| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/04/2002 | WO2002027338A2 Device for testing contacts |
| 04/04/2002 | WO2002027337A2 High performance tester interface module |
| 04/04/2002 | WO2002027334A1 Point of use digital electric energy measurement, control and monitoring apparatus |
| 04/04/2002 | WO2001090834A3 System for regulating the temperature of ic-chips with a fluid whose temperature is controlled quickly by a slow response cooler and a fast response heater |
| 04/04/2002 | WO2001077697A3 Electrical and electro-mechanical test method and apparatus |
| 04/04/2002 | WO2001073457A3 Controllable and testable oscillator apparatus for an integrated circuit |
| 04/04/2002 | US20020040466 Automated EMC-driven layout and floor planning of electronic devices and systems |
| 04/04/2002 | US20020040464 TAB autohandler |
| 04/04/2002 | US20020040459 Semiconductor integrated circuit having a self-testing function |
| 04/04/2002 | US20020040458 Hierarchical test circuit structure for chips with multiple circuit blocks |
| 04/04/2002 | US20020040457 System and method for applying flexible constraints |
| 04/04/2002 | US20020040456 Partially distributed control mechanism for scanout incorporating flexible debug triggering |
| 04/04/2002 | US20020040455 Semiconductor apparatus for providing reliable data analysys of signals |
| 04/04/2002 | US20020040288 Method for design validation of complex IC |
| 04/04/2002 | US20020040279 Nondestructive method of quality control of high-voltage systems and device for use of the method |
| 04/04/2002 | US20020039854 IC socket |
| 04/04/2002 | US20020039804 Process of making an integrated circuit using parallel scan paths |
| 04/04/2002 | US20020039802 Fabrication method of semiconductor integrated circuit device and its testing apparatus |
| 04/04/2002 | US20020039800 Burn-in method and burn-in device |
| 04/04/2002 | US20020039316 Semiconductor memory device operating at high speed with low current consumption |
| 04/04/2002 | US20020039032 Testing method and testing device for semiconductor integrated circuits |
| 04/04/2002 | US20020039031 Intellectual testing system for testing packages |
| 04/04/2002 | US20020039030 System, method, and apparatus for product diagnostic and evaluation testing |
| 04/04/2002 | US20020039028 Noncontact signal analyzer |
| 04/04/2002 | US20020039026 Power line testing device with signal generator and signal detector |
| 04/04/2002 | US20020039022 Calibration device for semiconductor testing apparatus, calibration method and semiconductor testing apparatus |
| 04/04/2002 | US20020038779 Method for sorting integrated circuit devices |
| 04/04/2002 | DE10146161A1 Fault diagnostic apparatus for detecting faults in electronic control system for motor vehicle has analyzer which detects presence of communication in elements |
| 04/04/2002 | DE10142855A1 Jitter measurement unit combines analog to digital converter, band pass filter, null crossing detector, period estimator, period difference estimator, peak to peak detector and root mean square detector |
| 04/04/2002 | DE10108044A1 Testing method for semiconductor memory device identifies defective memory addresses by comparing read out bit data with written-in bit data |
| 04/04/2002 | DE10042770C1 HV testing method for electric vacuum cleaner uses test pin in form of soft carbon fibre brush for contacting fixing screws for vacuum cleaner housing parts and/or joints between latter |
| 04/03/2002 | EP1193907A2 Network test instrument |
| 04/03/2002 | EP1193803A1 IC socket |
| 04/03/2002 | EP1193725A1 Method for diagnosing abnormal condition of isolation transformer and device therefor |
| 04/03/2002 | EP1193716A1 Error catch RAM for memory tester has SDRAM memory sets configurable for size and speed |
| 04/03/2002 | EP1193503A1 Automated testing of hybrid actuator |
| 04/03/2002 | EP1193502A2 Apparatus and method for performing conditional calculations |
| 04/03/2002 | EP1193501A2 Testing unit for connector testing |
| 04/03/2002 | EP1192475A2 Method and apparatus for testing a video display chip |
| 04/03/2002 | EP1038225B1 Parallel test method |
| 04/03/2002 | EP1038223B1 Monitoring system for a digital trimming cell |
| 04/03/2002 | EP1008144B1 Method for monitoring the operating condition of an integrated circuit |
| 04/03/2002 | EP0927356B1 Method of checking electrical components and device for carrying out this method |
| 04/03/2002 | EP0866979B1 Method for displaying a "low battery" state in electrical equipment with electrical energy stores and electrical equipment with electrical energy stores with means for displaying a "low battery" state |
| 04/03/2002 | EP0797794B1 A voltage reference arrangement, a voltameter, a battery voltage detection arrangement, and a wireless communication device |
| 04/03/2002 | EP0685075B1 Device for testing connections provided with pulling resistors |
| 04/03/2002 | CN2484573Y Detector for electronic regulator of automobile engine |
| 04/03/2002 | CN2484571Y Electromagnetic-ware radiation eleminator |
| 04/03/2002 | CN1343320A Liquid crystal display and its inspecting method |
| 04/03/2002 | CN1342907A System and method for screening ICT test blindspots to make mask board for visual check |
| 04/03/2002 | CN1082302C Method for testing electronic circuit and testable integrated circuit using the method |
| 04/03/2002 | CN1082270C Intelligent protector of accumulators for diesel locomotive |
| 04/02/2002 | US6367043 Implementation of signature analysis for analog and mixed signal circuits |
| 04/02/2002 | US6367042 Testing methodology for embedded memories using built-in self repair and identification circuitry |
| 04/02/2002 | US6367041 Self-adaptive test program |
| 04/02/2002 | US6367039 Method and apparatus for testing adjustment of a circuit parameter |
| 04/02/2002 | US6366867 Method and apparatus for providing controllable compensation factors to a compensated driver circuit which may be used to perform testing of the structural integrity of the compensated driver circuit |
| 04/02/2002 | US6366865 Apparatus and method for estimating the coil resistance in an electric motor |
| 04/02/2002 | US6366688 Apparatus and method for contact failure inspection in semiconductor devices |
| 04/02/2002 | US6366209 Method and apparatus for early detection of reliability degradation of electronic devices |
| 04/02/2002 | US6366208 Diagnostic functions for power supply |
| 04/02/2002 | US6366154 Method and circuit to perform a trimming phase |
| 04/02/2002 | US6366118 Antifuse repair circuit |
| 04/02/2002 | US6366115 Buffer circuit with rising and falling edge propagation delay correction and method |
| 04/02/2002 | US6366112 Probe card having on-board multiplex circuitry for expanding tester resources |
| 04/02/2002 | US6366111 Test circuit for semiconductor IC device |
| 04/02/2002 | US6366109 Semiconductor device testing system and method |
| 04/02/2002 | US6366108 System and method for detecting defects within an electrical circuit by analyzing quiescent current |
| 04/02/2002 | US6366107 Loading mechanism for automated verification and repair station |
| 04/02/2002 | US6366105 Electrical test apparatus with gas purge |
| 04/02/2002 | US6366103 Multiple test probe system |
| 04/02/2002 | US6366102 Wafer probing machine |
| 04/02/2002 | US6366101 Method for laser analysis from the back side an electronic circuit formed on the front side of a semiconductor |
| 04/02/2002 | US6366100 Apparatus and method for testing circuit board |
| 04/02/2002 | US6366098 Test structure, integrated circuit, and test method |
| 04/02/2002 | US6366097 Technique for the measurement of reflection coefficients in stored energy systems |
| 04/02/2002 | US6366095 Method and device for detecting and locating irregularities in a dielectric |
| 04/02/2002 | US6366057 Charging method of rechargeable battery |
| 04/02/2002 | US6366054 Method for determining state of charge of a battery by measuring its open circuit voltage |
| 04/02/2002 | US6365991 Method and structure for measurement of a multiple-power-source device during a test mode |
| 04/02/2002 | US6365914 Semiconductor device provided with a built-in minute charge detecting circuit |
| 04/02/2002 | US6365861 Method for sorting integrated circuit devices |
| 04/02/2002 | US6365860 Method for sorting integrated circuit devices |
| 04/02/2002 | US6365825 Reverse biasing apparatus for solar battery module |
| 04/02/2002 | US6365423 Method of inspecting a depth of an opening of a dielectric material layer |
| 04/02/2002 | US6365421 Method and apparatus for storage of test results within an integrated circuit |
| 04/02/2002 | US6364386 Apparatus and method for handling an integrated circuit |
| 04/02/2002 | CA2248610C A method and a device for space-charge measurement in cables using a pulsed electroacoustic method |
| 03/28/2002 | WO2002025301A1 Testing system in a circuit board manufacturing line for automatic testing of circuit boards |
| 03/28/2002 | WO2002025300A1 Testing system in a circuit boardmanufacturing line for automatic testing of circuit boards |
| 03/28/2002 | WO2002025299A1 Electronic circuit and method for testing a line |
| 03/28/2002 | WO2002025298A1 Inspection unit and method of manufacturing substrate |
| 03/28/2002 | WO2002025297A1 Method of selecting electrolytes for high capacity electric energy accumulators |
| 03/28/2002 | WO2002025296A2 Method and system for wafer and device-level testing of an integrated circuit |
| 03/28/2002 | WO2002025294A1 Method and apparatus for measuring liquid dielectric behavior |
| 03/28/2002 | WO2002025293A1 Radio paging multifunctional watt-hour meter |
| 03/28/2002 | WO2002025292A2 Manipulator for a test head with active compliance |
| 03/28/2002 | WO2002024400A2 Electronic test head positioner |
| 03/28/2002 | WO2001098901A3 Method and device for optimising a test programme |
| 03/28/2002 | WO2001095326A3 System and method for terminal short detection |