| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/23/2002 | US6377051 Relay test set using computer controlled voltage supply to stimulate both voltage and current transformers |
| 04/23/2002 | US6377036 Electro-optic sampling oscilloscope |
| 04/23/2002 | US6377035 Method of detecting an abrupt variation in an electrical alternating quantity |
| 04/23/2002 | US6376906 Mounting structure of semiconductor element |
| 04/23/2002 | US6376263 Non-destructive module placement verification |
| 04/23/2002 | US6375476 LGA package socket |
| 04/23/2002 | CA2353950C A reconfigurable integrated circuit with integrated debugging facilities for use in an emulation system |
| 04/19/2002 | CA2358738A1 Method and device for automatic adjustment of printed circuit board conveying means in a test machine |
| 04/18/2002 | WO2002031791A1 Method and device for in-use detecting low cranking strength of a combustion engine battery during engine starting |
| 04/18/2002 | WO2002031521A1 Method for operating a tap controller and corresponding tap controller |
| 04/18/2002 | WO2002031520A2 Stress-test information database structure and method of use |
| 04/18/2002 | WO2002031519A2 Automated monitoring system, virtual oven and method for stress testing logically grouped modules |
| 04/18/2002 | WO2002031518A2 Conversion board for dual handlers and single site device interface boards |
| 04/18/2002 | WO2002031516A1 Module for a testing device for testing printed circuit boards |
| 04/18/2002 | WO2002010783A3 Test systems for wireless-communications devices |
| 04/18/2002 | WO2002004965A3 Load board feeder |
| 04/18/2002 | WO2002001235A3 Testing device with a cdm simulator for providing a rapid discharge |
| 04/18/2002 | WO2002001234A3 System for calibrating timing of an integrated circuit wafer tester |
| 04/18/2002 | WO2001094955A3 Scanning electro-optic near field device and method of scanning |
| 04/18/2002 | WO2001067071B1 Evaluating a property of a multilayered structure |
| 04/18/2002 | WO2001004643A3 Wafer-level burn-in and test cartridge and methods |
| 04/18/2002 | US20020046391 Method for generating behavior model description of circuit and apparatus for logic verification |
| 04/18/2002 | US20020046388 Semiconductor integrated circuitry |
| 04/18/2002 | US20020046377 Method for built-in self test of an electronic circuit |
| 04/18/2002 | US20020046376 Method of generating test pattern for integrated circuit |
| 04/18/2002 | US20020046375 Tap and linking module for scan access of multiple cores with IEEE 1149.1 test access ports |
| 04/18/2002 | US20020046374 Method of testing memory device, method of manufacturing memory device, apparatus for testing memory device, method of testing memory module, method of manufacturing memory module, apparatus for testing memory module and method of manufacturing computer |
| 04/18/2002 | US20020046361 Intelligent binning for electrically repairable semiconductor chips |
| 04/18/2002 | US20020046004 General method for tracking the evolution of hidden damage or other unwanted changes in machinery components and predicting remaining useful life |
| 04/18/2002 | US20020045997 Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time |
| 04/18/2002 | US20020045996 Line tester |
| 04/18/2002 | US20020045995 Electromagnetic interference analysis method and apparatus |
| 04/18/2002 | US20020045993 Point of use digital electric energy apparatus with wireless communication port |
| 04/18/2002 | US20020045992 Point of use digital electric energy apparatus and method for measuring out-of-specification energy |
| 04/18/2002 | US20020045379 Testing unit and a connector testing apparatus using the same |
| 04/18/2002 | US20020044864 Method of delivering target object to be processed, table mechanism of target object and probe apparatus |
| 04/18/2002 | US20020044474 Semiconductor test apparatus |
| 04/18/2002 | US20020044124 Display panel, display panel inspection method, and display panel manufacturing method |
| 04/18/2002 | US20020044053 Semiconductor device and test method therefor |
| 04/18/2002 | US20020043987 Semiconductor test apparatus |
| 04/18/2002 | US20020043982 Apparatus for inspecting display board or circuit board |
| 04/18/2002 | US20020043981 Wafer probe station for low-current measurements |
| 04/18/2002 | US20020043980 Multiple-chip probe and universal tester contact assemblage |
| 04/18/2002 | US20020043979 Semiconductor testing apparatus |
| 04/18/2002 | US20020043978 Outlet heat indicator |
| 04/18/2002 | US20020043971 Ringing preventive circuit, device under test board, pin electronics card, and semiconductor device |
| 04/18/2002 | US20020043970 Method for inspecting electrical properties of a wafer and apparatus therefor |
| 04/18/2002 | US20020043628 Apparatus for detecting defects in semiconductor devices and methods of using the same |
| 04/18/2002 | DE19924242C2 Vektorrestauration mit beschleunigter Validation und Verfeinerung Vector restoration accelerated validation and refinement |
| 04/18/2002 | DE10143175A1 Spannfutter zum Halten einer zu testenden Vorrichtung A chuck for supporting a device under test |
| 04/18/2002 | DE10143174A1 Meßstation Measuring station |
| 04/18/2002 | DE10051357A1 Device for testing solar cells has matrix of essentially monochromatic solid state light sources radiating in preferred spectral sensitivity range, driver with current amplitude regulator |
| 04/18/2002 | DE10051077A1 Method for characterization and documentation of analogue circuits, ASICs, at the design phase using an analogue design computer and simulation modules for testing prior to circuit production |
| 04/17/2002 | EP1198001A2 Method of testing and mounting devices using a resilient contact structure |
| 04/17/2002 | EP1197861A2 System and method for diagnosing and validating a machine over a network using waveform data |
| 04/17/2002 | EP1197759A2 Semiconductor apparatus for providing reliable data analysis of signals |
| 04/17/2002 | EP1197758A2 Semiconductor integrated device with shuntable low pass filter at its inputs |
| 04/17/2002 | EP1197756A2 Probe card for testing integrated circuits |
| 04/17/2002 | EP1196790A1 Apparatus and method for temperature control of ic device during test |
| 04/17/2002 | EP1196789A1 Use of converging beams for transmitting electromagnetic energy to power devices for die testing |
| 04/17/2002 | EP1135859A4 Method and apparatus for logic synchronization |
| 04/17/2002 | EP1016089B1 Memory tester with data compression |
| 04/17/2002 | EP0943926B1 Instrument for measuring voltages of cells |
| 04/17/2002 | EP0715745B1 Device for triggering a warning device |
| 04/17/2002 | CN2486976Y Composite needle board of curing tools |
| 04/17/2002 | CN1345507A Portable multi-band communication device and method for determining charge consumption thereof |
| 04/17/2002 | CN1345177A Chip transfering device and method |
| 04/17/2002 | CN1345087A Contact component and its manufacture and probe contact assembly using the contact component |
| 04/17/2002 | CN1345086A Manufacture and testing apparatus for semiconductor integrated circuit device |
| 04/17/2002 | CN1345068A Circuit device and method for accelerated ageing in magnetoresistance memory |
| 04/17/2002 | CN1344941A In-situ generator rotor monitoring instrument |
| 04/17/2002 | CN1344940A Testing method and device of semiconductor integrated circuit |
| 04/17/2002 | CN1344939A Electronic conductivity testing method and manufacturing device of joint distributing comobination |
| 04/17/2002 | CN1344936A Measuring system and method for industrial frequency current in opened magnetic path |
| 04/17/2002 | CA2359201A1 Diagnostic tool graphical display apparatus |
| 04/16/2002 | US6374392 Semiconductor test system |
| 04/16/2002 | US6374380 Boundary scan cells to improve testability of core-embedded circuits |
| 04/16/2002 | US6374379 Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment |
| 04/16/2002 | US6374378 Failure analysis memory for semiconductor memory testing devices and its storage method |
| 04/16/2002 | US6374376 Circuit, system and method for arranging data output by semiconductor testers to packet-based devices under test |
| 04/16/2002 | US6373900 Multi-pair transceiver decoder system with low computation slicer |
| 04/16/2002 | US6373762 Programmable voltage divider and method for testing the impedance of a programmable element |
| 04/16/2002 | US6373744 Ferroelectric memory |
| 04/16/2002 | US6373420 Analog-to-digital converter with capability of outputting comparison results on bit at a time during testing |
| 04/16/2002 | US6373274 Characteristic evaluation apparatus for insulated gate type transistors |
| 04/16/2002 | US6373272 Arrangement for the testing of semiconductor structures |
| 04/16/2002 | US6373271 Semiconductor wafer front side pressure testing system and method therefor |
| 04/16/2002 | US6373270 Product carrier for environmental test system |
| 04/16/2002 | US6373268 Test handling method and equipment for conjoined integrated circuit dice |
| 04/16/2002 | US6373267 Ball grid array-integrated circuit testing device |
| 04/16/2002 | US6373266 Apparatus and method for determining process width variations in integrated circuits |
| 04/16/2002 | US6373260 Single cable, single point, stimulus and response probing system and method |
| 04/16/2002 | US6373259 Connector testing system having a test prong including a projection |
| 04/16/2002 | US6373258 Non-contact board inspection probe |
| 04/16/2002 | US6373257 Arc fault circuit interrupter |
| 04/16/2002 | US6373256 Programmable low battery detector |
| 04/16/2002 | US6373255 Diagnostic tester for multi-ballast lighting fixture |
| 04/16/2002 | US6373227 Charging and discharging control circuit and charging type power supply device |
| 04/16/2002 | US6373143 Integrated circuit having wirebond pads suitable for probing |
| 04/16/2002 | US6373011 Method for sorting integrated circuit devices |