| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/20/2002 | CN1337006A Device for testing cables provided with plug connectors |
| 02/20/2002 | CN1336588A Method and device for tracing hard-ware condition using dynamic reconstruction testing circuit |
| 02/20/2002 | CN1336556A Detection method of load impedance angle of AC motor |
| 02/20/2002 | CN1336555A Thuristor working state detecting method |
| 02/20/2002 | CN1336554A Contacting arm, and device for testing electronic parts by using same |
| 02/20/2002 | CN1336553A Mode generator used for testing semiconductor system |
| 02/20/2002 | CN1336552A Method for detecting failure welding of IC terminal by using resonating type sensor coil |
| 02/20/2002 | CN1336549A Probe contacting system having plane adjusting mechanism |
| 02/20/2002 | CN1079536C Method and device for testing of electronic components |
| 02/20/2002 | CN1079348C Electric bicyle |
| 02/19/2002 | US6349398 Method and apparatus for partial-scan built-in self test logic |
| 02/19/2002 | US6349397 Signal processing apparatus having non-volatile memory and programming method of the non-volatile memory |
| 02/19/2002 | US6349396 Testing system for evaluating integrated circuits, a burn-in testing system, and a method for testing an integrated circuit |
| 02/19/2002 | US6349395 Configurable integrated circuit and method of testing the same |
| 02/19/2002 | US6349387 Dynamic adjustment of the clock rate in logic circuits |
| 02/19/2002 | US6349267 Rise and fall time measurement circuit |
| 02/19/2002 | US6349248 Method and system for predicting failures in a power resistive grid of a vehicle |
| 02/19/2002 | US6348944 Selective aging for monitor production |
| 02/19/2002 | US6348826 Digital variable-delay circuit having voltage-mixing interpolator and methods of testing input/output buffers using same |
| 02/19/2002 | US6348825 High performance, low power, scannable flip-flop |
| 02/19/2002 | US6348810 Interface unit for a tester and method of connecting a tester with a semiconductor device to be tested |
| 02/19/2002 | US6348808 Mobile ionic contamination detection in manufacture of semiconductor devices |
| 02/19/2002 | US6348807 Method and system for utilizing multiple thermocouples to obtain a temperature contour map |
| 02/19/2002 | US6348806 Method and apparatus for measuring gate leakage current in an integrated circuit |
| 02/19/2002 | US6348805 Method and apparatus for assigning pins for electrical testing of printed circuit boards |
| 02/19/2002 | US6348802 Device for enhancing contact checking |
| 02/19/2002 | US6348801 Fault isolation of an antenna path for a radio telephone |
| 02/19/2002 | US6348800 Multi-phase ground fault current sensor system |
| 02/19/2002 | US6348795 Crystal resonant frequency sensor |
| 02/19/2002 | US6348789 Testboard for IC tester |
| 02/19/2002 | US6348785 Linear ramping digital-to-analog converter for integrated circuit tester |
| 02/19/2002 | US6348364 Navigation using 3-D detectable pattern |
| 02/19/2002 | US6347958 Connecting device to vehicle battery terminals |
| 02/19/2002 | US6347821 Gripper for picking apparatus of a module IC handler |
| 02/14/2002 | WO2002013259A2 Method and apparatus for measuring parameters of an electronic device |
| 02/14/2002 | WO2002012911A1 Method and device for testing the operativeness of printed circuit boards |
| 02/14/2002 | WO2002012910A1 Calibration method and device |
| 02/14/2002 | WO2002012909A2 Capturing and evaluating high speed data streams |
| 02/14/2002 | WO2002012907A2 System, method, and apparatus for electromagnetic compatibility-driven product design |
| 02/14/2002 | WO2001069273A3 Apparatus and method for determining the operational state of a battery |
| 02/14/2002 | US20020019964 Method and device for testing an integrated circuit, integrated circuit to be tested, and wafer with a large number of integrated circuits to be tested |
| 02/14/2002 | US20020019963 Tool to reconfigure pin connections between a DUT and a tester |
| 02/14/2002 | US20020019962 Integrated excitation/extraction system for test and measurement |
| 02/14/2002 | US20020019713 Electromagnetic wave analyzing apparatus and computer readable storage medium |
| 02/14/2002 | US20020019066 Semiconductor device manufacturing method |
| 02/14/2002 | US20020019050 Hybrid microorganism for use in gene therapy |
| 02/14/2002 | US20020018927 Battery having discharge state indication |
| 02/14/2002 | US20020018365 Test methodes for semiconductor non-volatile memories |
| 02/14/2002 | US20020018361 Method for nondestructively reading memory cells of an mram memory |
| 02/14/2002 | US20020017917 Inspection method for array substrate and inspection device for the same |
| 02/14/2002 | US20020017915 Probe card, probe card restoring method, and probe card manufacturing method |
| 02/14/2002 | US20020017914 Intergrated circuit test probe having ridge contact |
| 02/14/2002 | US20020017913 Electro-optic sampling probe |
| 02/14/2002 | US20020017912 Semiconductor device evaluation apparatus and semiconductor device evaluation program product |
| 02/14/2002 | US20020017906 Electromigration early failure distribution in submicron interconnects |
| 02/14/2002 | US20020017707 Multi-layered integrated semiconductor device incorporating electrically connected integrated circuit chips and monitoring pads |
| 02/14/2002 | US20020017688 Semiconductor memory circuit |
| 02/14/2002 | US20020017619 Processing/observing instrument |
| 02/14/2002 | US20020017482 Method for sorting integrated circuit devices |
| 02/14/2002 | DE10041798C1 Magnetic field testing device, uses test magnetic field influenced by stimulation field, indicator showing presence and/or polarity depending on sum of motor stimulation and test magnetic fields |
| 02/14/2002 | DE10038865A1 Kalibrierverfahren Calibration |
| 02/14/2002 | DE10038327A1 Integrierter Schaltkreis mit Selbsttest-Schaltung An integrated circuit with self-test circuit |
| 02/14/2002 | DE10037432A1 Monitoring of a capacitor bushing to detect faults, by comparison of the quotient of electrical measurements with a characterizing value, with any deviation indicating a fault, the invention being independent of operating voltage |
| 02/14/2002 | DE10037396A1 Program sequence or test routine execution/documentation device, has variable that maintains specific value, when value of variable is equal to certain value and external control signal having initial signal level is re-applied |
| 02/14/2002 | DE10036572A1 Brennstoffzellenanlage Fuel cell system |
| 02/14/2002 | DE10036177A1 Equipment for quality testing of semiconductor devices, measures gap between valence band and conduction band of semiconductor devices |
| 02/14/2002 | DE10034854A1 Verfahren und Vorrichtung zur Erzeugung digitaler Signalmuster Method and apparatus for generating digital signal samples |
| 02/14/2002 | DE10034850A1 Integrated digital semiconductor components testing system e.g. for semiconductor memories, has built outside self-test module that adjusts to time requirement of semiconductor to be tested |
| 02/14/2002 | DE10033540A1 Circuit for generating reference current for use in an ASIC also has means for generating an emergency reference current should the main reference circuit fail and indicating, using a light that the main circuit has failed |
| 02/14/2002 | DE10018356A1 Method for controlling an air bag in a vehicle, identifies suitable control devices, has an encoded ID marking applied to it consisting of a network of resistor positions supplied with test points |
| 02/13/2002 | EP1179872A1 Circuit module for protecting a rechargeable battery and method of manufacture thereof |
| 02/13/2002 | EP1179857A2 Method and apparatus for measuring photoelectric conversion characteristics |
| 02/13/2002 | EP1179740A2 Boundary scan chain routing |
| 02/13/2002 | EP1179739A1 Method for testing an integrated circuit with flexible control of the clock |
| 02/13/2002 | EP1179738A2 Test arrangement for an integrated circuit |
| 02/13/2002 | EP1179737A2 Test arrangement for an integrated circuit |
| 02/13/2002 | EP0978125B1 System for optimizing memory repair time using test data |
| 02/13/2002 | EP0656590B1 Measuring device to test the connection between at least two subassemblies |
| 02/13/2002 | CN2476824Y Automatic testing device for property of photoelectric coder and speedometer |
| 02/13/2002 | CN1335938A Device and method of preventing bus contention |
| 02/13/2002 | CN1335937A Device for and method of preventing bus contention |
| 02/13/2002 | CN1335514A Solar cell assembly testing instrument with pulse xenon lamp linear light source bench |
| 02/13/2002 | CN1335513A Solar cell testing instrument with linear pulse light source |
| 02/13/2002 | CN1335512A Centipede-shaped large-area solar cell testing fixture |
| 02/13/2002 | CN1335511A Method and apparatus for searching conductor in conductor array with tight space |
| 02/13/2002 | CN1335510A Fault-line selecting method and device for small-current earthing system |
| 02/13/2002 | CN1079168C Method for measuring leakage current in junction region of semiconductor device |
| 02/12/2002 | US6347388 Method and apparatus for test generation during circuit design |
| 02/12/2002 | US6347387 Test circuits for testing inter-device FPGA links including a shift register configured from FPGA elements to form a shift block through said inter-device FPGA links |
| 02/12/2002 | US6347386 System for optimizing the testing and repair time of a defective integrated circuit |
| 02/12/2002 | US6347381 Test mode circuitry for electronic storage devices and the like |
| 02/12/2002 | US6347025 Ground fault protection method and apparatus |
| 02/12/2002 | US6347005 Electro-optic sampling probe |
| 02/12/2002 | US6346847 Electronic circuit and corresponding method for trimming an IC |
| 02/12/2002 | US6346822 Semiconductor integrated circuit having diagnosis function |
| 02/12/2002 | US6346821 Method for nondestructive measurement of minority carrier diffusion length and minority carrier lifetime in semiconductor devices |
| 02/12/2002 | US6346682 Rambus handler |
| 02/12/2002 | US6346011 Battery-connecting plate, method of producing same and wire protector |
| 02/12/2002 | CA2224355C Electrical testing device |
| 02/12/2002 | CA2126649C Method and circuit arrangement for measuring the depletion layer temperature of a gto (gate turn-off) thyristor |