| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 03/28/2002 | WO2001040770A3 Adaptive tolerance reference inspection system |
| 03/28/2002 | WO2001009627A3 Environmental test chamber and carrier for use therein |
| 03/28/2002 | US20020038439 Tester architecture construction data generating method, tester architecture constructing method and test circuit |
| 03/28/2002 | US20020038438 Information processing unit with failure information management function and failure information management method four |
| 03/28/2002 | US20020038205 Operational verification for product safety testers |
| 03/28/2002 | US20020038203 Design verification system and method |
| 03/28/2002 | US20020038191 Data head writer coil testing |
| 03/28/2002 | US20020037657 Spiral contactor and manufacturing method for this apparatus, and a semiconductor inspecting equipment and electronical parts using this apparatus |
| 03/28/2002 | US20020037031 Dynamic regulation of power consumption of a high-speed communication system |
| 03/28/2002 | US20020036938 Semiconductor memory device that is tested even with fewer test pins |
| 03/28/2002 | US20020036770 Inspection method and inspection system of a terminal metal fitting |
| 03/28/2002 | US20020036534 Manufacturing method of semiconductor device |
| 03/28/2002 | US20020036515 Apparatus for reducing power supply noise in an integrated circuit |
| 03/28/2002 | US20020036514 Semiconductor device testing apparatus |
| 03/28/2002 | US20020036513 Ic testing method and ic testing device using the same |
| 03/28/2002 | US20020036511 Printed circuit board and method of manufacturing the same |
| 03/28/2002 | US20020036509 Semiconductor test apparatus and test method using the same |
| 03/28/2002 | US20020036508 Method of producing load for delay time calculation and recording medium |
| 03/28/2002 | US20020036505 Evaluating pattern for measuring an erosion of a semiconductor wafer polished by a chemical mechanical polishing |
| 03/28/2002 | US20020036504 Integrated conductance and load test based electronic battery tester |
| 03/28/2002 | US20020036493 Testing apparatus for semiconductor integrated circuits and a method for managing the same |
| 03/28/2002 | US20020036491 Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system |
| 03/28/2002 | US20020036482 Charging method of rechargeable battery |
| 03/28/2002 | US20020036481 Battery pack |
| 03/28/2002 | US20020036411 Apparatus and method for handling an integrated circuit |
| 03/28/2002 | US20020036235 Semiconductor device and an information management system thereof |
| 03/28/2002 | US20020036161 Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus |
| 03/28/2002 | DE10145147A1 Connecting structure used for forming electrical connection in highly integrated circuits comprises connecting substrate, connecting elements mounted on horizontal surface of the substrate, base region, and spring region |
| 03/28/2002 | DE10142840A1 Verzögerungsschaltung, Prüfvorrichtung und Kondensator Delay circuit tester and capacitor |
| 03/28/2002 | DE10124878A1 Testvorrichtung für Halbleiterbauelemente Test apparatus for semiconductor devices |
| 03/28/2002 | DE10060436A1 Test device for high frequency testing of fast integrated circuits has low and high frequency communications connections, arrangement for producing and receiving high frequency test signals |
| 03/28/2002 | DE10046393A1 Verfahren zur Erfassung eines durch eine Last fließenden impulsförmigen Stromes A method for detecting a current flowing through a load pulse-shaped current |
| 03/28/2002 | DE10045622A1 Monitoring charging of gas-tight alkaline storage batteries by linearizing voltage-current characteristic for different temperatures |
| 03/28/2002 | DE10043728A1 Verfahren und Vorrichtung zum Prüfen von Leiterplatten mit einem Paralleltester Method and apparatus for testing circuit boards with a parallel tester |
| 03/28/2002 | DE10029346A1 Verfahren und Vorrichtung für die Optimierung eines Testprogramms Method and apparatus for the optimization of a test program |
| 03/28/2002 | CA2423430A1 Method and apparatus for measuring liquid dielectric behavior |
| 03/28/2002 | CA2423003A1 Testing system in a circuit board manufacturing line for automatic testing of circuit boards |
| 03/28/2002 | CA2423002A1 Testing system in a circuit board manufacturing line for automatic testing of circuit boards |
| 03/28/2002 | CA2321346A1 Method, system and program product for testing and/or diagnosing circuits using embedded test controller access data |
| 03/27/2002 | EP1191620A2 Method for operating a fuel cell battery |
| 03/27/2002 | EP1191588A2 A spiral contactor and manufacturing method therefor |
| 03/27/2002 | EP1191343A2 Method and apparatus for fault detection in a resistive bridge sensor |
| 03/27/2002 | EP1191341A2 Procedure and apparatus for determining the quality of a cable |
| 03/27/2002 | EP1191339A2 Method of measuring a pulse-shaped current through a load |
| 03/27/2002 | EP1190420A1 Method and apparatus for testing an impedance-controlled input/output (i/o) buffer in a highly efficient manner |
| 03/27/2002 | EP1190322A2 Semiconductor parallel tester |
| 03/27/2002 | EP1190264A1 Integrated circuit and method for determining the current yield of a part of the integrated circuit |
| 03/27/2002 | EP1090305B1 Device for testing solar home systems |
| 03/27/2002 | EP0999956B1 System and method for testing a circuit device for controlling an automobile passenger protection mechanism |
| 03/27/2002 | EP0991996B1 Jitter reduction module |
| 03/27/2002 | EP0918998B1 Method and apparatus for testing the insulating ability of an insulation on an electric conductor |
| 03/27/2002 | EP0886783B1 Fault current recognition circuitry |
| 03/27/2002 | EP0846614B1 Moving apparatus with drive power assisting device and movement controlling method |
| 03/27/2002 | EP0748535B1 Improved supply voltage detection circuit |
| 03/27/2002 | CN2483835Y Register parts of holding unit of sequencer used for IC measurement |
| 03/27/2002 | CN2483734Y Battery discharge unit with constant current, resistance and power |
| 03/27/2002 | CN1342318A IC test software system for mapping logical functional data of logic integrated circuits to physical representation |
| 03/27/2002 | CN1341863A Photoelectric conversion characteristics testing method and equipment for photoelectric switching equipment |
| 03/27/2002 | CN1341860A Device and method for determining local short-circuit |
| 03/26/2002 | US6363520 Method for testability analysis and test point insertion at the RT-level of a hardware development language (HDL) specification |
| 03/26/2002 | US6363510 Electronic system for testing chips having a selectable number of pattern generators that concurrently broadcast different bit streams to selectable sets of chip driver circuits |
| 03/26/2002 | US6363509 Method and apparatus for transforming system simulation tests to test patterns for IC testers |
| 03/26/2002 | US6363508 Method for testing reflection LCD projector and display panel pixel area thereof |
| 03/26/2002 | US6363507 Integrated multi-channel analog test instrument architecture providing flexible triggering |
| 03/26/2002 | US6363506 Method for self-testing integrated circuits |
| 03/26/2002 | US6363505 Programmable control circuit for grounding unused outputs |
| 03/26/2002 | US6363504 Electronic system for testing a set of multiple chips concurrently or sequentially in selectable subsets under program control to limit chip power dissipation |
| 03/26/2002 | US6363501 Method and apparatus for saving and loading peripheral device states of a microcontroller via a scan path |
| 03/26/2002 | US6363500 Device and method for outputting positional information for LSI cells and recording medium for positional information output program for LSI cells |
| 03/26/2002 | US6363443 Addressable shadow port and protocol for serial bus networks |
| 03/26/2002 | US6363329 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture |
| 03/26/2002 | US6363129 Timing recovery system for a multi-pair gigabit transceiver |
| 03/26/2002 | US6363044 Automatically adapting forward or reversed biased photodiode detection circuit |
| 03/26/2002 | US6363022 Semiconductor memory device tester |
| 03/26/2002 | US6362944 System for regulating the temperature of IC-chips with a fluid whose temperature is controlled quickly by a slow response cooler and a fast response heater |
| 03/26/2002 | US6362877 Visual inspection supporting apparatus and printed circuit board inspecting apparatus, and methods of soldering inspection and correction using the apparatuses |
| 03/26/2002 | US6362744 Apparatus for checking an electrical drive |
| 03/26/2002 | US6362642 Method of chip testing of chip leads constrained in dielectric media |
| 03/26/2002 | US6362641 Integrated circuit device and semiconductor wafer having test circuit therein |
| 03/26/2002 | US6362640 Design of IC package test handler with temperature controller for minimized maintenance |
| 03/26/2002 | US6362639 Compliant contactor for testing semiconductors |
| 03/26/2002 | US6362638 Stacked via Kelvin resistance test structure for measuring contact anomalies in multi-level metal integrated circuit technologies |
| 03/26/2002 | US6362637 Apparatus for testing semiconductor wafers including base with contact members and terminal contacts |
| 03/26/2002 | US6362636 Probe station having multiple enclosures |
| 03/26/2002 | US6362634 Integrated defect monitor structures for conductive features on a semiconductor topography and method of use |
| 03/26/2002 | US6362631 Method for characterizing delay of frequency translation devices |
| 03/26/2002 | US6362630 Electronic test tag for wireline continuity verification |
| 03/26/2002 | US6362629 Electric arc monitoring systems |
| 03/26/2002 | US6362628 Arc fault circuit detector device detecting pulse width modulation of arc noise |
| 03/26/2002 | US6362626 Cell voltage measuring device for cell module |
| 03/26/2002 | US6362601 Method of battery charge restoration based on estimated battery plate deterioration and/or based on battery state of health |
| 03/26/2002 | US6362598 Method for determining the state of charge and loading capacity of an electrical storage battery |
| 03/26/2002 | US6362574 System for emitting electrical charge from a space object in a space plasma environment using micro-fabricated gated charge emission devices |
| 03/26/2002 | US6362015 Process of making an integrated circuit using parallel scan paths |
| 03/26/2002 | CA2198675C Electrical system monitoring apparatus with programmable custom display |
| 03/21/2002 | WO2002023207A1 A method and a device for checking a condition of an electric switching device |
| 03/21/2002 | WO2002023206A1 Inspection device and inspection method |
| 03/21/2002 | WO2002022726A2 Polymer composition and method and apparatus for testing electrical stress degradation of same |
| 03/21/2002 | WO2002022303A1 Method of retrofitting a probe station |
| 03/21/2002 | WO2001081933A3 Method and system for detecting defects in cellular transmission equipment |