| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/03/2002 | US6445558 Semiconductor integrated circuit device having pseudo-tuning function |
| 09/03/2002 | US6445305 CMOS low battery voltage detector |
| 09/03/2002 | US6445235 Iddq-testable uni-directional master-slave |
| 09/03/2002 | US6445208 Power source current measurement unit for semiconductor test system |
| 09/03/2002 | US6445207 IC tester and IC test method |
| 09/03/2002 | US6445206 Method and apparatus for determining yield impacting tests at wafer level package level for semiconductor devices |
| 09/03/2002 | US6445204 Apparatus for probing digital signals within printed circuit boards |
| 09/03/2002 | US6445203 Electric device testing apparatus |
| 09/03/2002 | US6445202 Probe station thermal chuck with shielding for capacitive current |
| 09/03/2002 | US6445201 IC package testing device and method for testing IC package using the same |
| 09/03/2002 | US6445200 Semiconductor element testing carrier using a membrane contactor and a semiconductor element testing method and apparatus using such a carrier |
| 09/03/2002 | US6445199 Methods and apparatus for generating spatially resolved voltage contrast maps of semiconductor test structures |
| 09/03/2002 | US6445198 Electro-optic sampling probe and a method for adjusting the same |
| 09/03/2002 | US6445197 Electron beam tester, recording medium therefor and signal data detecting method |
| 09/03/2002 | US6445190 Connector continuity checking device |
| 09/03/2002 | US6445189 Method and system for identifying cause of partial discharges |
| 09/03/2002 | US6445188 Intelligent, self-monitoring AC power plug |
| 09/03/2002 | US6445174 Sliding tray holder for ease in handling IC packages during testing of the IC packages |
| 09/03/2002 | US6445173 Printed circuit board tester |
| 09/03/2002 | US6445172 Wafer probing system and method of calibrating wafer probing needle using the same |
| 09/03/2002 | US6445162 Detecting a remaining battery capacity and a battery remaining capacity circuit |
| 09/03/2002 | US6445158 Vehicle electrical system tester with encoded output |
| 09/03/2002 | US6445042 Method and apparatus for making MOSFETs with elevated source/drain extensions |
| 09/03/2002 | US6445002 SRAM-based semiconductor integrated circuit testing element |
| 09/03/2002 | US6444925 Press-fit pin connection checking method and system |
| 09/03/2002 | US6444895 Irradiation surfaces with laser beams; nondeforming detection of defects |
| 09/03/2002 | US6443784 Contact and contact assembly using the same |
| 08/29/2002 | WO2002067638A1 Printed wiring board, multilayer printed wiring board, and, method of detecting foreign matter and voids in inner layer of multilayer printed wiring board |
| 08/29/2002 | WO2002067430A1 Interleave ad conversion system waveform digitizer device |
| 08/29/2002 | WO2002067003A1 Test circuit for hvdc thyristor valves |
| 08/29/2002 | WO2002067002A1 Method and device for testing the quality of printed circuits |
| 08/29/2002 | WO2002067001A1 Multiple-capture dft system for detecting or locating crossing clock-domain faults during self-test or scan test |
| 08/29/2002 | WO2002067000A1 Insert for electronic component test device |
| 08/29/2002 | WO2002048721A3 Method and device for monitoring the function of an output stage with pulse width modulation |
| 08/29/2002 | WO2002027337A3 High performance tester interface module |
| 08/29/2002 | WO2001098788A3 Diagnosting reliability of vias by e-beam probing |
| 08/29/2002 | WO2001088976B1 Wireless radio frequency testing methode of integrated circuits and wafers |
| 08/29/2002 | US20020120908 Process and system for management of test access port (TAP) functions |
| 08/29/2002 | US20020120906 Behavioral modeling and analysis of galvanic devices |
| 08/29/2002 | US20020120898 Digital random noise generator |
| 08/29/2002 | US20020120897 Test generator having a poisson distribution error signal |
| 08/29/2002 | US20020120896 Multiple-capture DFT system for detecting or locating crossing clock-domain faults during self-test or scan-test |
| 08/29/2002 | US20020120895 Integrated circuit device having boundary scan register |
| 08/29/2002 | US20020120894 Integrated circuit |
| 08/29/2002 | US20020120893 Integrated circuit testing method and system |
| 08/29/2002 | US20020120892 Error detecting circuit for detecting the location of error |
| 08/29/2002 | US20020120891 Method for diagnosing failures using invariant analysis |
| 08/29/2002 | US20020120773 Network documentation system with electronic modules |
| 08/29/2002 | US20020120417 Semi conductor production system |
| 08/29/2002 | US20020118590 Semiconductor memory device with low power consumption |
| 08/29/2002 | US20020118502 In-vehicle electric load drive/controlling device |
| 08/29/2002 | US20020118348 Semiconductor manufacturing device |
| 08/29/2002 | US20020118046 Detection of clock signal period abnormalities |
| 08/29/2002 | US20020118035 Testing method for buried strap and deep trench leakage current |
| 08/29/2002 | US20020118034 Transistor device testing employing virtual device fixturing |
| 08/29/2002 | US20020118033 IC tester and method of cooling the IC tester |
| 08/29/2002 | US20020118032 Heating apparatus containing an array of surface mount components for DUT performance testing |
| 08/29/2002 | US20020118031 Connector test card |
| 08/29/2002 | US20020118022 Arc detection |
| 08/29/2002 | US20020118021 Method of fault location in parallel transmission lines with series compensation |
| 08/29/2002 | US20020118018 Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device and method of manufacturing semiconductor integrated circuit device |
| 08/29/2002 | US20020118017 Apparatus and method for testing semiconductor integrated circuit |
| 08/29/2002 | US20020118009 Wafer probe station |
| 08/29/2002 | US20020118008 Autohandler |
| 08/29/2002 | US20020118007 External test auxiliary device to be used for testing semiconductor device |
| 08/29/2002 | US20020117997 Method of predicting the state of charge as well as the use time left of a rechargeable battery |
| 08/29/2002 | US20020117993 Battery charger |
| 08/29/2002 | US20020117729 Semiconductor integrated circuit device |
| 08/29/2002 | US20020117619 Inspecting system using electron beam and inspecting method using same |
| 08/29/2002 | US20020117468 Method for forming a recognition mark on a substrate for a KGD |
| 08/29/2002 | US20020117383 Tray accommodation unit |
| 08/29/2002 | US20020117330 Resilient contact structures formed and then attached to a substrate |
| 08/29/2002 | US20020117132 Method of estimating the effect of the parasitic currents in an electromagnetic actuator for the control of an engine valve |
| 08/29/2002 | DE10150509A1 Halbleiter-Datenspeicherschaltungseinrichtung, Verfahren zum Prüfen der Einrichtung, und Verfahren zum Befreien der Einrichtung von einer defekten Zelle Semiconductor data storage circuit means, method of testing the device, and method for freeing the device from a defective cell |
| 08/29/2002 | DE10145153A1 Halbleiterspeichervorrichtung mit steuerbarer Operationszeit des Leseverstärkers A semiconductor memory device having a controllable operating time of the sense amplifier |
| 08/29/2002 | DE10107583A1 Verfahren zur Bestimmung der Leistungsfähigkeit einer Speicherbatterie A method for determining the performance of a storage battery |
| 08/29/2002 | DE10107401A1 Vorrichtung zur Generatordiagnose bei eingebautem Rotor Apparatus for generating diagnosis of built-in rotor |
| 08/29/2002 | DE10106508A1 Verfahren und Anordnung zur Bestimmung der Leistungsfähigkeit einer Batterie Method and apparatus for determining the performance of a battery |
| 08/29/2002 | DE10106505A1 Verfahren und Vorrichtung zur Zustandserfassung von technischen Systemen wie Energiespeicher Method and apparatus for determining the condition of technical systems, such as energy storage |
| 08/29/2002 | DE10105366A1 Elektrische Verbindungsstruktur im Kraftfahrzeug Electrical connection structure in the motor vehicle |
| 08/29/2002 | DE10102752A1 Anirdnung und Verfahren zur Messung von Hochfrequenzparametern einer elektronischen Schaltung mit angeschlossener Antenne Anirdnung and method for measurement of high frequency parameters of an electronic circuit with connected antenna |
| 08/29/2002 | CA2439167A1 Method and device for testing the quality of printed circuits |
| 08/28/2002 | EP1235152A2 Apparatus and method for in-circuit emulation using a high-level programming language |
| 08/28/2002 | EP1234236A2 Hardware debugging in a hardware description language |
| 08/28/2002 | EP1234189A1 Multi-layered electronic parts |
| 08/28/2002 | EP0981758B1 Battery monitoring in metering systems |
| 08/28/2002 | EP0880708B1 I/o toggle test method using jtag |
| 08/28/2002 | EP0877948B1 Method of detecting a fault in a monitored section of an electric transmission line using distance protection techniques |
| 08/28/2002 | EP0864099B1 Process and device for testing electric drives |
| 08/28/2002 | CN2508253Y High-voltage transmission line insulator live line testing device |
| 08/28/2002 | CN1366798A Laminate with inside layer circuit used for multilayer printed circuit board for high frequency circuit, and method and device for measuring circuit impedance of laminate with inside layer circuit |
| 08/28/2002 | CN1366614A Integrated circuit with test interface |
| 08/28/2002 | CN1366612A Current measuring apparatus for battery |
| 08/28/2002 | CN1366189A 电池状态监测电路以及电池装置 Battery status monitor circuit and battery device |
| 08/28/2002 | CN1366188A Induction motor overload detector and overload detecting method |
| 08/28/2002 | CN1366187A Automatic tester and its method for motherboard |
| 08/28/2002 | CN1366186A Open circuit/short circuit detector and its detection method |
| 08/28/2002 | CN1089980C Electronic camera and battery voltage controlling method employed therein |
| 08/27/2002 | US6442733 Failure analyzing method and apparatus using two-dimensional wavelet transforms |
| 08/27/2002 | US6442725 System and method for intelligent analysis probe |