| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/30/2002 | US6380557 Test chip for evaluating fillers of molding material with dams formed on a semiconductor substrate to define slits for capturing the fillers |
| 04/30/2002 | US6380492 Contact film used for devices having ball grid array structure and device mounting structure |
| 04/30/2002 | US6379183 Adapter usable with an electronic interconnect for high speed signal and data transmission |
| 04/27/2002 | CA2359883A1 Method of determining the output capacitance of a voltage supply device |
| 04/25/2002 | WO2002033941A1 Method and apparatus for testing voice and data lines in a telecommunication system |
| 04/25/2002 | WO2002033773A1 Battery operable device with battery state-of-charge indicator |
| 04/25/2002 | WO2002033768A1 Battery pack and its tester |
| 04/25/2002 | WO2002033597A1 Electronic device designing supporting apparatus, electronic device designing supporting method, electronic device manufacturing method, and program |
| 04/25/2002 | WO2002033433A2 Built-in-self-test circuitry for testing a phase locked loop circuit |
| 04/25/2002 | WO2002033431A1 Device for testing an electromechanical apparatus and method for determining means constituting such a device |
| 04/25/2002 | WO2002033430A1 Device for testing solar cells |
| 04/25/2002 | WO2001097340A3 Apparatus and method for producing an ion channel microprobe |
| 04/25/2002 | WO2001096887A3 Method for measuring fault locations in high frequency cables and lines |
| 04/25/2002 | WO2001092904A3 Ate timing measurement unit and method |
| 04/25/2002 | WO2001084170A3 Source synchronous link integrity validation |
| 04/25/2002 | WO2001073929A3 Apparatus for reducing power supply noise in an integrated circuit |
| 04/25/2002 | WO2001067601A3 Test circuit configuration and method for testing a large number of transistors |
| 04/25/2002 | US20020049945 IC test system and storage medium for the same |
| 04/25/2002 | US20020049944 Vitaly lagoon and guy barruch |
| 04/25/2002 | US20020049943 Semiconductor test system |
| 04/25/2002 | US20020049942 Analog/digital characteristics testing device and IC testing apparatus |
| 04/25/2002 | US20020049941 Method and apparatus for properly disabling high current parts in a parallel test environment |
| 04/25/2002 | US20020049940 Method of testing an integrated circuit having a flexible timing control |
| 04/25/2002 | US20020049929 Humanity interface development system of testing program of circuit board |
| 04/25/2002 | US20020049928 1149.1TAP linking modules |
| 04/25/2002 | US20020049927 Semiconductor integrated circuit |
| 04/25/2002 | US20020049558 JTAG testing arrangement |
| 04/25/2002 | US20020049554 Cross-correlation timing calibration for wafer-level IC tester interconnect systems |
| 04/25/2002 | US20020048973 Contact structure and production method thereof and probe contact assembly using same |
| 04/25/2002 | US20020048954 Contact structure and production method thereof and probe contact assembly using same |
| 04/25/2002 | US20020048946 Local interconnect structures for integrated circuits and methods for making the same |
| 04/25/2002 | US20020048856 Method of testing a semiconductor memory device |
| 04/25/2002 | US20020048830 Plurality of strips for uniform polishing pressure |
| 04/25/2002 | US20020048827 Semiconductor-package measuring method, measuring socket, and semiconductor package |
| 04/25/2002 | US20020048826 Wafer level burn-in and electrical test system and method |
| 04/25/2002 | US20020048205 Dynamic random access memory |
| 04/25/2002 | US20020048191 Semiconductor device and testing method thereof |
| 04/25/2002 | US20020047965 Reflection liquid crystal display, method for producing the same, and method for driving the same |
| 04/25/2002 | US20020047797 Monitoring circuit |
| 04/25/2002 | US20020047724 Multi-state test structures and methods |
| 04/25/2002 | US20020047723 Arrangement for testing integrated circuits |
| 04/25/2002 | US20020047722 Contact-less probe of semiconductor wafers |
| 04/25/2002 | US20020047719 Automated testing of hybrid actuator |
| 04/25/2002 | US20020047714 Abnormality diagnosis method and apparatus for separable transformer |
| 04/25/2002 | US20020047711 Method and apparatus for testing cells and batteries embedded in series/parallel systems |
| 04/25/2002 | US20020047703 Method and device for automatic adjustment of printed circuit board conveying means in a test machine |
| 04/25/2002 | US20020047702 Temperature-controlled thermal platform for automated testing |
| 04/25/2002 | US20020047565 Apparatus and method for evaluating organic EL display |
| 04/25/2002 | US20020047192 Test circuit and multi-chip package type semiconductor device having the test circuit |
| 04/25/2002 | US20020047137 Semiconductor integrated circuit device having hierarchical test interface circuit |
| 04/25/2002 | US20020047092 Transmission line parasitic element discontinuity cancellation |
| 04/25/2002 | US20020046598 System and method for verifying wire harness connections in a fuel injector assembly |
| 04/25/2002 | DE10149189A1 Device test handler e.g. for semiconductor packages has indexing mechanism which transports devices from shuttle located at test loading position to testing socket and from socket to shuttle at test unloading position |
| 04/25/2002 | DE10147910A1 Method for testing a memory device under test on a memory tester applies the same sequence of transmission vectors to a memory under test and to a main memory within the memory tester comparing sample test data for both. |
| 04/25/2002 | DE10144645A1 Device for manipulating address information in a memory tester controls address channels in the memory tester with address registers storing logical address bits, replacement bits, a bit selector and a vector processor. |
| 04/25/2002 | DE10126878A1 Halbleitervorrichtung Semiconductor device |
| 04/25/2002 | DE10105251A1 Electronic component for testing the integrity of a soldered joint on a printed circuit board imparts signal impulse to component pin and derives a correlation value from the reflected signal |
| 04/25/2002 | DE10103961A1 Process and assembly to test an integrated circuit assembly using both analogue and digital signals |
| 04/25/2002 | DE10048962A1 Portable test meter for high voltage and high current has digital signal processor and computer |
| 04/25/2002 | DE10047648A1 Device for use in powerline communications or PLC systems has arrangement for implementing test mode whereby PLC device emits test signals irrespective of other components |
| 04/24/2002 | EP1199767A1 Battery operable device with battery state-of-charge indicator |
| 04/24/2002 | EP1199726A1 Method to test integrated circuits |
| 04/24/2002 | EP1199576A1 Device for testing solar cells |
| 04/24/2002 | EP1199575A1 A testing unit and a connector testing apparatus using the same |
| 04/24/2002 | EP1199571A2 Apparatus for inspecting display board or circuit board |
| 04/24/2002 | EP1199570A2 Method and device for automatic adjustment of printed circuit board conveying means in a test machine |
| 04/24/2002 | EP1198748A2 A system, method and apparatus pertaining to flexible selection scan test |
| 04/24/2002 | EP1198717A1 Apparatus and method for fault detection on conductors |
| 04/24/2002 | EP1198715A1 Method and device for individually determining the ageing condition of a capacitor |
| 04/24/2002 | EP1012613B1 Method and device for charging integrated circuits and structures with a pulsed high intensity current |
| 04/24/2002 | CN2488070Y Inductive network line detecting pen |
| 04/24/2002 | CN1346492A Device for weighting the cell resistances in magnetoresistive memory |
| 04/24/2002 | CN1346467A System for monitoring connection pattern of data ports |
| 04/24/2002 | CN1346444A Consumer usage recorder |
| 04/24/2002 | CN1346443A Rapid determination of present and potential battery capacity |
| 04/24/2002 | CN1346090A Automatic insert method for semiconductor circuit and easifying circuit test |
| 04/24/2002 | CN1083578C Device for testing protection relay connected with non-magnetic sensor |
| 04/24/2002 | CN1083577C Processor contact checking device and method of testing integrated circuit devices |
| 04/23/2002 | US6378098 Semiconductor test system |
| 04/23/2002 | US6378096 On-line partitioning for sequential circuit test generation |
| 04/23/2002 | US6378095 Dual mode memory for IC terminals |
| 04/23/2002 | US6378094 Method and system for testing cluster circuits in a boundary scan environment |
| 04/23/2002 | US6378093 Controller for scan distributor and controller architecture |
| 04/23/2002 | US6378092 Integrated circuit testing |
| 04/23/2002 | US6378091 Test mode circuit capable of surely resetting test mode signals |
| 04/23/2002 | US6378090 Hierarchical test access port architecture for electronic circuits including embedded core having built-in test access port |
| 04/23/2002 | US6378089 Internal guardband for semiconductor testing |
| 04/23/2002 | US6377912 Emulation system with time-multiplexed interconnect |
| 04/23/2002 | US6377901 Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time |
| 04/23/2002 | US6377897 Method and system for dynamic duration burn-in |
| 04/23/2002 | US6377499 Refresh-free semiconductor memory device |
| 04/23/2002 | US6377184 Transmission line safety monitoring system |
| 04/23/2002 | US6377067 Testing method for buried strap and deep trench leakage current |
| 04/23/2002 | US6377066 Method and apparatus for sub-micron imaging and probing on probe station |
| 04/23/2002 | US6377065 Glitch detection for semiconductor test system |
| 04/23/2002 | US6377064 IC device inspection apparatus |
| 04/23/2002 | US6377063 Semiconductor device and burn-in method thereof |
| 04/23/2002 | US6377056 Electrostatic capacitance type dynamical quantity sensor |
| 04/23/2002 | US6377055 Arc fault detector device with two stage arc sensing |
| 04/23/2002 | US6377053 Device for detecting short-circuits |