Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2002
10/03/2002US20020140431 Radiation test system
10/03/2002US20020140416 Probe for electro-optic sampling oscilloscope
10/03/2002US20020140404 Method for monitoring end of life for battery
10/03/2002US20020140360 Remote control test apparatus
10/03/2002US20020139791 Apparatus for and method of heating semiconductor devices
10/03/2002US20020139768 Automatic decapsulation system utilizing an integrated spacer/protection plate and a method of use
10/03/2002US20020139567 Chip on film (COF) package having test pad for testing electrical function of chip and method for manufacturing same
10/02/2002EP1246336A2 Operation method for secondary battery and secondary battery device
10/02/2002EP1246229A2 Semiconductor production system
10/02/2002EP1246067A2 Measurement module and system for monitoring the status of armored vehicles electronic components
10/02/2002EP1245962A1 Improved connection interface system
10/02/2002EP1245070A1 Household electric user having an electronic control, and control and programming system thereof
10/02/2002EP1244921A1 Time domain reflectometer display method
10/02/2002DE10212690A1 Pattern generation arrangement, especially for semiconducting test systems, can generate regular pattern converted by conversion arrangement or stored irregular pattern
10/02/2002DE10140726A1 Electronic component used as a semiconductor wafer comprises a semiconductor chip having contact surfaces of an integrated circuit on its active surface, and a bimetallic strip arranged on the contact surfaces
10/02/2002DE10137669A1 Method of aligning contact support onto countercontact support for chip test head
10/02/2002DE10116123A1 Testing device for testing switching cabinets, enables cabinets to be tested in a rational and systematic manner, by use of a connection field with connections for connectors in the cabinets so that test voltages can be applied
10/02/2002DE10115042A1 Function testing method for constituent electrical components used in motor vehicle production, uses a diagnostic control device that is connected to the vehicle cabling and buses so that appropriate tests can be implemented
10/02/2002DE10113556A1 Method for detecting faulty operation of digital-signaling devices, e.g. for motor vehicle engine position determination, by determining if a generated signal fulfills a plausibility criterion and, if not, how often it exceeds it
10/02/2002DE10112569A1 Fault diagnosis method for three phase stationary or motor vehicle generators for early detection of broken connections between generator and rectifier to prevent consequential damage
10/02/2002DE10112560A1 Testing of circuit modules, including highly complex integrated circuits, particularly using sampling testing with parallel testing of control and channel modules to reduce testing times
10/02/2002DE10112217A1 Determination of the output current of a generator, especially a motor vehicle generator with an electronic diode to provide an equivalent resistance to the generator so that its output current can be accurately measured
10/02/2002DE10111752A1 Structure for testing semiconductor components has a testing device with connectors to feed in a voltage supply and a semiconductor component fitted with a casing and coupled to the testing device.
10/02/2002CN2514357Y Voltage limiting type resistance discharging circuit device
10/02/2002CN2514356Y Electrode container for testing cells
10/02/2002CN2514355Y DC power supply wiring with polar protection
10/02/2002CN2514354Y Electrostatic grounding monitor
10/02/2002CN1372713A Device, system and method for monitoring a household electric appliance
10/02/2002CN1372707A Electric device with timer means
10/02/2002CN1372645A Partial discharge monitoring system for transformers
10/02/2002CN1372364A Controller for electricity recharge/discharge
10/02/2002CN1372355A Contact structure with silicone grease contact point and general laminated structure using same
10/02/2002CN1372346A Secondary cell and method for preventing overcharge
10/02/2002CN1372195A Signal checking equipment
10/02/2002CN1372193A In circuit emulated equipment using high-level programming language and method thereof
10/02/2002CN1091881C Method for detecting working condition of non-aqueous electrolyte secondary batterles
10/02/2002CN1091880C I/O toggle test method using JTAG
10/01/2002US6460152 High speed memory test system with intermediate storage buffer and method of testing
10/01/2002US6460148 Enhanced embedded logic analyzer
10/01/2002US6460091 Address decoding circuit and method for identifying individual addresses and selecting a desired one of a plurality of peripheral macros
10/01/2002US6460013 Shaft voltage current monitoring system for early warning and problem detection
10/01/2002US6459968 Digital automobile tester
10/01/2002US6459960 Distance relay equipment
10/01/2002US6459896 Notification of low-battery in a wireless network
10/01/2002US6459746 Multi-pair gigabit ethernet transceiver
10/01/2002US6459652 Semiconductor memory device having echo clock path
10/01/2002US6459293 Multiple parameter testing with improved sensitivity
10/01/2002US6459290 Test apparatus of integrated circuit
10/01/2002US6459289 Conductive bump array contactors having an ejector and methods of testing using same
10/01/2002US6459288 Conductive bump array contactors having an ejector and methods of testing using same
10/01/2002US6459286 Test head assembly utilizing replaceable silicon contact
10/01/2002US6459285 Burn-in apparatus for screening plurality of semiconductor devices
10/01/2002US6459284 Device having periodic wiring structure and test device therefor
10/01/2002US6459283 Method and system for testing an electrical component
10/01/2002US6459282 Charged particle beam test system for extracting test result at specified timing
10/01/2002US6459278 Method for characterizing delay of frequency translation devices
10/01/2002US6459276 Rotor analyzer for an induction motor
10/01/2002US6459274 Methods and apparatus for testing electrical connections
10/01/2002US6459272 Apparatus and method for inspecting wiring on board
10/01/2002US6459271 Open cable locating for sheathed cables
10/01/2002US6459270 Method for testing high voltage breakdown and leakage current of electrical cables
10/01/2002US6459269 Capacitance rejecting ground fault protecting apparatus and method
10/01/2002US6459268 Relay circuit test extender
10/01/2002US6459259 Tester for semiconductor devices and test tray used for the same
10/01/2002US6459243 Multiple plateau battery charging method and system to fully charge the first plateau
10/01/2002US6459242 Methods and systems for indicating a charge state of a charge storage device
10/01/2002US6459241 Capacity detection methodology and circuitry by boosted transient current
10/01/2002US6459206 System and method for adjusting the orbit of an orbiting space object using an electrodynamic tether and micro-fabricated field emission device
10/01/2002US6459175 Universal power supply
10/01/2002US6459095 Chemically synthesized and assembled electronics devices
10/01/2002US6458611 Integrated circuit device characterization
10/01/2002CA2243966C Electrochemical cell label with integrated tester
10/01/2002CA2141390C Method for measuring a resistance value
09/2002
09/26/2002WO2002076108A1 Method and device for testing the electromagnetic compatibility of screen devices
09/26/2002WO2002075987A1 On-chip method and apparatus for testing semiconductor circuits
09/26/2002WO2002075807A1 Probing method and device
09/26/2002WO2002075343A1 Ate calibration method and corresponding test equipment
09/26/2002WO2002075342A1 Apparatus and method for testing circuit modules
09/26/2002WO2002075341A1 Semiconductor device and its test method
09/26/2002WO2002075340A2 Device for holding an electronic circuit in a pre-determined state
09/26/2002WO2002075337A2 Low-jitter clock for test system
09/26/2002WO2002075336A2 Test system algorithmic program generators
09/26/2002WO2002075335A2 Test system formatters
09/26/2002WO2002075334A2 Apparatus and method for measuring and probability estimating for clock skews
09/26/2002WO2002075330A2 Universal test interface between a device under test and a test head
09/26/2002WO2002075329A2 Support member assembly for electroconductive contact members
09/26/2002WO2002075327A2 Handheld tester for starting/charging systems
09/26/2002WO2002075297A1 Method and device for measuring thermoelectric characteristics of combinatorial specimen
09/26/2002WO2002050558A3 System and method for pre-programming an electronic device's memory
09/26/2002WO2002039645A3 Network diagnostic meter
09/26/2002WO2001024337A3 Instantaneous arc fault light detector with resistance to false tripping
09/26/2002WO1999066337A3 Device for measuring and analyzing electrical signals of an integrated circuit component
09/26/2002US20020138814 Virtual component having a detachable verification-supporting circuit, a method of verifying the same, and a method of manufacturing an integrated circuit
09/26/2002US20020138801 Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques
09/26/2002US20020138799 Data transfer apparatus, memory device testing apparatus, data transfer method, and memory device testing method
09/26/2002US20020138231 On-chip histogram testing
09/26/2002US20020138225 Automatic configuration of delay parameters for memory controllers of slave processors
09/26/2002US20020138219 Quality assurance automatic display system
09/26/2002US20020138217 Dynamically configurable process for diagnosing faults in rotating machines
09/26/2002US20020138157 Clock controller for AC self-test timing analysis of logic system