| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 06/27/2002 | US20020081756 Inspection analyzing apparatus and semiconductor device |
| 06/27/2002 | US20020080811 Instrumentation system including a backplane having a switched fabric bus and instrumentation lines |
| 06/27/2002 | US20020080667 Semiconductor integrated circuit having test circuit |
| 06/27/2002 | US20020080666 Semiconductor memory device |
| 06/27/2002 | US20020080657 Semiconductor memory device and method for its test |
| 06/27/2002 | US20020080588 Probe card assembly and kit, and methods of making same |
| 06/27/2002 | US20020080041 Method of controlling IC handler and control system using the same |
| 06/27/2002 | US20020079920 Method for manufacturing a display device, and display device substrate |
| 06/27/2002 | US20020079919 Burn-in carrier and semiconductor die assembly |
| 06/27/2002 | US20020079917 IC measuring device |
| 06/27/2002 | US20020079916 Method for testing an integrated circuit |
| 06/27/2002 | US20020079915 Self-test for leakage current of driver/receiver stages |
| 06/27/2002 | US20020079914 Test pin unit for PCB test device and feeding device of the same |
| 06/27/2002 | US20020079911 Probe holder for low current measurements |
| 06/27/2002 | US20020079908 Inductive sensory apparatus |
| 06/27/2002 | US20020079906 Electrical system with capacitance tap and sensor for on-line monitoring the state of high-voltage insulation and remote monitoring device |
| 06/27/2002 | US20020079905 Cable sensor |
| 06/27/2002 | US20020079904 Termination assembly for power cable testing and methods for its use |
| 06/27/2002 | US20020079903 Electrical system with a stress shield system for partial discharge on-line monitoring of the state of high-voltage insulation |
| 06/27/2002 | US20020079882 Autohandler and testing method |
| 06/27/2002 | US20020079881 IC tester adjusting unit |
| 06/27/2002 | US20020079880 Signal pin tester for AC defects in integrated circuits |
| 06/27/2002 | US20020079869 Charge/discharge protection circuit for protecting a charge control FET from overheating |
| 06/27/2002 | US20020079468 Autohandler and method for controlling the same |
| 06/27/2002 | US20020079195 Carrier positional displacement detecting mechanism |
| 06/27/2002 | DE10127337A1 Verfahren und Vorrichtung zum Erzeugen von beim Testen von Halbleiter-ICs verwendeten Testmustern Method and apparatus for generating used in testing semiconductor ICs test patterns |
| 06/27/2002 | DE10063596A1 Device for testing the connections between a multi-core cable and its plug in which the cable is tested from one end only using a testing device that test individual cores in a specific sequence |
| 06/27/2002 | DE10061106A1 Verfahren und Vorrichtung zur Überprüfung elektrischer Materialeigenschaften Method and apparatus for checking electrical material properties |
| 06/27/2002 | CA2432058A1 System and method for pre-programming an electronic device's memory |
| 06/26/2002 | EP1217707A1 Device for termination of primary current in a current transformer having saturation compensation means |
| 06/26/2002 | EP1217630A2 Test method for integrated circuit |
| 06/26/2002 | EP1217382A2 Test pin unit for PCB test device and feeding device of the same |
| 06/26/2002 | EP1216420A1 Integrated test cell |
| 06/26/2002 | EP1216419A1 Measuring probe for measuring high frequencies and a method for producing the same |
| 06/26/2002 | EP1137953B1 A tester interface system for current drive mode memory device |
| 06/26/2002 | EP1116420B1 Printed circuit plate used for testing electric components |
| 06/26/2002 | EP1060398B1 Coaxial probe interface for automatic test equipment |
| 06/26/2002 | EP1031041B1 Device for checking an electric drive |
| 06/26/2002 | EP0755504B1 Programmable cable adaptor |
| 06/26/2002 | EP0559209B1 System for control of boundary-scan test logic in a communication network |
| 06/26/2002 | CN2497324Y Charging generator testing apparatus |
| 06/26/2002 | CN2497323Y Power source potential colour-changing display device |
| 06/26/2002 | CN2497322Y Belt conveyor electric failure monitoring instrument |
| 06/26/2002 | CN1355945A Reverberation chamber tuner and shaft with electromagnetic radiation leakage device |
| 06/26/2002 | CN1355889A Method and apparatus for testing video display chip |
| 06/26/2002 | CN1355749A Modulator mis-wire test |
| 06/26/2002 | CN1355586A Automatic test method and device for battery |
| 06/26/2002 | CN1355559A Carrier for testing chip |
| 06/26/2002 | CN1355558A Device for testing defect in semiconductor device and method for using said device |
| 06/26/2002 | CN1355437A Charging-discharge tester system |
| 06/26/2002 | CN1355435A Autoamtic on-off tester |
| 06/26/2002 | CN1086853C Range relay device |
| 06/25/2002 | US6412104 Integrated circuit debugging system |
| 06/25/2002 | US6412098 Scan cell including a propagation delay and isolation element |
| 06/25/2002 | US6412087 Pattern data transfer circuit |
| 06/25/2002 | US6412085 Method and apparatus for a special stress mode for N-NARY logic that initializes the logic into a functionally illegal state |
| 06/25/2002 | US6411912 Voltage level bus translator and safety interlock system for battery modules |
| 06/25/2002 | US6411911 Battery diagnostic method utilizing a universal normalized discharge curve for predicting battery reserve time |
| 06/25/2002 | US6411598 Signal conversion for fault isolation |
| 06/25/2002 | US6411572 Method and apparatus for efficient measurement of optical pickup sled mechanism parameters |
| 06/25/2002 | US6411563 Semiconductor integrated circuit device provided with a logic circuit and a memory circuit and being capable of efficient interface between the same |
| 06/25/2002 | US6411377 Optical apparatus for defect and particle size inspection |
| 06/25/2002 | US6411118 Method and apparatus for testing bumped die |
| 06/25/2002 | US6411117 Dynamic register with IDDQ testing capability |
| 06/25/2002 | US6411116 Method for testing a product integrated circuit wafer using a stimulus integrated circuit wafer |
| 06/25/2002 | US6411115 Apparatus for testing a semiconductor and process for the same |
| 06/25/2002 | US6411111 Electron-electro-optical debug system E2ODS |
| 06/25/2002 | US6411108 Noncontact signal analyzer |
| 06/25/2002 | US6411101 Method and apparatus for testing frequency-dependent electrical circuits |
| 06/25/2002 | US6411100 Apparatus for evaluating magnetoresistive head |
| 06/25/2002 | US6411098 Energy device analysis and evaluation |
| 06/25/2002 | US6411097 Electronic circuit for measuring series connected electrochemical cell voltages |
| 06/25/2002 | US6411079 Printed circuit board testing apparatus with dedicated test head and versatile-use test head |
| 06/25/2002 | US6411074 Pulse width modulated cable signal injecting apparatus |
| 06/25/2002 | US6410998 Circuit arrangement with a reduction circuit for reducing interfering longitudinal voltages on a two-wire line |
| 06/25/2002 | US6410936 Semiconductor device |
| 06/25/2002 | US6410354 Semiconductor substrate test device and method |
| 06/25/2002 | US6410352 Apparatus and method for testing fuses |
| 06/25/2002 | US6410350 Detecting die speed variations |
| 06/25/2002 | US6410349 Internal anti-reflective coating for interference reduction |
| 06/25/2002 | US6409878 Automatic decapsulation system utilizing an acid resistant, high heat endurance and flexible sheet coupled to a rubber gasket and a method of use |
| 06/25/2002 | US6408500 Method of retrofitting a probe station |
| 06/25/2002 | CA2255762C Electro-optical and magneto-optical sensing apparatus and method for characterizing free-space electromagnetic radiation |
| 06/22/2002 | CA2329597A1 Method for scan controlled sequential sampling of analog signals and circuit for use therewith |
| 06/20/2002 | WO2002049179A1 An improved control device and method thereof |
| 06/20/2002 | WO2002048730A1 Tap changer condition diagnosing |
| 06/20/2002 | WO2002048729A1 Tap changer monitoring |
| 06/20/2002 | WO2002048728A1 Functional testing based on a state machine description of the unit under test |
| 06/20/2002 | WO2002048727A2 Calibrating single ended channels for obtaining differential performance level |
| 06/20/2002 | WO2002048726A1 Method and device of fault location |
| 06/20/2002 | WO2002048725A1 Fault location method and device |
| 06/20/2002 | WO2002048724A1 System for detecting failure of a cable in a tree-structure network |
| 06/20/2002 | WO2002048723A1 Method of an apparatus for testing wiring |
| 06/20/2002 | WO2002048722A2 Data synchronization for a test access port |
| 06/20/2002 | WO2002048721A2 Method and device for monitoring the function of an output stage with pulse width modulation |
| 06/20/2002 | WO2002048718A2 Condition diagnosing |
| 06/20/2002 | WO2002015458A3 Discovering hidden damage in machinery and predicting remaining life |
| 06/20/2002 | WO2001094959A3 System and method for diagnosing fault conditions associated with powering an electrical load |
| 06/20/2002 | WO2000079294A9 A method and apparatus for providing controllable compensation factors to a compensated driver circuit which may be used to perform testing of the structural integrity of the compensated driver circuit |
| 06/20/2002 | WO2000050908A9 Multi-ended fault location system |