| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/14/2002 | US20020031026 Memory testing method and memory testing apparatus |
| 03/14/2002 | US20020031025 Semiconductor memory device performing redundancy repair based on operation test and semiconductor integrated circuit device having the same |
| 03/14/2002 | US20020031017 Nonvolatile semiconductor memory device and test method with memory-assisted roll call |
| 03/14/2002 | US20020031004 Ferroelectric storage device and test method thereof |
| 03/14/2002 | US20020030531 Multipurpose test chip input/output circuit |
| 03/14/2002 | US20020030507 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer |
| 03/14/2002 | US20020030506 Bias monitor for semiconductor burn-in |
| 03/14/2002 | US20020030505 Integrated circuit with in situ circuit arrangement for testing integrity of differential receiver inputs |
| 03/14/2002 | US20020030503 Method and apparatus for measuring temperature parameters of an ISFET using hydrogenated amorphous silicon as a sensing film |
| 03/14/2002 | US20020030502 Wafer burn-in and test employing detachable cartridge |
| 03/14/2002 | US20020030501 Semiconductor device test method |
| 03/14/2002 | US20020030500 Electro-optic sampling probe and measuring method using the same |
| 03/14/2002 | US20020030495 Method of testing a lead battery for the purpose of charging it under optimal conditions |
| 03/14/2002 | US20020030494 Remaining charge detection device for power storage unit |
| 03/14/2002 | US20020030493 Single sensor control of power converters |
| 03/14/2002 | US20020030480 Apparatus for the automated testing, calibration and characterization of test adapters |
| 03/14/2002 | US20020030476 Multi-test circuit breaker locator |
| 03/14/2002 | US20020030455 Non-linear light-emitting load current control |
| 03/14/2002 | US20020030153 Method and apparatus for measuring photoelectric conversion characteristics of photoelectric conversion device |
| 03/14/2002 | US20020030149 Supporting framework for display panel or probe block |
| 03/14/2002 | US20020029903 Adapter for a ball grid array device |
| 03/14/2002 | US20020029487 Examination of insulation displacement connection |
| 03/14/2002 | DE19961974A1 Diagnosing damage or aging of high voltage devices, involves repeatedly discharging measurement object at regular or irregular time intervals during repetitive voltage measurements |
| 03/14/2002 | DE10121501A1 Test station mount for ICs has indexed rotation reduces height maintains planarity |
| 03/14/2002 | DE10043218A1 Schaltungsanordnung und Verfahren zur Alterungsbeschleunigung bei einem MRAM Circuit arrangement and method for accelerating aging in an MRAM |
| 03/14/2002 | DE10043137A1 Vorrichtung und Verfahren zur Kennzeichnung der Version bei integrierten Schaltkreisen und Verwendung zur Steuerung von Betriebsabläufen Apparatus and method for identifying the version of integrated circuits and use for the control of operations |
| 03/14/2002 | DE10043119A1 Determining electromagnetic noise sources involves guiding sniffer probe along fixed path over electronic unit with numerically controlled movement device, automatically detecting position |
| 03/14/2002 | DE10042223A1 Testing integrated semiconducting circuit involves connecting monitor circuit to data pins and simultaneously evaluating state of semiconducting circuit in monitor circuit |
| 03/14/2002 | DE10041607A1 Elektrisches Arbeitsgerät sowie Verfahren zu dessen Betreiben Electrical work device and method of operation |
| 03/13/2002 | EP1187297A1 Method of charging a battery |
| 03/13/2002 | EP1187288A2 Device and method for determining rare short circuit |
| 03/13/2002 | EP1186903A2 Wafer inspection device and wafer inspection method |
| 03/13/2002 | EP1186902A2 Testmodule |
| 03/13/2002 | EP1186901A2 Method and device for generating digital signal pattern |
| 03/13/2002 | EP1186900A2 Arrangement for testing integrated circuits |
| 03/13/2002 | EP1186899A2 Supporting framework for display panel or probe block |
| 03/13/2002 | EP1186898A2 Procedure and apparatus for testing printed circuit boards |
| 03/13/2002 | EP1186897A1 Method and apparatus for the simulation of the electrical behavior of piezoelectric elements |
| 03/13/2002 | EP1186083A1 Method for operating an electronic overcurrent trip of a power circuit breaker |
| 03/13/2002 | EP1186070A1 On cell circumferential battery indicator |
| 03/13/2002 | EP1185876A1 Pass/fail battery indicator |
| 03/13/2002 | EP1185875A1 Gauge effect battery tester |
| 03/13/2002 | EP1185874A2 Power consumption reporting by an accessory of an electronic device |
| 03/13/2002 | EP1027707B1 Method for testing the bus terminals of writable-readable integrated electronic integrated circuits, especially of memory chips |
| 03/13/2002 | EP0950191B1 Contact probe unit |
| 03/13/2002 | CN2482099Y Measuring head of integrated circuit test sorter |
| 03/13/2002 | CN2482098Y Preset safety current leakage measurer for trolleybus |
| 03/13/2002 | CN2482097Y Checking apparatus for zinc oxide lightning arrester in-line monitoring device |
| 03/13/2002 | CN2482096Y Automatic circuit board function testing device |
| 03/13/2002 | CN2482095Y Zinc oxide lightning arrester state indicator |
| 03/13/2002 | CN1340163A Method for verification of polarity, presence, alignment of components and short circuit on a printed circuit board |
| 03/12/2002 | US6357027 On chip data comparator with variable data and compare result compression |
| 03/12/2002 | US6357026 System and method for at-speed interconnect tests |
| 03/12/2002 | US6357025 Testing and burn-in of IC chips using radio frequency transmission |
| 03/12/2002 | US6357023 Connector assembly for testing memory modules from the solder-side of a PC motherboard with forced hot air |
| 03/12/2002 | US6357022 Testing memory modules on a solder-side adaptor board attached to a PC motherboard |
| 03/12/2002 | US6356861 Deriving statistical device models from worst-case files |
| 03/12/2002 | US6356853 Enhancing voltmeter functionality |
| 03/12/2002 | US6356827 Auxiliary control with diagnostic capability |
| 03/12/2002 | US6356821 Electronic control unit for vehicle having reduced circuit scale |
| 03/12/2002 | US6356532 Computer network cross-connect panel providing physical layer monitoring and method therefor |
| 03/12/2002 | US6356514 Built-in self test method for measuring clock to out delays |
| 03/12/2002 | US6356513 Additional probe circuit for measuring delay time in embedded circuits |
| 03/12/2002 | US6356424 Electrical protection systems |
| 03/12/2002 | US6356301 Method and apparatus for landing adjustment jig calibration check |
| 03/12/2002 | US6356129 Low jitter phase-locked loop with duty-cycle control |
| 03/12/2002 | US6356107 Method and structure dynamic in-system programming |
| 03/12/2002 | US6356098 Probe card, test method and test system for semiconductor wafers |
| 03/12/2002 | US6356097 Capacitive probe for in situ measurement of wafer DC bias voltage |
| 03/12/2002 | US6356096 Test board for testing a semiconductor device utilizing first and second delay elements in a signal-transmission-path |
| 03/12/2002 | US6356095 Semiconductor integrated circuit |
| 03/12/2002 | US6356094 Automated multi-chip module handler, method of module handling, and module magazine |
| 03/12/2002 | US6356093 Printed circuit board testing apparatus |
| 03/12/2002 | US6356092 Method and apparatus for capacitively testing a semiconductor die |
| 03/12/2002 | US6356089 Contact probe arrangement |
| 03/12/2002 | US6356086 Method and apparatus for the in-circuit testing of a capacitor |
| 03/12/2002 | US6356084 Audio testing system |
| 03/12/2002 | US6356083 State of charge algorithm for a battery |
| 03/12/2002 | US6356058 Method and apparatus for monitoring and maintaining a plurality of batteries |
| 03/12/2002 | US6356057 Methods and apparatus for testing a powerability characteristic of a backup power supply |
| 03/12/2002 | US6355613 Cyclized oligopeptides with bridging groups of amide, thioether, thioester or disulfide |
| 03/12/2002 | US6355564 Selectively etching bulk silicon in target region in back side of semiconductor using reactive ion etching gas comprising sulfur hexafluoride and nitrogen and using epitaxial silicon as endpoint indicator, accessing circuitry via exposed region |
| 03/12/2002 | US6354856 IC socket and contact pin thereof |
| 03/12/2002 | US6354792 IC receiving tray storage device and mounting apparatus for the same |
| 03/12/2002 | US6354000 Method of creating an electrical interconnect device bearing an array of electrical contact pads |
| 03/12/2002 | CA2250751C Combined laser/flir optics system |
| 03/07/2002 | WO2002019471A1 Ic test socket |
| 03/07/2002 | WO2002019108A2 Method for providing bitwise constraints for test generation |
| 03/07/2002 | WO2002018966A1 Digitizer and semiconductor test instrument |
| 03/07/2002 | WO2002018964A1 Partial discharge injector |
| 03/07/2002 | WO2002018963A1 Re-locatable partial discharge transducer head |
| 03/07/2002 | WO2002018962A1 Computerized method and system for determining degradation of dc link capacitors |
| 03/07/2002 | WO2002018960A2 Device and method for characterizing the version of integrated circuits and use for controlling operations |
| 03/07/2002 | WO2001086660A8 Integrated circuit containing sram memory and method of testing same |
| 03/07/2002 | WO2001063311A3 Method and system for wafer and device-level testing of an integrated circuit |
| 03/07/2002 | WO2001061364A3 Semiconductor component test socket |
| 03/07/2002 | WO2001040941A3 Hardware debugging in a hardware description language |
| 03/07/2002 | US20020029361 Logic circuit design method and logic circuit |
| 03/07/2002 | US20020029125 Color optical inspection system |
| 03/07/2002 | US20020029124 Method for testing a CMOS integrated circuit |