| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/25/2002 | WO2002057802A1 Input/output continuity test mode circuit |
| 07/25/2002 | WO2002057801A2 High speed and high accuracy dut power supply with active boost circuitry |
| 07/25/2002 | WO2002057734A1 Testing apparatus with environmentally-controlled vibrator compartment |
| 07/25/2002 | WO2002019108A3 Method for providing bitwise constraints for test generation |
| 07/25/2002 | WO2001098793A3 Systems for testing integraged circuits during burn-in |
| 07/25/2002 | WO2001092898A3 Measurement method and device, in particular for the high-frequency measurement of electric components |
| 07/25/2002 | WO2001004652A9 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 07/25/2002 | US20020100010 Field programmable printed circuit board |
| 07/25/2002 | US20020100006 Delay characteristic analyzing method and delay characteristic analyzing system for a custom LSI |
| 07/25/2002 | US20020100000 Semiconductor testing apparatus and method for optimizing a wait time until stabilization of semiconductor device output signal |
| 07/25/2002 | US20020099993 Semiconductor testing apparatus and method |
| 07/25/2002 | US20020099992 System for reducing test data volume in the testing of logic products |
| 07/25/2002 | US20020099991 Method and system for reducing test data volume in the testing of logic products |
| 07/25/2002 | US20020099990 Method for scan controlled sequential sampling of analog signals and circuit for use therewith |
| 07/25/2002 | US20020099972 Method and system for selecting a master controller in a redundant control plane having plural controlllers |
| 07/25/2002 | US20020099531 Multiple device scan chain emulation/debugging |
| 07/25/2002 | US20020099513 Systems and methods for testing multi-gigahertz digital systems and components |
| 07/25/2002 | US20020099512 Method and circuit configuration for identifying an operating property of an integrated circuit |
| 07/25/2002 | US20020098734 Battery-connecting plate, method of producing same and wire protector |
| 07/25/2002 | US20020098602 Semiconductor integrated circuit |
| 07/25/2002 | US20020097913 Pattern evaluation method, pattern evaluation system and computer readable recorded medium |
| 07/25/2002 | US20020097672 Redundant control architecture for a network device |
| 07/25/2002 | US20020097617 Static semiconductor memory device capable of accurately detecting failure in standby mode |
| 07/25/2002 | US20020097611 Semiconductor memory device which can be simultaneously tested even when the number of semiconductor memory devices is large and semiconductor wafer on which the semiconductor memory devices are formed |
| 07/25/2002 | US20020097610 Semiconductor device |
| 07/25/2002 | US20020097540 Magneto-resistance effect element, magneto-resistance effect head, magneto-resistance transducer system, and magnetic storage system |
| 07/25/2002 | US20020097066 Method for determining whether a rotor is good in magnetic induction by measuring the emf of a motor |
| 07/25/2002 | US20020097065 Method and apparatus for evaluation of insulation in variable speed motors |
| 07/25/2002 | US20020097064 Testing apparatus for test piece, testing method, contactor and method of manufacturing the same |
| 07/25/2002 | US20020097063 Wafer level interposer |
| 07/25/2002 | US20020097062 Method and process of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing analysis, and manufacture |
| 07/25/2002 | US20020097061 Apparatus for probing digital signals within printed circuit boards |
| 07/25/2002 | US20020097035 Apparatus for measuring the duty cycle of a high speed clocking signal |
| 07/25/2002 | US20020097034 Physical quantity detection device |
| 07/25/2002 | US20020097023 Memorizing the first operating time of a stand-by battery and/or indicating the end of a stand-by battery lifetime |
| 07/25/2002 | US20020096941 Microelectronic transient power generator for power system validation |
| 07/25/2002 | US20020096026 Work transfer apparatus |
| 07/25/2002 | DE10154511A1 Determination of vector response of frequency translation device (FTD) used with communications system, using source for generating excitation signal with and without FTD connected with processing of both response signals together |
| 07/25/2002 | DE10136039A1 Elektro-optische Abtastvorrichtung An electro-optical scanning device |
| 07/25/2002 | DE10125910A1 Verfahren und Schaltung zur Erkennung von Motor-Isolationsfehlern Method and circuit for detection of motor insulation faults |
| 07/25/2002 | DE10102863A1 Schaltungsanordnung Circuitry |
| 07/25/2002 | DE10101971A1 An electronic state storage device for monitoring the availability of power supply voltages from an electrical system for monitoring the power supply to motor vehicle safety critical devices, while the engine is not running |
| 07/25/2002 | CA2432889A1 Input/output continuity test mode circuit |
| 07/24/2002 | EP1225740A2 Circuit arrangement |
| 07/24/2002 | EP1225588A2 Method and circuit for determining sense amplifier sensitivity |
| 07/24/2002 | EP1225452A2 Current measuring procedure for half-bridges |
| 07/24/2002 | EP1224792A2 Notification of low-battery in a wireless network |
| 07/24/2002 | EP1224738A1 Low jitter phase-locked loop with duty-cycle control |
| 07/24/2002 | EP1224487A1 Circuit and method for improved test and calibration in automated test equipment |
| 07/24/2002 | EP1224482A1 Method and device for the data protecting self-test of a microcontroller |
| 07/24/2002 | EP1224481A1 Apparatus and method for programmable parametric toggle testing of digital cmos pads |
| 07/24/2002 | EP1224480A1 Programme-controlled unit and method for identifying and/or analysing errors in programme-controlled units |
| 07/24/2002 | EP1224479A1 Built-in spare row and column replacement analysis system for embedded memories |
| 07/24/2002 | EP1224432A2 Automatic measuring apparatus, automatic measurement data processing and control apparatus, network system, and record medium of automatic measurement processing and control program |
| 07/24/2002 | EP1079993B1 Method and device for checking an electric circuit, especially an ignition circuit of a motor vehicle occupant protection system |
| 07/24/2002 | EP0985155B1 Method and device for testing electronic equipment |
| 07/24/2002 | EP0898715B1 Fast vector loading for automatic test equipment |
| 07/24/2002 | CN2502281Y Digital intellgient cell tester |
| 07/24/2002 | CN2502280Y Apparatus for raising test density |
| 07/24/2002 | CN1360741A Consumer battery having built-in indicator |
| 07/24/2002 | CN1360345A Processing system for cutting semiconductor packing device |
| 07/24/2002 | CN1360212A Hung indicator for low-current grounding failure of single-phase transmission line |
| 07/24/2002 | CN1088275C Recharging type power-supply unit |
| 07/24/2002 | CN1088198C Arrangement for testing cells, power supply circuit with same, and machine with such circuit |
| 07/24/2002 | CN1088197C Switching device |
| 07/23/2002 | US6425104 Method and system for test pattern generation and a computer readable medium instructing the system to perform the method |
| 07/23/2002 | US6425101 Programmable JTAG network architecture to support proprietary debug protocol |
| 07/23/2002 | US6425100 Snoopy test access port architecture for electronic circuits including embedded core with built-in test access port |
| 07/23/2002 | US6425097 Method and apparatus for testing an impedance-controlled input/output (I/O) buffer in a highly efficient manner |
| 07/23/2002 | US6425077 System and method for reading data from a programmable logic device |
| 07/23/2002 | US6424932 Methods and apparatus for measuring spectral energy |
| 07/23/2002 | US6424930 Distributed processing system for component lifetime prediction |
| 07/23/2002 | US6424653 Point-to-point link implemented over a broadcast network |
| 07/23/2002 | US6424587 Semiconductor memory device that is tested even with fewer test pins |
| 07/23/2002 | US6424168 Reduced terminal testing system |
| 07/23/2002 | US6424167 Vibration resistant test module for use with semiconductor device test apparatus |
| 07/23/2002 | US6424162 Insulated device diagnosing system that prepares detection data from partial discharge signal such that periodic elements are given to different specific frequencies of the partial discharge signal |
| 07/23/2002 | US6424161 Apparatus and method for testing fuses |
| 07/23/2002 | US6424160 Testing insulation between conductors |
| 07/23/2002 | US6424159 Methods and apparatus for monitoring contact slipring disconnections |
| 07/23/2002 | US6424158 Apparatus and method for carrying out diagnostic tests on batteries and for rapidly charging batteries |
| 07/23/2002 | US6424157 System and method for monitoring a vehicle battery |
| 07/23/2002 | US6424143 Process for monitoring the function of a sensor module and a sensor module to perform the process |
| 07/23/2002 | US6424142 Semiconductor device operable in a plurality of test operation modes |
| 07/23/2002 | US6424141 Wafer probe station |
| 07/23/2002 | US6424058 Testable on-chip capacity |
| 07/23/2002 | US6423653 Reduction of plasma damage for HDP-CVD PSG process |
| 07/23/2002 | US6423559 Integrated circuit and fabricating method and evaluating method of integrated circuit |
| 07/23/2002 | US6422879 IC socket for surface-mounting semiconductor device |
| 07/23/2002 | CA2133047C System for monitoring the insulation quality of step graded insulated high voltage apparatus |
| 07/18/2002 | WO2002056043A1 Semiconductor device tester and its method |
| 07/18/2002 | WO2002056042A1 Multiple-output arbitrary waveform generator and mixed lsi tester |
| 07/18/2002 | WO2002056041A1 A chamber for and a method of processing electronic devices and the use of such a chamber |
| 07/18/2002 | WO2002056040A1 Pusher and electronic part tester with the pusher |
| 07/18/2002 | WO2002056039A1 Method and apparatus for monitoring the health of individual electrical devices |
| 07/18/2002 | WO2002056038A1 Method for detecting short-circuit in circuit board, detecting jig used in the method, circuit board to be inspected, apparatus for detecting short-circuit in circuit board, and coil sensor for the inspection |
| 07/18/2002 | WO2002056037A1 Device and method for testing electronic components |
| 07/18/2002 | WO2002035249A3 Method and apparatus for testing for latch-up in integrated circuits |
| 07/18/2002 | WO2002031519A3 Automated monitoring system, virtual oven and method for stress testing logically grouped modules |
| 07/18/2002 | WO2002014885A3 Defective circuit scanning device and method |