| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/23/2002 | EP0927358B1 Impulse voltage generator circuit |
| 01/23/2002 | EP0622863B1 Battery pack |
| 01/23/2002 | CN1332853A Partial discharge site location system for determining position of faults in high voltage cable |
| 01/23/2002 | CN1332846A Apparatus and method for detecting memory effect in nickel-cadmium batteries |
| 01/23/2002 | CN1332459A Semiconductor integrated circuit and its storage repairing method |
| 01/23/2002 | CN1332110A Part holding device |
| 01/22/2002 | US6341361 Graphical user interface for testability operation |
| 01/22/2002 | US6341094 Method and apparatus for functional testing of memory related circuits |
| 01/22/2002 | US6341092 Designing memory for testability to support scan capability in an asic design |
| 01/22/2002 | US6341089 Semiconductor memory device allowing effective detection of leak failure |
| 01/22/2002 | US6340895 Wafer-level burn-in and test cartridge |
| 01/22/2002 | US6340894 Semiconductor testing apparatus including substrate with contact members and conductive polymer interconnect |
| 01/22/2002 | US6340893 Printed circuit board test apparatus and method |
| 01/22/2002 | US6340891 Method of diagnosing deterioration of the insulation of an electric power cable |
| 01/22/2002 | US6340890 Method and device for locating partial discharges in an electric high-voltage apparatus |
| 01/22/2002 | US6340889 Battery state monitoring circuit and battery apparatus |
| 01/22/2002 | US6340838 Apparatus and method for containing semiconductor chips to identify known good dies |
| 01/22/2002 | US6340823 Semiconductor wafer having a multi-test circuit, and method for manufacturing a semiconductor device including multi-test process |
| 01/22/2002 | US6340604 Contactor and semiconductor device inspecting method |
| 01/22/2002 | US6340302 Apparatus for establishing an electrical connection with a wafer to facilitate wafer-level burn-in and methods |
| 01/22/2002 | CA2142366C Method and apparatus for battery charging |
| 01/17/2002 | WO2002005405A1 Method for predicting battery capacity |
| 01/17/2002 | WO2002005325A2 Chuck with heat exchanger and temperature control fluid |
| 01/17/2002 | WO2002005144A1 Circuit component interface |
| 01/17/2002 | WO2002005051A2 Apparatus and method for controlling temperature in a wafer and a device under test using integrated temperature sensitive diode |
| 01/17/2002 | WO2002004965A2 Load board feeder |
| 01/17/2002 | WO2002004962A2 Circuit test light |
| 01/17/2002 | WO2001040943A3 A system, method and apparatus pertaining to flexible selection scan test |
| 01/17/2002 | WO2001033240A3 High resolution skew detection apparatus and method |
| 01/17/2002 | US20020007479 LSI testing apparatus |
| 01/17/2002 | US20020007477 Device and method for analyzing a circuit, and a computer product |
| 01/17/2002 | US20020007261 Circuit simulating apparatus performing simulation with unnecessary ciruit disconnected |
| 01/17/2002 | US20020007256 Analyzing method and system for measured data |
| 01/17/2002 | US20020007253 Noise analyzing method and apparatus and storage medium |
| 01/17/2002 | US20020007252 Method and apparatus for providing controllable compensation factors to a compensated driver circuit which may be used to perform testing of the structural integrity of the compensated driver circuit |
| 01/17/2002 | US20020006740 Real-time in-line testing of semiconductor wafers |
| 01/17/2002 | US20020006676 Method and apparatus for storage of test results within an integrated circuit |
| 01/17/2002 | US20020006173 High-speed decoder for a multi-pair gigabit transceiver |
| 01/17/2002 | US20020006067 Integrated circuit memory devices having efficient multi-row address test capability and methods of operating same |
| 01/17/2002 | US20020006066 Testable nonvolatile semiconductor device |
| 01/17/2002 | US20020006065 Apparatus for analyzing failure for semiconductor memory device |
| 01/17/2002 | US20020005732 Semiconductor integrated circuit and testing method thereof |
| 01/17/2002 | US20020005731 Electromigration evaluation circuit |
| 01/17/2002 | US20020005730 Comprehensive application power tester |
| 01/17/2002 | US20020005729 Method and system for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus |
| 01/17/2002 | US20020005723 Semiconductor wafer test system |
| 01/17/2002 | US20020005722 Signal supply apparatus and method for examining the same, and semiconductor device, electro-optical apparatus and electronic apparatus using the same |
| 01/17/2002 | US20020005721 Method for detecting short-circuit conditions and device which uses this method |
| 01/17/2002 | US20020005569 Contact terminal element, contact terminal device, manufacture thereof, and method of measuring semiconductor device |
| 01/17/2002 | US20020005520 Semiconductor device |
| 01/17/2002 | DE10129706A1 Contact arm for electronic device testing apparatus, has diaphragm cylinder to adjust relative pressing pressure from driving mechanism to holding head |
| 01/17/2002 | DE10125331A1 Generation of set of test sequences for testing integrated circuit by setting values of non-specified bit positions using systematic filling method |
| 01/17/2002 | DE10113799A1 Card and counter-card device for testing industrial cables has specific card which can be changed when connector type is changed |
| 01/17/2002 | DE10112311A1 Verfahren und Einrichtung zum Kalibrieren zur Korrektur von Impulsbreitenzeitfehlern beim Testen integrierter Schaltungen Method and device for calibrating to correct for pulse width time errors in the testing of integrated circuits |
| 01/17/2002 | DE10033349A1 Digital circuit test method, by providing local logical units in the form of feed back signature forming logic devices |
| 01/17/2002 | DE10033196A1 Leakage current detection for piezoelectric actuator involves reporting error when fluctuating voltage at either or both switches and piezoelectric actuator exceeds predetermined threshold |
| 01/17/2002 | CA2415933A1 Circuit test light |
| 01/16/2002 | EP1173008A2 Apparatus and method for detecting defects in a multi-channel scan driver |
| 01/16/2002 | EP1172662A2 Counter verification circuit |
| 01/16/2002 | EP1172661A1 Automatic test equipment for testing a device under test |
| 01/16/2002 | EP1172660A2 Method and device for fault location in distribution networks |
| 01/16/2002 | EP1171982A1 Gigabit ethernet with timing offsets between the twisted pairs |
| 01/16/2002 | EP1171934A1 A system and a method for monitoring and warning regarding the presence of manually and temporarily fitted ground connectors on high voltage conductors, as well as a warning device and a conductor means included in the system |
| 01/16/2002 | EP1171929A1 Reverberation chamber tuner and shaft with electromagnetic radiation leakage device |
| 01/16/2002 | EP1171777A1 Consumer usage recorder |
| 01/16/2002 | EP1171776A1 Circuit with improved dynamic response for measuring current in pulse width modulated amplifiers |
| 01/16/2002 | EP1171775A1 Link incident reporting for fibre channels |
| 01/16/2002 | EP1171774A2 Interface independent test system |
| 01/16/2002 | EP1171335A1 Modulator mis-wire test |
| 01/16/2002 | EP1171247A1 Four electrical contact testing machine for miniature inductors and process of using |
| 01/16/2002 | EP1064560B1 Compensating for the effects of round-trip delay in automatic test equipment |
| 01/16/2002 | EP1027614B1 Method for testing electrical modules |
| 01/16/2002 | CN2472241Y Leakage determiner |
| 01/16/2002 | CN1331805A Lead frame structure for testing integrated circuits |
| 01/16/2002 | CN1331804A Appts. for diagnosing and indicating operational failure in automobiles |
| 01/16/2002 | CN1331802A Improving multi-chip module testability using poled-polymer interlayer dielectrics |
| 01/16/2002 | CN1331488A Method and device for measuring photoelectric translating characteristic |
| 01/16/2002 | CN1331418A Detection signal distributing device of liquid crystal display |
| 01/16/2002 | CN1078013C Pallet installation table for processor |
| 01/16/2002 | CN1077981C Quick screening classifying and short circuit repairing device for battery |
| 01/15/2002 | US6339833 Automatic recovery from clock signal loss |
| 01/15/2002 | US6339557 Charge retention lifetime evaluation method for nonvolatile semiconductor memory |
| 01/15/2002 | US6339555 Semiconductor memory device enabling test of timing standard for strobe signal and data signal with ease, and subsidiary device and testing device thereof |
| 01/15/2002 | US6339388 Mixed analog and digital integrated circuit and testing method thereof |
| 01/15/2002 | US6339357 Semiconductor integrated circuit device capable of externally monitoring internal voltage |
| 01/15/2002 | US6339342 Semiconductor device and electronic equipment using the same |
| 01/15/2002 | US6339340 Apparatus for detecting capacity of a standby power and method therefor |
| 01/15/2002 | US6339339 TFT and reliability evaluation method thereof |
| 01/15/2002 | US6339338 Apparatus for reducing power supply noise in an integrated circuit |
| 01/15/2002 | US6339337 Method for inspecting semiconductor chip bonding pads using infrared rays |
| 01/15/2002 | US6339321 Electronic device tray electronic device tray, transporting apparatus, and electronic device testing apparatus |
| 01/15/2002 | US6339315 Measuring counter of the state of charge of the powering battery of an electronic appliance |
| 01/15/2002 | US6339313 Fuel cell manager |
| 01/15/2002 | US6339264 Apparatus and method for forecasting output voltage of a battery of a digital camera |
| 01/15/2002 | US6339229 Test structure for insulation-film evaluation |
| 01/15/2002 | US6338974 Integrated circuit analytical imaging technique employing a backside surface fill layer |
| 01/10/2002 | WO2002003450A2 Automated determination and display of the physical location of a failed cell in an array of memory cells |
| 01/10/2002 | WO2002003449A2 Apparatus and method for investigating semiconductor wafers |
| 01/10/2002 | WO2002003085A1 Automated protection of ic devices from eos (electro over stress) damage due to an undesired dc transient |
| 01/10/2002 | WO2002003083A1 Inspection apparatus and inspection method |