| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/21/2002 | WO2001080305A3 Electromigration early failure distribution in submicron interconnects |
| 03/21/2002 | WO2001069275A3 Test environment and a method for testing systems |
| 03/21/2002 | WO2000079421A3 Property coverage in formal verification |
| 03/21/2002 | US20020035712 Low power scan & delay test method and apparatus |
| 03/21/2002 | US20020035708 Method and apparatus for generating test patterns used in testing semiconductor integrated ciruit |
| 03/21/2002 | US20020035658 Addressable shadow port and protocol for serial bus networks |
| 03/21/2002 | US20020035462 Method of and device for simulation |
| 03/21/2002 | US20020035442 Hierarchical test circuit structure for chips with multiple circuit blocks |
| 03/21/2002 | US20020035420 Method of checking vehicle mounted electronic units |
| 03/21/2002 | US20020034833 Methods of testing integrated circuitry, methods of forming tester substrates, and circuitry testing substrates |
| 03/21/2002 | US20020034219 Switching noise reduction in a multi-clock domain transceiver |
| 03/21/2002 | US20020034114 Refresh-free semiconductor memory device |
| 03/21/2002 | US20020034112 Semiconductor device operable in a plurality of test operation modes |
| 03/21/2002 | US20020034093 Semiconductor memory device capable of repairing small leak failure |
| 03/21/2002 | US20020033723 Semiconductor memory device which controls sense amplifier for detecting bit line bridge and method of controlling the semiconductor memory device |
| 03/21/2002 | US20020033710 TDDB test pattern and method for testing TDDB of MOS capacitor dielectric |
| 03/21/2002 | US20020033709 Apparatus for monitoring a device powered by the apparatus, and a method for monitoring a device from its power draw |
| 03/21/2002 | US20020033707 Semiconductor device testing apparatus and semiconductor device manufacturing method using it |
| 03/21/2002 | US20020033706 System method, and apparatus for field scanning |
| 03/21/2002 | US20020033705 Method and apparatus for measuring hysteresis and drift values of an isfet using the hydrogenated amorphous silicon as a sensing film |
| 03/21/2002 | US20020033701 Arc fault circuit detector device detecting pulse width modulation of arc noise |
| 03/21/2002 | US20020033700 Method and apparatus for fault detection in a resistive bridge sensor |
| 03/21/2002 | US20020033693 Method for monitoring and controlling the charging of gastight alkaline rechargeable batteries |
| 03/21/2002 | US20020033522 IC socket |
| 03/21/2002 | US20020033482 Semiconductor device provided with a built-in minute charge detecting circuit |
| 03/21/2002 | US20020033391 Apparatus, method and system of liquid-based, wide range, fast response temperature control of electric devices |
| 03/21/2002 | US20020033360 Method for sorting integrated circuit devices |
| 03/21/2002 | DE10131581A1 Combinatorial formation and examination of composite layers for desired properties takes place on substrate, where external stimulus is applied |
| 03/21/2002 | DE10129329A1 Fehlersimulationsverfahren und Fehlersimulator für einen Halbleiter-IC Fault simulation method and fault simulator for a semiconductor IC |
| 03/21/2002 | DE10045041A1 Verbessertes Verfahren zur Probenpräparation für Elektronenmikroskopie An improved method for sample preparation for electron microscopy |
| 03/21/2002 | DE10043731A1 Measuring probe for detection of IC signals has lever arm of high conductivity material covered by insulation layer provided with window at apex of probe point |
| 03/21/2002 | DE10043726A1 Verfahren und Vorrichtung zum Prüfen von Leiterplatten Method and apparatus for testing circuit boards |
| 03/21/2002 | DE10041137A1 Anordnung zum Testen von integrierten Schaltkreisen Arrangement for the testing of integrated circuits |
| 03/21/2002 | DE10039928A1 Vorrichtung zum automatisierten Testen, Kalibrieren und Charakterisieren von Testadaptern Apparatus for automated testing, calibrating and characterizing test adapters |
| 03/20/2002 | EP1189326A2 Method of monitoring charge of a gastight alkaline accumulator |
| 03/20/2002 | EP1189070A2 JTAG testing arrangement |
| 03/20/2002 | EP1189069A1 Testable analogue/digital interface circuit |
| 03/20/2002 | EP1189068A2 Method of testing electronic components using mean deviation values |
| 03/20/2002 | EP1189067A2 A semiconductor device provided with a built-in minute charge detecting circuit |
| 03/20/2002 | EP1188117A2 Method of discriminating between different types of scan failures, a computer implemented circuit simulation and fault detection system |
| 03/20/2002 | EP1188063A1 Battery capacity measurement |
| 03/20/2002 | EP1188062A1 Method and apparatus for wireless testing of integrated circuits |
| 03/20/2002 | EP1188061A1 Segmented contactor |
| 03/20/2002 | CN2482698Y Data collecting protector for electric cable fault |
| 03/20/2002 | CN2482697Y Enamel-covered wire on-line detecting apparatus |
| 03/20/2002 | CN2482696Y Intermediate frequency electric furnace control circuit board maintenance detecting instrument |
| 03/20/2002 | CN1340888A Receiving device for crimp connector and automatic crimping machine with the said receiving device |
| 03/20/2002 | CN1340874A Detecting method for internal state of rechargeable battery, device and equipment with said device |
| 03/20/2002 | CN1340873A Charging method for battery |
| 03/20/2002 | CN1340719A Method for testing electronic element with consideration of mean value drift |
| 03/20/2002 | CN1340718A Method and device for local discharge in electric inspection device |
| 03/20/2002 | CN1081336C Comparator for semiconductor testing device |
| 03/19/2002 | US6360353 Automated alternating current characterization testing |
| 03/19/2002 | US6360344 Built in self test algorithm that efficiently detects address related faults of a multiport memory without detailed placement and routing information |
| 03/19/2002 | US6360343 Delta time event based test system |
| 03/19/2002 | US6360341 Editing apparatus and generating method for physical conversion definition |
| 03/19/2002 | US6360340 Memory tester with data compression |
| 03/19/2002 | US6360180 Driver with transmission path loss compensation |
| 03/19/2002 | US6360177 Voltage scanning, measurement, storage and reporting device |
| 03/19/2002 | US6359820 Integrated memory and method for checking the operation of memory cells in an integrated memory |
| 03/19/2002 | US6359818 Apparatus for analyzing failure for semiconductor memory device |
| 03/19/2002 | US6359816 Response time measurement |
| 03/19/2002 | US6359811 Semiconductor integrated circuit with random access memory testing |
| 03/19/2002 | US6359694 Method and device for identifying the position of an electrical component or terminals thereof, and equipping head employing same |
| 03/19/2002 | US6359681 Combined laser/FLIR optics system |
| 03/19/2002 | US6359561 Method of manufacturing and testing an electronic device, and an electronic device |
| 03/19/2002 | US6359461 Test structure for determining the properties of densely packed transistors |
| 03/19/2002 | US6359459 Integrated circuits including voltage-controllable power supply systems that can be used for low supply voltage margin testing and related methods |
| 03/19/2002 | US6359458 Apparatus for detecting a diaphragm failure |
| 03/19/2002 | US6359457 Method of holding a wafer and testing the integrated circuits on the wafer |
| 03/19/2002 | US6359456 Probe card and test system for semiconductor wafers |
| 03/19/2002 | US6359454 Pick and place mechanism for contactor |
| 03/19/2002 | US6359453 Vertical probe card for attachment within a central corridor of a magnetic field generator |
| 03/19/2002 | US6359451 System for contactless testing of printed circuit boards |
| 03/19/2002 | US6359450 System for checking the resistance of a load connected to a transformer |
| 03/19/2002 | US6359443 Device for detecting abnormality of wire harness for vehicle and power supply device for vehicle |
| 03/19/2002 | US6359442 Microprocessor-based hand-held battery tester system |
| 03/19/2002 | US6359441 Electronic battery tester |
| 03/19/2002 | US6359419 Quasi-adaptive method for determining a battery's state of charge |
| 03/19/2002 | US6358095 Consolidated automatic support system (CASS) flexible exchange adapter and interface device |
| 03/19/2002 | CA2271251C Method and apparatus for testing field programmable gate arrays |
| 03/14/2002 | WO2002021893A2 Method and device for testing printed circuit boards with a parallel tester |
| 03/14/2002 | WO2002021662A2 Battery monitoring network |
| 03/14/2002 | WO2002021241A2 Circuit arrangement and a method for detecting an undesired attack on an integrated circuit |
| 03/14/2002 | WO2002021228A1 Self-diagnosis circuit of input/output circuit system |
| 03/14/2002 | WO2002021149A2 Battery monitoring |
| 03/14/2002 | WO2002021148A1 Analogue/digital interface circuit |
| 03/14/2002 | WO2002021105A1 Reduction of false alarms in pcb inspection |
| 03/14/2002 | WO2001076914A3 Sound absorber, especially for motor vehicles, and a method for producing a sound absorber |
| 03/14/2002 | WO2001071779A3 Method and apparatus for planarizing a semiconductor contactor |
| 03/14/2002 | WO2001067071A3 Evaluating a property of a multilayered structure |
| 03/14/2002 | WO2001055738A3 Capacitively coupled electrical ground detection circuit |
| 03/14/2002 | WO2001050140A3 Electric test connector, equipment and system using same |
| 03/14/2002 | US20020032898 Computer implemented circuit synthesis system |
| 03/14/2002 | US20020032889 Automatic test pattern generation for functional register transfer level circuits using assignment decision diagrams |
| 03/14/2002 | US20020032887 Test circuit of semiconductor integrated circuit |
| 03/14/2002 | US20020032555 Method of and apparatus for signal-waveform simulation, and computer product |
| 03/14/2002 | US20020032537 Method and system for testing RAMBUS memory modules |
| 03/14/2002 | US20020031849 Semiconductor substrate test device and method |
| 03/14/2002 | US20020031248 Defect inspection method and apparatus therefor |