| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/18/2002 | WO2002007192A3 Triaxial probe assembly |
| 07/18/2002 | WO2001088976A3 Wireless radio frequency testing methode of integrated circuits and wafers |
| 07/18/2002 | US20020095646 Delay caluculation method and design method of a semiconductor integrated circuit |
| 07/18/2002 | US20020095634 Sequence-based verification method and system |
| 07/18/2002 | US20020095633 Electronic component, a test configuration and a method for testing connections of electronic components on a printed circuit board |
| 07/18/2002 | US20020095632 Method and apparatus for creating and testing a channel decoder with built-in self-test |
| 07/18/2002 | US20020095631 Input/output continuity test mode circuit |
| 07/18/2002 | US20020095630 Memory device redundant repair analysis method, recording medium and apparatus |
| 07/18/2002 | US20020095304 System, method, and apparatus for storing emissions and susceptibility information |
| 07/18/2002 | US20020095279 Process and system for estimating the power consumption of digital circuits and a computer program product therefor |
| 07/18/2002 | US20020095273 Method of extracting physical model parameter and storage medium therefor, and method of manufacturing non-linear element |
| 07/18/2002 | US20020094047 Timing recovery sytem for a multi-pair gigabit transceiver |
| 07/18/2002 | US20020093874 Semiconductor memory device |
| 07/18/2002 | US20020093862 Semiconductor memory device for reducing number of input cycles for inputting test pattern |
| 07/18/2002 | US20020093848 Device for evaluating cell resistances in a magnetoresistive memory |
| 07/18/2002 | US20020093846 Nonvolatile ferroelectric memory device and method for detecting weak cell using the same |
| 07/18/2002 | US20020093844 Read/write eight-slot cam with interleaving |
| 07/18/2002 | US20020093446 PWM-based measurement interface for a micro-machined electrostatic actuator |
| 07/18/2002 | US20020093361 Engagement probes |
| 07/18/2002 | US20020093360 Integrate circuit device |
| 07/18/2002 | US20020093359 Apparatus and method for driving circuit pins in a circuit testing system |
| 07/18/2002 | US20020093358 Parallel logic device/circuit tester for testing plural logic devices/circuits and parallel memory chip repairing apparatus |
| 07/18/2002 | US20020093357 Stress testing for semiconductor devices |
| 07/18/2002 | US20020093356 Intelligent test vector formatting to reduce test vector size and allow encryption thereof for integrated circuit testing |
| 07/18/2002 | US20020093354 Method and system for infrared detection of electrical short defects |
| 07/18/2002 | US20020093353 Wafer probe station having environment control enclosure |
| 07/18/2002 | US20020093352 Contactor of the device for testing semiconductor device |
| 07/18/2002 | US20020093350 Semiconductor device test method and semiconductor device tester |
| 07/18/2002 | US20020093341 Method and system for measuring electromagnetic waves, and recording medium in which electromagnetic wave measurement control program is recorded |
| 07/18/2002 | US20020093314 Electronic circuit for measuring series connected electrochemical cell voltages |
| 07/18/2002 | US20020093312 Remaining battery capacity corrector and controlling method therefor |
| 07/18/2002 | US20020093249 Method and system for operation verification |
| 07/18/2002 | US20020093014 Semiconductor chip, semiconductor device, and process for producing a semiconductor device |
| 07/18/2002 | US20020092594 Fixture for securing hard stops to a substrate |
| 07/18/2002 | US20020092357 Methods and apparatus for recycling cryogenic liquid or gas from test chambers |
| 07/18/2002 | US20020092354 Vibration compartment environmental control |
| 07/18/2002 | DE10154530A1 Verfahren und Vorrichtung zum Messen eines ohmschen Widerstandes einer Fahrzeugbatterie Method and apparatus for measuring an ohmic resistance of a vehicle battery |
| 07/18/2002 | DE10147652A1 Optisch getriggertes Latch auf einem Chip für IC-Zeitmessungen Optically triggered latch on a chip for IC-time measurements |
| 07/18/2002 | DE10141994A1 Halbleiterspeichervorrichtung zur Reduktion der Prüfzeitperiode A semiconductor memory device for reducing the Prüfzeitperiode |
| 07/18/2002 | DE10133812A1 Detection of short circuits in transformer windings by detection of an increase in the stray flux, which is used to quickly separate the transformer from the power supply, preventing any damage |
| 07/18/2002 | DE10065508A1 Testumgebung und Verfahren zur Untersuchung elektronischer Systeme Test environment and procedures for the investigation of electronic systems |
| 07/18/2002 | DE10065507A1 Description of a test environment that is to be used in testing electronic system, with a description first undertaken at an abstract level and then converted to a concrete level, such as a register- transfer level, to speed design |
| 07/17/2002 | EP1223731A2 2ND level power fault testing apparatus for testing telecommunications equipment |
| 07/17/2002 | EP1223730A2 1ST Level power fault testing apparatus for testing telecommunications equipment |
| 07/17/2002 | EP1223654A2 Battery charging circuit |
| 07/17/2002 | EP1223432A1 A chamber for and a method of processing electronic devices and the use of such a chamber |
| 07/17/2002 | EP1223431A2 Device for finding faults in a photovoltaic installation |
| 07/17/2002 | EP1223430A1 Leak sensor |
| 07/17/2002 | EP1222709A1 Low power indication circuit for lead acid battery pack |
| 07/17/2002 | EP1222580A1 Apparatus and method for verifying a multi-component electronic design |
| 07/17/2002 | EP1222475A1 Easy to program automatic test equipment |
| 07/17/2002 | EP1222474A1 Fault location device and method |
| 07/17/2002 | EP1222473A1 Electricity supply monitoring system |
| 07/17/2002 | EP1222472A1 Partial discharge monitoring system for transformers |
| 07/17/2002 | EP0968414A4 Probing with backside emission microscopy |
| 07/17/2002 | EP0879484A4 Electrochemical cell label with integrated tester |
| 07/17/2002 | EP0781457A4 Electrochemical cell label with integrated tester |
| 07/17/2002 | EP0692116B1 Power line communications analyzer |
| 07/17/2002 | CN2501063Y Equipment for testing square power battery |
| 07/17/2002 | CN2501062Y Universal tray for detecting battery |
| 07/17/2002 | CN2501061Y Grounding and short circuit fault indicator |
| 07/17/2002 | CN2501060Y Secondary battery separating device |
| 07/17/2002 | CN1359545A Integral sensors for monitoring a fuel cell membrane and methods of monitoring |
| 07/17/2002 | CN1359524A Test device for testing a memory |
| 07/17/2002 | CN1359470A Connector apparatus |
| 07/17/2002 | CN1359176A Aging for transmitter array adopting base substrate |
| 07/17/2002 | CN1359010A Apparatus and method for positioning parallel double electricity transmission line |
| 07/17/2002 | CN1358986A Characterization system for property measurement of intermediate infrared waveband semiconductor laser |
| 07/16/2002 | US6421812 Programming mode selection with JTAG circuits |
| 07/16/2002 | US6421811 Defect detection via acoustic analysis |
| 07/16/2002 | US6421810 Scalable parallel test bus and testing method |
| 07/16/2002 | US6421801 Testing IO timing in a delay locked system using separate transmit and receive loops |
| 07/16/2002 | US6421800 Circuit and method to prevent inadvertent test mode entry |
| 07/16/2002 | US6421791 Computer-implemented system and method for evaluating the diagnostic state of a component |
| 07/16/2002 | US6421789 Synchronous semiconductor memory device capable of reducing test cost and method of testing the same |
| 07/16/2002 | US6421634 Interface independent test system |
| 07/16/2002 | US6421631 Diagnostic procedure for electrical appliances |
| 07/16/2002 | US6421618 Incipient leakage current fault detection apparatus and method |
| 07/16/2002 | US6421286 Semiconductor integrated circuit device capable of self-analyzing redundancy replacement adapting to capacities of plural memory circuits integrated therein |
| 07/16/2002 | US6421284 Semiconductor device |
| 07/16/2002 | US6421071 Synchronous scrolling of time stamped log files |
| 07/16/2002 | US6420921 Delay signal generating apparatus and semiconductor test apparatus |
| 07/16/2002 | US6420896 Semiconductor integrated circuit |
| 07/16/2002 | US6420894 Implementation of iscan cell for self-resetting dynamic circuit |
| 07/16/2002 | US6420891 Wafer prober for in-line cleaning probe card |
| 07/16/2002 | US6420890 Method and apparatus for capacitively testing a semiconductor die |
| 07/16/2002 | US6420888 Test system and associated interface module |
| 07/16/2002 | US6420886 Membrane probe card |
| 07/16/2002 | US6420885 System and apparatus for low-temperature semiconductor device testing |
| 07/16/2002 | US6420881 Interface for cable testing |
| 07/16/2002 | US6420880 Method and arrangement for dielectric integrity testing using PLL loop capacitor |
| 07/16/2002 | US6420879 System and method for measurement of partial discharge signals in high voltage apparatus |
| 07/16/2002 | US6420877 Continuity totalizer/analyzer |
| 07/16/2002 | US6420876 Fault location in a medium-voltage network |
| 07/16/2002 | US6420851 Method of and device for determining the charge condition of a battery |
| 07/16/2002 | US6420681 Method and process of contact to a heat softened solder ball array |
| 07/16/2002 | US6420195 Method of aligning and testing a semiconductor chip package |
| 07/16/2002 | CA2042211C Battery state of charge indicator |
| 07/11/2002 | WO2002054478A1 Apparatus for inspecting surface mounted chip |
| 07/11/2002 | WO2002054447A2 System and method for prototyping and fabricating complex microwave circuits |