| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/07/2002 | US20020029123 Semiconductor device and semiconductor device testing method |
| 03/07/2002 | US20020028641 Probe end cleaning sheet |
| 03/07/2002 | US20020027654 Microvia inspection system |
| 03/07/2002 | US20020027465 Variable delay circuit |
| 03/07/2002 | US20020027444 Packaging and interconnection of contact structure |
| 03/07/2002 | US20020027443 High density probe card apparatus and method of manufacture |
| 03/07/2002 | US20020027442 Probe station having multiple enclosures |
| 03/07/2002 | US20020027441 Semiconductor test interconnect with variable flexure contacts |
| 03/07/2002 | US20020027440 Method and apparatus for inspecting integrated circuit pattern |
| 03/07/2002 | US20020027434 Probe station |
| 03/07/2002 | US20020027433 Chuck for holding a device under test |
| 03/07/2002 | US20020027431 Timing signal generation circuit and semiconductor test device with the same |
| 03/07/2002 | DE10128387A1 Integrierter Mikrokontakt-Pin und Verfahren zu dessen Herstellung Integrated micro-contact pin and method for its production |
| 03/07/2002 | DE10125344A1 Event supported semiconductor test system with modular architecture for embedded and operating system independent memory testing where testing patterns can be specified in higher level languages |
| 03/07/2002 | DE10045671A1 Testvorrichtung und Testverfahren für eine integrierte Halbleiterschaltung Test apparatus and test method for a semiconductor integrated circuit |
| 03/07/2002 | DE10038750A1 Fitting device for e.g. flexible flat conductor contacts detachably film conductor against rest area of contacting unit in which contact electrode is provided |
| 03/07/2002 | DE10037495A1 Method for detection of a sensor fault, especially a Hall sensor fault or open circuit condition caused by a connection breakage in which a voltage transient is applied to the circuit input and an output signal analyzed for faults |
| 03/07/2002 | CA2387969A1 Computerized method and system for determining degradation of dc link capacitors |
| 03/06/2002 | EP1184875A2 Circuit and method for accelerating the aging of a MRAM |
| 03/06/2002 | EP1183766A2 System and method for accurately determining remaining battery life |
| 03/06/2002 | EP1183604A2 Test interface for electronic circuirts |
| 03/06/2002 | EP1183546A2 Low power scan flipflop |
| 03/06/2002 | EP1183545A1 Circuit with built-in self-tester |
| 03/06/2002 | EP1183544A1 Apparatus and method for implementing a wireless system-on-a-chip with a reprogrammable tester, debugger, and bus monitor |
| 03/06/2002 | EP1015901B1 Test system for integrated circuits using a single memory for both the parallel and scan modes of testing |
| 03/06/2002 | EP0990164B1 Method and device for monitoring a cable |
| 03/06/2002 | EP0958632A4 Battery operating system |
| 03/06/2002 | EP0778584B1 Semiconductor integrated circuit device with large-scale memory and controller embedded on one semiconductor chip, and method of testing the device |
| 03/06/2002 | CN2480856Y Universal test clamp for CD driver |
| 03/06/2002 | CN2480855Y Tester |
| 03/06/2002 | CN2480854Y Thin type CD driver circuit board tester |
| 03/06/2002 | CN2480853Y Theft-proof and fault alarm device for electric power facilities |
| 03/06/2002 | CN1339192A Method and an apparatus for identifying a battery |
| 03/06/2002 | CN1339166A Vibro-acqustic signature treatment process in high-voltage electromechanical switching system |
| 03/06/2002 | CN1339163A Method for functionally testing memory cells of an integrated semiconductor memory |
| 03/06/2002 | CN1339132A Method enabling communication between an electronic device and a battery, and apparatus comprising an electronic device and a battery, and a battery enabling communication |
| 03/06/2002 | CN1339128A On-chip debug system |
| 03/06/2002 | CN1339113A Dry load test apparatus |
| 03/06/2002 | CN1339112A Automatic test equipment using sigma delta modulation to create reference levels |
| 03/06/2002 | CN1339111A Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment |
| 03/06/2002 | CN1339110A Apparatus and method for testing coating of an electrical conductor |
| 03/06/2002 | CN1338801A Charger and method for measuring charged level |
| 03/06/2002 | CN1080477C Circuit for detecting overcharging and overdischarging |
| 03/05/2002 | US6353906 Testing synchronization circuitry using digital simulation |
| 03/05/2002 | US6353905 Semiconductor integrated circuit and recording medium |
| 03/05/2002 | US6353904 Method of automatically generating new test programs for mixed-signal integrated circuit based on reusable test-block templates according to user-provided driver file |
| 03/05/2002 | US6353903 Method and apparatus for testing differential signals |
| 03/05/2002 | US6353801 Multi-resolution adaptive solution refinement technique for a method of moments-based electromagnetic simulator |
| 03/05/2002 | US6353800 Method, system, signal and software for sensing remote battery life based upon cursor characteristics |
| 03/05/2002 | US6353565 Semiconductor device, semiconductor memory device and test-mode entry method |
| 03/05/2002 | US6353563 Built-in self-test arrangement for integrated circuit memory devices |
| 03/05/2002 | US6353562 Integrated semiconductor memory with redundant units for memory cells |
| 03/05/2002 | US6353341 Method and apparatus for discriminating against signal interference |
| 03/05/2002 | US6353329 Integrated circuit test socket lid assembly |
| 03/05/2002 | US6353328 Test system with mechanical alignment for semiconductor chip scale packages and dice |
| 03/05/2002 | US6353327 Circuit board misalignment detection apparatus and method |
| 03/05/2002 | US6353312 Method for positioning a semiconductor die within a temporary package |
| 03/05/2002 | US6352871 Probe grid for integrated circuit excitation |
| 03/05/2002 | US6352868 Method and apparatus for wafer level burn-in |
| 03/05/2002 | CA2178822C Method and apparatus for the verification of an electrical insulator device based on the analysis of the electric field along the insulator |
| 03/04/2002 | CA2356778A1 Device and method for determining rare short circuit |
| 02/28/2002 | WO2001079868A3 System for measuring signal path resistance for an integrated circuit tester interconnect structure |
| 02/28/2002 | WO2001075775A3 Arc fault current interrupter testing device |
| 02/28/2002 | WO2001069268A3 Integrated circuit test socket lid assembly |
| 02/28/2002 | WO2001067576A3 Connection tester for an electronic trip unit |
| 02/28/2002 | US20020026623 Semiconductor Integrated circuit provided with determination circuit |
| 02/28/2002 | US20020026622 Delay circuit, testing apparatus, and capacitor |
| 02/28/2002 | US20020026613 Semiconductor device capable of adjusting timing of input waveform by tester with high accuracy |
| 02/28/2002 | US20020026612 Apparatus for testing semiconductor integrated circuits |
| 02/28/2002 | US20020026611 Method of design for testability, test sequence generation method and semiconductor integrated circuit |
| 02/28/2002 | US20020026610 Internal guardband for semiconductor testing |
| 02/28/2002 | US20020026609 Semiconductor integrated circuit and test method of built-in analog circuit |
| 02/28/2002 | US20020026608 Method for checking the functioning of memory cells of an integrated semiconductor memory |
| 02/28/2002 | US20020026303 Transaction conflict testing method and apparatus |
| 02/28/2002 | US20020026258 Method and apparatus for testing IC device |
| 02/28/2002 | US20020025698 Electric contact device for establishing an improved contact with contactors of other device |
| 02/28/2002 | US20020025603 Method for mounting an electronic component |
| 02/28/2002 | US20020025470 Pass/fail battery indicator |
| 02/28/2002 | US20020025464 Fuel cell system |
| 02/28/2002 | US20020025100 Method and apparatus for OPTO-electronic built-in tests |
| 02/28/2002 | US20020024996 Dynamic regulation of power consumption of a high-speed communication system |
| 02/28/2002 | US20020024879 Semiconductor integrated circuit device provided with a logic circuit and a memory circuit and being capable of efficient interface between the same |
| 02/28/2002 | US20020024869 Semiconductor device |
| 02/28/2002 | US20020024868 Semiconductor memory device having a second voltage supplier supplying transfer gates with a second voltage higher than a first voltage |
| 02/28/2002 | US20020024862 Nonvolatile semiconductor memory test circuit and method, nonvolatile semiconductor memory and method for fabricating nonvolatile semiconductor memory |
| 02/28/2002 | US20020024860 Semiconductor memory device capable of high speed plural parallel test, method of data writing therefor and parallel tester |
| 02/28/2002 | US20020024844 Non-volatile semiconductor memory device |
| 02/28/2002 | US20020024839 Ferroelectric memory |
| 02/28/2002 | US20020024786 Integrated circuit with current sense circuit and associated methods |
| 02/28/2002 | US20020024356 Method and apparatus for parallel die testing on wafer |
| 02/28/2002 | US20020024355 Wafer inspection device and wafer inspection method |
| 02/28/2002 | US20020024353 Regulable test integrated circuit system for signal noise and method of using same |
| 02/28/2002 | US20020024352 Semiconductor integrated circuit with test points inserted thereinto |
| 02/28/2002 | US20020024350 Method and apparatus for testing a semiconductor package |
| 02/28/2002 | US20020024348 Packaging and interconnection of contact structure |
| 02/28/2002 | US20020024343 Method and apparatus for testing frequency-dependent electrical circuits |
| 02/28/2002 | US20020024342 Method and device for locating an insulation fault in an electric cable |
| 02/28/2002 | US20020024341 Method and device for detecting a partial discharge in an electrical device |
| 02/28/2002 | US20020024330 Semiconductor integrated circuit allowing internal voltage to be measured and controlled externally |
| 02/28/2002 | US20020024321 Method of charging a battery |