| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/20/2002 | US6437699 Battery capacity indication circuit and indication method thereof, and battery-operated electronic device and cellular communication terminal apparatus comprising the indication circuit |
| 08/20/2002 | US6437623 Data retention registers |
| 08/20/2002 | US6437606 Method of anomalous offset detection and a corresponding circuit |
| 08/20/2002 | US6437597 Methods and circuits for precise edge placement of test signals |
| 08/20/2002 | US6437595 Method and system for providing an automated switching box for testing of integrated circuit devices |
| 08/20/2002 | US6437594 SOI pass gate leakage monitor |
| 08/20/2002 | US6437593 Electric device testing apparatus and electric device testing method |
| 08/20/2002 | US6437592 Characterization of a semiconductor/dielectric interface by photocurrent measurements |
| 08/20/2002 | US6437590 Integrated semiconductor device with wafer-level burn-in circuit and function decision method of wafer-level burn-in circuit |
| 08/20/2002 | US6437589 Semiconductor device test circuit |
| 08/20/2002 | US6437588 Circuitry testing substrates |
| 08/20/2002 | US6437587 ICT test fixture for fine pitch testing |
| 08/20/2002 | US6437584 Membrane probing system with local contact scrub |
| 08/20/2002 | US6437580 Cable continuity tester and tracer |
| 08/20/2002 | US6437579 Screening method for a multi-layered ceramic capacitor |
| 08/20/2002 | US6437578 Cable loss correction of distance to fault and time domain reflectometer measurements |
| 08/20/2002 | US6437576 Method for detecting short-circuit conditions and device which uses this method |
| 08/20/2002 | US6437574 Auxiliary battery test and alarm system for telecommunication equipment |
| 08/20/2002 | US6437557 PC card clamping device for automated test fixture |
| 08/20/2002 | US6437553 Method for delay line linearity testing |
| 08/20/2002 | US6437541 Battery state monitoring circuit and battery device |
| 08/20/2002 | US6437538 Battery voltage measurement apparatus |
| 08/20/2002 | US6437364 Internal probe pads for failure analysis |
| 08/20/2002 | US6437271 Method for sorting integrated circuit devices |
| 08/20/2002 | US6436741 Semiconductor integrated circuit device |
| 08/20/2002 | US6436725 Method of manufacturing semiconductor device using redundancy technique |
| 08/20/2002 | US6435045 Apparatus and method for automatically changing the probe head in a four-point probe system |
| 08/15/2002 | WO2002063766A2 Method and apparatus for detecting valid signal information |
| 08/15/2002 | WO2002063743A1 Detecting a microcurrent and a microcurrent detecting circuit |
| 08/15/2002 | WO2002063323A2 Method and apparatus for contactless capacitive testing of integrated circuits |
| 08/15/2002 | WO2002063322A1 Member exchanger, method of controlling member exchanger, ic inspection method, ic handler, and ic inspector |
| 08/15/2002 | WO2002063321A2 Test circuitry of an integrated circuit comprising only one selection element for each signal path |
| 08/15/2002 | WO2002063318A2 System and method for sampling timing error reduction |
| 08/15/2002 | WO2002063315A1 Low profile pneumatically actuated docking module with power fault release |
| 08/15/2002 | WO2002063314A1 Probe |
| 08/15/2002 | WO2002063313A2 Method for scan testing of digital circuit, digital circuit and program product |
| 08/15/2002 | WO2002048718A3 Condition diagnosing |
| 08/15/2002 | WO2002001237A3 System and method for testing integrated circuits |
| 08/15/2002 | WO2001092897A3 Systems and methods employing micro-fabricated field emission devices to sense and control potential differences between a space object and its space plasma environment, to emit charge from a space object, and in use with an electrodynamic tether to adjust an orbit of an orbiting space object |
| 08/15/2002 | US20020112218 Delay time calculating method by delay equivalent circuit |
| 08/15/2002 | US20020112216 Method and system for representing hierarchical extracted resistance-capacitance files of a circuit model |
| 08/15/2002 | US20020112213 Design analysis tool for path extraction and false path identification and method thereof |
| 08/15/2002 | US20020112209 Sequential test pattern generation using combinational techniques |
| 08/15/2002 | US20020112208 Method and apparatus for failure detection utilizing functional test vectors and scan mode |
| 08/15/2002 | US20020112207 Method and system for inferring fault propagation paths in combinational logic circuit |
| 08/15/2002 | US20020112206 Semiconductor module with a configuration for the self-test of a plurality of interface circuits and test method |
| 08/15/2002 | US20020112199 Adapting scan-bist architectures for low power operation |
| 08/15/2002 | US20020111759 Failure analysis device and failure analysis method |
| 08/15/2002 | US20020111051 Bare chip carrier and method for manufacturing semiconductor device using the bare chip carrier |
| 08/15/2002 | US20020110957 Method of using a semiconductor chip package |
| 08/15/2002 | US20020110942 System and method for prototyping and fabricating complex microwave circuits |
| 08/15/2002 | US20020110939 Semiconductor device and method of inspecting the same |
| 08/15/2002 | US20020110198 Multi-pair transceiver decoder system with low computation slicer |
| 08/15/2002 | US20020110027 Semiconductor data storing circuit device, method of checking the device and method of relieving the device from defective cell |
| 08/15/2002 | US20020109734 GUI processing system for performing an operation of an application which controls testing equipment |
| 08/15/2002 | US20020109524 Test system for conducting a function test of a semiconductor element on a wafer, and operating method |
| 08/15/2002 | US20020109523 Reduced cost, high speed integrated circuit test arrangement |
| 08/15/2002 | US20020109522 Test system and test method of semiconductor device |
| 08/15/2002 | US20020109520 Method and apparatus for wafer-level testing of semiconductor lasers |
| 08/15/2002 | US20020109519 Planar subassembly for testing IC chips having faces with pressed electrical contacts that carry all power and signals for the chips |
| 08/15/2002 | US20020109518 Device testing apparatus |
| 08/15/2002 | US20020109517 Automated multi-chip module handler and testing system |
| 08/15/2002 | US20020109514 Planarizing interposer |
| 08/15/2002 | US20020109508 Test pen for lamp strings |
| 08/15/2002 | US20020109507 In-service testing of current transformers |
| 08/15/2002 | US20020109506 Detecting method for detecting internal state of a rechargeable battery, detecting device for practicing said detecting method, and instrument provided with said detecting device |
| 08/15/2002 | US20020109504 Method and apparatus using a circuit model to evaluate cell/battery parameters |
| 08/15/2002 | US20020109414 Capacitive load driving unit and method and apparatus for inspecting the same |
| 08/15/2002 | CA2404884A1 System and method for intersample timing error reduction |
| 08/14/2002 | EP1231551A2 Process of simulating defects, which may appear during the semiconductor manufacturing process, as well as associated components |
| 08/14/2002 | EP1231476A2 Method and apparatus for determining the performance of a battery |
| 08/14/2002 | EP1231475A2 Procedure and method of determining the state of a technical system such as an energy storage |
| 08/14/2002 | EP1231360A2 Method for starting an internal combustion engine with electromagnetic valve drives |
| 08/14/2002 | EP1230709A2 Consumer battery having a built-in indicator |
| 08/14/2002 | EP1032519B1 Protective circuit for a controlling element and method for testing the control circuit of a controlling element |
| 08/14/2002 | EP1004059B1 Method for detecting malfunctions of a first relay |
| 08/14/2002 | EP0956500B1 Infrared screening and inspection system |
| 08/14/2002 | EP0939997B1 Back-up battery management system for a dc power supply |
| 08/14/2002 | EP0877946B1 Method of detecting an abrupt variation in an electrical alternating quantity |
| 08/14/2002 | DE19935867C2 Verfahren und Vorrichtung zur Ortung von Kabelfehlern Method and apparatus for locating cable faults |
| 08/14/2002 | DE10150050A1 Verfahren und Vorrichtung zur Erfassung eines Signales Method and apparatus for detection of a signal |
| 08/14/2002 | CN2505849Y Battery performance testing holder |
| 08/14/2002 | CN2505848Y Electrolytic capacitor current leakage measuring tool |
| 08/14/2002 | CN2505847Y Electron rectifier testing apparatus |
| 08/14/2002 | CN2505846Y Quartz crystal wafer frequency automatic selecting device |
| 08/14/2002 | CN1363935A Semiconductor storaging device for shortening test time |
| 08/14/2002 | CN1363841A Examination method for integrated circuit |
| 08/13/2002 | US6434733 System and method for high-level test planning for layout |
| 08/13/2002 | US6434728 Activation path simulation equipment and activation path simulation method |
| 08/13/2002 | US6434716 Network link tester device configured to selectively and automatically couple to a network transmit pair line or a node transmit pair line of a LAN port and determine available operational modes |
| 08/13/2002 | US6434503 Automated creation of specific test programs from complex test programs |
| 08/13/2002 | US6434491 Method of analyzing electromagnetic fields in rotary machine and electromagnetic field analyzer |
| 08/13/2002 | US6434285 Fiber optic difference current sensor |
| 08/13/2002 | US6434264 Vision comparison inspection system |
| 08/13/2002 | US6434070 Semiconductor integrated circuit with variable bit line precharging voltage |
| 08/13/2002 | US6434068 Nonvolatile semiconductor memory with testing circuit |
| 08/13/2002 | US6434065 Semiconductor memory device of low power consumption |
| 08/13/2002 | US6433989 Overvoltage protector for high or medium voltage |
| 08/13/2002 | US6433976 Instantaneous arc fault light detector with resistance to false tripping |
| 08/13/2002 | US6433714 Apparatus and method for precision trimming of a semiconductor device |