| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/28/2002 | US6396286 Apparatus and method for testing computer equipment for susceptibility to neutral to ground noise |
| 05/28/2002 | US6396284 Ground resistance monitor |
| 05/28/2002 | US6396283 Device for detecting abnormality of sensor, and control device for vehicle |
| 05/28/2002 | US6396282 Process for testing the ground contact of parts of a networked system |
| 05/28/2002 | US6396281 Work bench for holding electric wires and system for producing wire harness subassembly |
| 05/28/2002 | US6396279 Method and device for testing differential protection relays or differential protection relay systems |
| 05/28/2002 | US6396258 Sliding tray holder for ease in handling IC packages during testing of the IC packages |
| 05/28/2002 | US6396257 Test head manipulator for semiconductor tester with manual assist for vertical test head movement |
| 05/28/2002 | US6396255 System and method for determining the polarity of an electrostatic event |
| 05/28/2002 | US6395974 Protective pipe element for sheathed cable for controlling the integrity of the sheath |
| 05/28/2002 | US6395622 Manufacturing process of semiconductor devices |
| 05/28/2002 | US6395580 Backside failure analysis for BGA package |
| 05/28/2002 | US6395567 Process control using ideal die data in an optical comparator scanning system |
| 05/28/2002 | US6395437 Junction profiling using a scanning voltage micrograph |
| 05/28/2002 | US6394520 Apparatus and method for handling an integrated circuit |
| 05/28/2002 | US6394346 Contactless smart card high production encoding machine |
| 05/28/2002 | CA2307535C Method of testing at-speed circuits having asynchronous clocks and controller for use therewith |
| 05/28/2002 | CA2286044C An electrical insulation testing device and method for electrosurgical instruments |
| 05/28/2002 | CA2226061C Method and apparatus for controlling power level during bist |
| 05/23/2002 | WO2002041516A1 Cable sensor |
| 05/23/2002 | WO2002041454A1 Contacting device for establishing an electrically conductive connection |
| 05/23/2002 | WO2002041390A1 Device and method for electronic device test |
| 05/23/2002 | WO2002041167A2 Method and apparatus for dynamically testing electrical interconnect |
| 05/23/2002 | WO2002041019A1 Inspecting apparatus and inspecting method for circuit board |
| 05/23/2002 | WO2002041018A1 Inspecting apparatus and inspecting method for circuit board |
| 05/23/2002 | WO2002041017A1 Test adapter for testing printed circuit boards |
| 05/23/2002 | WO2002041016A1 Arrangement for connecting the test needles of a test adapter to a testing device |
| 05/23/2002 | WO2002041015A1 Kit and method for cleaning socket connection terminal, and electronic part tester |
| 05/23/2002 | WO2002041014A2 Method and arrangement for determination of the state of charge of a battery |
| 05/23/2002 | WO2002041013A2 Method and system for automated measuring of electromagnetic emissions |
| 05/23/2002 | WO2002010782A3 Method and device for checking for errors in electrical lines and/or electrical consumers in a vehicle |
| 05/23/2002 | WO2001094958A3 Process for the electromagnetic modelling of electronic components and systems |
| 05/23/2002 | WO2001090766A3 System for regulating the temperature of ic-chips with a fluid which is heated and cooled as a function of the fluid temperatures to and from heat exchangers for the ic-chips |
| 05/23/2002 | WO2001082081A3 Capturing of a register value to another clock domain |
| 05/23/2002 | WO2001071726A3 Method and apparatus for improving the testing, yield and performance of very large scale integrated circuits |
| 05/23/2002 | US20020062474 Semiconductor circuit designing apparatus and a semiconductor circuit designing method in which the number of steps in a circuit design and a layout design is reduced |
| 05/23/2002 | US20020062473 Semiconductor device and semiconductor storage device testing method |
| 05/23/2002 | US20020062466 Semiconductor integrated circuit and recording medium |
| 05/23/2002 | US20020062465 LSI device failure analysis apparatus and analysis method thereof |
| 05/23/2002 | US20020062200 Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits |
| 05/23/2002 | US20020061668 Probe card and method of fabricating same |
| 05/23/2002 | US20020061606 Semiconductor wafer, semiconductor chip, semiconductor device and method for manufacturing semiconductor device |
| 05/23/2002 | US20020060934 Semiconductor memory device and method of identifying programmed defective address thereof |
| 05/23/2002 | US20020060933 Semiconductor device and multichip module |
| 05/23/2002 | US20020060931 Semiconductor memory circuit |
| 05/23/2002 | US20020060584 Method and apparatus of determining defect-free semiconductor integrated circuit |
| 05/23/2002 | US20020060581 Mechanism for connecting test head to handler |
| 05/23/2002 | US20020060580 Probe card |
| 05/23/2002 | US20020060579 Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection |
| 05/23/2002 | US20020060577 Apparatus and method for determining process width variations in integrated circuits |
| 05/23/2002 | US20020060571 Method for inspecting capacitors |
| 05/23/2002 | US20020060563 Electronic device and manufacturing method thereof |
| 05/23/2002 | US20020060555 Method of diagnosing the state of health of a battery |
| 05/23/2002 | US20020060553 Indicating method of battery life and electronic device |
| 05/23/2002 | US20020060328 Semiconductor device |
| 05/23/2002 | DE10147298A1 Verfahren und Vorrichtung für Hochgeschwindigkeits-IC-Testschnittstelle Method and apparatus for high speed IC test interface |
| 05/23/2002 | DE10057457A1 Test adapter for testing printed circuit boards has very thin, closely packed test needles running in sleeves held in position by lamination stacks |
| 05/23/2002 | DE10057456A1 Arrangement for connecting test needles of test adapter to test equipment using separate terminal board to interface with test equipment |
| 05/23/2002 | DE10056971A1 Determining battery charge state involves forming weighted mean of unloaded battery charge state and integral of battery current over time to determine mean state of battery charge |
| 05/23/2002 | DE10056970A1 Verfahren und Anordnung zur Ermittlung der Startfähigkeit einer Starterbatterie eines Verbrennungsmotors Method and apparatus for determining the starting capability of a starter battery of an internal combustion engine |
| 05/23/2002 | DE10056969A1 Determining battery charge involves computing charge in first range of operation on basis of model computation in which measured and computed battery voltages are equalized by feedback |
| 05/23/2002 | DE10056591A1 Verfahren zum Schutz einer Schaltungsanordnung zum Verarbeiten von Daten A method of protecting a circuit arrangement for processing data |
| 05/22/2002 | EP1207399A2 Method for protecting a data processing circuit |
| 05/22/2002 | EP1207297A2 Method and device for the determination of the startability of a starting battery of the combustion engine |
| 05/22/2002 | EP1206826A1 Energy management system for automotive vehicle |
| 05/22/2002 | EP1206706A1 Testing device for an electrical connector |
| 05/22/2002 | EP1031995B1 Built-in self-test circuit for memory |
| 05/22/2002 | EP0943083B1 Method and apparatus for inspecting spark plug while spark plug is installed in engine |
| 05/22/2002 | EP0861130A4 Electrical circuit component handler |
| 05/22/2002 | CN2492859Y Automobile accumulator performance monitor |
| 05/22/2002 | CN2492858Y IC chip specially for detection of accumulator performance |
| 05/22/2002 | CN2492857Y Connection error detector |
| 05/22/2002 | CN1350642A Multi-ended fault locating system |
| 05/22/2002 | CN1350325A Contact structure member and production method thereof, and probe contact assembly using said contact structure member |
| 05/21/2002 | US6393594 Method and system for performing pseudo-random testing of an integrated circuit |
| 05/21/2002 | US6393593 Tester and method for testing LSI designed for scan method |
| 05/21/2002 | US6393592 Scan flop circuitry and methods for making the same |
| 05/21/2002 | US6393385 Knowledge driven simulation time and data reduction technique |
| 05/21/2002 | US6393373 Model-based fault detection system for electric motors |
| 05/21/2002 | US6393330 Method and device for managing an electronic component with complementary MOS transistors functioning under radiation |
| 05/21/2002 | US6393102 Computer-executable method for diagnosing trouble causes in telephone cable segments when trouble data are available only for entire cables |
| 05/21/2002 | US6393081 Plural circuit selection using role reversing control inputs |
| 05/21/2002 | US6393053 Digital output unit |
| 05/21/2002 | US6392940 Semiconductor memory circuit |
| 05/21/2002 | US6392938 Semiconductor memory device and method of identifying programmed defective address thereof |
| 05/21/2002 | US6392866 High frequency relay assembly for automatic test equipment |
| 05/21/2002 | US6392459 Gate signal generating circuit, semiconductor evaluation apparatus, and semiconductor evaluating method |
| 05/21/2002 | US6392433 Method and apparatus for testing semiconductor devices |
| 05/21/2002 | US6392432 Automated protection of IC devices from EOS (electro over stress) damage due to an undesired DC transient |
| 05/21/2002 | US6392430 Method of forming coaxial silicon interconnects |
| 05/21/2002 | US6392429 Temporary semiconductor package having dense array external contacts |
| 05/21/2002 | US6392428 Wafer level interposer |
| 05/21/2002 | US6392427 Testing electronic devices |
| 05/21/2002 | US6392426 Methods of forming apparatuses and a method of engaging electrically conductive test pads on a semiconductor substrate |
| 05/21/2002 | US6392423 Method for testing integrated circuit devices |
| 05/21/2002 | US6392419 Apparatus for and method of monitoring the status of the insulation on the wire in a winding |
| 05/21/2002 | US6392416 Electrode integrity checking |
| 05/21/2002 | US6392415 Method for determining the state of charge of lead-acid rechargeable batteries |
| 05/21/2002 | US6392414 Electronic battery tester |
| 05/21/2002 | US6392413 Short circuit inspection method for battery and method of manufacturing batteries |