| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 09/12/2002 | WO2001045565A3 Modeling and testing of an integrated circuit |
| 09/12/2002 | US20020129341 Selective expansion of high-level design language macros for automated design modification |
| 09/12/2002 | US20020129323 Connection device and test system |
| 09/12/2002 | US20020129322 Method of design for testability, method of design for integrated circuits and integrated circuits |
| 09/12/2002 | US20020129311 Architecture for built-in self-test of parallel optical transceivers |
| 09/12/2002 | US20020129310 Semiconductor integrated circuit with local monitor circuits |
| 09/12/2002 | US20020129308 Multi-bit test circuit |
| 09/12/2002 | US20020129304 Computer-implemented system and method for evaluating the diagnostic state of a component |
| 09/12/2002 | US20020129298 Method of and apparatus for testing CPU built-in RAM mixed LSI |
| 09/12/2002 | US20020129293 Scan based multiple ring oscillator structure for on-chip speed measurement |
| 09/12/2002 | US20020129234 Microprocessor comprising input means in the test mode |
| 09/12/2002 | US20020128812 Time-multiplexing data between asynchronous clock domains within cycle simulation and emulation environments |
| 09/12/2002 | US20020128794 Semiconductor device having self test function |
| 09/12/2002 | US20020128051 Notification of low-battery and Mantaining Communication In Wireless Network |
| 09/12/2002 | US20020127749 Characteristic evaluation apparatus for insulated gate type transistors |
| 09/12/2002 | US20020127748 Integrated circuit device characterization |
| 09/12/2002 | US20020127744 Integrated circuit device characterization |
| 09/12/2002 | US20020126581 Method of analyzing clock skew between signals |
| 09/12/2002 | US20020126525 Circuit configuration for evaluating the information content of a memory cell |
| 09/12/2002 | US20020126285 High precision laser bar test fixture |
| 09/12/2002 | US20020126230 Liquid crystal display device and testing method therefor |
| 09/12/2002 | US20020126029 Programmable test modulator for selectively generating test signals of delta-sigma order N |
| 09/12/2002 | US20020125909 Testing of BGA and other CSP packages using probing techniques |
| 09/12/2002 | US20020125908 Testing of BGA and other CSP packages using probing techniques |
| 09/12/2002 | US20020125907 Method and system for determining repeatable yield detractors of integrated circuits |
| 09/12/2002 | US20020125905 Evaluating a multi-layered structure for voids |
| 09/12/2002 | US20020125904 Apparatus for reducing power supply noise in an integrated circuit |
| 09/12/2002 | US20020125903 Method and apparatus for enabling a digital memory tester to read the frequency of a free running oscillator |
| 09/12/2002 | US20020125901 Probe for inspecting semiconductor device and method of manufacturing the same |
| 09/12/2002 | US20020125900 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current |
| 09/12/2002 | US20020125896 Automatic test equipment for testing a device under test |
| 09/12/2002 | US20020125895 Insulation inspection apparatus for motor |
| 09/12/2002 | US20020125894 Device for testing coaxial connectors |
| 09/12/2002 | US20020125893 Electric device |
| 09/12/2002 | US20020125892 Electric arc monitoring systems |
| 09/12/2002 | US20020125891 Method and apparatus for monitoring integrity of wires or electrical cables |
| 09/12/2002 | US20020125890 Failure detection method and apparatus for sensor network |
| 09/12/2002 | US20020125879 Parallel test board used in testing semiconductor memory devices |
| 09/12/2002 | US20020125878 High-frequency tester for semiconductor devices |
| 09/12/2002 | US20020125877 Closely-coupled multiple-winding magnetic induction-type sensor |
| 09/12/2002 | US20020125473 Semiconductor device and method of analyzing same |
| 09/12/2002 | DE10208020A1 Determination of the storage effectiveness of a motor vehicle battery and warning of a driver when battery effectiveness falls below a threshold limit by monitoring of battery dynamic internal resistance |
| 09/12/2002 | DE10158240A1 Systeme und Verfahren zum Erleichtern des Testens von Anschlussflächenempfängern integrierter Schaltungen Systems and methods for facilitating the testing of integrated circuits pad receivers |
| 09/12/2002 | DE10152095A1 Blank-Chip-Träger und Verfahren zum Herstellen einer Halbleitervorrichtung unter Verwendung des Blank-Chip-Trägers Blank chip carrier and method for producing a semiconductor device using the chip carrier blank |
| 09/12/2002 | DE10150406A1 Vorrichtung und Verfahren zum Testen von integrierten Halbleiterschaltungen Apparatus and method for testing semiconductor integrated circuits |
| 09/12/2002 | DE10150404A1 Apparat und Verfahren zum Testen einer integrierten Halbleiterschaltung Apparatus and method for testing a semiconductor integrated circuit |
| 09/12/2002 | DE10150371A1 Externe Testhilfsvorrichtung und Testverfahren einer Halbleitervorrichtung External test auxiliary device and test method of a semiconductor device |
| 09/12/2002 | DE10150370A1 Apparat und Verfahren zum Testen einer integrierten Halbleiterschaltung Apparatus and method for testing a semiconductor integrated circuit |
| 09/12/2002 | DE10150369A1 Halbleitertestvorrichtung und Verfahren zum Testen von Halbleitervorrichtungen The semiconductor test apparatus and method for testing semiconductor devices |
| 09/12/2002 | DE10113523A1 Verfahren und Vorrichtung zur Qualitätsprüfung von Leiterplatten Method and device for quality inspection of printed circuit boards |
| 09/12/2002 | DE10110777A1 Anordnung und Verfahren zum Testen von integrierten Schaltkreisen Arrangement and method for testing of integrated circuits |
| 09/12/2002 | DE10106557A1 Test device for parallel high frequency testing of semiconductor devices has signals transmitted via optical waveguides to and from devices under test |
| 09/12/2002 | DE10106556A1 Halbleiterbaustein mit einer Anordnung zum Selbsttest einer Mehrzahl von Interfaceschaltungen und Testverfahren A semiconductor device with an arrangement for self-testing of a plurality of interface circuits and test procedures |
| 09/12/2002 | DE10050707C2 Verfahren zum Betreiben eines TAP-Controllers und entsprechender TAP-Controller Method for operating a TAP controller and corresponding TAP controller |
| 09/12/2002 | CA2435677A1 Apparatus and method for network-initiated real-time multi-party communications |
| 09/11/2002 | EP1239293A2 Device and method for testing integrated circuits |
| 09/11/2002 | EP1238288A1 Battery sensor device |
| 09/11/2002 | EP1057038B1 Method and device for testing printed circuit boards |
| 09/11/2002 | EP0953154B1 Device and method for detecting conductor breaks in solar modules |
| 09/11/2002 | EP0884680B1 ROM testing circuit |
| 09/11/2002 | CN2511010Y Automatic checking instrument for aviation nickel-cadmium cell |
| 09/11/2002 | CN2510874Y Testing apparatus of liquid crystal displaying device |
| 09/11/2002 | CN2510873Y Relay-protection tester |
| 09/11/2002 | CN2510872Y Intelligent network tester |
| 09/11/2002 | CN1369064A Method and apparatus for detecting failed thyristor |
| 09/11/2002 | CN1369063A Actuator arangement, especially for controlling injection valve in internal combustion engine |
| 09/11/2002 | CN1368788A Power change device |
| 09/11/2002 | CN1368737A Semiconductor data storage circuit device and its checking method and method for alternating badly element in said device |
| 09/11/2002 | CN1368734A Semiconductor memory capable of control work timing of read amplifier |
| 09/11/2002 | CN1368665A Method for display service life of cell and electronic device |
| 09/11/2002 | CN1368646A Method and device for testing accumulator for car |
| 09/11/2002 | CN1368645A Constant-current, constant-impedance type electronic load device |
| 09/11/2002 | CN1368644A Electronic load device |
| 09/11/2002 | CN1368643A Switching device between electronic load device and tested power supply apparatus |
| 09/11/2002 | CN1368640A Modular testing probe |
| 09/11/2002 | CN1090883C Device and method for monitoring battery in mobile communication terminal |
| 09/10/2002 | US6449755 Instruction signature and primary input and primary output extraction within an IEEE 1149.1 compliance checker |
| 09/10/2002 | US6449751 Method of analyzing static current test vectors with reduced file sizes for semiconductor integrated circuits |
| 09/10/2002 | US6449749 System and method for product yield prediction |
| 09/10/2002 | US6449748 Non-destructive method of detecting die crack problems |
| 09/10/2002 | US6449745 Method and apparatus for random stimulus generation |
| 09/10/2002 | US6449744 Flexible test environment for automatic test equipment |
| 09/10/2002 | US6449743 Method of generating test sequences |
| 09/10/2002 | US6449742 Test and characterization of source synchronous AC timing specifications by trace length modulation of accurately controlled interconnect topology of the test unit interface |
| 09/10/2002 | US6449741 Single platform electronic tester |
| 09/10/2002 | US6449738 Apparatus for bus frequency independent wrap I/O testing and method therefor |
| 09/10/2002 | US6449726 Method, system, software, and signal for estimating battery life in a remote control device |
| 09/10/2002 | US6449704 Memory failure analysis device that records which regions have at least one defect |
| 09/10/2002 | US6449577 Self-optimizing adjustment algorithm |
| 09/10/2002 | US6449576 Network processor probing and port mirroring |
| 09/10/2002 | US6449570 Analysis of noise in repetitive waveforms |
| 09/10/2002 | US6449567 Apparatus and method for determining shaft speed of a motor |
| 09/10/2002 | US6449544 Method for operating a restraint system connected by a bus line in case of a short circuit |
| 09/10/2002 | US6449307 Apparatus for measuring electrical characteristics of circuit |
| 09/10/2002 | US6449208 Semiconductor memory device capable of switching reference voltage for generating intermediate voltage |
| 09/10/2002 | US6448806 Circuit for providing a logical output signal in accordance with crossing points of differential signals |
| 09/10/2002 | US6448805 Method and apparatus for wafer-level testing of semiconductor lasers |
| 09/10/2002 | US6448804 Contactless total charge measurement with corona |
| 09/10/2002 | US6448803 Test socket |
| 09/10/2002 | US6448802 Photosensors for testing an integrated circuit |