Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2002
09/19/2002US20020133770 Circuit and method for test and repair
09/19/2002US20020133767 Circuit and method for test and repair
09/19/2002US20020133766 Apparatus and method for providing a diagnostic problem determination methodology for complex systems
09/19/2002US20020133763 Bit error rate measurement
09/19/2002US20020133750 Integrated circuit having a test operating mode and method for testing a multiplicity of such circuits
09/19/2002US20020133748 Circuit for measuring on-chip power supply integrity
09/19/2002US20020133318 Method for demonstrating the dependence of a signal based on another signal
09/19/2002US20020133305 System and method for detecting slave power supply failure
09/19/2002US20020132514 Method and apparatus for retaining a spring probe
09/19/2002US20020132499 Electrical connection structure in a motor vehicle
09/19/2002US20020132381 Fabrication method of semiconductor integrated circuit device and testing method
09/19/2002US20020132379 Method and system for semiconductor die testing
09/19/2002US20020132378 Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting
09/19/2002US20020131308 Semiconductor Memory
09/19/2002US20020131307 Semiconductor memory device
09/19/2002US20020131305 Semiconductor memory device
09/19/2002US20020130712 System and method utilizing on-chip voltage monitoring to manage power consumption
09/19/2002US20020130697 BIST circuit for variable impedance system
09/19/2002US20020130681 Programmable logic array integrated circuits
09/19/2002US20020130679 Characteristic evaluation apparatus for insulated gate type transistors
09/19/2002US20020130678 Multi-channel semiconductor test system
09/19/2002US20020130675 Inspection method and inspection apparatus
09/19/2002US20020130674 Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage current
09/19/2002US20020130672 Oxide tracking voltage reference
09/19/2002US20020130669 Terminal crimped state testing method
09/19/2002US20020130668 Parallel arc fault diagnostic for aircraft wiring
09/19/2002US20020130667 Reflection measurement method and apparatus for devices that are accessed through dispersive elements
09/19/2002US20020130665 Electronic battery tester
09/19/2002US20020130654 Method and apparatus for automatically testing semiconductor device
09/19/2002US20020130653 Universal test interface between a device under test and a test head
09/19/2002US20020130652 System and method for scheduling and monitoring electrical device usage
09/19/2002US20020130637 Method and system for determining the capacity of a battery
09/19/2002US20020130635 Method of controlling the discharging of a secondary storage cell battery
09/19/2002US20020130368 Method for protecting MOS components form antenna effect and the apparatus thereof
09/19/2002DE10207412A1 Funkenfeststellung Radio detection
09/19/2002DE10203148A1 Fehler-Detektionsverfahren und Gerät für ein Sensornetzwerk Error detection method and apparatus for a sensor network
09/19/2002DE10150058A1 Vorrichtung und Verfahren zum Testen einer integrierten Halbleiterschaltung Apparatus and method for testing a semiconductor integrated circuit
09/19/2002DE10150056A1 Externe Prüfhilfsvorrichtung zur Verwendung zum Testen einer Halbleitereinrichtung und Verfahren zum Testen einer Halbleitereinrichtung unter Verwendung der Vorrichtung External Prüfhilfsvorrichtung for use for testing a semiconductor device and method for testing a semiconductor device using the apparatus
09/19/2002DE10112528A1 Method for testing the electromagnetic compatibility (EMC) of image screen devices, involves determining the deviation of the average value of a test signal for each discrete segment of test window
09/19/2002DE10105969A1 Current measurement in electrical machines involves measuring winding currents of electrical machine with stator windings arranged in triangle circuit using current sensors
09/19/2002DE10105664A1 Circuit interrupting device for motor vehicle, diagnoses correctness of path through which diagnostic signal from exterior is input to circuit breaker via switch element
09/18/2002EP1241578A2 Measurement module and system for monitoring the status of armored vehicles electronic components
09/18/2002EP1241483A1 Bit error rate measurement
09/18/2002EP1241481A2 Contact structure for interconnections, interposer, semiconductor assembly and method
09/18/2002EP1119882A4 Method and apparatus for measuring complex impedance of cells and batteries
09/18/2002EP0968637B1 Method for gauging a device for producing electrical components
09/18/2002EP0934615B1 Method and device for managing an electronic component with complementary mos transistors functioning under radiation
09/18/2002EP0893223B1 A method for obtaining a seamless engraving cylinder for producing sheets with optical effects, and a plant including said cylinder
09/18/2002EP0797889B1 A method and apparatus for testing lines in a telecommunications network
09/18/2002CN2511981Y Online monitor system for chain insulator
09/18/2002CN2511567Y 43 core integrated wire aligner for railway vehicle
09/18/2002CN1369906A Tester of chip without package
09/18/2002CN1369792A Method and device for testing USB port
09/18/2002CN1369714A Boundary scan and test system for large-scale integrated circuit
09/18/2002CN1091259C Method for detecting operational errors of tester for semiconductor devices
09/18/2002CN1091258C Semiconductor device transferring appts.
09/17/2002USRE37847 Method and apparatus for testing LCD panel array prior to shorting bar removal
09/17/2002US6453437 Method and system for performing transition fault simulation along long circuit paths for high-quality automatic test pattern generation
09/17/2002US6453436 Method and apparatus for improving transition fault testability of semiconductor chips
09/17/2002US6453435 Method and apparatus for automated testing of circuit boards
09/17/2002US6453433 Reduced signal test for dynamic random access memory
09/17/2002US6453276 Method and apparatus for efficiently generating test input for a logic simulator
09/17/2002US6453260 Apparatus and method for collecting motor test data
09/17/2002US6453258 Optimized burn-in for fixed time dynamic logic circuitry
09/17/2002US6453249 Apparatus for judging deterioration of battery
09/17/2002US6453248 High impedance fault detection
09/17/2002US6453063 Automatic focused ion beam imaging system and method
09/17/2002US6452966 Digital signal carrier detector
09/17/2002US6452861 Semiconductor memory device allowing simultaneous inputting of N data signals
09/17/2002US6452849 Semiconductor device with test mode for performing efficient calibration of measuring apparatus
09/17/2002US6452847 Testable nonvolatile semiconductor device
09/17/2002US6452502 Method and apparatus for early detection of reliability degradation of electronic devices
09/17/2002US6452436 Apparatus and method for managing automatic transitions between multiple feedback paths
09/17/2002US6452416 Abnormality detecting apparatus for a rotating electric machine
09/17/2002US6452415 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
09/17/2002US6452412 Drop-in test structure and methodology for characterizing an integrated circuit process flow and topography
09/17/2002US6452411 Efficient parallel testing of integrated circuit devices using a known good device to generate expected responses
09/17/2002US6452410 Apparatus and method for electrolytic bare board testing
09/17/2002US6452409 Mechanism that holds down packages
09/17/2002US6452407 Probe contactor and production method thereof
09/17/2002US6452406 Probe structure having a plurality of discrete insulated probe tips
09/17/2002US6452402 Apparatus for determining the type of external device being connected
09/17/2002US6452378 Probe for electro-optic sampling oscilloscope
09/17/2002US6452209 Semiconductor devices having backside probing capability
09/17/2002US6450469 Flat panel display or probe block support framework
09/17/2002US6450034 Method and apparatus for measuring and adjusting resonance frequency of resonators
09/17/2002CA2196254C Method and reagent kit for determining paper degradation in transformers
09/17/2002CA2087966C Reusable test unit for simulating electrochemical sensor signals for quality assurance of portable blood analyzer instruments
09/12/2002WO2002071706A1 Apparatus and method for network-initiated real-time multi-party communications
09/12/2002WO2002071567A1 Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (dfd) techniques
09/12/2002WO2002071411A1 Clock-skew resistant chain of sequential cells
09/12/2002WO2002071362A2 Remaining life prediction for field device electronics board
09/12/2002WO2002071135A1 Inspection device for liquid crystal driving substrate
09/12/2002WO2002071087A1 Method and system for determining the buffer action of a battery
09/12/2002WO2002071086A1 Anionic polymers composed of dicarboxylic acids and uses thereof
09/12/2002WO2002071085A1 Method for testing a measurement recording device and corresponding testing device
09/12/2002WO2002071083A2 Circuit for improved test and calibration in automated test equipment.
09/12/2002WO2002071082A2 Method for testing a testable electronic device
09/12/2002WO2002071080A1 Electronic voltage transformer
09/12/2002WO2002041013A3 Method and system for automated measuring of electromagnetic emissions