| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/07/2002 | WO2002011149A1 Defect analysis method, defect analyzer, and computer program product |
| 02/07/2002 | WO2002010785A2 Hierarchical design and test method and system, program product embodying the method and integrated circuit produced thereby |
| 02/07/2002 | WO2002010783A2 Test systems for wireless-communications devices |
| 02/07/2002 | WO2002010782A2 Method and device for checking for errors in electrical lines and/or electrical consumers in a vehicle |
| 02/07/2002 | WO2001067116A3 Temperature compensated vertical pin probing device |
| 02/07/2002 | WO2001063301A3 Electromechanical apparatus for testing ic chips using first and second sets of substrates which are pressed together |
| 02/07/2002 | WO2001048494A3 Digital signal testing |
| 02/07/2002 | US20020016950 Signal delay time calculation method of semiconductor integrated circuit and computer program product for executing the method |
| 02/07/2002 | US20020016941 Semiconductor memory device tester |
| 02/07/2002 | US20020016931 Electric power unit, electric power unit controller, electric power unit controlling method, and computer |
| 02/07/2002 | US20020016706 System and method for a circuit component interface |
| 02/07/2002 | US20020016693 Method for fabricating and checking structures of electronic circuits in a semiconductor substrate |
| 02/07/2002 | US20020016690 Operating efficiency of a nonvolatile memory |
| 02/07/2002 | US20020016013 Semiconductor device manufacturing method |
| 02/07/2002 | US20020015520 Automatic X-ray determination of solder joint and view delta Z values from a laser mapped reference surface for circuit board inspection using X-ray laminography |
| 02/07/2002 | US20020015271 Methods and arrangements to detect and respond to faults in electrical power distribution equipment and systems |
| 02/07/2002 | US20020014896 Method for the testing of electronic components taking the drift of the mean into account |
| 02/07/2002 | US20020014894 Temperature control apparatus |
| 02/07/2002 | US20020014892 Electrical test tool having easily replaceable electrical probe |
| 02/07/2002 | US20020014890 System and method for measurement of partial discharge signals in high voltage apparatus |
| 02/07/2002 | US20020014886 Method and apparatus for measuring photoelectric conversion characteristics |
| 02/07/2002 | US20020014885 Signal generator |
| 02/07/2002 | US20020014851 Apparatus and method of testing an organic light emitting diode array |
| 02/07/2002 | US20020014699 Semiconductor device, function setting method thereof, and evaluation method thereof |
| 02/07/2002 | US20020014004 High density integrated circuit apparatus, test probe and methods of use thereof |
| 02/07/2002 | DE10036935A1 Sensor monitoring system for vehicles detects excessive gradient in output sums |
| 02/07/2002 | DE10036341A1 Elektronische Einheit zur Erkennung des Ladezustands und/oder des Verschleißes einer Kraftfahrzeugbatterie Electronic unit for detecting the state of charge and / or the wear of a motor vehicle battery |
| 02/07/2002 | DE10034900A1 Test system for quick synchronous digital circuit, has BOST module with switching unit for switching between two operation modes based on detected switching criteria of changeover switching |
| 02/07/2002 | DE10016996C1 Testanordnung zur Funktionsprüfung eines Halbleiterchips Test set for testing the function of a semiconductor chip |
| 02/07/2002 | CA2416655A1 Hierarchical design and test method and system, program product embodying the method and integrated circuit produced thereby |
| 02/06/2002 | EP1178324A2 Method and apparatus for tracing hardware states using dynamically reconfigurable test circuits |
| 02/06/2002 | EP1178323A2 Method and device for testing an integrated circuit, integrated circuit under test and wafer with a plurality of integarted circuits under test |
| 02/06/2002 | EP1178322A2 Integrated circuit with self-test portion |
| 02/06/2002 | EP1178321A2 Method of operating a component having a logic and a memory portion |
| 02/06/2002 | EP1177454A1 Battery testers |
| 02/06/2002 | EP1177452A1 Cooling system for test head |
| 02/06/2002 | EP1019314B1 Diagnosing malfunctions in materials handling vehicles |
| 02/06/2002 | EP0946956B1 Method and system for detecting relay failure |
| 02/06/2002 | CN2476034Y Synchronizing generator powre angle monitor |
| 02/06/2002 | CN2476033Y Device for monitoring circuit breaker contact head electric service life |
| 02/06/2002 | CN2476032Y Theft-proof alarm for protecting electric power line |
| 02/06/2002 | CN2476031Y Conducting wire with electroscope function |
| 02/06/2002 | CN2476029Y Radio alarm device for high voltage transmission line |
| 02/06/2002 | CN1334627A Relay protection and failure location system for power distribution network |
| 02/06/2002 | CN1334602A Semiconductor device and packaging method |
| 02/06/2002 | CN1334466A Modular structure for testing momery in testing system based on event |
| 02/06/2002 | CN1078948C AC power outlet ground integrity and wire test circuit device |
| 02/05/2002 | US6345373 System and method for testing high speed VLSI devices using slower testers |
| 02/05/2002 | US6345372 Method for testing bus connections of writable and readable integrated electronic circuits, in particular memory components |
| 02/05/2002 | US6345236 Method for detecting installation and/or calibration errors in a plurality of signal output units of one or more partial-discharge measurement systems |
| 02/05/2002 | US6345004 Repair analysis circuit for redundancy, redundant repairing method, and semiconductor device |
| 02/05/2002 | US6344792 Method of manufacturing and testing an electronic device, and a electronic device |
| 02/05/2002 | US6344753 Test socket having improved contact terminals, and method of forming contact terminals of the test socket |
| 02/05/2002 | US6344751 Finger tester probe |
| 02/05/2002 | US6344750 Voltage contrast method for semiconductor inspection using low voltage particle beam |
| 02/05/2002 | US6344749 Test system for measuring frequency response and dynamic range on cable plant |
| 02/05/2002 | US6344748 Coaxial cable connector testing methods and apparatus |
| 02/05/2002 | US6344747 Device and method for monitoring the condition of a thermocouple |
| 02/05/2002 | US6344736 Self-aligning interface apparatus for use in testing electrical |
| 02/05/2002 | US6344733 Portable jump-starting battery pack with charge monitoring system |
| 02/05/2002 | US6344730 Method and apparatus for determining the remaining operating time of battery-powered appliances |
| 02/05/2002 | US6343940 Contact structure and assembly mechanism thereof |
| 02/05/2002 | US6343498 Physical quantity sensor having fault detection function |
| 01/31/2002 | WO2002009254A2 Battery monitoring system with low power and end-of-life messaging and shutdown |
| 01/31/2002 | WO2002009156A1 Temperature-controlled thermal platform for automated testing |
| 01/31/2002 | WO2002009155A2 Wafer chuck having with interleaved heating and cooling elements |
| 01/31/2002 | WO2002009121A2 Dynamic pulse width programming of programmable logic devices |
| 01/31/2002 | WO2002008904A2 System initialization of microcode-based memory built-in self-test |
| 01/31/2002 | WO2002008777A1 Electronic unit for identifying the charged state and/or the wear and tear of a motor vehicle battery |
| 01/31/2002 | WO2002008776A2 Automatic test equipment with narrow output pulses |
| 01/31/2002 | WO2002008775A1 Test instrument |
| 01/31/2002 | WO2002008774A1 Probe driving method, and probe apparatus |
| 01/31/2002 | WO2002008773A2 Apparatus and method for electrical testing of electrical circuits |
| 01/31/2002 | WO2001061745A3 Surface passivation method and arrangement for measuring the lifetime of minority carriers in semiconductors |
| 01/31/2002 | US20020013928 Multiple voted logic cell testable by a scan chain and system and method of testing the same |
| 01/31/2002 | US20020013921 Method of generating test pattern for semiconductor integrated circuit and method of testing the same |
| 01/31/2002 | US20020013920 Pattern generator for semiconductor test system |
| 01/31/2002 | US20020013835 Adapter for controlling a measuring device, a measuring device, a controller for a measuring device, a method for processing measurement and a recording medium |
| 01/31/2002 | US20020013688 Back annotation apparatus for carrying out a simulation based on the extraction result in regard to parasitic elements |
| 01/31/2002 | US20020013682 Method and system for improving a transistor model |
| 01/31/2002 | US20020013680 Method and configuration for comparing a first characteristic with predetermined characteristics of a technical system |
| 01/31/2002 | US20020013672 Timing calibration method and semiconductor device testing apparatus having timing calibration function |
| 01/31/2002 | US20020013667 Apparatus and method for electrical testing of electrical circuits |
| 01/31/2002 | US20020013010 Contactor having conductive particles in a hole as a contact electrode |
| 01/31/2002 | US20020013009 Failure analysis method for chip of ball grid array type semiconductor |
| 01/31/2002 | US20020012540 Method of fault location in parallel lines with series compensation |
| 01/31/2002 | US20020012213 Digital distance relay |
| 01/31/2002 | US20020012118 Method for characterizing defects on semiconductor wafers |
| 01/31/2002 | US20020011866 Apparatus for testing a semiconductor and process for the same |
| 01/31/2002 | US20020011865 A test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path |
| 01/31/2002 | US20020011863 IC chip tester with heating element for preventing condensation |
| 01/31/2002 | US20020011862 Direct to chuck coolant delivery for integrated circuit testing |
| 01/31/2002 | US20020011861 Circuit board misalignment detection apparatus and method |
| 01/31/2002 | US20020011860 Conductive bump array contactors having an ejector and methods of testing using same |
| 01/31/2002 | US20020011859 Method for forming conductive bumps for the purpose of contrructing a fine pitch test device |
| 01/31/2002 | US20020011858 Temperature compensated vertical pin probing device |
| 01/31/2002 | US20020011857 Test coupon in printed wiring board |
| 01/31/2002 | US20020011856 Test methods, systems, and probes for high-frequency wireless-communications devices |
| 01/31/2002 | US20020011854 Probe device |
| 01/31/2002 | US20020011852 Non-contact photothermal radiometric metrologies and instrumentation for characterization of semiconductor wafers, devices and non electronic materials |