| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/02/2002 | US20020053064 Dynamic detection and removal of inactive clauses in sat with application in image computation |
| 05/02/2002 | US20020053057 Test pattern compression for an integrated circuit test environment |
| 05/02/2002 | US20020053056 Method and apparatus for testing digital circuitry |
| 05/02/2002 | US20020053055 Semiconductor device having a test mode |
| 05/02/2002 | US20020053048 Semiconductor integrated circuit device |
| 05/02/2002 | US20020053045 Real-time test controller |
| 05/02/2002 | US20020052705 Testing method of semiconductor integrated circuit and equipment thereof |
| 05/02/2002 | US20020052315 Conformationally constrained backbone cyclized somatostatin analogs |
| 05/02/2002 | US20020052055 Non-destructive inspection method |
| 05/02/2002 | US20020051907 Battery terminal unit provided with a current sensor |
| 05/02/2002 | US20020051906 Battery terminal provided with a current sensor |
| 05/02/2002 | US20020051564 Method and device for optically monitoring fabrication processes of finely structured surfaces in a semiconductor production |
| 05/02/2002 | US20020051506 Transmitter circuit comprising timing deskewing means |
| 05/02/2002 | US20020051395 Dynamic register with low clock rate testing capability |
| 05/02/2002 | US20020051391 Integrated circuit having forced substrate test mode with improved substrate isolation |
| 05/02/2002 | US20020050840 Circuit configuration and method for accelerating aging in an MRAM |
| 05/02/2002 | US20020050837 Electronic part inspection device |
| 05/02/2002 | US20020050836 Reduced terminal testing system |
| 05/02/2002 | US20020050835 Method and apparatus for the simultaneous electrical testing of multiple semiconductor devices |
| 05/02/2002 | US20020050834 Apparatus and method for controlling temperature in a device under test using integrated temperature sensitive diode |
| 05/02/2002 | US20020050833 Temperature control of electronic devices using power following feedback |
| 05/02/2002 | US20020050832 Probe contact system having planarity adjustment mechanism |
| 05/02/2002 | US20020050831 Probe station having multiple enclosures |
| 05/02/2002 | US20020050813 Burn-in test method for a semiconductor chip and burn-in test apparatus therefor |
| 05/02/2002 | US20020050809 Power supply apparatus |
| 05/02/2002 | US20020050443 Transferring apparatus for chips and method of use |
| 05/02/2002 | US20020050042 Docking system for connecting a tester to a probe station using an A-type docking configuration |
| 05/02/2002 | EP1202457A1 Method and software for switching off battery supplied electronic devices and mobile telephone equipped therewith |
| 05/02/2002 | EP1202165A2 Generation of cryptographically strong random numbers using MISR registers |
| 05/02/2002 | EP1202071A2 Voltage measurement apparatus |
| 05/02/2002 | EP1202070A2 Method of inspecting an electrical disconnection between circuits |
| 05/02/2002 | EP1202069A2 Non-destructive inspection method |
| 05/02/2002 | EP1202068A2 Method for determining the output capacitance of a voltage supply device |
| 05/02/2002 | EP1202041A1 Procedure and device for endurance testing of electrical systems of a vehicle |
| 05/02/2002 | EP1200963A1 Testing rambus memories |
| 05/02/2002 | EP1200895A1 Extending synchronous busses by arbitrary lengths using native bus protocol |
| 05/02/2002 | EP1200849A1 Assessing a parameter of cells in the batteries of uninterruptable power supplies |
| 05/02/2002 | EP1200847A1 A method and system for detecting arcing faults and testing such system |
| 05/02/2002 | EP1200846A1 Actuator arrangement, especially for controlling an injection valve in an internal combustion engine |
| 05/02/2002 | EP1200844A1 Method and apparatus for detecting slow and small changes of electrical signals including the sign of the changes, and circuit arrangement for the exact detection of the peak value of an alternating voltage |
| 05/02/2002 | EP1200843A1 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 05/02/2002 | EP1200842A1 Automatic test manipulator with support internal to test head |
| 05/02/2002 | EP1110097B1 Terminator unit for wiring networks |
| 05/02/2002 | EP0785513B1 CMOS integrated circuit failure diagnosis apparatus and diagnostic method |
| 05/02/2002 | EP0596909B1 Electrosurgical apparatus for laparoscopic and like procedures |
| 05/02/2002 | DE10142293A1 System for enabling automated test equipment functionality in integrated circuits, has automated test equipment for delivering signal to IC and parametric test circuit |
| 05/02/2002 | DE10053514A1 Function testing of hardware architectures, especially CPU and chipset, or multiprocessor computers, where the minimum number of test vectors to ensure a sufficiently small probability of errors is used |
| 05/02/2002 | DE10052198A1 Method and device for production testing of semiconductor wafers comprising microelectronic components by generation of potential contrast images that are then analyzed for the presence of defects |
| 05/02/2002 | DE10050716A1 Integrated test data matching circuit, has buffer stores acting as interface between high transmission rate tested circuit and low transmission rate testing circuit |
| 05/02/2002 | DE10050707A1 Verfahren zum Betreiben eines TAP-Controllers und entsprechender TAP-Controller Method for operating a TAP controller and corresponding TAP controller |
| 05/02/2002 | DE10049301A1 Modul für eine Prüfvorrichtung zum Testen von Leiterplatten Module for a test apparatus for testing printed circuit boards |
| 05/02/2002 | DE10047900A1 Method and device for measuring HF parameters in an electric circuit with an antenna connected to it has an antenna feed point connected as a short circuit to an earth potential and a triplate line to a transmitter-receiver module |
| 05/02/2002 | CA2425098A1 An improved consumer product kit, and a method of use therefor |
| 05/01/2002 | CN2488773Y Special-purpose electroprobe for car |
| 05/01/2002 | CN1347576A On cell circumferential battery indicator |
| 05/01/2002 | CN1347560A Device for weighting cell resistances in magnetoresistive memory |
| 05/01/2002 | CN1347505A Pass/fail battery indicator |
| 05/01/2002 | CN1347504A Gauge effect battery tester |
| 05/01/2002 | CN1347503A Circuit with built-in self-tester |
| 05/01/2002 | CN1347230A 网络测试仪器 Network Test Equipment |
| 05/01/2002 | CN1347174A Ic插座 Ic Socket |
| 05/01/2002 | CN1347149A Compound integrated circuit design verification method |
| 05/01/2002 | CN1347144A Method for mfg. semiconductor device |
| 05/01/2002 | CN1347143A Spiral contactor and mfg. method thereof, semiconductor detection apparatus using same and electronic element |
| 05/01/2002 | CN1347118A Method for revising defective tunnel node |
| 05/01/2002 | CN1346985A Digital statistic information method for measuring ultra-long local discharge |
| 05/01/2002 | CN1084072C 电源监控集成电路器件及电池组 Power monitoring integrated circuit device and battery pack |
| 05/01/2002 | CN1084070C Controlling system, protection controlling system for power system and storage medium for storing program |
| 05/01/2002 | CN1083984C Method for testing dielectric film reliability |
| 05/01/2002 | CN1083983C Method for performing test mode of electric device |
| 05/01/2002 | CN1083980C Semiconductor-type accelerometer and method for evaluating properties of sensor element formed |
| 04/30/2002 | US6381722 Method and apparatus for testing high speed input paths |
| 04/30/2002 | US6381721 Detecting communication errors across a chip boundary |
| 04/30/2002 | US6381720 Test circuit and method for system logic |
| 04/30/2002 | US6381719 System and method for reducing clock skew sensitivity of a shift register |
| 04/30/2002 | US6381717 Snoopy test access port architecture for electronic circuits including embedded core having test access port with instruction driven wake-up |
| 04/30/2002 | US6381716 System and method for testing devices sensitive to magnetic fields |
| 04/30/2002 | US6381714 Error detection method, error detection apparatus, and network system |
| 04/30/2002 | US6381704 Method and apparatus for altering timing relationships of non-overlapping clock signals in a microprocessor |
| 04/30/2002 | US6381565 Functional logic circuit verification device |
| 04/30/2002 | US6381218 Network controller system that uses directed heartbeat packets |
| 04/30/2002 | US6381195 Circuit, apparatus and method for generating address |
| 04/30/2002 | US6381186 Dynamic random access memory |
| 04/30/2002 | US6381110 Method and apparatus for detecting isolation faults in motor/inverter systems |
| 04/30/2002 | US6380795 Semiconductor integrated circuit |
| 04/30/2002 | US6380785 Method and apparatus for eliminating shoot-through events during master-slave flip-flop scan operations |
| 04/30/2002 | US6380782 Integrated circuit |
| 04/30/2002 | US6380781 Soft error rate tolerant latch |
| 04/30/2002 | US6380780 Integrated circuit with scan flip-flop |
| 04/30/2002 | US6380757 Start pulse rejection for a motor commutation pulse detection circuit |
| 04/30/2002 | US6380756 Burin carrier and semiconductor die assembly |
| 04/30/2002 | US6380755 Testing apparatus for test piece testing method contactor and method of manufacturing the same |
| 04/30/2002 | US6380754 Removable electrical interconnect apparatuses including an engagement proble |
| 04/30/2002 | US6380753 Screening method of semiconductor device and apparatus thereof |
| 04/30/2002 | US6380752 IC socket |
| 04/30/2002 | US6380751 Wafer probe station having environment control enclosure |
| 04/30/2002 | US6380730 Integrated circuit tester having a program status memory |
| 04/30/2002 | US6380729 Testing integrated circuit dice |
| 04/30/2002 | US6380724 Method and circuitry for an undisturbed scannable state element |
| 04/30/2002 | US6380716 Condition monitoring of opportunity charged batteries |