Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2002
09/10/2002US6448801 Method and device for supporting flip chip circuitry in analysis
09/10/2002US6448800 Load current output circuit for electronic device and IC tester using the same load current output circuit
09/10/2002US6448799 Timing adjustment method and apparatus for semiconductor IC tester
09/10/2002US6448798 Electronic device system including semiconductor integrated circuits
09/10/2002US6448797 Method and apparatus automated docking of a test head to a device handler
09/10/2002US6448796 Selective netlist to test fine pitch multi-chip semiconductor
09/10/2002US6448786 Stimulus/response system and method for vector characterization of frequency translation devices
09/10/2002US6448784 Configuration and method for testing a circuit apparatus provided for controlling an occupant protection device of a motor vehicle
09/10/2002US6448783 Method of inspecting semiconductor chip with projecting electrodes for defects
09/10/2002US6448782 Arrangement and method for defining the location of source of partial discharges
09/10/2002US6448781 Method and system for analyzing cable faults
09/10/2002US6448779 Wiring test assembly
09/10/2002US6448778 Automated verification of proper connectivity of components to a wiring harness during assembly of article of manufacture
09/10/2002US6448776 Method for measuring fitness for use of a storage battery subject to electric loading
09/10/2002US6448758 Method for determining wear and other characteristics of electrodes in high voltage equipment
09/10/2002US6448743 Rechargeable battery pack
09/10/2002US6448662 Arrangement for accessing region of a flip chip die
09/10/2002US6448636 Multi-layered integrated semiconductor device incorporating electrically connected integrated circuit chips and monitoring pads
09/10/2002US6448547 Method for determining photodiode performance parameters
09/10/2002US6448525 Capacitor characteristics measurement and packing apparatus
09/10/2002US6448524 Circuit board handler
09/10/2002US6448099 Method and apparatus for detecting voltage contrast in a semiconductor wafer
09/10/2002US6448095 Circuit access and analysis for a SOI flip-chip die
09/10/2002US6447328 Method and apparatus for retaining a spring probe
09/10/2002US6447162 Semiconductor wirebond machine leadframe thermal map system
09/10/2002US6446867 Electro-optic interface system and method of operation
09/10/2002US6446508 Vibration compartment environmental control
09/10/2002US6446354 Handler system for cutting a semiconductor package device
09/10/2002CA2260773C Model-based fault detection system for electric motors
09/10/2002CA2113013C Automatic testing of circuit-size cables
09/06/2002WO2002069565A2 Network documentation system with electronic modules
09/06/2002WO2002068977A1 Method and assembly for determining the output capacity of a battery
09/06/2002WO2002068976A1 Method for measuring propagation delay time and test equipment
09/06/2002WO2002068975A1 Ic testing device with a heating apparatus
09/06/2002WO2002068971A1 Method of determining when electrode pads are unsuitable for use by detecting relative humidity
09/06/2002WO2002068968A2 Low-cost, compact, frequency domain reflectometry system for testing wires and cables
09/06/2002WO2002027342A3 Measurement of fuel cell impedance
09/06/2002WO2001064389A3 Vertical counter balanced test head manipulator
09/06/2002WO2001007871A9 Enhancing voltmeter functionality
09/06/2002WO2001004642A9 Kinematic coupling
09/05/2002US20020124219 Pseudo random signal producing circuit
09/05/2002US20020124218 Method of testing a semiconductor integrated circuit and method and apparatus for generating test patterns
09/05/2002US20020124217 Testing apparatus and testing method for an integrated circuit, and integrated circuit
09/05/2002US20020124216 Integrated circuit and method of operation of such a circuit
09/05/2002US20020124146 Data processing device, signal processing device, and interface device
09/05/2002US20020124120 Universal laboratory prototyping interface system
09/05/2002US20020123869 Simulation method and test arrangement for determining nonlinear signal distortion
09/05/2002US20020123853 Generating and using calibration information
09/05/2002US20020123850 System and method for providing information on secondary batteries for storing electric power
09/05/2002US20020123252 Contact structure and production method thereof and probe contact assembly using same
09/05/2002US20020123161 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device
09/05/2002US20020122879 Forming a crystalline thin film on inner surfaces of voids in a porous amorphous film; generating image data representing porous amorphous film having said crystalline thin film with using a transmission electron microscope
09/05/2002US20020122479 Multi-pair gigabit ethernet transceiver
09/05/2002US20020122334 Flash memory device with cell current measuring scheme using write driver
09/05/2002US20020121917 Apparatus and method for testing electrode structure for thin display device using FET function
09/05/2002US20020121916 Semiconductor tester, semiconductor integrated circuit and semiconductor testing method
09/05/2002US20020121914 Non-contact method for determining soft breakdown in dielectrics
09/05/2002US20020121913 Tester with independent control of devices under test
09/05/2002US20020121910 Electronics board life prediction of microprocessor-based transmitters
09/05/2002US20020121908 Method and device for inspecting a microactuator
09/05/2002US20020121904 Curcuit for improved test and calibration in automated test equipment
09/05/2002US20020121903 Systems and methods for locating faults on a transmission line with a single tapped load
09/05/2002US20020121902 Ground detection apparatus for electric vehicle
09/05/2002US20020121901 Apparatus and method for testing battery condition
09/05/2002US20020121900 Connection tester for an electronic trip unit
09/05/2002DE4143545C2 Testing external quality of objects, esp. components on PCB
09/05/2002DE10160092A1 Integrierte Halbleiterschaltungsvorrichtung A semiconductor integrated circuit device
09/05/2002DE10136443A1 Taktkalibrierverfahren und Halbleiterbauelement-Testgerät mit Taktkalibrierfunktion Taktkalibrierverfahren and semiconductor device testing apparatus with Taktkalibrierfunktion
09/05/2002DE10114291C1 IC chip testing method compares voltage applied to one supply voltage terminal of each tested IC chip with detected voltage at different supply voltage terminal of IC chip
09/05/2002DE10109879A1 Device for handling small components, especially electronic components for test purposes, has a handling mechanism that greatly reduces the contact force when a component is brought together with test contacts
09/05/2002DE10106200C1 Insulation monitoring method for unearthed electrical network uses pulses AC voltage applied between network and earth and evaluation of measured current values
09/05/2002DE10104633A1 Anschlussklemme Terminal
09/04/2002EP1237282A1 Circuit for the detection of clock signal period abnormalities
09/04/2002EP1237280A2 Enhanced field programmable gate array
09/04/2002EP1237249A2 Protection relay
09/04/2002EP1237069A2 Data procesing device, signal procesing device, and interface device
09/04/2002EP1236120A1 Measurement module and system for monitoring the status of armored vehicle electronic components
09/04/2002EP1236111A1 Test pattern compression for an integrated circuit test environment
09/04/2002EP1236053A2 A test access port (tap) controller system and method to debug internal intermediate scan test faults
09/04/2002EP1236052A1 Electrical test of the interconnection of conductors on a substrate
09/04/2002EP1236051A2 Bit fail map compression with fail signature analysis
09/04/2002EP1236017A2 X-ray tomography bga ( ball grid array ) inspections
09/04/2002EP0946914B1 Methods and devices relating to circuit board constructions
09/04/2002CN2509588Y Domestic power source socket wiring testing device
09/04/2002CN1367872A Method and apparatus to transport, inspect and measure objects and surface details at high speeds
09/04/2002CN1367392A High-accuracy failure wave-recording device and its transmission line combined failure distance-measuring method
09/04/2002CN1367391A High-voltage transmission line insulator live intelligent detector apparatus
09/04/2002CN1367371A Circuit board checking device and method
09/04/2002CN1090325C Method for testing electronic components
09/04/2002CN1090324C Accelerative sensor and method for manufacturing same
09/03/2002US6446231 Method for testing a semiconductor integrated circuit when a difference between max current and min current exceeds a threshold value
09/03/2002US6446230 Mechanism for enabling compliance with the IEEE standard 1149.1 for boundary-scan designs and tests
09/03/2002US6446229 Method and apparatus for integrated flip-flop to support two test modes
09/03/2002US6446228 Semiconductor integrated circuit testing apparatus and method of controlling the same
09/03/2002US6446226 Programmable pulse generator and method for using same
09/03/2002US6446027 Intelligent analysis system and method for fluid-filled electrical equipment
09/03/2002US6445977 Carrier handling apparatus for a module IC handler, and method therefor
09/03/2002US6445813 System for inspecting an apparatus of a printed circuit board
09/03/2002US6445630 Method for carrying out a burn-in process for electrically stressing a semiconductor memory
09/03/2002US6445627 Semiconductor integrated circuit