| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/10/2002 | WO2002037128A2 Verification system |
| 05/10/2002 | WO2002009254A3 Battery monitoring system with low power and end-of-life messaging and shutdown |
| 05/10/2002 | WO2001086314A3 Method and circuit for testing dc parameters of circuit input and output nodes |
| 05/10/2002 | WO2001031285A3 Automatic measuring apparatus, automatic measurement data processing and control apparatus, network system, and record medium of automatic measurement processing and control program |
| 05/10/2002 | WO1999053527A3 Method and system for fabricating and testing assemblies containing wire bonded semiconductor dice |
| 05/09/2002 | US20020056061 Circuit for reducing test time and semiconductor memory device including the circuit |
| 05/09/2002 | US20020056060 Physical layer device testing method, physical layer device with test circuits, and transmitting/receiving circuit with test circuits |
| 05/09/2002 | US20020056057 Local heating of memory modules tested on a multi-motherboard tester |
| 05/09/2002 | US20020055284 Socket apparatus for removably mounting electronic packages |
| 05/09/2002 | US20020055193 Process perturbation to measured-modeled method for semiconductor device technology modeling |
| 05/09/2002 | US20020054813 Apparatus for handling integrated circuits and trays for integrated circuits |
| 05/09/2002 | US20020054731 Optical fiber interface for integrated circuit test system |
| 05/09/2002 | US20020054703 Pattern inspection method and apparatus |
| 05/09/2002 | US20020054528 Semiconductor memory testing method and apparatus |
| 05/09/2002 | US20020054526 Semiconductor memory and its test method |
| 05/09/2002 | US20020054507 Nonvolatile semiconductor memory device |
| 05/09/2002 | US20020054209 Method for aligning two objects, method for detecting superimposing state of two objects, and apparatus for aligning two objects |
| 05/09/2002 | US20020053943 Semiconductor integrated circuit device capable of externally monitoring internal voltage |
| 05/09/2002 | US20020053922 Assembly apparatus and method of contactor |
| 05/09/2002 | US20020053921 Semiconductor test apparatus and control method therefor |
| 05/09/2002 | US20020053920 System and method for detecting bonding status of bonding wire of semiconductor package |
| 05/09/2002 | US20020053917 Probe structure and method for manufacturing the same |
| 05/09/2002 | US20020053914 Arc location |
| 05/09/2002 | US20020053913 Integrated semiconductor module with a bridgeable input low-pass filter |
| 05/09/2002 | US20020053912 Method and device of fault location for distribution networks |
| 05/09/2002 | US20020053910 Method and apparatus for measuring pure resistance of in-vehicle battery |
| 05/09/2002 | US20020053896 Fuel cell manager |
| 05/09/2002 | US20020053809 Gripper for picking apparatus of a module IC handler |
| 05/09/2002 | US20020053734 Probe card assembly and kit, and methods of making same |
| 05/09/2002 | US20020053463 Robust, small scale electrical contactor |
| 05/08/2002 | EP1204187A2 Battery charging system |
| 05/08/2002 | EP1204185A2 Procedure and device for recording the operational state of a motor connected to a power grid |
| 05/08/2002 | EP1204166A1 Battery terminal unit with current sensor |
| 05/08/2002 | EP1204165A1 A battery terminal provided with a current sensor |
| 05/08/2002 | EP1203964A2 Battery voltage measurement device |
| 05/08/2002 | EP1203963A2 Battery voltage measurement device |
| 05/08/2002 | EP1203962A2 A test instrument powered video camera |
| 05/08/2002 | EP1203434A1 Method and apparatus for detecting a failed thyristor |
| 05/08/2002 | EP1203202A1 Enhancing voltmeter functionality |
| 05/08/2002 | EP1202774A1 Battery status detection |
| 05/08/2002 | EP0943099B1 Protective pipe element for sheathed cable for verifying the integrity of the sheath |
| 05/08/2002 | EP0935256B1 Test method for writable nonvolatile semiconductor memory device |
| 05/08/2002 | EP0866977B1 Generic interface test adapter |
| 05/08/2002 | EP0856207B1 Power management system |
| 05/08/2002 | DE19721453C2 Prüfgerät zur Leitungsüberprüfung n-adriger Leitungen Tester for testing lines n-core cables |
| 05/08/2002 | DE10053279A1 Verfahren zur Bestimmung der Ausgangskapazität einer Spannungsversorgungsvorrichtung A method for determining the output capacity of a power supply device |
| 05/08/2002 | DE10052692A1 Component handling device has at least one position of transport device in which one holding element is being loaded, one has component being tested and the other is being unloaded |
| 05/08/2002 | DE10052211A1 Test arrangement for integrated circuit memory chips |
| 05/08/2002 | CN2490591Y High-frequency high-voltage generator |
| 05/08/2002 | CN2490590Y Infrared testing device for current leakage |
| 05/08/2002 | CN1348544A System and method for accurately determining remaining battery life |
| 05/08/2002 | CN1348190A Method and apparatus for nondestructive magnetic resistance random access storing unit of memory |
| 05/08/2002 | CN1084478C Method and apparatus for checking electric driving device |
| 05/08/2002 | CN1084477C Installation testing system with cable pivot and its installing method |
| 05/08/2002 | CN1084476C Semiconductor device tester and semiconductor device testing system |
| 05/07/2002 | US6385762 Data reduction using rank-of-ranks methodology |
| 05/07/2002 | US6385750 Method and system for controlling test data volume in deterministic test pattern generation |
| 05/07/2002 | US6385749 Method and arrangement for controlling multiple test access port control modules |
| 05/07/2002 | US6385748 Direct access logic testing in integrated circuits |
| 05/07/2002 | US6385742 Microprocessor debugging mechanism employing scan interface |
| 05/07/2002 | US6385561 Automatic fault location in cabling systems |
| 05/07/2002 | US6385273 Device for testing clock pulse generating circuit |
| 05/07/2002 | US6385237 Non-invasive digital cable test system |
| 05/07/2002 | US6385098 Method and apparatus for supplying regulated power to memory device components |
| 05/07/2002 | US6385084 Semiconductor memory |
| 05/07/2002 | US6384911 Apparatus and method for detecting accuracy of drill holes on a printed circuit board |
| 05/07/2002 | US6384734 Method of controlling IC handler and control system using the same |
| 05/07/2002 | US6384664 Differential voltage sense circuit to detect the state of a CMOS process compatible fuses at low power supply voltages |
| 05/07/2002 | US6384660 Clock control circuit and method |
| 05/07/2002 | US6384629 High-speed programmable interconnect |
| 05/07/2002 | US6384616 Packaging and interconnection of contact structure |
| 05/07/2002 | US6384615 Probe holder for low current measurements |
| 05/07/2002 | US6384613 Wafer burn-in testing method |
| 05/07/2002 | US6384612 Method and apparatus for testing the light output of light emitting devices |
| 05/07/2002 | US6384609 Method of measuring insulation resistance of capacitors |
| 05/07/2002 | US6384608 Battery tester using internal resistance to measure a condition of a battery |
| 05/07/2002 | US6384593 Semiconductor device testing apparatus |
| 05/07/2002 | US6384576 Condition monitoring system for batteries |
| 05/07/2002 | US6384470 Contact terminal element, contact terminal device |
| 05/07/2002 | US6384426 System for testing semiconductor chip leads constrained in dielectric media |
| 05/07/2002 | US6384377 Aging socket, aging cassette and aging apparatus |
| 05/07/2002 | US6384360 IC pickup, IC carrier and IC testing apparatus using the same |
| 05/07/2002 | US6383822 Methodology for testing and qualifying an integrated circuit by measuring an operating frequency as a function of adjusted timing edges |
| 05/07/2002 | US6383031 Keyed electronic interconnect device for high speed signal and data transmission |
| 05/07/2002 | US6383002 Heat sink for an electrical part assembly |
| 05/07/2002 | US6382740 Protective circuit for a controlling element and method for testing the control circuit of a controlling element |
| 05/07/2002 | US6381841 Mechanism for loading a respective fuzz button into each of a high number of button holes within an IC contactor |
| 05/02/2002 | WO2002035677A1 A battery monitoring system |
| 05/02/2002 | WO2002035638A1 Method for early detection of defective single cells in valve controlled batteries |
| 05/02/2002 | WO2002035603A1 Wafer prover device, and ceramic substrate used for wafer prover device |
| 05/02/2002 | WO2002035249A2 Method and apparatus for testing for latch-up in integrated circuits |
| 05/02/2002 | WO2002035248A1 Power transformer transfer function testing |
| 05/02/2002 | WO2002035247A1 System and method for verifying wire harness connections in a fuel injector assembly |
| 05/02/2002 | WO2002035246A1 Monitoring circuit |
| 05/02/2002 | WO2002035220A1 An improved consumer product kit, and a method of use therefor |
| 05/02/2002 | WO2002035169A2 Methods and apparatus for recycling cryogenic liquid or gas from test chamber |
| 05/02/2002 | WO2002012907A3 System, method, and apparatus for electromagnetic compatibility-driven product design |
| 05/02/2002 | WO2002008904A3 System initialization of microcode-based memory built-in self-test |
| 05/02/2002 | WO2001061370A3 Method of measuring the battery level in a mobile telephone |
| 05/02/2002 | WO2001004653A9 Method and apparatus for sub-micron imaging and probing on probe station |