| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/06/2002 | US6429675 Structure and method for probing wiring bond pads |
| 08/06/2002 | US6429674 Pulse circuit |
| 08/06/2002 | US6429673 Printed wiring board inspection apparatus |
| 08/06/2002 | US6429669 Temperature-insensitive electro-optic probe |
| 08/06/2002 | US6429667 Electrically testable process window monitor for lithographic processing |
| 08/06/2002 | US6429663 Apparatus for conserving fuses |
| 08/06/2002 | US6429661 Fault indicator for three-phase sheathed cable |
| 08/06/2002 | US6429659 Connection tester for an electronic trip unit |
| 08/06/2002 | US6429644 Method and apparatus of interconnecting with a system board |
| 08/06/2002 | US6429643 Device for measuring power using switchable impedance |
| 08/06/2002 | US6429626 Battery pack |
| 08/06/2002 | US6429454 Semiconductor device with test circuit |
| 08/06/2002 | US6429453 Substrate assembly for burn in test of integrated circuit chip |
| 08/06/2002 | US6429124 Local interconnect structures for integrated circuits and methods for making the same |
| 08/06/2002 | US6429029 Concurrent design and subsequent partitioning of product and test die |
| 08/06/2002 | US6428356 Test interface for coaxial cable |
| 08/06/2002 | US6428341 Inspecting jig for wire harness |
| 08/06/2002 | CA2292088C Method and apparatus for testing an arcing fault circuit interrupter |
| 08/06/2002 | CA2255900C Circuit for motion estimation in digitised video sequence encoders |
| 08/06/2002 | CA2211703C Test device for flat electronic assemblies |
| 08/01/2002 | WO2002059935A1 Method for determining photodiode performance parameters |
| 08/01/2002 | WO2002059632A1 Interleave ad conversion system waveform digitizer device, and test device |
| 08/01/2002 | WO2002059631A1 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current |
| 08/01/2002 | WO2002059630A1 Systems and methods for testing multi-gigahertz digital systems and components |
| 08/01/2002 | WO2002046730A8 System and method for measuring the dielectric strength of a fluid |
| 08/01/2002 | WO2002031520A3 Stress-test information database structure and method of use |
| 08/01/2002 | WO2002029825A3 Method to descramble the data mapping in memory circuits |
| 08/01/2002 | WO2002001233A3 Method and apparatus for adjusting the phase of input/output circuitry |
| 08/01/2002 | WO2001046706A3 Design-based reticle defect prioritization |
| 08/01/2002 | WO2001031718A9 Shunt resistance device for monitoring battery state of charge |
| 08/01/2002 | WO2000075677A9 Segmented contactor |
| 08/01/2002 | US20020104062 Validating integrated circuits |
| 08/01/2002 | US20020104052 Circuit including a built-in self-test |
| 08/01/2002 | US20020104051 Embedded field programmable gate array for performing built-in self test functions in a system on a chip and method of operation |
| 08/01/2002 | US20020104050 Automatable scan partitioning for low power using external control |
| 08/01/2002 | US20020104049 Semiconductor test system and method for effectively testing a semiconductor device having many pins |
| 08/01/2002 | US20020103618 System and method for delay line testing |
| 08/01/2002 | US20020103611 System and method for receiving information from a test apparatus |
| 08/01/2002 | US20020101774 Semiconductor memory device with controllable operation timing of sense amplifier |
| 08/01/2002 | US20020101740 Power supply voltage detection circuit and power supply voltage detection method |
| 08/01/2002 | US20020101270 Current pulse receiving circuit |
| 08/01/2002 | US20020101256 Detecting failures in printed circuit boards |
| 08/01/2002 | US20020101255 Method and apparatus for a device under test fixture |
| 08/01/2002 | US20020101254 Vertical probe card for attachment within a central corridor of a magnetic field generator |
| 08/01/2002 | US20020101251 Apparatus for and method of measuring capacitance with high accuracy |
| 08/01/2002 | US20020101249 Semiconductor integrated circuit and method for testing the same |
| 08/01/2002 | US20020101248 Bundled probe apparatus for multiple terminal contacting |
| 08/01/2002 | US20020101243 Method and device for determining the charge status of a battery |
| 08/01/2002 | US20020101227 Dc terminal polarity tester |
| 08/01/2002 | US20020101218 Battery pack having memory |
| 08/01/2002 | US20020101115 Method for communicating a wheel speed sensor fault in a vehicle anti-lock braking system |
| 08/01/2002 | US20020100971 Integrated circuit packages |
| 08/01/2002 | DE10201973A1 Thermographieverfahren und Vorrichtung zur Überprüfung elektrischer Leitungen Thermography method and apparatus for checking electrical lines |
| 08/01/2002 | DE10139810A1 Sensor zur Überwachung elektronischer Zündkreise Sensor for monitoring electronic ignition circuits |
| 08/01/2002 | DE10138077A1 Halbleiter-Herstellungs- und Inspektionssystem und Halbleitervorrichtung Semiconductor manufacturing and inspection system and semiconductor device |
| 08/01/2002 | DE10103853A1 Verfahren zur Ansteuerung einer Warnlampe bei einem Antiblockiersystem für Strassenfahrzeuge Method for driving a warning lamp in an anti-lock brake system for road vehicles |
| 08/01/2002 | DE10103848A1 Verfahren und Vorrichtung zur Bestimmung und/oder Beurteilung der Alterung oder zumindest eines vorgewählten Anteils der Alterung einer Batterie Method and apparatus for determining and / or assessing the aging or at least a preselected proportion of the deterioration of a battery |
| 08/01/2002 | DE10103061A1 Verfahren zur Inspektion der Tiefe einer Öffnung in einer dielektrischen Materialschicht A method for inspection of the depth of an opening in a dielectric material layer |
| 08/01/2002 | DE10102344A1 Verfahren zur Messung des Stromes in Halbbrücken A method for measuring the current in the half-bridges |
| 07/31/2002 | EP1227563A2 Method for charging a battery |
| 07/31/2002 | EP1227533A2 Secondary battery device and method of protecting an overdischarge of the same |
| 07/31/2002 | EP1227330A1 Power-supply voltage detection circuit and power-supply voltage detection method |
| 07/31/2002 | EP1227329A1 Poor powersupply connection detector circuit |
| 07/31/2002 | EP1227019A1 Method for controlling of a warning lamp for an antilock system for vehicles |
| 07/31/2002 | EP1226447A2 High resolution skew detection apparatus and method |
| 07/31/2002 | EP1226446A1 System for testing ic chips selectively with stored or internally generated bit streams |
| 07/31/2002 | EP1226445A1 Algorithmic test pattern generator for testing ic chips |
| 07/31/2002 | EP1226444A1 Multi-stage algorithmic pattern generator for testing ic chips |
| 07/31/2002 | EP1112504B1 Diagnostic circuitry for measuring the resistance and leakage current of at least one electric consumer, especially a primer in a motor vehicle passenger protection system, and a passenger protection system fitted therewith |
| 07/31/2002 | EP1073906B1 Method and apparatus for protecting sensitive data during automatic testing of hardware |
| 07/31/2002 | EP1071961B1 Layout, method and current measuring device for measuring a current in a conductor |
| 07/31/2002 | EP0961936B1 Semiconductor tester with data serializer |
| 07/31/2002 | CN1361935A Method and apparatus for detecting a failed thyristor |
| 07/31/2002 | CN1361869A Multi-layered electronic parts |
| 07/31/2002 | CN1361868A Method and apparatus for circuit board continuity test, tool for continuity test, and recording medium |
| 07/31/2002 | CN1361572A Method and apparatus for measuring charging and discharging current of battery |
| 07/31/2002 | CN1361428A Circuit time delay measuring method |
| 07/31/2002 | CN1361427A Remote transmitted display for faults of ultrahigh voltage transmission line |
| 07/30/2002 | US6427222 Inter-dice wafer level signal transfer methods for integrated circuits |
| 07/30/2002 | US6427218 Method of generating test pattern for semiconductor integrated circuit and method of testing the same |
| 07/30/2002 | US6427217 System and method for scan assisted self-test of integrated circuits |
| 07/30/2002 | US6427024 Apparatus for and method of automatic optical inspection of electronic circuit boards, wafers and the like for defects, using skeletal reference inspection and separately programmable alignment tolerance and detection parameters |
| 07/30/2002 | US6426904 Structures for wafer level test and burn-in |
| 07/30/2002 | US6426889 Semiconductor integrated circuit |
| 07/30/2002 | US6426813 Telemetry system and method for EMI susceptibility testing of motor vehicles |
| 07/30/2002 | US6426650 Integrated circuit with metal programmable logic having enhanced reliability |
| 07/30/2002 | US6426645 Semiconductor device that fixes a potential on an input signal wiring |
| 07/30/2002 | US6426643 Method for the testing of electronic components |
| 07/30/2002 | US6426641 Single pin performance screen ring oscillator with frequency division |
| 07/30/2002 | US6426640 Semiconductor module for burn-in test configuration |
| 07/30/2002 | US6426639 Method and apparatus for capacitively testing a semiconductor die |
| 07/30/2002 | US6426632 Method and apparatus for testing an AFCI/GFCI circuit breaker |
| 07/30/2002 | US6426553 Test socket of semiconductor device |
| 07/30/2002 | US6426499 Multi-probe test head and process using same |
| 07/30/2002 | US6426469 Printed board with signal wiring patterns that can measure characteristic impedance |
| 07/30/2002 | US6425771 IC socket |
| 07/30/2002 | US6425178 Carrier for a module integrated circuit handler |
| 07/30/2002 | CA2366340A1 System and method for automatic thermal detection of defects in electronic circuits |
| 07/25/2002 | WO2002058208A2 Microelectronic transient power generator for power system validation |
| 07/25/2002 | WO2002058137A2 Composite microelectronic spring structure and method for making same |