Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
09/2002
09/26/2002US20020137389 Connection interface system
09/26/2002US20020137316 Manufacture of probe unit having lead probes extending beyong edge of substrate
09/26/2002US20020137238 Method for releasable contact-connection of a plurality of integrated semiconductor modules on a wafer
09/26/2002US20020136064 Semiconductor device having scan test circuit that switches clock signal between shift mode and capture mode, and method of testing the semiconductor device
09/26/2002US20020135393 System and method for high speed integrated circuit device testing utilizing a lower speed test environment
09/26/2002US20020135391 Systems and methods for facilitating testing of pad receivers of integrated circuits
09/26/2002US20020135390 Method and apparatus for inspection
09/26/2002US20020135389 Wafer-level burn-in oven
09/26/2002US20020135388 Membrane probing system with local contact scrub
09/26/2002US20020135387 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof
09/26/2002US20020135383 Device for generator diagnosis with built-in rotor
09/26/2002US20020135379 Circuit for the detection of a defective power supply connection
09/26/2002US20020135357 Method and apparatus for socket calibration of integrated circuit testers
09/26/2002US20020135356 Tester for semiconductor devices and test tray used for the same
09/26/2002US20020135350 Ergonomic test apparatus for the operator-assisted testing of electronic devices
09/26/2002US20020134936 Wafer inspection system and wafer inspection process using charged particle beam
09/26/2002US20020134908 Method for determining photodiode performance parameters
09/26/2002US20020133941 Electrical connector
09/26/2002DE10210902A1 Paralleltestplatine und zugehöriges Speichermodultestverfahren Parallel test board and associated memory module test method
09/26/2002DE10207659A1 Estimation of the terminal voltage of a motor vehicle battery as a measure of its remaining capacity by measurement of battery voltage and loading to determine a characteristic curve without the influence of polarization
09/26/2002DE10110207A1 Verfahren zum Testen einer Meßaufnahmeeinrichtung A method for testing a measurement recording device
09/26/2002DE10107180A1 Testsystem zur Funktionsprüfung eines Halbleiterbauelements auf einem Wafer und Betriebsverfahren Test system for testing the function of a semiconductor device on a wafer and method of operation
09/26/2002DE10106156A1 Verfahren zum Starten einer Brennkraftmaschine mit elektromagnetischen Ventiltrieben Method for starting an internal combustion engine with electromagnetic valve trains
09/25/2002EP1243935A1 Discharge control method for a battery of secundary electrochemical generators
09/25/2002EP1243934A1 Battery life estimation
09/25/2002EP1243933A1 State of charge prediction method and apparatus for a battery
09/25/2002EP1243932A2 Terminal crimped state testing method
09/25/2002EP1243915A1 Apparatus for evaluating electrical characteristics
09/25/2002EP1242998A1 Method and apparatus for exercising external memory with a memory built-in self-test
09/25/2002EP1242885A2 Continuous application and decompression of test patterns to a circuit-under-test
09/25/2002EP1242830A1 Method for testing circuits with tri-state drivers and circuit for use therewith
09/25/2002EP1242827A1 Method and device for testing circuit boards
09/25/2002EP1080471B1 High speed memory test system with intermediate storage buffer and method of testing
09/25/2002EP0983562B1 Emulation system with time-multiplexed interconnect
09/25/2002EP0880706B1 Arrangement for the testing of semiconductor structures
09/25/2002EP0637754B1 Battery capacity meter
09/25/2002CN2513213Y Capacitor core inserting machine
09/25/2002CN2513118Y Photoelectric converting circuit of thyristor breakdown detection
09/25/2002CN2513117Y Photoelectric converting circuit of thyristor breakdown detection
09/25/2002CN2513116Y Location detection system for loud speaker fault
09/25/2002CN1371100A Semiconductor memory used in reducing input cycles of input test mode
09/25/2002CN1371099A Self-analyzing semiconductor IC unit capable of carrying out redundant replacement with installed memory circuits
09/25/2002CN1370999A Intelligent cell electricity amount reading device
09/25/2002CN1370998A Diagnosis mechanism for power generator with rotor
09/25/2002CN1370997A Regular calibration method and device for integrated circuit testing unit
09/24/2002US6457151 Waveform controller for an IC tester
09/24/2002US6457150 Method and apparatus for on-chip monitoring of integrated circuits with a distributed system
09/24/2002US6457149 Semiconductor integrated circuit and semiconductor integrated circuit test method
09/24/2002US6457148 Apparatus for testing semiconductor device
09/24/2002US6457147 Method and system for run-time logic verification of operations in digital systems in response to a plurality of parameters
09/24/2002US6457141 Semiconductor device with embedded memory cells
09/24/2002US6456988 Method for determining state-of-health using an intelligent system
09/24/2002US6456961 Method and apparatus for creating testable circuit designs having embedded cores
09/24/2002US6456948 Method of generating data for use in monitoring and controlling charge and discharge status of secondary battery
09/24/2002US6456591 Fair bandwidth sharing for video traffic sources using distributed feedback control
09/24/2002US6456561 Synchronous semiconductor memory device
09/24/2002US6456560 Semiconductor integrated circuit device with test interface circuit for performing test on embedded memory from outside
09/24/2002US6456552 Dynamic register with low clock rate testing capability
09/24/2002US6456141 Current pulse receiving circuit
09/24/2002US6456138 Method and apparatus for a single upset (SEU) tolerant clock splitter
09/24/2002US6456113 Scan flip-flop circuit having scan logic output terminal dedicated to scan test
09/24/2002US6456105 Method for determining transistor gate oxide thickness
09/24/2002US6456104 Method and structure for in-line monitoring of negative bias temperature instability in field effect transistors
09/24/2002US6456103 Apparatus for reducing power supply noise in an integrated circuit
09/24/2002US6456102 External test ancillary device to be used for testing semiconductor device, and method of testing semiconductor device using the device
09/24/2002US6456101 Chip-on-chip testing using BIST
09/24/2002US6456089 Method for testing electrical modules
09/24/2002US6456088 1st level power fault testing apparatus for testing telecommunications equipment
09/24/2002US6456085 Diagnostic device for detecting short circuits or line interruptions in an inductive sensor
09/24/2002US6456084 Radiation test system
09/24/2002US6456081 Holiday light tester
09/24/2002US6456070 Method and device for measuring intensity of electromagnetic field, method and device for measuring current-voltage distribution, and method for judging quality of electronic device, and electronic device therefor
09/24/2002US6456062 Contact arm and electronic device testing apparatus using the same
09/24/2002US6456045 Integrated conductance and load test based electronic battery tester
09/24/2002US6456043 Method of diagnosing the state of health of a battery
09/24/2002US6455766 Contact-less probe of semiconductor wafers
09/24/2002US6455336 Power reduction method and design technique for burn-in
09/24/2002US6455334 Probe grid for integrated circuit analysis
09/24/2002US6455180 Flexible method for monitoring fuel cell voltage
09/24/2002US6454100 Semiconductor element carrying equipment
09/24/2002CA2274335C Oscillator module and communications device using the same
09/19/2002WO2002073661A2 Extraction method of defect density and size distributions
09/19/2002WO2002073474A1 Method and apparatus for design validation of complex ic without using logic simulation
09/19/2002WO2002073225A1 Integrated circuit testing device with improved reliability
09/19/2002WO2002073224A1 A test circuit for verifying a manufacturing process
09/19/2002WO2002073223A2 Device for testing coaxial connectors
09/19/2002WO2002073220A2 Method and apparatus for retaining a spring probe
09/19/2002WO2002041014A3 Method and arrangement for determination of the state of charge of a battery
09/19/2002WO2002001719A3 Method and apparatus for testing high performance circuits
09/19/2002WO2001077698A3 Power line testing device with signal generator and signal detector
09/19/2002US20020133796 Apparatus and method for automatically verifying a designed circuit
09/19/2002US20020133795 Interface circuit and method of testing or debugging semiconductor device using it
09/19/2002US20020133794 Method and apparatus for integrated circuit debugging
09/19/2002US20020133790 Method and apparatus for measuring and designing electric circuit based on two-port network thereof, and computer-readable recording medium for recording the same
09/19/2002US20020133776 Method for testing for the presence of faults in digital circuits
09/19/2002US20020133775 Combinational test pattern generation method and apparatus
09/19/2002US20020133774 Semiconductor test apparatus
09/19/2002US20020133773 Method and configuration for protecting data during a self-test of a microcontroller
09/19/2002US20020133772 Method and apparatus for low cost signature testing for analog and RF circuits
09/19/2002US20020133771 On-chip method and apparatus for testing semiconductor circuits