| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/18/2002 | US6407561 Probe for electro-optic sampling oscilloscope |
| 06/18/2002 | US6407560 Thermally-induced voltage alteration for analysis of microelectromechanical devices |
| 06/18/2002 | US6407559 Laser fault correction of semiconductor devices |
| 06/18/2002 | US6407554 Diagnostic tester for electronic control devices in a variety of motor vehicle types |
| 06/18/2002 | US6407553 Strain gages for determining charge of a battery having a thin walled pressure vessel |
| 06/18/2002 | US6407552 Testing of bimetallic actuators with radio frequency induction heating |
| 06/18/2002 | US6407551 Device for testing a solid state glow plug controller |
| 06/18/2002 | US6407541 Docking mechanism for semiconductor tester |
| 06/18/2002 | US6407534 Detecting a microcurrent and a microcurrent detecting circuit |
| 06/18/2002 | US6407532 Method and apparatus for measuring battery charge and discharge current |
| 06/18/2002 | US6407373 Apparatus and method for reviewing defects on an object |
| 06/18/2002 | US6406246 Device handler |
| 06/18/2002 | US6405447 Alignment device for electrically connecting a testing device to a sliding plate on a conveyer |
| 06/18/2002 | CA2112215C Cable test set |
| 06/18/2002 | CA2101336C Interactive diagnostic system for an automotive vehicle, and method |
| 06/13/2002 | WO2002047298A2 Method and apparatus for creating and testing a channel decoder with built-in self-test (bist) |
| 06/13/2002 | WO2002047209A1 Contact structure and production method thereof and probe contact assembly using same |
| 06/13/2002 | WO2002046785A1 Semiconductor test equipment and its preventive maintenance method |
| 06/13/2002 | WO2002046782A1 Method and device for checking electrical material properties |
| 06/13/2002 | WO2002046781A1 Socket for electronic component test, and electronic component test apparatus using the socket |
| 06/13/2002 | WO2002046780A1 Device for electromagnetic characterisation of a tested structure |
| 06/13/2002 | WO2002046730A2 System and method for measuring the dielectric strength of a fluid |
| 06/13/2002 | WO2002031518A3 Conversion board for dual handlers and single site device interface boards |
| 06/13/2002 | WO2002029568A3 A test access port (tap) controller system and method to debug internal intermediate scan test faults |
| 06/13/2002 | WO2002024400A3 Electronic test head positioner |
| 06/13/2002 | WO2002015355A3 Method and device for identifying and localising high-ohm, single-pole earth faults |
| 06/13/2002 | WO2002009121A3 Dynamic pulse width programming of programmable logic devices |
| 06/13/2002 | US20020073387 Embedding parasitic model for pi-fet layouts |
| 06/13/2002 | US20020073386 Semiconductor die manufacture method to limit a voltage drop on a power plane thereof by noninvasively measuring voltages on a power plane |
| 06/13/2002 | US20020073383 Method for detecting lack of synchronism in VLSI designs during high level simulation |
| 06/13/2002 | US20020073375 Method and apparatus for test generation during circuit design |
| 06/13/2002 | US20020073374 Method,system and program product for testing and/or diagnosing circuits using embedded test controller access data |
| 06/13/2002 | US20020073373 Test method of semiconductor intergrated circuit and test pattern generator |
| 06/13/2002 | US20020073372 General port capable of implementing the jtag protocol |
| 06/13/2002 | US20020073371 Dual mode memory for IC terminals |
| 06/13/2002 | US20020073370 Testing system for evaluating integrated circuits, a testing system, and a method for testing an integrated circuit |
| 06/13/2002 | US20020073369 Method and apparatus for controlling and observing data in a logic block-based asic |
| 06/13/2002 | US20020073366 Semiconductor device test method for optimizing test time |
| 06/13/2002 | US20020073253 Test module |
| 06/13/2002 | US20020072870 Calibrating single ended channels for differential performance |
| 06/13/2002 | US20020072866 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processed during their manufacture |
| 06/13/2002 | US20020072822 Dynamic testing of electronic assemblies |
| 06/13/2002 | US20020072136 Method for manufacturing semiconductor device utilizing semiconductor testing equipment |
| 06/13/2002 | US20020072135 Manufacturing method of semiconductor integrated circuit device |
| 06/13/2002 | US20020072132 Semiconductor integrated circuit |
| 06/13/2002 | US20020071334 Testing of high speed DDR interface using single clock edge triggered tester data |
| 06/13/2002 | US20020071326 Apparatus for analyzing failure for semiconductor memory device |
| 06/13/2002 | US20020071325 Built-in self-test arrangement for integrated circuit memory devices |
| 06/13/2002 | US20020071306 Device for evaluating cell resistances in a magnetoresistive memory |
| 06/13/2002 | US20020071232 Electronic load for the testing of electrochemical energy conversion devices |
| 06/13/2002 | US20020071228 Circuit interrupting device with reset lockout and reverse wiring protection and method of manufacture |
| 06/13/2002 | US20020071127 Positioning apparatus for probe card and TAB |
| 06/13/2002 | US20020070750 Test method of electro-optical device, test circuit of electro-optical device, electro-optical device, and electronic equipment |
| 06/13/2002 | US20020070749 Insulating film evaluation method and apparatus therefor |
| 06/13/2002 | US20020070748 System for testing fast synchronous digital circuits, particularly semiconductor memory chips |
| 06/13/2002 | US20020070747 Semiconductor package for chip with testing contact pad |
| 06/13/2002 | US20020070746 Method and apparatus for testing semiconductor devices |
| 06/13/2002 | US20020070745 Cooling system for burn-in unit |
| 06/13/2002 | US20020070744 Automatic scan pad assignment utilizing I/O pad architecture |
| 06/13/2002 | US20020070742 Universal wafer carrier for wafer level die burn-in |
| 06/13/2002 | US20020070741 Test fixture assembly for printed circuit boards |
| 06/13/2002 | US20020070739 Apparatus and method to read output information from a backside of a silicon device |
| 06/13/2002 | US20020070738 Semiconductor device inspecting apparatus |
| 06/13/2002 | US20020070735 Displacement detecting device |
| 06/13/2002 | US20020070733 Voltage measurement apparatus |
| 06/13/2002 | US20020070732 Testing device for evaluating the immunity of an electronic device to electromagentic noise |
| 06/13/2002 | US20020070731 Apparatus and method for analyzing capacitance of insulator |
| 06/13/2002 | US20020070726 Power source current measurement unit for semiconductor test system |
| 06/13/2002 | US20020070725 Integrated circuit tester with multi-port testing functionality |
| 06/13/2002 | US20020070706 Method and apparatus for evaluating stored charge in an electrochemical cell or battery |
| 06/13/2002 | US20020070675 Method for non-contact stress evaluation of wafer gate dielectric reliability |
| 06/13/2002 | US20020070144 Test tray insert of test handler |
| 06/13/2002 | DE10144660A1 Managing inversion characteristics in memory tester involves storing inversion mask in memory, selectively inverting data using mask, applying masked output signal to data channels |
| 06/13/2002 | DE10060438A1 Testing device for parallel testing of IC's, has active bus module inserted in signal path between test system and tested IC |
| 06/13/2002 | DE10060437A1 Needle card device for parallel testing of IC's has active module inserted in signal path between test system and each tested IC |
| 06/13/2002 | DE10056638C1 Electromagnetic screening chamber for testing electronic device e.g. mobile telephone, with mechanical transmission of operating force for operating elements of device within screening chamber |
| 06/13/2002 | DE10052144C1 IC with integrated testing function has HF test clock signal provided by logic combining of 2 LF external test clock signals |
| 06/12/2002 | EP1213818A1 Electronic device method, method of controlling electronic device, method of estimating charge in rechargeable battery, and method of charging rechargeable battery |
| 06/12/2002 | EP1213589A2 Indicating method of battery life and associated electronic device |
| 06/12/2002 | EP1212770A1 Control system for an electromagnetic switching device and electromagnetic switching device corresponding thereto |
| 06/12/2002 | EP1212630A1 Method and apparatus for electronically evaluating the internal temperature of an electrochemical cell or battery |
| 06/12/2002 | EP1212629A1 Tester for concurrently testing multiple chips |
| 06/12/2002 | EP1212628A1 Variable length pattern generator for chip tester system |
| 06/12/2002 | EP1212627A1 Method and system for transporting generic data in a pstn |
| 06/12/2002 | EP1212626A1 Method for testing circuits |
| 06/12/2002 | EP1212606A1 Inspecting component placement relative to component pads |
| 06/12/2002 | EP1042682B1 Device and method for testing an electronic chip sensitive element |
| 06/12/2002 | EP1040420B1 Process for repairing integrated circuits |
| 06/12/2002 | CN2494990Y Circuit trouble indicator |
| 06/12/2002 | CN1353858A Short and break tester probe for plasma display panel |
| 06/12/2002 | CN1353817A Self-aligning interface apparatus for use in testing electrical devices |
| 06/12/2002 | CN1353492A Float cut-off method for voltage of battery in UPS |
| 06/12/2002 | CN1353315A Power cable lines |
| 06/11/2002 | USRE37740 Method and apparatus for optical inspection of substrates |
| 06/11/2002 | US6405359 Method for backside failure analysis requiring simple bias conditions |
| 06/11/2002 | US6405355 Method for placement-based scan-in and scan-out ports selection |
| 06/11/2002 | US6405341 Multi-dimensional pseudo noise generating circuit for soft-decision decoding |
| 06/11/2002 | US6405336 Device and method for testing a semiconductor |
| 06/11/2002 | US6405335 Position independent testing of circuits |
| 06/11/2002 | US6405334 Method and apparatus characterizing AC parameters of a field programmable gate array internal cell array |