| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/21/2002 | US6392404 Triggered integrated circuit tester |
| 05/21/2002 | US6392403 Integrated wafer stocker and sorter apparatus |
| 05/21/2002 | US6392401 Closely-coupled multiple-winding magnetic induction-type sensor |
| 05/21/2002 | US6392399 Device for measurement of the electrical consumption of a portable data- or signal-processing terminal |
| 05/21/2002 | US6392396 Electromagnetic interference pulse generator for lightning testing of electronic equipment |
| 05/21/2002 | US6392395 Automatic circuit breaker detector |
| 05/21/2002 | US6392389 Method for monitoring and controlling the charging of gastight alkaline rechargeable batteries |
| 05/21/2002 | US6392349 Remote control test apparatus |
| 05/21/2002 | US6392165 Adapter for a ball grid array device |
| 05/21/2002 | US6391667 Power supply unit, semiconductor device testing apparatus and semiconductor device testing method |
| 05/21/2002 | US6390846 Connector checker |
| 05/16/2002 | WO2002039801A2 Device for the targeted displacement of electronic components, using a pivoting mirror |
| 05/16/2002 | WO2002039645A2 Network diagnostic meter |
| 05/16/2002 | WO2002039642A2 Apparatus and method for detecting and calculating ground fault resistance |
| 05/16/2002 | WO2002039629A2 Channel time calibration means |
| 05/16/2002 | WO2002039131A2 Method for locating defects and measuring resistance in a test structure |
| 05/16/2002 | WO2002039129A1 Holding device for electronic part test, and device and method for electronic part test |
| 05/16/2002 | WO2002039128A1 Method and apparatus of nondestructive insulation test for small electric machine |
| 05/16/2002 | WO2002039127A2 Test head actuation system with positioning and compliant modes |
| 05/16/2002 | WO2002039050A1 Sensor for monitoring electronic detonation circuits |
| 05/16/2002 | WO2002027340A3 Method and system for testing and/or diagnosing circuits using test controller access data |
| 05/16/2002 | WO2002014883A3 Analog signal testing circuit and -method |
| 05/16/2002 | WO2001090768A3 Method and apparatus for testing source synchronous integrated circuits |
| 05/16/2002 | WO2001079863A3 Method and apparatus for testing signal paths between an integrated circuit wafer and a wafer tester |
| 05/16/2002 | US20020059547 Semiconductor integrated circuit including a test facilitation circuit for functional blocks intellectual properties and automatic insertion method of the same test facilitation circuit |
| 05/16/2002 | US20020059546 Method of generating a pattern for testing a logic circuit and apparatus for doing the same |
| 05/16/2002 | US20020059040 Network diagnostic meter |
| 05/16/2002 | US20020059035 Diagnosis method and diagnosis apparatus of photovoltaic power system |
| 05/16/2002 | US20020059020 Failure diagnosis apparatus and failure diagnosis method of vehicular electronic control system |
| 05/16/2002 | US20020058346 TFI probe I/O wrap test method |
| 05/16/2002 | US20020058343 Evaluation method of ferroelectric capacitor and wafer mounted with evaluation element |
| 05/16/2002 | US20020057831 Pattern inspection method and apparatus |
| 05/16/2002 | US20020057830 Method and apparatus for inspection of assemblies |
| 05/16/2002 | US20020057546 Semiconductor integrated circuit device having pseudo-tuning function |
| 05/16/2002 | US20020057108 Semiconductor integrated circuit |
| 05/16/2002 | US20020057099 Contactor, method for manufacturing the same, and probe card using the same |
| 05/16/2002 | US20020057098 Probe contract system having planarity adjustment mechanism |
| 05/16/2002 | US20020057093 Method for characterizing delay of frequency translation devices |
| 05/16/2002 | US20020057091 Portable testing device for testing test-pieces operated at high voltages and/or high currents |
| 05/16/2002 | US20020057089 Audible circuit breaker |
| 05/16/2002 | US20020056194 Method and apparatus for confirming connection of a terminal connecting portion |
| 05/16/2002 | DE10153753A1 Memory tester for forbidding programming of addresses in bad columns, includes automatic data replacement mechanism |
| 05/16/2002 | DE10153665A1 Memory tester for enhanced re-decoding, involves applying mask on data result without previous storage of test result |
| 05/16/2002 | DE10062571C1 Simulation method for determining non-linear signal attenuation of tested analogue circuit has digital filter adjusted until it simulates analogue circuit with measurement of its intermodulation product |
| 05/16/2002 | DE10055002A1 Device for measuring voltage potentials and analogue electrical signals of an integrated circuit has a multiplexer connected to a large number of measurement points and connected to an analog-digital converter and memory |
| 05/16/2002 | CA2436800A1 Apparatus and method for detecting and calculating ground fault resistance |
| 05/16/2002 | CA2426040A1 At-speed built-in self testing of multi-port compact srams |
| 05/15/2002 | EP1205938A2 Integrated circuit with test mode and method for testing a plurality of such circuits |
| 05/15/2002 | EP1205861A1 A process and system for estimating the power consumption of digital circuits and a computer program product therefor |
| 05/15/2002 | EP1205759A1 Method for achieving scan testability of an integrated circuit including multiple clock domain |
| 05/15/2002 | EP1205642A1 Method of estimating the effect of the parasitic currents in an electromagnetic actuator for the control of an engine valve |
| 05/15/2002 | EP1204990A1 An integrated circuit with metal programmable logic having enhanced reliability |
| 05/15/2002 | EP1204988A2 Controlled compliance fine pitch interconnect |
| 05/15/2002 | EP1204876A1 Low cost timing system for highly accurate multi-modal semiconductor testing |
| 05/15/2002 | EP1204875A1 System for aligning rectangular wafers |
| 05/15/2002 | EP1204872A1 Electrical contactor, especially wafer level contactor, using fluid pressure |
| 05/15/2002 | EP0895633B1 Method of manufacturing a liquid crystal display module |
| 05/15/2002 | EP0737337B1 Apparatus and method for testing integrated circuits |
| 05/15/2002 | CN1349106A Calculation method of back-up period of battery in UPS |
| 05/15/2002 | CN1349105A Test device for electronic circuit breaker |
| 05/15/2002 | CN1349104A Automatic alarm method and device for power line anti-theft |
| 05/15/2002 | CN1349103A Judgement method of one-phase earthing failure in electric distribution network |
| 05/15/2002 | CN1349102A Method and devie for testing fault on stator winding of an AC motor |
| 05/15/2002 | CN1349100A Device for testing display plate or circuit board |
| 05/15/2002 | CN1084878C Assembly and method for testing integrated circuit device |
| 05/15/2002 | CA2359829A1 Method of calculating capacity of intelligent battery, intelligent battery and portable electronic device |
| 05/14/2002 | US6389575 Data integrity checking apparatus |
| 05/14/2002 | US6389567 Testable IC having analog and digital circuits |
| 05/14/2002 | US6389566 Edge-triggered scan flip-flop and one-pass scan synthesis methodology |
| 05/14/2002 | US6389565 Mechanism and display for boundary-scan debugging information |
| 05/14/2002 | US6389563 Semiconductor memory test circuit and method for the same |
| 05/14/2002 | US6389558 Embedded logic analyzer for a programmable logic device |
| 05/14/2002 | US6389525 Pattern generator for a packet-based memory tester |
| 05/14/2002 | US6389491 Test instrumentation I/O communication interface and method |
| 05/14/2002 | US6389225 Apparatus, method and system of liquid-based, wide range, fast response temperature control of electronic device |
| 05/14/2002 | US6389109 Fault conditions affecting high speed data services |
| 05/14/2002 | US6388934 Semiconductor memory device operating at high speed with low current consumption |
| 05/14/2002 | US6388929 Semiconductor memory device performing redundancy repair based on operation test and semiconductor integrated circuit device having the same |
| 05/14/2002 | US6388926 Integrated circuit having forced substrate test mode with improved substrate isolation |
| 05/14/2002 | US6388917 Method for nondestructively reading memory cells of an MRAM memory |
| 05/14/2002 | US6388849 ARC fault detector responsive to average instantaneous current and step increases in current and circuit breaker incorporating same |
| 05/14/2002 | US6388695 Driving circuit with switching element on static current path, and printer using same |
| 05/14/2002 | US6388465 Reconfigurable integrated circuit with integrated debussing facilities and scalable programmable interconnect |
| 05/14/2002 | US6388461 Semiconductor inspection apparatus and inspection method using the apparatus |
| 05/14/2002 | US6388460 Alternate timing wafer burn-in method |
| 05/14/2002 | US6388459 Conductive bump array contactors having an ejector and methods of testing using same |
| 05/14/2002 | US6388456 Probe card and manufactoring method therefor |
| 05/14/2002 | US6388455 Method and apparatus for simulating a surface photo-voltage in a substrate |
| 05/14/2002 | US6388454 Electro-optic sampling prober |
| 05/14/2002 | US6388450 Method for determining the state of charge of storage batteries |
| 05/14/2002 | US6388448 Electronic battery tester with normal/cold test modes and terminal connection detection |
| 05/14/2002 | US6388437 Ergonomic test apparatus for the operator-assisted testing of electronic devices |
| 05/14/2002 | US6388428 Method of charging a battery |
| 05/14/2002 | US6388426 Battery power source protecting device for an electromotive device |
| 05/14/2002 | CA2273628C Method for testability analysis and test point insertion at the rt-leve l of a hardware development language (hdl) specification |
| 05/10/2002 | WO2002037679A2 Transmitter circuit comprising timing deskewing means |
| 05/10/2002 | WO2002037671A1 Integrated circuit with current sense circuit and associated methods |
| 05/10/2002 | WO2002037340A2 System and method for test generation with dynamic constraints using static analysis |
| 05/10/2002 | WO2002037130A2 Method for testing integrated circuits |
| 05/10/2002 | WO2002037129A2 Ground check system for delta-flex test handler |