| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 01/31/2002 | US20020011848 System and method for on-line impulse frequency response analysis |
| 01/31/2002 | US20020011836 Semiconductor device testing apparatus and a test tray for use in the testing apparatus |
| 01/31/2002 | US20020011835 Low-temperature test equipment |
| 01/31/2002 | US20020011833 Circuit test light |
| 01/31/2002 | US20020011830 Electro-optical probe for oscilloscope measuring signal waveform |
| 01/31/2002 | US20020011829 Alternator testing method and system using timed application of load |
| 01/31/2002 | US20020011827 Fabricating pixel electrode on thin film transistor side of substrate, so major part of each transistor is buried under electrode, allowing for active matrix addressing of polymeric electroluminescent pixels and maintaining high aperture ratio |
| 01/31/2002 | US20020011822 Battery pack diagnostic method and battery pack diagnostic apparatus |
| 01/31/2002 | US20020011651 Semiconductor device and packaging method thereof |
| 01/31/2002 | US20020011581 Valve seating with electrodes, especially for <<enamel-test>> type control device |
| 01/31/2002 | DE10126262A1 Verfahren zur Fehlerortmessung bei Hochfrequenzkabeln und -leitungen Method for Fehlerortmessung at high frequency cables and wires |
| 01/31/2002 | CA2416547A1 Battery monitoring system with low power and end-of-life messaging and shutdown |
| 01/30/2002 | EP1176638A2 Semiconductor device and packaging method thereof |
| 01/30/2002 | EP1176637A1 Semiconductor integrated circuit and manufacture thereof |
| 01/30/2002 | EP1176608A2 Nonvolatile semiconductor storage device and test method therefor |
| 01/30/2002 | EP1176604A2 Method for testing a plurality of word lines in a semiconductor memory device |
| 01/30/2002 | EP1176600A1 Method and device for noiselesss reading of memory cells of a MRAM memory |
| 01/30/2002 | EP1176426A2 Method of checking vehicle mounted electronic units |
| 01/30/2002 | EP1176348A1 Valve seat comprising electrodes particularly for an "enamel-test"-type control device. |
| 01/30/2002 | EP1175624A1 Integrated circuit with test interface |
| 01/30/2002 | EP1149385A4 Ic test software system for mapping logical functional test data of logic integrated circuits to physical representation |
| 01/30/2002 | EP1137952A4 Boundary scan method for terminating or modifying integrated circuit operating modes |
| 01/30/2002 | EP0895607B1 Anti-vibration stabilizer for a portable emission microscope |
| 01/30/2002 | EP0837801B1 Device for the recognition of electromagnetic interference |
| 01/30/2002 | EP0627631B1 Analog autonomous test bus framework for testing integrated circuits on a printed circuit board |
| 01/30/2002 | CN1333939A Energy gauge |
| 01/30/2002 | CN1333466A Semiconductor device test method and apparatus |
| 01/30/2002 | CN1333454A Optical cable real time monitoring system |
| 01/30/2002 | CN1078721C Data protection circuit |
| 01/30/2002 | CN1078719C Method for real-time measuirng memory chip divided into field in running of computer |
| 01/30/2002 | CN1078711C Device for sensing of electric discharges in atest object |
| 01/30/2002 | CN1078710C Process for producing signals identifying faulty loops in polyphase electrical power supply |
| 01/30/2002 | CN1078709C Monitoring of internal partial discharges on power transformer |
| 01/30/2002 | CN1078708C Checking device for wrong wire distribution of power supply |
| 01/29/2002 | US6343369 Methods for making contact device for making connection to an electronic circuit device and methods of using the same |
| 01/29/2002 | US6343365 Large-scale integrated circuit and method for testing a board of same |
| 01/29/2002 | US6343358 Executing multiple debug instructions |
| 01/29/2002 | US6343048 Operation mode setting circuit of semiconductor memory device and method for setting thereof |
| 01/29/2002 | US6342931 Active-matrix substrate and inspecting method thereof |
| 01/29/2002 | US6342833 Apparatus for displaying electrical measurement of distributor of motor vehicle |
| 01/29/2002 | US6342791 Diode defect detecting device |
| 01/29/2002 | US6342790 High-speed, adaptive IDDQ measurement |
| 01/29/2002 | US6342789 Universal wafer carrier for wafer level die burn-in |
| 01/29/2002 | US6342788 Probing systems for chilled environment |
| 01/29/2002 | US6342400 Dye penetrant test for semiconductor package assembly solder joints |
| 01/29/2002 | US6342399 Testing integrated circuits |
| 01/29/2002 | US6342398 Method of backside emission analysis for BGA packaged IC's |
| 01/29/2002 | US6341970 Modularized socket for integrated circuit |
| 01/29/2002 | US6341530 Apparatus and method for shear testing bonds of electrical connections |
| 01/29/2002 | CA2145403C Robust delay fault built-in self-testing method and apparatus |
| 01/29/2002 | CA2113836C Method and apparatus for identifying objects using compound signal and a detector employing an electrical static coupling technique |
| 01/28/2002 | CA2353683A1 Method for the testing of electronic components taking the drift of the mean into account |
| 01/24/2002 | WO2002007192A2 Triaxial probe assembly |
| 01/24/2002 | WO2002007169A1 Silicon wafer probe station using backside imaging |
| 01/24/2002 | WO2002006843A1 Method for measuring motor constant of induction motor |
| 01/24/2002 | WO2000041536A3 Test head manipulator |
| 01/24/2002 | US20020010887 IC with IP core and user-added scan register |
| 01/24/2002 | US20020010886 Recording medium storing a program for constructing scan paths, scan path constructing method, and arithmetic processing system in which said scan paths are integrated |
| 01/24/2002 | US20020010885 Configurable integrated circuit and method of testing the same |
| 01/24/2002 | US20020010884 Test method for switching to redundant circuit in SRAM pellet |
| 01/24/2002 | US20020010856 IC, IC-mounted electronic device, debugging method and IC debugger |
| 01/24/2002 | US20020010560 System for mapping logical functional test data of logical integrated circuits to physical representation using pruned diagnostic list |
| 01/24/2002 | US20020010559 Semiconductor device having a mode of functional test |
| 01/24/2002 | US20020010558 Storage battery with integral battery tester |
| 01/24/2002 | US20020009815 Semi-conductor device with test element group for evaluation of interlayer dielectric and process for producing the same |
| 01/24/2002 | US20020009120 Burn-in system and burn-in method |
| 01/24/2002 | US20020009007 Method and device for generating digital signal patterns |
| 01/24/2002 | US20020009006 Semiconductor wafer, semiconductor chip, and manufacturing method of semiconductor device |
| 01/24/2002 | US20020009004 Semiconductor memory device enabling test of timing standard for strobe signal and data signal with ease, and subsidiary device and testing device thereof |
| 01/24/2002 | US20020008998 Repair analysis circuit for redundancy, redundant repairing method, and semiconductor device |
| 01/24/2002 | US20020008966 Microelectronic contacts with asperities and methods of making same |
| 01/24/2002 | US20020008951 Device and method for determining rare short circuit |
| 01/24/2002 | US20020008773 Electronic camera and battery voltage controlling method employed therein for successively, rather than simultaneously, operating camera portions during conditions of low battery voltage |
| 01/24/2002 | US20020008587 Methods of compensating for wafer parameters |
| 01/24/2002 | US20020008555 Semiconductor integrated circuit including a plurality of macros that can be operated although their operational voltages are different from each other |
| 01/24/2002 | US20020008538 Electrical circuit and method for testing a circuit component of the electrical circuit |
| 01/24/2002 | US20020008536 Contactless total charge measurement with corona |
| 01/24/2002 | US20020008534 Prober and low-temperature test equipment having same incorporated therein |
| 01/24/2002 | US20020008532 Conductive bump array contactors having an ejector and methods of testing using same |
| 01/24/2002 | US20020008531 Conductive bump array contactors having an ejector and methods of testing using same |
| 01/24/2002 | US20020008529 High density, area array probe card apparatus |
| 01/24/2002 | US20020008528 Electronic part inspection method and an electronic part assembly apparatus |
| 01/24/2002 | US20020008523 Apparatus and method for carrying out diagnostic tests on batteries and for rapidly charging batteries |
| 01/24/2002 | US20020008507 Remote light indication fault indicator with a timed reset circuit and a manual reset circuit |
| 01/24/2002 | US20020008252 Method of estimating lifetime of semiconductor device, and method of reliability simulation |
| 01/24/2002 | US20020008235 Integrated circuit with test mode, and test configuration for testing an integrated circuit |
| 01/24/2002 | US20020008201 Specimen inspection instrument |
| 01/24/2002 | US20020008016 Shields |
| 01/24/2002 | EP1145018A3 Test head manipulator |
| 01/24/2002 | DE10110934A1 Integrierte Halbleiterschaltung, Speicherreparaturverfahren für eine integrierte Halbleiterschaltung und Computererzeugnis A semiconductor integrated circuit memory repair method for a semiconductor integrated circuit and computer product |
| 01/24/2002 | DE10034443A1 Device for control and diagnosis of lamps in cars, especially of headlamps and tail lamps has devices for detection of lamp wear-related input signals and for evaluation of these input signals with regard to lifetime |
| 01/24/2002 | DE10034363A1 Partial discharge sensor for high voltage unit has broadband loop antenna to sense longitudinal fields |
| 01/24/2002 | DE10033933A1 Current supply method for organic LEDs used in display, involves connecting resistance in parallel to across potentiometer that is connected between voltage dividers and operational amplifiers |
| 01/24/2002 | DE10033868A1 Transformer monitoring system has several sensors giving continuous status information |
| 01/24/2002 | DE10032451A1 Fault inspection of electrical circuit arrangement in motor vehicle, involves determining effect of water and chemical component contamination on electrical field at external and additional connections using sensor |
| 01/23/2002 | EP1174723A1 Temperature control apparatus |
| 01/23/2002 | EP1173853A1 Failure capture apparatus and method for automatic test equipment |
| 01/23/2002 | EP1173811A1 A system for monitoring connection pattern of data ports |
| 01/23/2002 | EP1173775A1 Telemetry system and method for emi susceptibility testing of motor vehicles |
| 01/23/2002 | EP1060399B1 Device for testing the electromagnetic compatibility of systems having large dimensions |