| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/11/2002 | WO2002054240A2 Enhanced loopback testing of serial devices |
| 07/11/2002 | WO2002054096A1 System for dynamic evaluation of the state of health and charge of a vehicle battery |
| 07/11/2002 | WO2002054095A1 Test environment and a method for testing electronic systems |
| 07/11/2002 | WO2002054094A1 Tester with independent control of devices under test |
| 07/11/2002 | WO2002054093A1 Lsi test device |
| 07/11/2002 | WO2002037679A8 Transmitter circuit comprising timing deskewing means |
| 07/11/2002 | WO2002029383A3 Optical inspection system having integrated component learning |
| 07/11/2002 | WO2002014886A3 Method to descramble the data mapping in memory circuits |
| 07/11/2002 | WO2002001689A3 Alternator testing method and system using timed application of load |
| 07/11/2002 | WO2001015174A9 A memory module test system with reduced driver output impedance |
| 07/11/2002 | WO2001006273A9 Apparatus and method for temperature control of ic device during test |
| 07/11/2002 | US20020091980 Single-pass methods for generating test patterns for commbinational circuits |
| 07/11/2002 | US20020091979 System and method for testing integrated circuits |
| 07/11/2002 | US20020091977 Method and system for multi-user channel allocation for a multi-channel analyzer |
| 07/11/2002 | US20020091976 Reverse parity coding |
| 07/11/2002 | US20020091496 Method for developing testing program of tester |
| 07/11/2002 | US20020089887 Built-in self-test arrangement for integrated circuit memory devices |
| 07/11/2002 | US20020089879 Semiconductor memory device of low power consumption |
| 07/11/2002 | US20020089663 Technique for imaging electrical contacts |
| 07/11/2002 | US20020089349 Reconfigurable integrated circuit with integrated debugging facilities and scalable programmable interconnect |
| 07/11/2002 | US20020089344 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| 07/11/2002 | US20020089341 Test configuration and test method for testing a plurality of integrated circuits in parallel |
| 07/11/2002 | US20020089335 Integrated time domain reflectometry (TDR) tester |
| 07/11/2002 | US20020089308 Battery state monitoring circuit and battery device |
| 07/11/2002 | US20020088974 Method for evaulating of molding material with dams formed on a semiconductor substrate to define slits for capturing the fillers contained in the molding material |
| 07/11/2002 | US20020088743 Method for sorting integrated circuit devices |
| 07/11/2002 | US20020088271 Method and arrangement for load testing electrical systems of a motor vehicle |
| 07/11/2002 | US20020088113 Index head in semiconductor device test handler |
| 07/11/2002 | DE10162222A1 Optical test system for testing integrated circuits via optical coupling uses a device under test to hold an optical fibre in optical alignment by applying an alignment holder |
| 07/11/2002 | DE10162193A1 Semiconductor memory device for processing internal command signals, addresses and data input/output uses an internal timing signal inverted by an external timing signal, logical combination circuits and clock pulse generators. |
| 07/11/2002 | DE10051100C1 Integrated semiconducting component with bridgeable input low pass filter has data bus connection(s), low pass filter connected to connection, circuit for bridging filter for test purposes |
| 07/10/2002 | EP1221700A1 Electronic component with improved boundary-scan implementation |
| 07/10/2002 | EP1221225A1 Method and system for performing time domain reflectometry contemporaneously with recurrent transmissions on computer network |
| 07/10/2002 | EP1221097A2 Circuit cell for test pattern generation and test pattern compression |
| 07/10/2002 | EP1221056A1 Sensor for detecting high-frequency oscillations of a voltage and an arrangement of a sensor |
| 07/10/2002 | EP1012848B1 System for storing information with data compression |
| 07/10/2002 | EP0943100A4 Internal testability system for microprocessor-based integrated circuit |
| 07/10/2002 | CN2499846Y Display device for ac city electricity state |
| 07/10/2002 | CN2499845Y Detection switch for lightning arrester failure |
| 07/10/2002 | CN2499844Y Environment detection tool for electrolytic capacitor after cutting-off legs |
| 07/10/2002 | CN2499843Y Numbering device for multistrand conductor wire |
| 07/10/2002 | CN1358276A Inspection apparatus and sensor |
| 07/10/2002 | CN1358275A Tester and holder for tester |
| 07/10/2002 | CN1358274A Tester and testing method, and testing unit |
| 07/10/2002 | CN1357956A Charger with energy detector |
| 07/10/2002 | CN1357871A Electrooptical device and its testing method, testing circuit and electronic equipment |
| 07/10/2002 | CN1357766A Light load detection method and circuit for shifted power supply system |
| 07/09/2002 | US6418547 Internal guardband for semiconductor testing |
| 07/09/2002 | US6418546 Circuit for checking a tristate detection circuit |
| 07/09/2002 | US6418545 System and method to reduce scan test pins on an integrated circuit |
| 07/09/2002 | US6418391 Testing system for performing an operation of an application which controls testing equipment for testing a device under test and method for controlling the same |
| 07/09/2002 | US6418389 Test system and test method for testing the operability of test samples |
| 07/09/2002 | US6418387 Method of and system for generating a binary shmoo plot in N-dimensional space |
| 07/09/2002 | US6418385 Method for determining the location of a partial discharge |
| 07/09/2002 | US6418044 Method and circuit for determining sense amplifier sensitivity |
| 07/09/2002 | US6417776 Input buffer circuit having function for detecting cable connection |
| 07/09/2002 | US6417685 Test system having alignment member for aligning semiconductor components |
| 07/09/2002 | US6417683 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 07/09/2002 | US6417682 Semiconductor device testing apparatus and its calibration method |
| 07/09/2002 | US6417680 Method and apparatus for stress testing a semiconductor device using laser-induced circuit excitation |
| 07/09/2002 | US6417673 Scanning depletion microscopy for carrier profiling |
| 07/09/2002 | US6417672 Detection of bridge tap using frequency domain analysis |
| 07/09/2002 | US6417670 Accurate battery current measurement system for a battery care unit |
| 07/09/2002 | US6417669 Suppressing interference in AC measurements of cells, batteries and other electrical elements |
| 07/09/2002 | US6417646 Circuit for monitoring cells of a multi-cell battery during charge |
| 07/09/2002 | US6417562 Silicon verification with embedded testbenches |
| 07/09/2002 | US6416331 IC socket and semiconductor device with replaceable lead members |
| 07/09/2002 | US6415858 Temperature control system for a workpiece chuck |
| 07/09/2002 | CA2250703C Constructive module of an electronic telecommunications equipment, with an interface towards a testing and diagnosing system |
| 07/04/2002 | WO2002052672A2 Storage battery with integrated detecton and indicating means |
| 07/04/2002 | WO2002052637A2 Method and apparatus for monitoring a semiconductor wafer during a spin drying operation |
| 07/04/2002 | WO2002052635A2 Characterizing semiconductor wafers with enhanced s parameter contour mapping |
| 07/04/2002 | WO2002052361A1 A method for global automated process control |
| 07/04/2002 | WO2002052290A1 Asynchronous reset circuit testing |
| 07/04/2002 | WO2002052289A1 Method for scan controlled sequential sampling of analog signals and circuit for use therewith |
| 07/04/2002 | WO2002052288A2 Weighted random pattern test using pre-stored weights |
| 07/04/2002 | WO2002052287A2 Method and device for testing of a transistor using a network analyzer |
| 07/04/2002 | WO2002052285A1 Probe cartridge assembly and multi-probe assembly |
| 07/04/2002 | WO2002029428A3 Docking system for connecting a tester to a probe station using an a-type docking configuration |
| 07/04/2002 | WO2002027338A3 Device for testing contacts |
| 07/04/2002 | US20020087941 Semiconductor device having embedded array |
| 07/04/2002 | US20020087932 Method of determining non-accessible device I/O pin speed using on chip LFSR and MISR as data source and results analyzer respectively |
| 07/04/2002 | US20020087931 Microprocessor on-chip testing architecture and implementation |
| 07/04/2002 | US20020087930 Scan flip-flop circuit capable of guaranteeing normal operation |
| 07/04/2002 | US20020087929 Test circuit for logical integrated circuit and method for testing same |
| 07/04/2002 | US20020087927 Method for testing integrated circuits |
| 07/04/2002 | US20020087924 Enhanced loopback testing of serial devices |
| 07/04/2002 | US20020087918 Semiconductor integrated circuit, system board and debugging system |
| 07/04/2002 | US20020087284 Method of protecting a circuit arrangement for processing data |
| 07/04/2002 | US20020087278 Method of calculating capacity of intelligent battery, intelligent battery and portable electronic device |
| 07/04/2002 | US20020087277 In-situ test for embedded passives |
| 07/04/2002 | US20020086718 Method of and an apparatus for monitoring the condition of batteries used by a mobile radio telecommunications fleet |
| 07/04/2002 | US20020086580 Connector and continuity test method for connector |
| 07/04/2002 | US20020086578 Battery-connecting plate, method of producing same and wire protector |
| 07/04/2002 | US20020086562 Contact pin module and testing device provided with the same |
| 07/04/2002 | US20020085907 Self-aligning and floating apparatus for an automatic tester |
| 07/04/2002 | US20020085445 Semiconductor memory device enabling reduction of test time period |
| 07/04/2002 | US20020085429 Semiconductor memory device capable of outputting a wordline voltage via an external pin |
| 07/04/2002 | US20020085169 Liquid crystal display for testing defects of wiring in panel |
| 07/04/2002 | US20020084798 Method for determining a load line based variable voltage input for an integrated circuit product |