| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/13/2002 | US6433628 Wafer testable integrated circuit |
| 08/13/2002 | US6433617 Configuration for reducing the number of measuring pads on a semiconductor chip |
| 08/13/2002 | US6433616 Method and apparatus for detection of electrical overstress |
| 08/13/2002 | US6433574 Interconnect and system for testing bumped semiconductor components with on-board multiplex circuitry for expanding tester resources |
| 08/13/2002 | US6433573 Method and apparatus for measuring parameters of an electronic device |
| 08/13/2002 | US6433572 Intergrated circuit integrity analysis as a function of magnetic field decay |
| 08/13/2002 | US6433571 Process for testing a semiconductor device |
| 08/13/2002 | US6433570 Modular design for an integrated circuit testing apparatus |
| 08/13/2002 | US6433569 Apparatus for testing an integrated circuit in an oven during burn-in |
| 08/13/2002 | US6433568 Massive parallel semiconductor manufacturing test process |
| 08/13/2002 | US6433567 CMOS integrated circuit and timing signal generator using same |
| 08/13/2002 | US6433566 Probing method and probing system |
| 08/13/2002 | US6433563 Probe card with rigid base having apertures for testing semiconductor device, and semiconductor device test method using probe card |
| 08/13/2002 | US6433562 Method and apparatus of interconnecting with a system board |
| 08/13/2002 | US6433561 Methods and apparatus for optimizing semiconductor inspection tools |
| 08/13/2002 | US6433558 Method for diagnosing performance problems in cabling |
| 08/13/2002 | US6433557 Electrical system with capacitance tap and sensor for on-line monitoring the state of high-voltage insulation and remote monitoring device |
| 08/13/2002 | US6433532 Method and apparatus for mounting a load board onto a test head |
| 08/13/2002 | US6433513 Method, apparatus and computer readable recorded medium for secondary battery life evaluation |
| 08/13/2002 | US6433512 Power consumption reporting by an accessory of an electronic device |
| 08/13/2002 | US6433485 Apparatus and method of testing an organic light emitting diode array |
| 08/13/2002 | US6433410 Semiconductor device tester and method of testing semiconductor device |
| 08/13/2002 | US6433337 Method for detecting carrier profile |
| 08/13/2002 | US6433294 Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus |
| 08/13/2002 | US6432569 Method and apparatus for monitoring a selected group of fuel cells of a high-temperature fuel cell stack |
| 08/13/2002 | US6431814 Integrated wafer stocker and sorter with integrity verification system |
| 08/13/2002 | US6431749 Method and device to measure the temperature of microwave components |
| 08/08/2002 | WO2002061913A2 Method of and apparatus for estimating the state of charge of a battery |
| 08/08/2002 | WO2002061885A1 Terminal connector |
| 08/08/2002 | WO2002061518A1 Power supply device for a component testing installation |
| 08/08/2002 | WO2002061443A1 Nickel alloy probe card frame laminate |
| 08/08/2002 | WO2002061442A1 Planarizing interposer |
| 08/08/2002 | WO2002039131A3 Method for locating defects and measuring resistance in a test structure |
| 08/08/2002 | WO2002037128A3 Verification system |
| 08/08/2002 | WO2001095238A3 Chip design verifying and chip testing apparatus and method |
| 08/08/2002 | WO2001035051A9 X-ray tomography bga (ball grid array) inspections |
| 08/08/2002 | US20020108080 Apparatus and method for testing semiconductor integrated circuit |
| 08/08/2002 | US20020108079 Test pattern conversion apparatus and conversion method |
| 08/08/2002 | US20020108056 Semiconductor device including function verification capability |
| 08/08/2002 | US20020107654 Apparatus for testing semiconductor integrated circuit |
| 08/08/2002 | US20020107653 Sharing data files in a test environment |
| 08/08/2002 | US20020107581 Stress-test information database structure and method of use |
| 08/08/2002 | US20020106927 Low profile pneumatically actuated docking module with power fault release |
| 08/08/2002 | US20020106925 Socket for electrical parts |
| 08/08/2002 | US20020106911 Apparatus for establishing an electrical connection with a wafer to facilitate wafer-level burn-in and methods |
| 08/08/2002 | US20020106822 Test coupon for measuring a dielectric constant of a memory module board and method of use |
| 08/08/2002 | US20020106820 Device and method for nondestructive inspection on semiconductor device |
| 08/08/2002 | US20020106817 Semiconductor test apparatus, and method of testing semiconductor device |
| 08/08/2002 | US20020106154 Apparatus for and method of jointing probes |
| 08/08/2002 | US20020106058 2nd level power fault testing apparatus for testing telecommunications equipment |
| 08/08/2002 | US20020105847 Semiconductor memory device capable of switching reference voltage for generating intermediate voltage |
| 08/08/2002 | US20020105832 Nonvolatile semiconductor memory device detecting sign of data transformation |
| 08/08/2002 | US20020105818 Power conversion device with power source voltage drop detection unit |
| 08/08/2002 | US20020105768 Circuit breaker |
| 08/08/2002 | US20020105765 Apparatus and method of detecting ground fault of solar power generation system |
| 08/08/2002 | US20020105577 Device and method for nondestructive inspection on semiconductor device |
| 08/08/2002 | US20020105499 Method and apparatus for testing a joystick control circuit |
| 08/08/2002 | US20020105452 Apparatus and method for precision trimming of a semiconductor device |
| 08/08/2002 | US20020105371 Inverter circuit |
| 08/08/2002 | US20020105355 Automated monitoring system, virtual oven and method for stress testing logically grouped modules |
| 08/08/2002 | US20020105354 Semiconductor integrated circuit testing system and method |
| 08/08/2002 | US20020105353 External test ancillary device to be used for testing semiconductor device, and method of testing semiconductor device using the device |
| 08/08/2002 | US20020105352 Apparatus and method for testing semiconductor integrated circuit |
| 08/08/2002 | US20020105351 Systems and methods for testing bumped wafers |
| 08/08/2002 | US20020105350 Apparatus and method for driving circuit pins in a circuit testing system |
| 08/08/2002 | US20020105347 Contactor for testing semiconductor device and manufacturing method thereof |
| 08/08/2002 | US20020105337 Method and apparatus for probing an integrated circuit through capacitive coupling |
| 08/08/2002 | US20020105336 1st level power fault testing apparatus for testing telecommunications equipment |
| 08/08/2002 | US20020105315 Method of testing and/or monitoring the system frequency of a microcontroller and a microcontroller |
| 08/08/2002 | US20020105314 System and method for intersample timing error reduction |
| 08/08/2002 | US20020105304 Circuit and method for monitoring the operational reliability of rechargeable lithium cells |
| 08/08/2002 | US20020105303 Residual capacity correction method for battery |
| 08/08/2002 | US20020104683 Press-fit pin connection checking method and system |
| 08/08/2002 | US20020104212 Apparatus for establishing an electrical connection with a wafer to facilitate wafer-level burn-in and methods |
| 08/08/2002 | DE10132254A1 Simulationsvorrichtung für elektrische Verdrahtung und Aufzeichnungsmedium,welches ein Simulationsprogramm für die Simulationsvorrichtung für elektrische Verdrahtung aufzeichnet A simulation device for electrical wiring, and recording medium which records a simulation program for the simulation device for electrical wiring |
| 08/08/2002 | DE10104981A1 Verfahren zur Überwachung der Betriebssicherheit von wiederaufladbaren Li-Zellen Method for monitoring the operational reliability of rechargeable lithium cells |
| 08/08/2002 | DE10102349C1 Verfahren und Schaltungsanordnung zur Kennzeichnung einer Betriebseigenschaft einer integrierten Schaltung Method and circuit for identifying an operating characteristic of an integrated circuit |
| 08/07/2002 | EP1229629A2 Apparatus and method of detecting ground fault of solar power generation system |
| 08/07/2002 | EP1229462A1 Method and apparatus for analysing a source current waveform in a semiconductor integrated circuit |
| 08/07/2002 | EP1229339A2 Method of monitoring the safe operation of rechargeable lithium cells |
| 08/07/2002 | EP1229338A1 A test access port (TAP) management method and system |
| 08/07/2002 | EP1228381A1 Method of characterizing a device under test |
| 08/07/2002 | EP1228378A1 Method and apparatus for testing circuits with multiple clocks |
| 08/07/2002 | EP1116315A4 Battery charge measurement and discharge reserve time prediction technique and apparatus |
| 08/07/2002 | EP1032955A4 Apparatus and method for carrying out diagnostic tests on batteries and for rapidly charging batteries |
| 08/07/2002 | CN2504814Y Intelligent safety dynamo |
| 08/07/2002 | CN2504648Y Intelligence integrated debugging device |
| 08/07/2002 | CN1363042A Apparatus and method for inspection |
| 08/06/2002 | US6430728 Acoustic 3D analysis of circuit structures |
| 08/06/2002 | US6430725 System and method for aligning output signals in massively parallel testers and other electronic devices |
| 08/06/2002 | US6430720 Functional testing method and circuit including means for implementing said method |
| 08/06/2002 | US6430719 General port capable of implementing the JTAG protocol |
| 08/06/2002 | US6430718 Architecture, circuitry and method for testing one or more integrated circuits and/or receiving test information therefrom |
| 08/06/2002 | US6430717 Semiconductor integrated circuit device and method for monitoring its internal signal |
| 08/06/2002 | US6430517 Circuits, user terminals, and methods for determining information associated with pin limited devices using excitations of different frequencies |
| 08/06/2002 | US6430097 Semiconductor memory device enabling reduction of test time period |
| 08/06/2002 | US6429835 Method and apparatus for testing emissive cathodes |
| 08/06/2002 | US6429795 Method and apparatus for transforming pseudorandom binary patterns into test stimulus patterns appropriate for circuits having 1 of N encoded inputs |
| 08/06/2002 | US6429677 Method and apparatus for characterization of gate dielectrics |
| 08/06/2002 | US6429676 Semiconductor chip ground noise immunity testing system and tester |