| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 08/27/2002 | US6442724 Failure capture apparatus and method for automatic test equipment |
| 08/27/2002 | US6442723 Logic built-in self test selective signature generation |
| 08/27/2002 | US6442722 Method and apparatus for testing circuits with multiple clocks |
| 08/27/2002 | US6442721 Accelerating scan test by re-using response data as stimulus data |
| 08/27/2002 | US6442720 Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis |
| 08/27/2002 | US6442718 Memory module test system with reduced driver output impedance |
| 08/27/2002 | US6442717 Parallel bit testing circuits and methods for integrated circuit memory devices including shared test drivers |
| 08/27/2002 | US6442716 Data output buffer |
| 08/27/2002 | US6442542 Diagnostic system with learning capabilities |
| 08/27/2002 | US6442499 Methods and apparatus for statistical process control of test |
| 08/27/2002 | US6442498 Apparatus and method for determining the integrity of cables and wiring harnesses |
| 08/27/2002 | US6442494 Method and circuit for detecting batteries in a distributed battery network |
| 08/27/2002 | US6442493 Method of detecting a fault in a monitored section of an electric transmission line using distance protection techniques |
| 08/27/2002 | US6442049 Power conversion device with power source voltage drop detection unit |
| 08/27/2002 | US6441675 Method and apparatus for detection of electrical overstress |
| 08/27/2002 | US6441668 Digital device with internal differential signal generator |
| 08/27/2002 | US6441637 Apparatus and method for power continuity testing in a parallel testing system |
| 08/27/2002 | US6441636 Device for testing printed boards |
| 08/27/2002 | US6441635 Method for the statistical test of integrated circuits |
| 08/27/2002 | US6441634 Apparatus for testing emissive cathodes in matrix addressable displays |
| 08/27/2002 | US6441633 High resolution (quiescent) supply current system (IDD monitor) |
| 08/27/2002 | US6441631 Processor module heatsink mounting guide posts for function test |
| 08/27/2002 | US6441630 Probing apparatus and head plate opening/closing force-reducing mechanism |
| 08/27/2002 | US6441629 Probe contact system having planarity adjustment mechanism |
| 08/27/2002 | US6441621 Waveform observing jig and waveform observing device |
| 08/27/2002 | US6441619 Remaining charge detection device for power storage unit |
| 08/27/2002 | US6441607 Apparatus for docking a floating test stage in a terrestrial base |
| 08/27/2002 | US6441606 Dual zone wafer test apparatus |
| 08/27/2002 | US6441600 Apparatus for measuring the duty cycle of a high speed clocking signal |
| 08/27/2002 | US6441592 Method for measurement of backup power supply capacitance in restraint control module |
| 08/27/2002 | US6441587 Method to determine capacity of a battery |
| 08/27/2002 | US6441586 State of charge prediction method and apparatus for a battery |
| 08/27/2002 | US6441585 Apparatus and method for testing rechargeable energy storage batteries |
| 08/27/2002 | US6440771 Method for constructing a wafer interposer by using conductive columns |
| 08/27/2002 | US6440757 Microelectronic fabrication die electrical probe apparatus electrical test method providing enhanced microelectronic fabrication die electrical test accuracy and efficiency |
| 08/27/2002 | US6439910 Rotatable guide member for a socket for electrical parts |
| 08/27/2002 | US6439897 Socket apparatus for removably mounting electronic packages with improved contacting system |
| 08/22/2002 | WO2002065734A1 Packet transmitter unit, packet receiver unit and packet transmission system |
| 08/22/2002 | WO2002065612A1 Charging/discharging apparatus and method, power supplying apparatus and method, power supplying system and method, program storage medium, and program |
| 08/22/2002 | WO2002065588A1 Anisotropic conductive connector, its manufacture method and probe member |
| 08/22/2002 | WO2002065544A1 User interface of semiconductor evaluator |
| 08/22/2002 | WO2002065146A2 APPARATUS AND METHOD FOR DRIVING CIRCUIT PINS IN A CIRCUIT testing system |
| 08/22/2002 | WO2000058740A3 Static charge warning device |
| 08/22/2002 | WO2000027097A9 Fault conditions affecting high speed data services |
| 08/22/2002 | US20020116696 Capacitance and transmission line measurements for an integrated circuit |
| 08/22/2002 | US20020116694 Dynamic test program generator for VLIW simulation |
| 08/22/2002 | US20020116691 Semi-physical modeling of HEMT high frequency noise equivalent circuit models |
| 08/22/2002 | US20020116690 Method for insertion of test points into integrated logic circuit designs |
| 08/22/2002 | US20020116675 Method and system for determining common failure modes for integrated circuits |
| 08/22/2002 | US20020116674 Boundary scan delay chain for cross-chip delay measurement |
| 08/22/2002 | US20020116671 Alarm display unit of IC tester |
| 08/22/2002 | US20020116666 System and method for testing a group of related products |
| 08/22/2002 | US20020116142 Signal inspection device |
| 08/22/2002 | US20020116140 Method and apparatus for testing batteries on a golf car |
| 08/22/2002 | US20020116139 Apparatus and method for measuring and reporting the reliability of a power distribution system |
| 08/22/2002 | US20020115337 Socket for electrical parts |
| 08/22/2002 | US20020114203 Semiconductor integrated circuit with variable bit line precharging voltage |
| 08/22/2002 | US20020113958 Optical coupling for testing integrated circuits |
| 08/22/2002 | US20020113614 Method and apparatus to enhance testability of logic coupled to IO buffers |
| 08/22/2002 | US20020113613 Characterizing semiconductor wafers with enhanced S parameter contour mapping |
| 08/22/2002 | US20020113610 Test system and associated interface module |
| 08/22/2002 | US20020113606 Method of determining when electrode pads are unsuitable for use by detecting relative humidity |
| 08/22/2002 | US20020113602 Pinched object detection apparatus for detecting object pinched by automatic door |
| 08/22/2002 | US20020113598 Circuit board testing apparatus and method for testing a circuit board |
| 08/22/2002 | US20020113595 Battery control method for hybrid vehicle |
| 08/22/2002 | US20020113594 Vehicle battery's open circuit voltage estimating method and a system therefor |
| 08/22/2002 | US20020113593 Method for determining the performance of a storage battery |
| 08/22/2002 | US20020113574 Charge and discharge controller |
| 08/21/2002 | EP1233422A1 Method and apparatus for refreshing reference cells |
| 08/21/2002 | EP1233341A1 Embedded logic analyser |
| 08/21/2002 | EP1233278A2 Device for diagnosing a generator with mounted rotor |
| 08/21/2002 | EP1233277A2 Memory designs for IC terminals |
| 08/21/2002 | EP1233276A1 Boundary scan delay chain for crosschip delay measurement |
| 08/21/2002 | EP1233275A2 Circuit board testing apparatus and method |
| 08/21/2002 | EP1232634A1 Non-contact signal analyzer |
| 08/21/2002 | EP1232592A1 Active-passive flow switch failover technology |
| 08/21/2002 | EP1232399A1 High-speed failure capture apparatus and method for automatic test equipment |
| 08/21/2002 | EP1232398A1 Apparatus and method for testing coating of an electrical conductor |
| 08/21/2002 | EP1232384A1 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool |
| 08/21/2002 | EP0904548B1 Test system and test method |
| 08/21/2002 | CN2507152Y Intelligent accumulator tester |
| 08/21/2002 | CN2507018Y High-frequency stabilizing current type discharge monitor for accumulator |
| 08/21/2002 | CN2507017Y Short circuit fault indicator for electric power line |
| 08/21/2002 | CN1365020A Device and method for predicting cell output voltage of digital camera |
| 08/21/2002 | CN1365006A Test method and circuit for tristate gate control end |
| 08/21/2002 | CN1365005A Comprehensive measuring method for the optical and electric characters of semiconductor laser |
| 08/21/2002 | CN1089501C Video camera |
| 08/21/2002 | CN1089441C Method and apapratus for testing a megacell in an ASIC using JTAG |
| 08/21/2002 | CN1089440C Jtag testing of buses using plug-in card with Jtag logic mounted thereon |
| 08/21/2002 | CN1089439C Loakage current correction circuit |
| 08/20/2002 | US6438722 Method and system for testing an integrated circuit |
| 08/20/2002 | US6438719 Memory supervision |
| 08/20/2002 | US6438502 Environmental condition sensor device and method |
| 08/20/2002 | US6438438 Method and system for manufacturing semiconductor devices, and method and system for inspecting semiconductor devices |
| 08/20/2002 | US6438163 Cable length and quality indicator |
| 08/20/2002 | US6438102 Method and apparatus for providing asynchronous memory functions for bi-directional traffic in a switch platform |
| 08/20/2002 | US6438056 Method and device for refreshing the memory content of a memory cell of a read-only memory |
| 08/20/2002 | US6438017 Read/write eight-slot CAM with interleaving |
| 08/20/2002 | US6437957 System and method for providing surge, short, and reverse polarity connection protection |
| 08/20/2002 | US6437956 Circuit for bipolar transistor stress and qualification |