| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/16/2002 | US6372627 Method and arrangement for characterization of focused-ion-beam insulator deposition |
| 04/16/2002 | US6372529 Forming elongated probe points useful in testing semiconductor devices |
| 04/16/2002 | US6372528 Burn-in method and burn-in device |
| 04/16/2002 | US6371782 Sliding contact for electrical connections |
| 04/16/2002 | US6370948 Mini-tension tester |
| 04/16/2002 | US6370766 Manufacture of printed circuit cards |
| 04/11/2002 | WO2002029856A2 A testing device for semiconductor components and a method of using the same |
| 04/11/2002 | WO2002029825A2 Method to descramble the data mapping in memory circuits |
| 04/11/2002 | WO2002029824A2 System and method for testing integrated circuit devices |
| 04/11/2002 | WO2002029748A1 Apparatus and circuit for use with capacitive presence detection systems |
| 04/11/2002 | WO2002029747A1 Apparatus for use with capacitive presence detection systems |
| 04/11/2002 | WO2002029569A2 A system and method to enhance manufacturing test failure analysis with dedicated pins |
| 04/11/2002 | WO2002029568A2 A test access port (tap) controller system and method to debug internal intermediate scan test faults |
| 04/11/2002 | WO2002029428A2 Docking system for connecting a tester to a probe station using an a-type docking configuration |
| 04/11/2002 | WO2002029422A2 A scan test system and method for manipulating logic values that remain constant during normal operations |
| 04/11/2002 | WO2002029383A2 Optical inspection system having integrated component learning |
| 04/11/2002 | WO2002029357A2 Method and apparatus for evaluating integrated circuit packages having three dimensional features |
| 04/11/2002 | WO2002013259A3 Method and apparatus for measuring parameters of an electronic device |
| 04/11/2002 | WO2002001698A3 Alternator testing method and system using ripple detection |
| 04/11/2002 | WO2001077698A9 Power line testing device with signal generator and signal detector |
| 04/11/2002 | WO2001069604A3 Automated reference cell trimming verify |
| 04/11/2002 | US20020042898 Test interface for verification of high speed embedded synchronous dynamic random access memory (SDRAM) circuitry |
| 04/11/2002 | US20020042746 Programmable voltage divider and method for testing the impedance of a programmable element |
| 04/11/2002 | US20020042684 Point of use digital electric energy apparatus with uninterruptible telephone communication |
| 04/11/2002 | US20020042683 Point of use digital electric energy apparatus with real-time dual channel metering |
| 04/11/2002 | US20020041800 Apparatus for automatic loading of sleeve on device testing apparatus |
| 04/11/2002 | US20020041529 Semiconductor integrated circuit and operating method |
| 04/11/2002 | US20020041475 Method and device for detecting a fault current across a piezoelectric actuator of an injector or its high voltage supply lead |
| 04/11/2002 | US20020041242 Semiconductor apparatus |
| 04/11/2002 | US20020041190 Current measuring method and current measuring apparatus |
| 04/11/2002 | US20020041189 Vertical probe card |
| 04/11/2002 | US20020041188 Method and apparatus for inspecting printed wiring boards |
| 04/11/2002 | US20020041187 Procedure and device for the evaluation of the quality of a cable |
| 04/11/2002 | US20020041181 Device test handler and method for operating the same |
| 04/11/2002 | US20020040809 Multilayer type printed-wiring board and method of measuring impedance of multilayer type printed-wiring board |
| 04/11/2002 | DE10148164A1 Zerstörungsfreies Verfahren zur Qualitätskontrolle von Hochspannungssystemen und Vorrichtung zur Verwendung des Verfahrens Non-destructive methods for quality control of high voltage systems and apparatus for using the method |
| 04/11/2002 | DE10132241A1 Verfahren und Vorrichtung zum Testen von Halbleiterbauelementen A method and apparatus for testing semiconductor devices |
| 04/11/2002 | DE10049495A1 Determination of motor vehicle battery condition from the battery internal resistance by measurement of the voltage across the battery during start-up |
| 04/11/2002 | DE10047548A1 Verfahren und Vorrichtung zum Ermitteln der Qualität eines Kabels Method and device for determining the quality of a cable |
| 04/11/2002 | CA2424159A1 Apparatus for use with capacitive presence detection systems |
| 04/11/2002 | CA2424104A1 Apparatus and circuit for use with capacitive presence detection systems |
| 04/11/2002 | CA2419939A1 System and method for testing integrated circuit devices |
| 04/10/2002 | EP1195861A2 Aging in tunable semiconductor lasers |
| 04/10/2002 | EP1195771A2 Differential voltage sense circuit to detect the state of a CMOS process compatible fuses at low supply voltages |
| 04/10/2002 | EP1195613A1 Functionality testing of programmed devices |
| 04/10/2002 | EP1195021A2 Phy control module for a multi-pair gigabit transceiver |
| 04/10/2002 | EP1194857A1 Method for marking a hardware variant of an electrical or electronic hardware unit |
| 04/10/2002 | EP1194787A1 Data carrier module having indication means for indicating the result of a test operation |
| 04/10/2002 | EP1194784A2 Temperature compensated vertical pin probing device |
| 04/10/2002 | EP1042651B1 Electrode integrity checking |
| 04/10/2002 | EP0939908A4 Combined laser/flir optics system |
| 04/10/2002 | EP0922321B1 Circuit arrangement for monitoring of an electronic tripping device for low voltage switches |
| 04/10/2002 | EP0639812B1 Apparatus for synchronizing asynchronous circuits for testing operations |
| 04/10/2002 | EP0621649B1 Battery pack |
| 04/10/2002 | CN2485660Y Indicator for circuit faults |
| 04/10/2002 | CN2485659Y Device for testing voltageover performance of holiday lights automatically |
| 04/10/2002 | CN2485182Y Intellectual automotive light faults inspector |
| 04/10/2002 | CN1344433A Monitoring internal parameters of electrical motor systems |
| 04/10/2002 | CN1344416A Device and method for carrying out built-in self-test of electronic circuit |
| 04/10/2002 | CN1343901A Support frame of displaying panel or detector block |
| 04/10/2002 | CN1082668C Semiconductor device testing appts. |
| 04/10/2002 | CN1082667C Appts. for measuring pulse duration |
| 04/09/2002 | US6370676 On-demand process sorting method and apparatus |
| 04/09/2002 | US6370675 Semiconductor integrated circuit design and evaluation system using cycle base timing |
| 04/09/2002 | US6370665 Semiconductor integrated circuit and recording medium |
| 04/09/2002 | US6370664 Method and apparatus for partitioning long scan chains in scan based BIST architecture |
| 04/09/2002 | US6370663 Semiconductor integrated circuit |
| 04/09/2002 | US6370662 Modifying circuit designs running from both edges of clock to run from positive edge |
| 04/09/2002 | US6370658 Device for testing digital signal processor in digital video disc reproducing apparatus |
| 04/09/2002 | US6370252 Circuit arrangement for testing the connection of a sound reproducing device to a sound signal source |
| 04/09/2002 | US6370069 Method for testing a multiplicity of word lines of a semiconductor memory configuration |
| 04/09/2002 | US6369856 Synchronous signal detection circuit and method |
| 04/09/2002 | US6369636 Method, architecture and circuit for selecting, calibrating and monitoring circuits |
| 04/09/2002 | US6369603 Radio frequency coupling apparatus and method for measuring minority carrier lifetimes in semiconductor materials |
| 04/09/2002 | US6369601 Method of measuring a propagation delay time through a transmission path in a semiconductor integrated circuit testing apparatus and semiconductor integrated circuit testing apparatus using the same |
| 04/09/2002 | US6369599 Circuit and a method for configuring pad connections in an integrated device |
| 04/09/2002 | US6369597 Method and apparatus for capacitively testing a semiconductor die |
| 04/09/2002 | US6369593 Load board test fixture |
| 04/09/2002 | US6369592 Probe for testing and repairing printed circuit features |
| 04/09/2002 | US6369591 Apparatus and method using photoelectric effect for testing electrical traces |
| 04/09/2002 | US6369590 Apparatus and method using photoelectric effect for testing electrical traces |
| 04/09/2002 | US6369585 System and method for tuning a resonant structure |
| 04/09/2002 | US6369582 System and method for off-line impulse frequency response analysis test |
| 04/09/2002 | US6369580 Electrode pattern inspection device and method for detecting voltage variation |
| 04/09/2002 | US6369578 State of health for automotive batteries |
| 04/09/2002 | US6369577 Electronic battery tester |
| 04/09/2002 | US6369576 Battery pack with monitoring function for use in a battery charging system |
| 04/09/2002 | US6369562 Electro-optical probe for oscilloscope measuring signal waveform |
| 04/09/2002 | US6369547 Method of correcting battery remaining capacity |
| 04/09/2002 | US6369445 Method and apparatus for edge connection between elements of an integrated circuit |
| 04/09/2002 | US6369407 Semiconductor device |
| 04/09/2002 | US6368188 Alternate method and device for analysis of flip chip electrical connections |
| 04/09/2002 | US6368137 Vertically actuated BGA socket |
| 04/09/2002 | US6367763 Test mounting for grid array packages |
| 04/04/2002 | WO2002027982A1 Device and method for measuring high-frequency parameters of an electronic circuit having an antenna connected thereto |
| 04/04/2002 | WO2002027869A1 Conductive contactor with movable guide plate |
| 04/04/2002 | WO2002027343A1 Method of detecting residual capacity of secondary battery |
| 04/04/2002 | WO2002027342A2 Measurement of fuel cell impedance |
| 04/04/2002 | WO2002027340A2 Method and system for testing and/or diagnosing circuits using test controller access data |
| 04/04/2002 | WO2002027339A1 An apparatus for testing an electrical device |