| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/04/2002 | US20020084797 Parameter variation probing technique |
| 07/04/2002 | US20020084796 Method for forming coaxial silicon interconnects |
| 07/04/2002 | US20020084795 System for and method of testing a microelectronic device using a dual probe technique |
| 07/04/2002 | US20020084794 Probe tile for probing semiconductor wafer |
| 07/04/2002 | US20020084793 Simultaneous testing of multiple optical circuits in substrate |
| 07/04/2002 | US20020084792 SOI die analysis of circuitry logic states via coupling through the insulator |
| 07/04/2002 | US20020084791 Measurement probe for detecting electrical signals in an integrated semiconductor circuit |
| 07/04/2002 | US20020084788 Method and apparatus for testing frequency-dependent electrical circuits |
| 07/04/2002 | US20020084785 Method for diagnosing a battery of a vehicle and a system thereof |
| 07/04/2002 | US20020084784 Automated diagnostic tester for HID lamp luminaires |
| 07/04/2002 | US20020084779 Mark forming method, mark forming apparatus and analyzing apparatus |
| 07/04/2002 | US20020084772 Method and apparatus for measuring battery charge and discharg current using a direct analog-to-digital conversion of a charge/discharge replica current |
| 07/04/2002 | US20020084771 Battery operable device with battery state-of-charge indicator |
| 07/04/2002 | US20020084512 Semiconductor wafer |
| 07/04/2002 | US20020084457 Semiconductor device having embedded array |
| 07/04/2002 | US20020084456 Multilayered wiring board and production method thereof |
| 07/04/2002 | US20020083581 Defective circuit scanning device and method |
| 07/04/2002 | US20020083580 Defective circuit scanning device and method |
| 07/04/2002 | DE10163408A1 Improved fault location in a power transmission network with a single load tapping point by use of synchronized or unsynchronized measurement data from two ends of a power transmission line |
| 07/04/2002 | DE10163405A1 Improved fault location in a power transmission network with multiple load tapping points by use of synchronized or unsynchronized measurement data from two ends of a power transmission line |
| 07/04/2002 | DE10065119A1 Checking and/or monitoring microcontroller system frequency involves determining and/or checking system frequency based on working frequency of interacting voltage-controlled oscillator |
| 07/04/2002 | DE10064478A1 Verfahren zur Prüfung einer integrierten Schaltung A method for testing an integrated circuit |
| 07/03/2002 | EP1220413A1 Apparatus for battery capacity measurement and for remaining capacity calculation |
| 07/03/2002 | EP1220395A2 Transmitter array burn-in using a submount substrate |
| 07/03/2002 | EP1220350A1 Electric device with timer means |
| 07/03/2002 | EP1219969A1 Termination assembly for power cable testing and methods for its use |
| 07/03/2002 | EP1219968A1 Automobile vehicle starter and controlling method for the running of such a starter |
| 07/03/2002 | EP1219008A2 Apparatus for reducing power supply noise in an integrated circuit |
| 07/03/2002 | EP1219004A1 Device, system and method for monitoring a household electrical appliance |
| 07/03/2002 | EP1218946A1 Apparatus for localizing production errors in a photovoltaic element |
| 07/03/2002 | EP1218887A1 Method and apparatus for supplying regulated power to memory device components |
| 07/03/2002 | EP1218765A2 Wafer-level burn-in and test cartridge and methods |
| 07/03/2002 | EP1218760A1 Measurement of current in a vehicle using battery cable as a shunt |
| 07/03/2002 | EP1218720A1 Contactless smart card test/encoding machine |
| 07/03/2002 | EP1088241B1 Voltage measuring device |
| 07/03/2002 | EP1024855A4 Packaging and coating for bio-electrical stimulation and recording electrodes |
| 07/03/2002 | EP0826176B1 Integrated circuit arrangement |
| 07/03/2002 | EP0763275B1 Method and means for supervision of valve units |
| 07/03/2002 | CN2498737Y 显像管栅极脉冲发生器 CRT gate pulse generator |
| 07/03/2002 | CN2498614Y Automatic capacitor online monitor |
| 07/03/2002 | CN1357110A System, method and appts. available for actively selecting scan test |
| 07/03/2002 | CN1356558A Static frequency-measuring method and device for classifying piezoelectric ceramic chiops and devices |
| 07/03/2002 | CN1087101C 半导体检查装置 The semiconductor inspection apparatus |
| 07/03/2002 | CN1087099C Simulation method in lithographic process |
| 07/02/2002 | US6415419 Semiconductor integrated circuit device and circuit designing method therefor |
| 07/02/2002 | US6415409 System for testing IC chips selectively with stored or internally generated bit streams |
| 07/02/2002 | US6415408 Multi-stage algorithmic pattern generator for testing IC chips |
| 07/02/2002 | US6415404 Method of an apparatus for designing test facile semiconductor integrated circuit |
| 07/02/2002 | US6415403 Programmable built in self test for embedded DRAM |
| 07/02/2002 | US6415402 Programmable timing circuit for testing the cycle time of functional circuits on an integrated circuit chip |
| 07/02/2002 | US6415401 Integrated circuit having a test cell that resynchronizes the integrated circuit |
| 07/02/2002 | US6415399 Semiconductor memory device requiring performance of plurality of tests for each of plurality of memory circuits and method for testing the same |
| 07/02/2002 | US6415397 Automated multi-PC-motherboard memory-module test system with robotic handler and in-transit visual inspection |
| 07/02/2002 | US6414888 Semiconductor storage device having burn-in mode |
| 07/02/2002 | US6414752 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
| 07/02/2002 | US6414600 Ground check system for delta-flex test handler |
| 07/02/2002 | US6414563 Low-loss microwave device test fixture with adjustable blocks |
| 07/02/2002 | US6414511 Arrangement for transient-current testing of a digital electronic CMOS circuit |
| 07/02/2002 | US6414510 Testing apparatus and method of IC devices |
| 07/02/2002 | US6414509 Method and apparatus for in-situ testing of integrated circuit chips |
| 07/02/2002 | US6414508 Methods for predicting reliability of semiconductor devices using voltage stressing |
| 07/02/2002 | US6414507 Device testing system |
| 07/02/2002 | US6414503 Magazine for carrying a plurality of multi-chip modules |
| 07/02/2002 | US6414502 Loaded-board, guided-probe test fixture |
| 07/02/2002 | US6414498 System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances |
| 07/02/2002 | US6414496 Comparator structures and methods for automatic test equipment |
| 07/02/2002 | US6414478 Transfer mechanism for use in exchange of probe card |
| 07/02/2002 | US6414477 Method for optimizing probe card analysis and scrub mark analysis data |
| 07/02/2002 | US6414473 Electro-optic/magneto-optic measurement of electromagnetic radiation using chirped optical pulse |
| 07/02/2002 | US6414466 Device, method and computer readable recording medium for indicating charge information of a battery |
| 07/02/2002 | US6414335 Selective state change analysis of a SOI die |
| 07/02/2002 | US6414334 Semi-conductor device with test element group for evaluation of interlayer dielectric and process for producing the same |
| 07/02/2002 | US6413113 Kinematic coupling |
| 07/02/2002 | US6412551 System for regulating the temperature of IC-chips with a fluid which is heated and cooled as a function of the fluid temperatures to and from heat exchangers for the IC-chips |
| 07/02/2002 | CA2292658C Measuring battery clamps |
| 06/27/2002 | WO2002050927A2 Battery capacity calibration |
| 06/27/2002 | WO2002050884A1 Cleaning and etching methods and their apparatuses |
| 06/27/2002 | WO2002050883A1 Cleaning method and etching method |
| 06/27/2002 | WO2002050559A1 Ic handler |
| 06/27/2002 | WO2002050558A2 System and method for pre-programming an electronic device's memory |
| 06/27/2002 | WO2002049718A1 Method and apparatus for determining depleted capacity of a battery |
| 06/27/2002 | WO2002029856A3 A testing device for semiconductor components and a method of using the same |
| 06/27/2002 | WO2002021893A3 Method and device for testing printed circuit boards with a parallel tester |
| 06/27/2002 | WO2002019471B1 Ic test socket |
| 06/27/2002 | WO2002014884A3 Test system for smart card and identification devices and the like |
| 06/27/2002 | WO2000065361A9 Simulator cart |
| 06/27/2002 | WO2000042444A9 Testing electric cables and their joints |
| 06/27/2002 | US20020083406 Hybrid semi-physical and data fitting HEMT modeling approach for large signal and non-linear microwave/millimeter wave circuit CAD |
| 06/27/2002 | US20020083389 Testing integrated circuits |
| 06/27/2002 | US20020083388 Method and arrangement for testing digital circuits |
| 06/27/2002 | US20020083387 Test access port |
| 06/27/2002 | US20020083386 Random path delay testing methodology |
| 06/27/2002 | US20020083384 System for optimizing anti-fuse repair time using fuse ID |
| 06/27/2002 | US20020083330 LSI design method and verification method |
| 06/27/2002 | US20020083040 Data log acquisition circuit and data log acquisition method |
| 06/27/2002 | US20020082796 Method for determining failure rate and selecting best burn-in time |
| 06/27/2002 | US20020082765 Method and arrangement for determining the starting ability of a starter battery of an internal combustion engine |
| 06/27/2002 | US20020082738 Method for global automated process control |
| 06/27/2002 | US20020081942 Method and apparatus for monitoring a semiconductor wafer during a spin drying operation |
| 06/27/2002 | US20020081757 System for providing information on quality and reliability of optical semiconductor device by using communication network |