Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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10/03/2002 | US20020140431 Radiation test system |
10/03/2002 | US20020140416 Probe for electro-optic sampling oscilloscope |
10/03/2002 | US20020140404 Method for monitoring end of life for battery |
10/03/2002 | US20020140360 Remote control test apparatus |
10/03/2002 | US20020139791 Apparatus for and method of heating semiconductor devices |
10/03/2002 | US20020139768 Automatic decapsulation system utilizing an integrated spacer/protection plate and a method of use |
10/03/2002 | US20020139567 Chip on film (COF) package having test pad for testing electrical function of chip and method for manufacturing same |
10/02/2002 | EP1246336A2 Operation method for secondary battery and secondary battery device |
10/02/2002 | EP1246229A2 Semiconductor production system |
10/02/2002 | EP1246067A2 Measurement module and system for monitoring the status of armored vehicles electronic components |
10/02/2002 | EP1245962A1 Improved connection interface system |
10/02/2002 | EP1245070A1 Household electric user having an electronic control, and control and programming system thereof |
10/02/2002 | EP1244921A1 Time domain reflectometer display method |
10/02/2002 | DE10212690A1 Pattern generation arrangement, especially for semiconducting test systems, can generate regular pattern converted by conversion arrangement or stored irregular pattern |
10/02/2002 | DE10140726A1 Electronic component used as a semiconductor wafer comprises a semiconductor chip having contact surfaces of an integrated circuit on its active surface, and a bimetallic strip arranged on the contact surfaces |
10/02/2002 | DE10137669A1 Method of aligning contact support onto countercontact support for chip test head |
10/02/2002 | DE10116123A1 Testing device for testing switching cabinets, enables cabinets to be tested in a rational and systematic manner, by use of a connection field with connections for connectors in the cabinets so that test voltages can be applied |
10/02/2002 | DE10115042A1 Function testing method for constituent electrical components used in motor vehicle production, uses a diagnostic control device that is connected to the vehicle cabling and buses so that appropriate tests can be implemented |
10/02/2002 | DE10113556A1 Method for detecting faulty operation of digital-signaling devices, e.g. for motor vehicle engine position determination, by determining if a generated signal fulfills a plausibility criterion and, if not, how often it exceeds it |
10/02/2002 | DE10112569A1 Fault diagnosis method for three phase stationary or motor vehicle generators for early detection of broken connections between generator and rectifier to prevent consequential damage |
10/02/2002 | DE10112560A1 Testing of circuit modules, including highly complex integrated circuits, particularly using sampling testing with parallel testing of control and channel modules to reduce testing times |
10/02/2002 | DE10112217A1 Determination of the output current of a generator, especially a motor vehicle generator with an electronic diode to provide an equivalent resistance to the generator so that its output current can be accurately measured |
10/02/2002 | DE10111752A1 Structure for testing semiconductor components has a testing device with connectors to feed in a voltage supply and a semiconductor component fitted with a casing and coupled to the testing device. |
10/02/2002 | CN2514357Y Voltage limiting type resistance discharging circuit device |
10/02/2002 | CN2514356Y Electrode container for testing cells |
10/02/2002 | CN2514355Y DC power supply wiring with polar protection |
10/02/2002 | CN2514354Y Electrostatic grounding monitor |
10/02/2002 | CN1372713A Device, system and method for monitoring a household electric appliance |
10/02/2002 | CN1372707A Electric device with timer means |
10/02/2002 | CN1372645A Partial discharge monitoring system for transformers |
10/02/2002 | CN1372364A Controller for electricity recharge/discharge |
10/02/2002 | CN1372355A Contact structure with silicone grease contact point and general laminated structure using same |
10/02/2002 | CN1372346A Secondary cell and method for preventing overcharge |
10/02/2002 | CN1372195A Signal checking equipment |
10/02/2002 | CN1372193A In circuit emulated equipment using high-level programming language and method thereof |
10/02/2002 | CN1091881C Method for detecting working condition of non-aqueous electrolyte secondary batterles |
10/02/2002 | CN1091880C I/O toggle test method using JTAG |
10/01/2002 | US6460152 High speed memory test system with intermediate storage buffer and method of testing |
10/01/2002 | US6460148 Enhanced embedded logic analyzer |
10/01/2002 | US6460091 Address decoding circuit and method for identifying individual addresses and selecting a desired one of a plurality of peripheral macros |
10/01/2002 | US6460013 Shaft voltage current monitoring system for early warning and problem detection |
10/01/2002 | US6459968 Digital automobile tester |
10/01/2002 | US6459960 Distance relay equipment |
10/01/2002 | US6459896 Notification of low-battery in a wireless network |
10/01/2002 | US6459746 Multi-pair gigabit ethernet transceiver |
10/01/2002 | US6459652 Semiconductor memory device having echo clock path |
10/01/2002 | US6459293 Multiple parameter testing with improved sensitivity |
10/01/2002 | US6459290 Test apparatus of integrated circuit |
10/01/2002 | US6459289 Conductive bump array contactors having an ejector and methods of testing using same |
10/01/2002 | US6459288 Conductive bump array contactors having an ejector and methods of testing using same |
10/01/2002 | US6459286 Test head assembly utilizing replaceable silicon contact |
10/01/2002 | US6459285 Burn-in apparatus for screening plurality of semiconductor devices |
10/01/2002 | US6459284 Device having periodic wiring structure and test device therefor |
10/01/2002 | US6459283 Method and system for testing an electrical component |
10/01/2002 | US6459282 Charged particle beam test system for extracting test result at specified timing |
10/01/2002 | US6459278 Method for characterizing delay of frequency translation devices |
10/01/2002 | US6459276 Rotor analyzer for an induction motor |
10/01/2002 | US6459274 Methods and apparatus for testing electrical connections |
10/01/2002 | US6459272 Apparatus and method for inspecting wiring on board |
10/01/2002 | US6459271 Open cable locating for sheathed cables |
10/01/2002 | US6459270 Method for testing high voltage breakdown and leakage current of electrical cables |
10/01/2002 | US6459269 Capacitance rejecting ground fault protecting apparatus and method |
10/01/2002 | US6459268 Relay circuit test extender |
10/01/2002 | US6459259 Tester for semiconductor devices and test tray used for the same |
10/01/2002 | US6459243 Multiple plateau battery charging method and system to fully charge the first plateau |
10/01/2002 | US6459242 Methods and systems for indicating a charge state of a charge storage device |
10/01/2002 | US6459241 Capacity detection methodology and circuitry by boosted transient current |
10/01/2002 | US6459206 System and method for adjusting the orbit of an orbiting space object using an electrodynamic tether and micro-fabricated field emission device |
10/01/2002 | US6459175 Universal power supply |
10/01/2002 | US6459095 Chemically synthesized and assembled electronics devices |
10/01/2002 | US6458611 Integrated circuit device characterization |
10/01/2002 | CA2243966C Electrochemical cell label with integrated tester |
10/01/2002 | CA2141390C Method for measuring a resistance value |
09/26/2002 | WO2002076108A1 Method and device for testing the electromagnetic compatibility of screen devices |
09/26/2002 | WO2002075987A1 On-chip method and apparatus for testing semiconductor circuits |
09/26/2002 | WO2002075807A1 Probing method and device |
09/26/2002 | WO2002075343A1 Ate calibration method and corresponding test equipment |
09/26/2002 | WO2002075342A1 Apparatus and method for testing circuit modules |
09/26/2002 | WO2002075341A1 Semiconductor device and its test method |
09/26/2002 | WO2002075340A2 Device for holding an electronic circuit in a pre-determined state |
09/26/2002 | WO2002075337A2 Low-jitter clock for test system |
09/26/2002 | WO2002075336A2 Test system algorithmic program generators |
09/26/2002 | WO2002075335A2 Test system formatters |
09/26/2002 | WO2002075334A2 Apparatus and method for measuring and probability estimating for clock skews |
09/26/2002 | WO2002075330A2 Universal test interface between a device under test and a test head |
09/26/2002 | WO2002075329A2 Support member assembly for electroconductive contact members |
09/26/2002 | WO2002075327A2 Handheld tester for starting/charging systems |
09/26/2002 | WO2002075297A1 Method and device for measuring thermoelectric characteristics of combinatorial specimen |
09/26/2002 | WO2002050558A3 System and method for pre-programming an electronic device's memory |
09/26/2002 | WO2002039645A3 Network diagnostic meter |
09/26/2002 | WO2001024337A3 Instantaneous arc fault light detector with resistance to false tripping |
09/26/2002 | WO1999066337A3 Device for measuring and analyzing electrical signals of an integrated circuit component |
09/26/2002 | US20020138814 Virtual component having a detachable verification-supporting circuit, a method of verifying the same, and a method of manufacturing an integrated circuit |
09/26/2002 | US20020138801 Method and apparatus for diagnosing failures in an integrated circuit using design-for-debug (DFD) techniques |
09/26/2002 | US20020138799 Data transfer apparatus, memory device testing apparatus, data transfer method, and memory device testing method |
09/26/2002 | US20020138231 On-chip histogram testing |
09/26/2002 | US20020138225 Automatic configuration of delay parameters for memory controllers of slave processors |
09/26/2002 | US20020138219 Quality assurance automatic display system |
09/26/2002 | US20020138217 Dynamically configurable process for diagnosing faults in rotating machines |
09/26/2002 | US20020138157 Clock controller for AC self-test timing analysis of logic system |