| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/04/2002 | US6400196 Semiconductor integrated circuit, liquid crystal apparatus, electronic apparatus and method for testing semiconductor integrated circuit |
| 06/04/2002 | US6400188 Test mode clock multiplication |
| 06/04/2002 | US6400175 Method of testing semiconductor integrated circuits and testing board for use therein |
| 06/04/2002 | US6400174 Test system having alignment member for aligning semiconductor components |
| 06/04/2002 | US6400173 Test system and manufacturing of semiconductor device |
| 06/04/2002 | US6400171 Method and system for processing integrated circuits |
| 06/04/2002 | US6400170 High current examining structure for a circuit protective element |
| 06/04/2002 | US6400165 Ultra-fast probe |
| 06/04/2002 | US6400164 Method for comparing package EMI performance at multiple clock speeds |
| 06/04/2002 | US6400163 Circuit arrangement for monitoring an electronic switch controlling a load |
| 06/04/2002 | US6400160 Method and apparatus for mutual impedance coupling for component level EMI measurements |
| 06/04/2002 | US6400129 Apparatus for and method of detecting a delay fault in a phase-locked loop circuit |
| 06/04/2002 | US6400128 Thermal modulation system and method for locating a circuit defect |
| 06/04/2002 | US6400123 Battery fuel gauging using battery chemistry identification |
| 06/04/2002 | US6400102 Non-linear light-emitting load current control |
| 06/04/2002 | US6399900 Contact structure formed over a groove |
| 06/04/2002 | US6399474 Method and apparatus for precoining BGA type packages prior to electrical characterization |
| 06/04/2002 | US6398570 Semiconductor component mounting apparatus |
| 06/04/2002 | US6397460 Electrical connector |
| 05/30/2002 | WO2002043287A1 Component measures |
| 05/30/2002 | WO2002043219A1 Battery pack charging system |
| 05/30/2002 | WO2002042949A1 Multiple device scan chain emulation/debugging |
| 05/30/2002 | WO2002042793A1 System for testing an electric high frequency signal and level measuring device provided with said system |
| 05/30/2002 | WO2002042786A2 Method and apparatus for determining the state of charge of a lithium-ion battery |
| 05/30/2002 | WO2002042783A2 Vddq INTEGRATED CIRCUIT TESTING SYSTEM AND METHOD |
| 05/30/2002 | WO2002004962A3 Circuit test light |
| 05/30/2002 | WO2001092903A3 Method and apparatus for maximizing test coverage |
| 05/30/2002 | WO2001035718A9 System and method for product yield prediction |
| 05/30/2002 | WO2000029860A3 Dynamic register with iddq testing capability |
| 05/30/2002 | US20020066088 System and method for software code optimization |
| 05/30/2002 | US20020066063 Methods for making contact device for making connection to an electronic circuit device and methods of using the same |
| 05/30/2002 | US20020066062 Method and system for testing interconnected integrated circuits |
| 05/30/2002 | US20020066058 Synchronous semiconductor device, and inspection system and method for the same |
| 05/30/2002 | US20020066056 Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memory |
| 05/30/2002 | US20020065641 Method and apparatus for encoding and generating transaction-based stimulus for simulation of VLSI circuits |
| 05/30/2002 | US20020065640 Method and apparatus for generating transaction-based stimulus for simulation of VLSI circuits using event coverage analysis |
| 05/30/2002 | US20020065621 Method and apparatus for characterizing frequency response on an error performance analyzer |
| 05/30/2002 | US20020065620 System and method for waveform processing |
| 05/30/2002 | US20020065619 Battery test module |
| 05/30/2002 | US20020065026 IC handler and contact cleaning method |
| 05/30/2002 | US20020063635 Point of use digital electric energy apparatus with TCP/ IP network communication |
| 05/30/2002 | US20020063572 Device for evaluating characteristic of insulated gate transistor |
| 05/30/2002 | US20020063570 Apparatus and method for measuring electrical characteristics of a semiconductor element in a packaged semiconductor device |
| 05/30/2002 | US20020063567 Measurement device with remote adjustment of electron beam stigmation by using MOSFET ohmic properties and isolation devices |
| 05/30/2002 | US20020063566 Mechanism for clamping device interface board to peripheral |
| 05/30/2002 | US20020063565 Arc fault current interrupter testing device |
| 05/30/2002 | US20020063558 Test head connection unit |
| 05/30/2002 | US20020063557 Carrier transporting apparatus, method of transporting a carrier and transporting apparatus |
| 05/30/2002 | US20020063556 High speed VLSI digital tester architecture for real-time output timing acquisition, results accumulation, and analysis |
| 05/30/2002 | US20020063553 Method and apparatus for displaying triggered waveform on an error performance analyzer |
| 05/30/2002 | US20020063481 Load-control-type actuator |
| 05/30/2002 | US20020063251 Semiconductor device and testing method therefor |
| 05/30/2002 | US20020063250 Semiconductor device and method of inspecting the same |
| 05/30/2002 | US20020062954 Temperature control system for a workpiece chuck |
| 05/30/2002 | EP1145024A3 Dynamic register with iddq testing capability |
| 05/30/2002 | CA2431159A1 Battery pack charging system |
| 05/30/2002 | CA2430208A1 Method and apparatus for determining the state of charge of a lithium-ion battery |
| 05/29/2002 | EP1209778A1 A wire control apparatus and a wire mount control method |
| 05/29/2002 | EP1209777A1 A wire insertion detection jig |
| 05/29/2002 | EP1209478A2 Calculating capacity of a power supply cell or battery |
| 05/29/2002 | EP1209476A1 Electronic device and manufacturing method thereof |
| 05/29/2002 | EP1208591A1 Method and apparatus for characterizing a semiconductor device |
| 05/29/2002 | EP1208568A1 A memory module test system with reduced driver output impedance |
| 05/29/2002 | EP1208389A1 Method and apparatus for evaluating stored charge in an electrochemical cell or battery |
| 05/29/2002 | EP1208388A2 Connection tester for an electronic trip unit |
| 05/29/2002 | EP0791934B1 Semiconductor memory device |
| 05/29/2002 | DE10150321A1 Verfahren und Vorrichtung zum Testen von integrierten Schaltungen Method and device for testing integrated circuits |
| 05/29/2002 | DE10060640A1 High frequency measurement and test chamber for mobile telephones, etc. in which a test housing is divided into two, one containing the phone being tested and the other, which is shielded from the first, phone operating equipment |
| 05/29/2002 | DE10058245A1 Method for analyzing crosstalk on a printed circuit board with multiple signals for leading lines divides a line into coupling segments to keep the cross section constant for a line-disturbing line configuration. |
| 05/29/2002 | DE10058026A1 Durchführung für ein elektrisches Hochfrequenzsignal und Füllstandmeßeinrichtung mit einer solchen Durchführung Bushing for an electrical high-frequency signal and with such an implementation Füllstandmeßeinrichtung |
| 05/29/2002 | DE10055631A1 Device for targeted movement of an electronic component onto a contact socket using a tilting mirror arrangement with a measuring device arranged above the mirror and perpendicular to the optical axis between component and socket |
| 05/29/2002 | DE10054176A1 Verfahren und Vorrichtung zur Ermittlung eines Betriebszustandes eines an einem starren Netz angeschlossenen Motors Method and apparatus for determining an operating state of a connected to a rigid network engine |
| 05/29/2002 | DE10053481A1 Non-destructive mechanical testing of heterogeneously formed electronic components, especially capacitors, using thermo-hydraulically generated shock-waves for quality control of heterogeneous connections |
| 05/29/2002 | DE10033540C2 Einrichtung zum Erzeugen eines Referenzstromes Means for generating a reference current |
| 05/29/2002 | CN2494034Y Means for testing semiconductor package element |
| 05/29/2002 | CN2493943Y Tester structure for printed circuit board |
| 05/29/2002 | CN2493942Y Double-wave time difference digital display fixed-point instrument |
| 05/29/2002 | CN1351372A Pre-burning controller of integrated circuit |
| 05/29/2002 | CN1351321A Photoelectric device, inspecting method and electronic device therefor |
| 05/29/2002 | CN1351263A Nondestructive inspecting method |
| 05/29/2002 | CN1351262A Failure tester for electric power cable |
| 05/29/2002 | CN1351261A Voltage measuring device |
| 05/29/2002 | CN1085888C IC mounting/demounting system and mounting/demounting head therefor |
| 05/29/2002 | CN1085842C Method and device for monitoring deterioration of battery |
| 05/28/2002 | US6397363 Semiconductor integrated circuit device with test circuit |
| 05/28/2002 | US6397362 Fault diagnosis method and system for a sequential circuit |
| 05/28/2002 | US6397360 Method and apparatus for generating a fibre channel compliant frame |
| 05/28/2002 | US6397353 Method and apparatus for protecting sensitive data during automatic testing of hardware |
| 05/28/2002 | US6397342 Device with a clock output circuit |
| 05/28/2002 | US6397173 Application specific waveform generator |
| 05/28/2002 | US6397160 Power sensor module for microwave test systems |
| 05/28/2002 | US6397159 Method and system for characterizing terminations in a local area network |
| 05/28/2002 | US6396754 Semiconductor memory device which controls sense amplifier for detecting bit line bridge and method of controlling the semiconductor memory device |
| 05/28/2002 | US6396517 Integrated trigger function display system and methodology for trigger definition development in a signal measurement system having a graphical user interface |
| 05/28/2002 | US6396407 Method for displaying residual capacity of battery, battery pack and portable electric device using the method |
| 05/28/2002 | US6396298 Active feedback pulsed measurement method |
| 05/28/2002 | US6396296 Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station |
| 05/28/2002 | US6396295 System and method for combining integrated circuit final test and marking |
| 05/28/2002 | US6396292 Test carrier with decoupling capacitors for testing semiconductor components |
| 05/28/2002 | US6396290 Test carrier and method of mounting semiconductor device thereon |