Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
---|
10/10/2002 | DE10115491A1 Testing tool of de-capsulated chip - is able to avoid damaging the chips and effectively analyze the chips |
10/10/2002 | DE10108050C1 Test arrangement for electronic units has mechanical drive for moving first plate towards second to bring contact points in contact with needles, vacuum chamber, seal and vacuum pump |
10/09/2002 | EP1248269A1 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device |
10/09/2002 | EP1247330A1 Shaft voltage and current monitoring system |
10/09/2002 | EP1247319A1 An improved electronic earth leakage current device |
10/09/2002 | EP1247304A2 Shunt resistance device for monitoring battery state of charge |
10/09/2002 | EP1247113A1 System and method for determining battery state-of-health |
10/09/2002 | EP1247112A1 Circuit arrangement for simulation of the input or output load of an analogue circuit |
10/09/2002 | EP1247110A1 Single ended measurement method and system for determining subscriber loop make up |
10/09/2002 | EP1247107A1 Test device for a semiconductor component |
10/09/2002 | EP1247063A1 Scanning force microscope probe cantilever with reflective structure |
10/09/2002 | EP1102999A4 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit |
10/09/2002 | EP1018031B1 Device for testing circuit boards |
10/09/2002 | EP0920635B1 Diagnostic procedure for electrical appliances |
10/09/2002 | CN2515809Y Cell protective element with multilayer structure |
10/09/2002 | CN2515685Y 电池学习装置 Battery learning device |
10/09/2002 | CN2515684Y Switch action state monitor |
10/09/2002 | CN2515683Y Short-circuit and earth-fault indicator |
10/09/2002 | CN1373853A Measuring probe for measuring high frequencies and method for producing same |
10/09/2002 | CN1373851A Inspecting component placement relative to component pads |
10/09/2002 | CN1373368A Device and method for detecting earthing failure in solar generating system |
10/09/2002 | CN1092415C Diagnostic circuit for testing capacity of electric capacitor |
10/08/2002 | US6463562 Semiconductor device including macros and its testing method |
10/08/2002 | US6463561 Almost full-scan BIST method and system having higher fault coverage and shorter test application time |
10/08/2002 | US6463560 Method for implementing a bist scheme into integrated circuits for testing RTL controller-data paths in the integrated circuits |
10/08/2002 | US6463558 Semiconductor memory device |
10/08/2002 | US6463392 System and method for adjusting a sampling time in a logic analyzer |
10/08/2002 | US6462996 Semiconductor integrated circuit device having internal synchronizing circuit responsive to test mode signal |
10/08/2002 | US6462814 Beam delivery and imaging for optical probing of a device operating under electrical test |
10/08/2002 | US6462792 Active-matrix liquid crystal display device and method for compensating for defective display lines |
10/08/2002 | US6462575 Method and system for wafer level testing and burning-in semiconductor components |
10/08/2002 | US6462574 Burn-in system, burn-in control technique, and semiconductor device production method using said system and technique |
10/08/2002 | US6462573 System interface assembly and method |
10/08/2002 | US6462572 Socket used for semiconductor device and testing system connected to socket through dual-transmission lines |
10/08/2002 | US6462571 Engagement probes |
10/08/2002 | US6462570 Breakout board using blind vias to eliminate stubs |
10/08/2002 | US6462568 Conductive polymer contact system and test method for semiconductor components |
10/08/2002 | US6462557 System for the complete diagnosis of a driver |
10/08/2002 | US6462556 Circuit board testing apparatus and method |
10/08/2002 | US6462555 Apparatus for detecting a completed electrical circuit, reverse polarity, ground and ground fault interrupter |
10/08/2002 | US6462552 Apparatus for measuring electric charge |
10/08/2002 | US6462551 Method and system to ensure full functionality of battery pack assembly using thermal imaging |
10/08/2002 | US6462550 Battery voltage detection apparatus and detection method |
10/08/2002 | US6462534 Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewith |
10/08/2002 | US6462533 IC test system for testing BGA packages |
10/08/2002 | US6462532 Automated testing equipment having a modular offset test head with split backplane |
10/08/2002 | US6462528 Method and apparatus for probing a conductor of an array of closely-spaced conductors |
10/08/2002 | US6462510 Battery voltage detector |
10/08/2002 | US6462433 Capacitive load driving unit and method and apparatus for inspecting the same |
10/08/2002 | US6461882 Fault simulation method and fault simulator for semiconductor integrated circuit |
10/08/2002 | CA2231106C Condition tester for a battery |
10/06/2002 | CA2343348A1 Contact column array template and method of use |
10/03/2002 | WO2002078239A2 Method and apparatus for transmission line analysis |
10/03/2002 | WO2002077656A1 A multiple-capture dft system for scan-based integrated circuits |
10/03/2002 | WO2002077655A1 Handler for electronic circuits |
10/03/2002 | WO2002077654A1 Method of detecting carrier dose of a semiconductor wafer |
10/03/2002 | WO2002077594A1 Circuit arrangement with several sensor elements in matrix circuit design |
10/03/2002 | WO2002076789A1 System and method for supervision |
10/03/2002 | WO2002037129A3 Ground check system for delta-flex test handler |
10/03/2002 | WO2002025292A3 Manipulator for a test head with active compliance |
10/03/2002 | WO2002021662A3 Battery monitoring network |
10/03/2002 | US20020144222 Method of simulating PLL circuit and computer program product therefor |
10/03/2002 | US20020144203 Method and circuit for testing a chip |
10/03/2002 | US20020144202 Arrangement and method for testing integrated circuits |
10/03/2002 | US20020144201 Program-controlled unit and method for identifying and/or analyzing errors in program-controlled units |
10/03/2002 | US20020144200 Scan test system for semiconductor device |
10/03/2002 | US20020144199 Integration type input circuit and method of testing it |
10/03/2002 | US20020144198 Method to prevent inadvertent test mode entry |
10/03/2002 | US20020144197 Method of and apparatus for measuring the correctness of and correcting an automatic test arrangement |
10/03/2002 | US20020144195 System for varying timing between source and data signals in a source synchronous interface |
10/03/2002 | US20020144183 Microprocessor design support for computer system and platform validation |
10/03/2002 | US20020144168 Circuit for producing a variable frequency clock signal having a high frequency low jitter pulse component |
10/03/2002 | US20020143519 Virtual test environment |
10/03/2002 | US20020143486 Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment |
10/03/2002 | US20020143450 Abnormality detecting method and device for position detecting device, and electric power steering device |
10/03/2002 | US20020142935 Consumer product kit, and a method of use therefor |
10/03/2002 | US20020142534 Semiconductor integrated circuit |
10/03/2002 | US20020141525 Data flow synchronization |
10/03/2002 | US20020141495 Efficient FIR filter for high-speed communication |
10/03/2002 | US20020141348 Remote diagnostic tool for a media delivery network |
10/03/2002 | US20020141261 Semiconductor device having test mode |
10/03/2002 | US20020141259 Memory cell structural test |
10/03/2002 | US20020141258 Semiconductor device |
10/03/2002 | US20020141247 Semiconductor device having chip selection circuit and method of generating chip selection signal |
10/03/2002 | US20020141246 Output buffer capable of adjusting current drivability and semiconductor integrated circuit device having the same |
10/03/2002 | US20020141227 Semiconductor device in which storage electrode of capacitor is connected to gate electrode of fet and inspection method thereof |
10/03/2002 | US20020140650 Liquid crystal display device |
10/03/2002 | US20020140565 Monitoring apparatus and method for tape automated bonding process |
10/03/2002 | US20020140536 Method and apparatus for detecting partial discharge in a voltage transformer |
10/03/2002 | US20020140451 Apparatus for testing integrated circuits |
10/03/2002 | US20020140450 Methods of engaging electrically conductive test pads on a semiconductor substrate removable electrical interconnect apparatuses, engagement probes and removable engagement probes |
10/03/2002 | US20020140449 Apparatus and method for disabling and re-enabling access to IC test functions |
10/03/2002 | US20020140448 Inspection apparatus and sensor |
10/03/2002 | US20020140445 Tester and holder for tester |
10/03/2002 | US20020140444 Device testing contactor, method of producing the same, and device testing carrier |
10/03/2002 | US20020140443 Method and apparatus for inspecting conductive pattern |
10/03/2002 | US20020140442 Inspection apparatus, inspection method and inspection unit therefor |
10/03/2002 | US20020140434 System for logic state detection |
10/03/2002 | US20020140433 Apparatus and method for detecting and calculating ground fault resistance |
10/03/2002 | US20020140432 Capacitance rejecting ground fault protecting apparatus and method |