| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 02/28/2002 | US20020024062 Semiconductor integrated circuit |
| 02/28/2002 | US20020024059 MIS semiconductor device having improved gate insulating film reliability |
| 02/28/2002 | US20020024046 Semiconductor reliability test chip |
| 02/28/2002 | US20020023773 Method for manufacturing raised electrical contact patten of controlled geometry |
| 02/28/2002 | DE10128365A1 Verbindungsstruktur eines Koaxialkabels an einem elektrischen Schaltungssubstrat Connecting structure of a coaxial cable to an electrical circuit substrate |
| 02/28/2002 | DE10105505A1 Integrated circuit for testing DRAM, has judging circuit which detects normal condition of DRAM, when divided test data input for every predetermined number of bits correspond to excepted level |
| 02/28/2002 | DE10062190C1 Microcontroller-controlled end stage monitoring method compares actual output of end state with expected output calculated from supplied input signal |
| 02/28/2002 | DE10039350A1 Integrierte Schaltung, Testaufbau und Verfahren zum Testen von integrierten Schaltungen An integrated circuit test set-up and method for testing integrated circuits |
| 02/27/2002 | EP1182762A2 Electrical tool and method of its use |
| 02/27/2002 | EP1182691A2 Method and apparatus for transfering a wafer |
| 02/27/2002 | EP1182669A2 Non-volatile semiconductor memory device |
| 02/27/2002 | EP1182460A2 Fritting inspection method and apparatus |
| 02/27/2002 | EP1181654A1 Circuit simulator |
| 02/27/2002 | EP1181569A1 A microvia inspection system |
| 02/27/2002 | EP1181568A2 Analog test output switchably connected to pcmcia connector pin |
| 02/27/2002 | EP1181567A1 Detection of bridge tap using frequency domain analysis |
| 02/27/2002 | EP1181566A1 Testing fastenings of printed circuit board |
| 02/27/2002 | EP1181565A1 Device for electrically contacting a floating semiconductor wafer having an insulating film |
| 02/27/2002 | EP1181564A1 Multi-ended fault location system |
| 02/27/2002 | EP1181540A1 Electronic battery tester |
| 02/27/2002 | EP1019881B1 Digital output unit with means for detecting wire breakage |
| 02/27/2002 | EP0864195B1 Battery-powered electrical device |
| 02/27/2002 | EP0731992B1 High-density interconnect technique |
| 02/27/2002 | CN2479513Y Battery three-parameter measuring gauge |
| 02/27/2002 | CN2479512Y Distributed insulation monitoring and earth fault automatic position indicator in DC system |
| 02/27/2002 | CN2479511Y Addressable communication cable anti-theft alarm |
| 02/27/2002 | CN1338055A Power consumption reporting by an accessory of an electronic device |
| 02/27/2002 | CN1338054A Battery power source protecting device for an electromotive device |
| 02/27/2002 | CN1337739A Method for producing semi-conductor device |
| 02/27/2002 | CN1337737A Method for producing semi-conductor device |
| 02/27/2002 | CN1080017C System for equalizing level of charge in batteries |
| 02/26/2002 | US6351836 Semiconductor device with boundary scanning circuit |
| 02/26/2002 | US6351835 High speed LSI spectral analysis testing apparatus and method |
| 02/26/2002 | US6351834 Apparatus for testing semiconductor device |
| 02/26/2002 | US6351833 Address generator |
| 02/26/2002 | US6351827 Voltage and clock margin testing of memory-modules using an adapter board mounted to a PC motherboard |
| 02/26/2002 | US6351793 Memory latency compensation |
| 02/26/2002 | US6351722 Apparatus and method for testing snow removal equipment |
| 02/26/2002 | US6351681 Method and apparatus for a multi-chip module that is testable and reconfigurable based on testing results |
| 02/26/2002 | US6351405 Pad for integrated circuit device which allows for multiple probing and reliable bonding and integrated circuit device including the pad |
| 02/26/2002 | US6351161 Integrated circuit with actuation circuit for actuating a driver circuit |
| 02/26/2002 | US6351135 TDDB test pattern and method for testing TDDB of MOS capacitor dielectric |
| 02/26/2002 | US6351134 Semiconductor wafer test and burn-in |
| 02/26/2002 | US6351133 Packaging and interconnection of contact structure |
| 02/26/2002 | US6351130 Device for testing solar home systems |
| 02/26/2002 | US6351112 Calibrating combinations of probes and channels in an oscilloscope |
| 02/26/2002 | US6351102 Automotive battery charging system tester |
| 02/26/2002 | US6351099 Battery monitoring system with integrated battery holder |
| 02/26/2002 | US6350978 Deterioration sensing device for light-emitting diode |
| 02/26/2002 | US6350959 Method for sorting integrated circuit devices |
| 02/26/2002 | US6350694 Reducing CMP scratch, dishing and erosion by post CMP etch back method for low-k materials |
| 02/26/2002 | US6350626 Method of testing electromigration lifetime |
| 02/26/2002 | US6350624 Substrate removal as a functional of sonic analysis |
| 02/26/2002 | US6350138 Socket for removably mounting electronic parts having a plurality of conductive terminals such as BGA packages |
| 02/26/2002 | US6350137 IC socket and contact pins for IC socket |
| 02/26/2002 | US6350130 Electrically coupling an avionics line replaceable unit with an avionics test station |
| 02/21/2002 | WO2002015458A2 Discovering hidden damage in machinery and predicting remaining life |
| 02/21/2002 | WO2002015355A2 Method and device for identifying and localising high-ohm, single-pole earth faults |
| 02/21/2002 | WO2002015260A1 Probe, probe card and probe manufacturing method |
| 02/21/2002 | WO2002014887A1 Circuit arrangement for monitoring the state of charge of an accumulator |
| 02/21/2002 | WO2002014886A2 Method to descramble the data mapping in memory circuits |
| 02/21/2002 | WO2002014885A2 Defective circuit scanning device and method |
| 02/21/2002 | WO2002014884A2 Test system for smart card and identification devices and the like |
| 02/21/2002 | WO2002014883A2 Analog signal testing circuit and -method |
| 02/21/2002 | WO2002014823A1 Water monitoring system and water monitoring method for high voltage cables |
| 02/21/2002 | WO2001081937A3 Electronic circuit device with a short circuit switch and method of testing such a device |
| 02/21/2002 | WO2001048465A3 Cam reference for inspection of multi-color and contour images |
| 02/21/2002 | US20020022951 Method, apparatus and computer program product for determination of noise in mixed signal systems |
| 02/21/2002 | US20020022949 Apparatus and method for calculating temporal deterioration margin amount of LSI, and LSI inspection method |
| 02/21/2002 | US20020021676 Method and system for computer network link with undefined termination condition |
| 02/21/2002 | US20020021605 Nonvolatile semiconductor memory with testing circuit |
| 02/21/2002 | US20020021603 Apparatus and method for package level burn-in test in semiconductor device |
| 02/21/2002 | US20020021225 Method and apparatus for indicating an over-current condition |
| 02/21/2002 | US20020021156 Method and apparatus for a multi-state single program pin |
| 02/21/2002 | US20020021148 Current control of output swing |
| 02/21/2002 | US20020021142 Inspection method and inspection apparatus |
| 02/21/2002 | US20020021141 Apparatus for testing semiconductor devices |
| 02/21/2002 | US20020021140 Semiconductor test system and method |
| 02/21/2002 | US20020021138 Method of wafer level burn-in |
| 02/21/2002 | US20020021137 Method for calibrating a semiconductor testing device, a semiconductor testing apparatus, and a method for testing a semiconductor device |
| 02/21/2002 | US20020021132 Continuity tester for long wires |
| 02/21/2002 | US20020021110 Power supply unit, battery, electrical apparatus, and memory effect detection method |
| 02/21/2002 | US20020021108 Battery charging/discharging apparatus and battery charging/discharging method |
| 02/21/2002 | US20020020904 Semiconductor device |
| 02/21/2002 | US20020020854 Integrated circuit, test structure and method for testing integrated circuits |
| 02/21/2002 | DE10137664A1 Semi-conductor test system for contacting of semiconductor component parts located on wafers using probe heads having test tips with granite baseplate and wafer mounting on it adjustable compared to baseplate |
| 02/21/2002 | DE10041670A1 Location loop for determining fault position in cable, has switch connecting two wires together at remote cable end opened/closed with 1:1 duty cycle to alternately form bridge circuits |
| 02/21/2002 | DE10040050A1 Test module for comparative testing of electronic component, simulation module connects component, simulation interfaces, compares/records component, simulation output signals |
| 02/21/2002 | DE10039472A1 Schaltungsanordnung zur Überwachung des Ladezustands eines Akkumulators Circuit arrangement for monitoring the state of charge of an accumulator |
| 02/21/2002 | DE10039004A1 Anordnung zum Testen eines integrierten Schaltkreises Arrangement for the testing of an integrated circuit |
| 02/21/2002 | DE10039001A1 Anordnung zum Testen eines integrierten Schaltkreises Arrangement for the testing of an integrated circuit |
| 02/21/2002 | DE10038313A1 Verfahren und Vorrichtung zur Prüfung von Leiterplatten auf Funktionsfähigkeit Method and apparatus for testing printed circuit boards for functionality |
| 02/21/2002 | DE10037992A1 Verfahren zum Betreiben eines Logik- und Speicherelemente aufweisenden Bausteins A method of operating a logic and memory elements having block |
| 02/21/2002 | DE10037794A1 Verfahren und Vorrichtung zum Testen einer integrierten Schaltung, zu testende integrierte Schaltung, und Wafer mit einer Vielzahl von zu testenden integrierten Schaltungen Method and apparatus for testing an integrated circuit under test integrated circuit and wafer having a plurality of integrated circuits to be tested |
| 02/21/2002 | DE10037698A1 Operation method of protocol test devices, involves transmitting addresses assigned to each test device, in response to query command, via communication bus |
| 02/20/2002 | EP1180692A1 Test method of a lead battery in order to charge it in optimal conditions |
| 02/20/2002 | EP1180691A1 Circuit and method for stress testing a transistor in an integrated circuit device |
| 02/20/2002 | CN2478314Y Circuit board tester test board |
| 02/20/2002 | CN2478118Y Table appts. of circuit board testing machine |
| 02/20/2002 | CN2478117Y Voltage resistance experimental appts. having safety protective high voltage output switching switch |