| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/11/2002 | US6405333 Fail array memory control circuit with selective input disable |
| 06/11/2002 | US6405330 Process for determining potential shifts between eletronic modules in a wire bus network |
| 06/11/2002 | US6405154 Method and apparatus for power electronics health monitoring |
| 06/11/2002 | US6405150 Program storage device containing instructions that are spaced apart by unused bits that end on word boundaries and which generate chip testing bit streams of any length |
| 06/11/2002 | US6405148 Automatic semiconductor device classification system, method for classifying semiconductor device and recording medium having program for the system |
| 06/11/2002 | US6405147 Signal transfer device measurement system and method |
| 06/11/2002 | US6405110 Failure diagnosis apparatus and failure diagnosis method of vehicular electronic control system |
| 06/11/2002 | US6405062 Battery level indicator for a telephone set |
| 06/11/2002 | US6404949 Optical fiber interface for integrated circuit test system |
| 06/11/2002 | US6404684 Test interface circuit and semiconductor integrated circuit device including the same |
| 06/11/2002 | US6404683 Nonvolatile semiconductor memory device and test method with memory-assisted roll call |
| 06/11/2002 | US6404371 Waveform generator and testing device |
| 06/11/2002 | US6404346 Method and apparatus for detecting a failed thyristor |
| 06/11/2002 | US6404250 On-chip circuits for high speed memory testing with a slow memory tester |
| 06/11/2002 | US6404222 Chip capacitance measurement circuit |
| 06/11/2002 | US6404220 IC testing method and IC testing device using the same |
| 06/11/2002 | US6404219 Burn-in test method for a semiconductor chip and burn-in test apparatus therefor |
| 06/11/2002 | US6404218 Multiple end of test signal for event based test system |
| 06/11/2002 | US6404217 Enhanced security semiconductor device, semiconductor circuit arrangement and method or production thereof |
| 06/11/2002 | US6404216 Test contact |
| 06/11/2002 | US6404214 Substrate for inspecting electronic device, method of manufacturing substrate, and method of inspecting electronic device |
| 06/11/2002 | US6404212 Testing of BGA and other CSP packages using probing techniques |
| 06/11/2002 | US6404206 Process and circuit for testing a solder joint for faults |
| 06/11/2002 | US6404170 Electrical storage capacitor system having initializing function |
| 06/11/2002 | US6404167 Battery charging device |
| 06/11/2002 | US6404166 Signalling system |
| 06/11/2002 | US6404164 Method of battery chemistry identification through analysis of voltage behavior |
| 06/11/2002 | US6403388 Nanomachining method for integrated circuits |
| 06/11/2002 | US6403386 Method and apparatus for identifying failure sites on IC chips |
| 06/11/2002 | US6402565 Electronic interconnect device for high speed signal and data transmission |
| 06/11/2002 | US6402549 Adapter usable with an electronic interconnect for high speed signal and data transmission |
| 06/11/2002 | CA2276762C Remote light indication fault indicator with a timed reset circuit and a manual reset circuit |
| 06/11/2002 | CA2229573C Measurement system for electric disturbances in a high-voltage switchgear |
| 06/06/2002 | WO2002045277A2 A method and system for infrared detection of electrical short defects |
| 06/06/2002 | WO2002045213A2 Tapped delay line high speed register |
| 06/06/2002 | WO2002045124A2 Measurement device with remote adjustment of electron beam stigmation by using mosfet ohmic properties and isolation devices |
| 06/06/2002 | WO2002045094A2 Method and apparatus for built-in self-repair of memory storage arrays |
| 06/06/2002 | WO2002044743A1 A method of predicting the state of charge as well as the use time left of a rechargeable battery |
| 06/06/2002 | WO2002044742A2 Mechanism for clamping device interface board to peripheral |
| 06/06/2002 | WO2002043463A2 Systems and methods for generating hardware description code |
| 06/06/2002 | WO2002018960A3 Device and method for characterizing the version of integrated circuits and use for controlling operations |
| 06/06/2002 | WO2002008776A3 Automatic test equipment with narrow output pulses |
| 06/06/2002 | WO2002008773A3 Apparatus and method for electrical testing of electrical circuits |
| 06/06/2002 | WO2002003449A3 Apparatus and method for investigating semiconductor wafers |
| 06/06/2002 | WO2002001236A3 Burn-in testing method and device with temperature control |
| 06/06/2002 | WO2000068698A9 Apparatus and method for implementing a wireless system-on-a-chip with a reprogrammable tester, debugger, and bus monitor |
| 06/06/2002 | WO2000063054A8 Modulator mis-wire test |
| 06/06/2002 | US20020069387 Integrated circuit with self-test circuit |
| 06/06/2002 | US20020069386 Joint test action group (JTAG) tester, such as to test integrated circuits in parallel |
| 06/06/2002 | US20020069385 Arrangement and method of testing an integrated circuit |
| 06/06/2002 | US20020069384 Method and apparatus for testing pipelined dynamic logic |
| 06/06/2002 | US20020069382 Semiconductor integrated circuit device and method of testing it |
| 06/06/2002 | US20020069027 Arrangement and method of testing an integrated circuit |
| 06/06/2002 | US20020069026 Semiconductor device capable of test mode operation |
| 06/06/2002 | US20020067647 Semiconductor integrated circuit device |
| 06/06/2002 | US20020067183 Methods of engaging electrically conductive pads on a semiconductor substrate |
| 06/06/2002 | US20020067182 Semiconductor manufacturing-and-inspection system, and semiconductor device |
| 06/06/2002 | US20020067181 Probe card assembly and kit, and methods of making same |
| 06/06/2002 | US20020067180 Method and system for adapting burn-in boards to multiple burn-in systems |
| 06/06/2002 | US20020067179 Probe card for testing an LSI operating on two power source voltages |
| 06/06/2002 | US20020067171 Time domain reflectometer display method |
| 06/06/2002 | US20020067169 Electric potential detector, device tester and method of detecting electric potential |
| 06/06/2002 | US20020067157 Test bus circuit and associated method |
| 06/06/2002 | US20020067156 Apparatus and method for enabling auto-insertion of production level devices |
| 06/06/2002 | US20020066726 Wafer chuck having thermal plate with interleaved heating and cooling elements, interchangeable top surface assemblies and hard coated layer surfaces |
| 06/06/2002 | DE10158029A1 Verfahren zum Berechnen des dynamischen Ladezustandes in einer Batterie A method for calculating the dynamic state of charge in a battery |
| 06/06/2002 | DE10151127A1 Defect detection method for semiconductor device manufacture, involves estimating similarity between the conductive pad groups based on the secondary electron emission after accumulation of electrons and holes in pads |
| 06/06/2002 | DE10151125A1 Anschlussstruktur und zugehöriges Herstellungsverfahren sowie die Anschlussstruktur verwendende Prüfanschlussanordnung Terminal structure and manufacturing method thereof, and the connection structure Prüfanschlussanordnung use |
| 06/06/2002 | DE10146940A1 Leiterplatte und Verfahren zur Herstellung derselben Printed circuit board and method of manufacturing the same |
| 06/06/2002 | DE10145152A1 Tester für integrierte Halbleiterschaltungen und Verfahren zum Testen integrierter Halbleiterschaltungen Tester for integrated semiconductor circuits and methods for testing semiconductor integrated circuits |
| 06/06/2002 | DE10143173A1 Wafer probe has contact finger array with impedance matching network suitable for wide band |
| 06/06/2002 | DE10141523A1 Randanordnung und Sterilitätsmessung für elektronische Bauteile Edge assembly and sterility measurement for electronic components |
| 06/06/2002 | DE10129263A1 Non-volatile ferroelectric memory has pulse width generating unit for varying width of reproduction pulse and outputting varied width to word line driver to identify defective cell |
| 06/06/2002 | DE10108425C1 Electromagnetic valve monitoring unit, consists of switching circuit, differentiating units, comparator and monostable member |
| 06/06/2002 | DE10060243A1 Non-destructive diagnosis of isolation system for dielectric machines involves use of step voltage of increasing amplitude and partial discharge measurement |
| 06/06/2002 | DE10056882A1 Verfahren zum Kalibrieren eines Testsystems für Halbleiterbauelemente und Testsubstrat A method for calibrating a test system for semiconductor devices and test substrate |
| 06/05/2002 | EP1210613A1 Method and apparatus for detecting a failed thyristor |
| 06/05/2002 | EP1210612A1 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 06/05/2002 | EP1097460B1 Integrated circuit comprising a self-test device for executing a self-test of the integrated circuit |
| 06/05/2002 | EP0891559B1 Apparatus and method for providing a programmable delay |
| 06/05/2002 | CN2494570Y Power switch overcurrent detector for power inverter |
| 06/05/2002 | CN1352747A Method and apparatus for wireless testing of integrated circuits |
| 06/05/2002 | CN1352746A Adaptive probe device |
| 06/05/2002 | CN1352398A Battery voltage detector |
| 06/05/2002 | CN1352397A Method and device for detecting circuit board |
| 06/05/2002 | CN1352396A Insualtor detector and using method |
| 06/04/2002 | US6401227 Timing fault diagnosis method and apparatus |
| 06/04/2002 | US6401226 Electronic system with self-test function and simulation circuit for electronic system |
| 06/04/2002 | US6401225 Comparator circuit for semiconductor test system |
| 06/04/2002 | US6401224 Integrated circuit and method for testing it |
| 06/04/2002 | US6401219 Failure analysis system, method for managing estimated logic status and information storage medium for programmed instruction of the method |
| 06/04/2002 | US6401048 Circuit trace probe and method |
| 06/04/2002 | US6401018 Sensor device having malfunction detector |
| 06/04/2002 | US6400686 Method and apparatus for network flow control |
| 06/04/2002 | US6400682 Method and apparatus for a fault tolerant, software transparent and high data integrity extension to a backplane bus or interconnect |
| 06/04/2002 | US6400650 Pulse width detection |
| 06/04/2002 | US6400600 Method of repairing defective tunnel junctions |
| 06/04/2002 | US6400260 Apparatus for displaying electrical measurement of distributor of motor vehicle |
| 06/04/2002 | US6400258 Electric arc monitoring systems |
| 06/04/2002 | US6400225 Differential difference amplifier for amplifying small signals close to zero volts |