Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/2002
06/20/2002US20020078420 Data synchronization for a test access port
06/20/2002US20020078412 Built-in self test for a programmable logic device using linear feedback shift registers and hierarchical signature generation
06/20/2002US20020078411 Scan flip flop apparatus for performing speed test
06/20/2002US20020078410 Master-slave-type scanning flip-flop circuit for high-speed operation with reduced load capacity of clock controller
06/20/2002US20020078409 Method and system for detecting an outlying resistance in a plurality of resistive elements
06/20/2002US20020078408 Apparatus for testing computer memory
06/20/2002US20020078402 Method and apparatus for elastic shorts testing, a hardware-assisted wire test mechanism
06/20/2002US20020078400 Self-test with split, asymmetric controlled driver output stage
06/20/2002US20020078266 Processing system and method using recombinable software
06/20/2002US20020077799 Delay time estimation method and recording medium storing estimation program
06/20/2002US20020077781 Data monitoring and display method and apparatus
06/20/2002US20020077780 Diagnostic tool graphical display apparatus and method
06/20/2002US20020077779 Apparatus and method for displaying diagnostic values
06/20/2002US20020077763 Automatic tester having separate coarse and precise timing modules
06/20/2002US20020077093 System and method for pre-programming a cellular phone
06/20/2002US20020076971 Contact structure and production method thereof
06/20/2002US20020076841 Transmitter array burn-in using a submount substrate
06/20/2002US20020076095 Automatic optical inspection of printed circuit board packages with polarity
06/20/2002US20020075721 Semiconductor integrated circuit with memory redundancy circuit
06/20/2002US20020075618 Over voltage protection test multiplexer and methods of operating the same
06/20/2002US20020075439 Electro-optical device, inspection method therefor, and electronic equipment
06/20/2002US20020075248 Display device and driving method of the same
06/20/2002US20020075067 Semiconductor integrated circuit
06/20/2002US20020075058 Apparatus for low-power, high performance, and cycle accurate test simulation
06/20/2002US20020075035 Circuit for providing a logical output signal in accordance with crossing points of differential signals
06/20/2002US20020075031 Testing integrated circuits
06/20/2002US20020075030 Method of calibrating a test system for semiconductor components, and test substrate
06/20/2002US20020075029 Devices for testing contacts
06/20/2002US20020075028 Design circuit pattern for test of semiconductor circuit
06/20/2002US20020075027 Triaxial probe assembly
06/20/2002US20020075026 Method and system for providing an automated switching box for testing of integrated circuit devices
06/20/2002US20020075025 Semiconductor testing tool
06/20/2002US20020075021 Contact structure having silicon finger contactor
06/20/2002US20020075019 Wafer probe
06/20/2002US20020075018 Method and apparatus for analyzing electromagnetic interference
06/20/2002US20020075017 Apparatus and method for evaluating semiconductor structures and devices
06/20/2002US20020075016 Methods and structures for electronic probing arrays
06/20/2002US20020075015 Battery voltage measurement device
06/20/2002US20020075012 Method and apparatus for detecting valid signal information
06/20/2002US20020075009 Automated domain reflectometry testing system
06/20/2002US20020075008 Method of inspecting an electrical disconnection between circuits by calculating physical quantities thereof based on capacitances regarding the circuits measured twice
06/20/2002US20020075004 Battery voltage measurement device
06/20/2002US20020074993 RF isolation test device accommodating multiple nest plates for testing different devices and providing variable testing options
06/20/2002US20020074991 Device for determining the primary current of a current transformer comprising saturation correction means
06/20/2002US20020074990 Electric energy service apparatus with tamper detection
06/20/2002US20020074962 Electric device as well as process for its operation
06/20/2002US20020074958 Remote control test apparatus
06/20/2002US20020074640 Semiconductor test socket having pogo-pin contacts
06/20/2002US20020073575 Handler system for cutting a semiconductor package device
06/20/2002DE10157854A1 Verfahren und Vorrichtung zum Erzeugen eines transaktionsbasierten Stimulus für eine Simulation von VLSI-Schaltungen unter Verwendung einer Ereignisabdeckungsanalyse Method and device for generating a transaction-based stimulus for a simulation of VLSI-circuits using an event coverage analysis
06/20/2002DE10157458A1 Automatische Abtastanschlussfeldzuweisung unter Verwendung einer I/O-Anschlussfeldarchitektur Automatic Abtastanschlussfeldzuweisung using an I / O port array architecture
06/20/2002DE10148882A1 Stator winding error detector for use with an AC motor, has multiple sensors to acquire a set of current/voltage values, processor to calculate sequence components, feed-forward neuronal network and comparator.
06/20/2002DE10147078A1 Complex design validation method for system-on-chip integrated circuit, involves feedbacking modified vectors to EDA environment to modify IC design data so as to correct design errors
06/20/2002DE10063054A1 Sensorloses Ansteuerverfahren A sensorless control method
06/20/2002DE10062855A1 Testing of inverters by use of a specially configured second inverter as a test load, which provides a cheaper and smaller alternative to use of an electric motor
06/20/2002DE10062333A1 Binary sensor output circuit diagnosing method e.g. for sensors in motor vehicle by switching output port of microcontroller to be input or output and analyzing output of circuit when test signal applied
06/19/2002EP1215810A2 Sensorless control method
06/19/2002EP1215795A2 Apparatus for and method of detecting charge state of vehicle battery
06/19/2002EP1215794A2 Power management system
06/19/2002EP1215792A1 An improved control device and method thereof
06/19/2002EP1215503A2 Measuring power factor
06/19/2002EP1214788A1 Integrated circuit comprising at least two clock systems
06/19/2002EP1214768A1 System and method for providing surge, short and reverse polarity connection protection
06/19/2002EP1214606A1 Method for compensating for measurement errors that occur while measuring current in an energy store
06/19/2002EP1214605A1 Charge-based frequency measurement bist
06/19/2002EP1135665A4 Measurements using tunnelling current between elongate conductors
06/19/2002EP0842439B1 Low cost cmos tester
06/19/2002CN2496036Y Testing tool for printed circuit board
06/19/2002CN2496035Y Testing tool for metal ball potted element of ball grid array
06/19/2002CN2496034Y 380V/220V transmission line theft-proof alarm
06/19/2002CN2496033Y Electricity testing apparatus for cable branch box
06/19/2002CN1354833A Use of conveying beams for transmitting electromagnetic energy to power devices for die testing
06/19/2002CN1354620A Quality maintenance and backtracking system in course of manufacturing printed circuit board
06/19/2002CN1354557A Non-synchronous motor parameter identification method
06/19/2002CN1354503A Testing device and method for semiconductor integrated circuit
06/19/2002CN1354369A 电子装置及其制造方法 Electronic device and method of manufacturing
06/19/2002CN1086471C Electrochemical cell
06/18/2002US6408424 Verification of sequential circuits with same state encoding
06/18/2002US6408423 Method for faster verification of a design for an integrated circuit
06/18/2002US6408415 Test mode setup circuit for microcontroller unit
06/18/2002US6408414 Semiconductor device provided with a boundary-scan test circuit
06/18/2002US6408413 Hierarchical access of test access ports in embedded core integrated circuits
06/18/2002US6408412 Method and structure for testing embedded analog/mixed-signal cores in system-on-a-chip
06/18/2002US6408410 Method and apparatus for built in self-test of buffer circuits for speed related defects
06/18/2002US6408172 System and method for delivery of low battery indicator for emergency calls
06/18/2002US6408020 Dual-mode radio communication device having function for selectively using analog or digital mode
06/18/2002US6407903 PDA coupler containing a flexible joint
06/18/2002US6407899 Fault detection in a redundant power converter
06/18/2002US6407893 Arc fault detector with circuit interrupter and early arc fault detection
06/18/2002US6407795 Liquid crystal display and its inspecting method
06/18/2002US6407770 Apparatus and method for detecting defects in a discrete picture element detector circuit
06/18/2002US6407756 Graphical user interface for a logic analyzer which allows simplified clock selection
06/18/2002US6407613 Multipurpose test chip input/output circuit
06/18/2002US6407573 Device for evaluating characteristic of insulated gate transistor
06/18/2002US6407572 System and method for testing and evaluating a device
06/18/2002US6407569 Integrated circuit with in situ circuit arrangement for testing integrity of differential receiver inputs
06/18/2002US6407568 Apparatus for probing ends of pins
06/18/2002US6407567 IC Device burn-in method and apparatus
06/18/2002US6407566 Test module for multi-chip module simulation testing of integrated circuit packages
06/18/2002US6407563 Semiconductor device test apparatus