits |
| 01/03/2002 | WO2002001698A2 Alternator testing method and system using ripple detection |
| 01/03/2002 | WO2002001689A2 Alternator testing method and system using timed application of load |
| 01/03/2002 | WO2002001241A1 Testing and engagement tool for components in a high-voltage plant |
| 01/03/2002 | WO2002001240A1 Method for assessing security of operating conditions of an assembly of integrated electronic systems receiving and producing data |
| 01/03/2002 | WO2002001239A1 Method for customizing an integrated circuit element |
| 01/03/2002 | WO2002001237A2 System and method for testing integrated circuits |
| 01/03/2002 | WO2002001236A2 Burn-in testing method and device with temperature control |
| 01/03/2002 | WO2002001235A2 Testing device with a cdm simulator for providing a rapid discharge |
| 01/03/2002 | WO2002001234A2 System for calibrating timing of an integrated circuit wafer tester |
| 01/03/2002 | WO2002001233A2 Method and apparatus for adjusting the phase of input/output circuitry |
| 01/03/2002 | WO2002001232A1 Conductive contact |
| 01/03/2002 | WO2002000394A1 Vacuum chuck with integrated electrical testing points |
| 01/03/2002 | WO2001073459A3 System and method for testing signal interconnections using built-in self test |
| 01/03/2002 | WO2001063304A3 Method and apparatus for isolated thermal fault finding in electronic components |
| 01/03/2002 | WO2001037091A3 Method of discriminating between different types of scan failures, a computer implemented circuit simulation and fault detection system |
| 01/03/2002 | WO2000065772A3 Phy control module for a multi-pair gigabit transceiver |
| 01/03/2002 | US20020002691 Method and apparatus for processor emulation |
| 01/03/2002 | US20020002008 Kinematic coupling |
| 01/03/2002 | US20020001863 Powering dies on a semiconductor wafer through wafer scribe line areas |
| 01/03/2002 | US20020001745 Battery having a built-in controller |
| 01/03/2002 | US20020001307 VPI/VCI availability index |
| 01/03/2002 | US20020001235 Semiconductor memory device allowing effective detection of leak failure |
| 01/03/2002 | US20020000914 Apparatus and method for monitoring line disconnection and a fire, and a fire alarm system having the same |
| 01/03/2002 | US20020000861 Method and apparatus for eliminating shoot-through events during master-slave flip-flop scan operations |
| 01/03/2002 | US20020000827 Semiconductor integrated circuit device |
| 01/03/2002 | US20020000826 Semiconductor parametric testing apparatus |
| 01/03/2002 | US20020000825 Method for screening multi-layer ceramic electronic component |
| 01/03/2002 | US20020000824 Tester and related method for testing electrical parameters of circuit paths |
| 01/03/2002 | US20020000823 Tester for a semiconductor ic circuit having multiple pins |
| 01/03/2002 | US20020000821 Contact probe and fabrication method thereof |
| 01/03/2002 | US20020000819 High resolution analytical probe station |
| 01/03/2002 | US20020000817 Conductive bump array contactors having an ejector and methods of testing using same |
| 01/03/2002 | US20020000816 CPU adapter for a motherboard test machine |
| 01/03/2002 | US20020000812 Data carrier module having indication means for indicating the result of a test operation |
| 01/03/2002 | US20020000803 COF autohandler |
| 01/03/2002 | US20020000790 Rechargeable battery pack |
| 01/03/2002 | US20020000788 Method and apparatus for charging a rechargeable battery |
| 01/03/2002 | US20020000048 Alignment device for electrically connecting a testing device to a sliding plate on a conveyer |
| 01/03/2002 | DE10060585A1 Vorrichtung und Verfahren zur Untersuchung einer integrierten Halbleiterschaltung Apparatus and method for examining a semiconductor integrated circuit |
| 01/03/2002 | DE10024085C1 Verfahren zur Korrektur der frequenz-und längenabhängigen Leitungsdämpfung bei TDR-Messungen an Hochfrequenzkabeln Method for correcting the frequency and length-dependent line attenuation in TDR measurements on high-frequency cables |
| 01/03/2002 | DE10020685A1 Counter structure for digital circuits that can be configured for error testing and where a test signal of chosen width can be supplied to the counter blocks by a counter controller |
| 01/03/2002 | CA2413039A1 Alternator testing method and system using timed application of load |
| 01/03/2002 | CA2410432A1 Method and apparatus for testing high performance circuits |