Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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09/10/2002 | US6448801 Method and device for supporting flip chip circuitry in analysis |
09/10/2002 | US6448800 Load current output circuit for electronic device and IC tester using the same load current output circuit |
09/10/2002 | US6448799 Timing adjustment method and apparatus for semiconductor IC tester |
09/10/2002 | US6448798 Electronic device system including semiconductor integrated circuits |
09/10/2002 | US6448797 Method and apparatus automated docking of a test head to a device handler |
09/10/2002 | US6448796 Selective netlist to test fine pitch multi-chip semiconductor |
09/10/2002 | US6448786 Stimulus/response system and method for vector characterization of frequency translation devices |
09/10/2002 | US6448784 Configuration and method for testing a circuit apparatus provided for controlling an occupant protection device of a motor vehicle |
09/10/2002 | US6448783 Method of inspecting semiconductor chip with projecting electrodes for defects |
09/10/2002 | US6448782 Arrangement and method for defining the location of source of partial discharges |
09/10/2002 | US6448781 Method and system for analyzing cable faults |
09/10/2002 | US6448779 Wiring test assembly |
09/10/2002 | US6448778 Automated verification of proper connectivity of components to a wiring harness during assembly of article of manufacture |
09/10/2002 | US6448776 Method for measuring fitness for use of a storage battery subject to electric loading |
09/10/2002 | US6448758 Method for determining wear and other characteristics of electrodes in high voltage equipment |
09/10/2002 | US6448743 Rechargeable battery pack |
09/10/2002 | US6448662 Arrangement for accessing region of a flip chip die |
09/10/2002 | US6448636 Multi-layered integrated semiconductor device incorporating electrically connected integrated circuit chips and monitoring pads |
09/10/2002 | US6448547 Method for determining photodiode performance parameters |
09/10/2002 | US6448525 Capacitor characteristics measurement and packing apparatus |
09/10/2002 | US6448524 Circuit board handler |
09/10/2002 | US6448099 Method and apparatus for detecting voltage contrast in a semiconductor wafer |
09/10/2002 | US6448095 Circuit access and analysis for a SOI flip-chip die |
09/10/2002 | US6447328 Method and apparatus for retaining a spring probe |
09/10/2002 | US6447162 Semiconductor wirebond machine leadframe thermal map system |
09/10/2002 | US6446867 Electro-optic interface system and method of operation |
09/10/2002 | US6446508 Vibration compartment environmental control |
09/10/2002 | US6446354 Handler system for cutting a semiconductor package device |
09/10/2002 | CA2260773C Model-based fault detection system for electric motors |
09/10/2002 | CA2113013C Automatic testing of circuit-size cables |
09/06/2002 | WO2002069565A2 Network documentation system with electronic modules |
09/06/2002 | WO2002068977A1 Method and assembly for determining the output capacity of a battery |
09/06/2002 | WO2002068976A1 Method for measuring propagation delay time and test equipment |
09/06/2002 | WO2002068975A1 Ic testing device with a heating apparatus |
09/06/2002 | WO2002068971A1 Method of determining when electrode pads are unsuitable for use by detecting relative humidity |
09/06/2002 | WO2002068968A2 Low-cost, compact, frequency domain reflectometry system for testing wires and cables |
09/06/2002 | WO2002027342A3 Measurement of fuel cell impedance |
09/06/2002 | WO2001064389A3 Vertical counter balanced test head manipulator |
09/06/2002 | WO2001007871A9 Enhancing voltmeter functionality |
09/06/2002 | WO2001004642A9 Kinematic coupling |
09/05/2002 | US20020124219 Pseudo random signal producing circuit |
09/05/2002 | US20020124218 Method of testing a semiconductor integrated circuit and method and apparatus for generating test patterns |
09/05/2002 | US20020124217 Testing apparatus and testing method for an integrated circuit, and integrated circuit |
09/05/2002 | US20020124216 Integrated circuit and method of operation of such a circuit |
09/05/2002 | US20020124146 Data processing device, signal processing device, and interface device |
09/05/2002 | US20020124120 Universal laboratory prototyping interface system |
09/05/2002 | US20020123869 Simulation method and test arrangement for determining nonlinear signal distortion |
09/05/2002 | US20020123853 Generating and using calibration information |
09/05/2002 | US20020123850 System and method for providing information on secondary batteries for storing electric power |
09/05/2002 | US20020123252 Contact structure and production method thereof and probe contact assembly using same |
09/05/2002 | US20020123161 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
09/05/2002 | US20020122879 Forming a crystalline thin film on inner surfaces of voids in a porous amorphous film; generating image data representing porous amorphous film having said crystalline thin film with using a transmission electron microscope |
09/05/2002 | US20020122479 Multi-pair gigabit ethernet transceiver |
09/05/2002 | US20020122334 Flash memory device with cell current measuring scheme using write driver |
09/05/2002 | US20020121917 Apparatus and method for testing electrode structure for thin display device using FET function |
09/05/2002 | US20020121916 Semiconductor tester, semiconductor integrated circuit and semiconductor testing method |
09/05/2002 | US20020121914 Non-contact method for determining soft breakdown in dielectrics |
09/05/2002 | US20020121913 Tester with independent control of devices under test |
09/05/2002 | US20020121910 Electronics board life prediction of microprocessor-based transmitters |
09/05/2002 | US20020121908 Method and device for inspecting a microactuator |
09/05/2002 | US20020121904 Curcuit for improved test and calibration in automated test equipment |
09/05/2002 | US20020121903 Systems and methods for locating faults on a transmission line with a single tapped load |
09/05/2002 | US20020121902 Ground detection apparatus for electric vehicle |
09/05/2002 | US20020121901 Apparatus and method for testing battery condition |
09/05/2002 | US20020121900 Connection tester for an electronic trip unit |
09/05/2002 | DE4143545C2 Testing external quality of objects, esp. components on PCB |
09/05/2002 | DE10160092A1 Integrierte Halbleiterschaltungsvorrichtung A semiconductor integrated circuit device |
09/05/2002 | DE10136443A1 Taktkalibrierverfahren und Halbleiterbauelement-Testgerät mit Taktkalibrierfunktion Taktkalibrierverfahren and semiconductor device testing apparatus with Taktkalibrierfunktion |
09/05/2002 | DE10114291C1 IC chip testing method compares voltage applied to one supply voltage terminal of each tested IC chip with detected voltage at different supply voltage terminal of IC chip |
09/05/2002 | DE10109879A1 Device for handling small components, especially electronic components for test purposes, has a handling mechanism that greatly reduces the contact force when a component is brought together with test contacts |
09/05/2002 | DE10106200C1 Insulation monitoring method for unearthed electrical network uses pulses AC voltage applied between network and earth and evaluation of measured current values |
09/05/2002 | DE10104633A1 Anschlussklemme Terminal |
09/04/2002 | EP1237282A1 Circuit for the detection of clock signal period abnormalities |
09/04/2002 | EP1237280A2 Enhanced field programmable gate array |
09/04/2002 | EP1237249A2 Protection relay |
09/04/2002 | EP1237069A2 Data procesing device, signal procesing device, and interface device |
09/04/2002 | EP1236120A1 Measurement module and system for monitoring the status of armored vehicle electronic components |
09/04/2002 | EP1236111A1 Test pattern compression for an integrated circuit test environment |
09/04/2002 | EP1236053A2 A test access port (tap) controller system and method to debug internal intermediate scan test faults |
09/04/2002 | EP1236052A1 Electrical test of the interconnection of conductors on a substrate |
09/04/2002 | EP1236051A2 Bit fail map compression with fail signature analysis |
09/04/2002 | EP1236017A2 X-ray tomography bga ( ball grid array ) inspections |
09/04/2002 | EP0946914B1 Methods and devices relating to circuit board constructions |
09/04/2002 | CN2509588Y Domestic power source socket wiring testing device |
09/04/2002 | CN1367872A Method and apparatus to transport, inspect and measure objects and surface details at high speeds |
09/04/2002 | CN1367392A High-accuracy failure wave-recording device and its transmission line combined failure distance-measuring method |
09/04/2002 | CN1367391A High-voltage transmission line insulator live intelligent detector apparatus |
09/04/2002 | CN1367371A Circuit board checking device and method |
09/04/2002 | CN1090325C Method for testing electronic components |
09/04/2002 | CN1090324C Accelerative sensor and method for manufacturing same |
09/03/2002 | US6446231 Method for testing a semiconductor integrated circuit when a difference between max current and min current exceeds a threshold value |
09/03/2002 | US6446230 Mechanism for enabling compliance with the IEEE standard 1149.1 for boundary-scan designs and tests |
09/03/2002 | US6446229 Method and apparatus for integrated flip-flop to support two test modes |
09/03/2002 | US6446228 Semiconductor integrated circuit testing apparatus and method of controlling the same |
09/03/2002 | US6446226 Programmable pulse generator and method for using same |
09/03/2002 | US6446027 Intelligent analysis system and method for fluid-filled electrical equipment |
09/03/2002 | US6445977 Carrier handling apparatus for a module IC handler, and method therefor |
09/03/2002 | US6445813 System for inspecting an apparatus of a printed circuit board |
09/03/2002 | US6445630 Method for carrying out a burn-in process for electrically stressing a semiconductor memory |
09/03/2002 | US6445627 Semiconductor integrated circuit |