Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
10/2002
10/10/2002DE10115491A1 Testing tool of de-capsulated chip - is able to avoid damaging the chips and effectively analyze the chips
10/10/2002DE10108050C1 Test arrangement for electronic units has mechanical drive for moving first plate towards second to bring contact points in contact with needles, vacuum chamber, seal and vacuum pump
10/09/2002EP1248269A1 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device
10/09/2002EP1247330A1 Shaft voltage and current monitoring system
10/09/2002EP1247319A1 An improved electronic earth leakage current device
10/09/2002EP1247304A2 Shunt resistance device for monitoring battery state of charge
10/09/2002EP1247113A1 System and method for determining battery state-of-health
10/09/2002EP1247112A1 Circuit arrangement for simulation of the input or output load of an analogue circuit
10/09/2002EP1247110A1 Single ended measurement method and system for determining subscriber loop make up
10/09/2002EP1247107A1 Test device for a semiconductor component
10/09/2002EP1247063A1 Scanning force microscope probe cantilever with reflective structure
10/09/2002EP1102999A4 Method and apparatus using an infrared laser probe for measuring voltages directly in an integrated circuit
10/09/2002EP1018031B1 Device for testing circuit boards
10/09/2002EP0920635B1 Diagnostic procedure for electrical appliances
10/09/2002CN2515809Y Cell protective element with multilayer structure
10/09/2002CN2515685Y 电池学习装置 Battery learning device
10/09/2002CN2515684Y Switch action state monitor
10/09/2002CN2515683Y Short-circuit and earth-fault indicator
10/09/2002CN1373853A Measuring probe for measuring high frequencies and method for producing same
10/09/2002CN1373851A Inspecting component placement relative to component pads
10/09/2002CN1373368A Device and method for detecting earthing failure in solar generating system
10/09/2002CN1092415C Diagnostic circuit for testing capacity of electric capacitor
10/08/2002US6463562 Semiconductor device including macros and its testing method
10/08/2002US6463561 Almost full-scan BIST method and system having higher fault coverage and shorter test application time
10/08/2002US6463560 Method for implementing a bist scheme into integrated circuits for testing RTL controller-data paths in the integrated circuits
10/08/2002US6463558 Semiconductor memory device
10/08/2002US6463392 System and method for adjusting a sampling time in a logic analyzer
10/08/2002US6462996 Semiconductor integrated circuit device having internal synchronizing circuit responsive to test mode signal
10/08/2002US6462814 Beam delivery and imaging for optical probing of a device operating under electrical test
10/08/2002US6462792 Active-matrix liquid crystal display device and method for compensating for defective display lines
10/08/2002US6462575 Method and system for wafer level testing and burning-in semiconductor components
10/08/2002US6462574 Burn-in system, burn-in control technique, and semiconductor device production method using said system and technique
10/08/2002US6462573 System interface assembly and method
10/08/2002US6462572 Socket used for semiconductor device and testing system connected to socket through dual-transmission lines
10/08/2002US6462571 Engagement probes
10/08/2002US6462570 Breakout board using blind vias to eliminate stubs
10/08/2002US6462568 Conductive polymer contact system and test method for semiconductor components
10/08/2002US6462557 System for the complete diagnosis of a driver
10/08/2002US6462556 Circuit board testing apparatus and method
10/08/2002US6462555 Apparatus for detecting a completed electrical circuit, reverse polarity, ground and ground fault interrupter
10/08/2002US6462552 Apparatus for measuring electric charge
10/08/2002US6462551 Method and system to ensure full functionality of battery pack assembly using thermal imaging
10/08/2002US6462550 Battery voltage detection apparatus and detection method
10/08/2002US6462534 Semiconductor package testing equipment including loader having package guider and method of loading a semiconductor package onto a test socket as aligned therewith
10/08/2002US6462533 IC test system for testing BGA packages
10/08/2002US6462532 Automated testing equipment having a modular offset test head with split backplane
10/08/2002US6462528 Method and apparatus for probing a conductor of an array of closely-spaced conductors
10/08/2002US6462510 Battery voltage detector
10/08/2002US6462433 Capacitive load driving unit and method and apparatus for inspecting the same
10/08/2002US6461882 Fault simulation method and fault simulator for semiconductor integrated circuit
10/08/2002CA2231106C Condition tester for a battery
10/06/2002CA2343348A1 Contact column array template and method of use
10/03/2002WO2002078239A2 Method and apparatus for transmission line analysis
10/03/2002WO2002077656A1 A multiple-capture dft system for scan-based integrated circuits
10/03/2002WO2002077655A1 Handler for electronic circuits
10/03/2002WO2002077654A1 Method of detecting carrier dose of a semiconductor wafer
10/03/2002WO2002077594A1 Circuit arrangement with several sensor elements in matrix circuit design
10/03/2002WO2002076789A1 System and method for supervision
10/03/2002WO2002037129A3 Ground check system for delta-flex test handler
10/03/2002WO2002025292A3 Manipulator for a test head with active compliance
10/03/2002WO2002021662A3 Battery monitoring network
10/03/2002US20020144222 Method of simulating PLL circuit and computer program product therefor
10/03/2002US20020144203 Method and circuit for testing a chip
10/03/2002US20020144202 Arrangement and method for testing integrated circuits
10/03/2002US20020144201 Program-controlled unit and method for identifying and/or analyzing errors in program-controlled units
10/03/2002US20020144200 Scan test system for semiconductor device
10/03/2002US20020144199 Integration type input circuit and method of testing it
10/03/2002US20020144198 Method to prevent inadvertent test mode entry
10/03/2002US20020144197 Method of and apparatus for measuring the correctness of and correcting an automatic test arrangement
10/03/2002US20020144195 System for varying timing between source and data signals in a source synchronous interface
10/03/2002US20020144183 Microprocessor design support for computer system and platform validation
10/03/2002US20020144168 Circuit for producing a variable frequency clock signal having a high frequency low jitter pulse component
10/03/2002US20020143519 Virtual test environment
10/03/2002US20020143486 Method and apparatus for evaluating and correcting the tester derating factor (TDF) in a test environment
10/03/2002US20020143450 Abnormality detecting method and device for position detecting device, and electric power steering device
10/03/2002US20020142935 Consumer product kit, and a method of use therefor
10/03/2002US20020142534 Semiconductor integrated circuit
10/03/2002US20020141525 Data flow synchronization
10/03/2002US20020141495 Efficient FIR filter for high-speed communication
10/03/2002US20020141348 Remote diagnostic tool for a media delivery network
10/03/2002US20020141261 Semiconductor device having test mode
10/03/2002US20020141259 Memory cell structural test
10/03/2002US20020141258 Semiconductor device
10/03/2002US20020141247 Semiconductor device having chip selection circuit and method of generating chip selection signal
10/03/2002US20020141246 Output buffer capable of adjusting current drivability and semiconductor integrated circuit device having the same
10/03/2002US20020141227 Semiconductor device in which storage electrode of capacitor is connected to gate electrode of fet and inspection method thereof
10/03/2002US20020140650 Liquid crystal display device
10/03/2002US20020140565 Monitoring apparatus and method for tape automated bonding process
10/03/2002US20020140536 Method and apparatus for detecting partial discharge in a voltage transformer
10/03/2002US20020140451 Apparatus for testing integrated circuits
10/03/2002US20020140450 Methods of engaging electrically conductive test pads on a semiconductor substrate removable electrical interconnect apparatuses, engagement probes and removable engagement probes
10/03/2002US20020140449 Apparatus and method for disabling and re-enabling access to IC test functions
10/03/2002US20020140448 Inspection apparatus and sensor
10/03/2002US20020140445 Tester and holder for tester
10/03/2002US20020140444 Device testing contactor, method of producing the same, and device testing carrier
10/03/2002US20020140443 Method and apparatus for inspecting conductive pattern
10/03/2002US20020140442 Inspection apparatus, inspection method and inspection unit therefor
10/03/2002US20020140434 System for logic state detection
10/03/2002US20020140433 Apparatus and method for detecting and calculating ground fault resistance
10/03/2002US20020140432 Capacitance rejecting ground fault protecting apparatus and method