| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 10/17/2002 | US20020149385 Semiconductor element test apparatus, and method of testing semiconductor element using the apparatus |
| 10/17/2002 | US20020149383 Apparatus for electrical testing of a substrate having a plurality of terminals |
| 10/17/2002 | US20020149382 Distance change output device and method |
| 10/17/2002 | US20020149381 Voltage contrast method and apparatus for semiconductor inspection using low voltage particle beam |
| 10/17/2002 | US20020149375 Systems and methods for locating faults on a transmission line with multiple tapped loads |
| 10/17/2002 | US20020149373 Method of calculating remaining battery capacity |
| 10/17/2002 | US20020149357 Device for determining physical quantity of battery pack |
| 10/17/2002 | US20020149354 Voltage modulator circuit to control light emission for non-invasive timing measurements |
| 10/17/2002 | US20020149013 Semiconductor device with test mode |
| 10/17/2002 | US20020148132 Semiconductor load port alignment device |
| 10/17/2002 | DE10116746A1 Data processing circuit with functional capability testing via test scan flip flops, has several scan chains connected parallel to driver circuit on input side |
| 10/17/2002 | DE10116406A1 Device for manufacturing and testing electronic units, has bearer plate with externally contactable central electrical contact area for connecting voltage, load or signals to electronic units |
| 10/17/2002 | DE10115880A1 Test circuit for testing synchronous memory circuit compares generated test data with data read from memory circuit, outputs display signal indicating whether memory circuit is functional |
| 10/16/2002 | EP1249706A2 Non-contact voltage measurement method and device, and related detection probe |
| 10/16/2002 | EP1249026A1 Low profile, current-driven relay for integrated circuit tester |
| 10/16/2002 | EP1248953A1 A printed circuit assembly with configurable boundary scan paths |
| 10/16/2002 | EP1000366B1 Device for measuring partial discharges in gas-insulated high voltage facilities |
| 10/16/2002 | EP0926598B1 A field programmable gate array with integrated debugging facilities |
| 10/16/2002 | EP0729652B1 Method for fabricating a contact structure for interconnections, interposer, semiconductor assembly |
| 10/16/2002 | EP0692876B1 Power-out reset system |
| 10/16/2002 | CN2516981Y Device for testing synchronous machine powder angle |
| 10/16/2002 | CN2516980Y Crystal gas relay active compensated simulator |
| 10/16/2002 | CN2516979Y Fault locating and isolating device for distribution line |
| 10/16/2002 | CN2516978Y Single-phase three-wire socket tester |
| 10/16/2002 | CN1375110A Control system for an electromagnetic switching device and electromagnetic switching device corresponding thereto |
| 10/16/2002 | CN1374729A Method and apparatus for measuring battery charging & discharging current using direct analog-to-digital conversion of charging/discharging reproducing current |
| 10/16/2002 | CN1374727A 保护继电装置 Protective relay devices |
| 10/16/2002 | CN1374688A Pin block structure for fixing plug pin |
| 10/16/2002 | CN1374532A Program executive system for semi-conductor test instrument |
| 10/16/2002 | CN1092842C Production of integrated circuit plane figure sample with defect and method for measuring fault therein |
| 10/15/2002 | US6467067 ε-discrepant self-test technique |
| 10/15/2002 | US6467058 Segmented compaction with pruning and critical fault elimination |
| 10/15/2002 | US6467057 Scan driver of LCD with fault detection and correction function |
| 10/15/2002 | US6467051 Method and apparatus for selecting test point nodes of a group of components having both accessible and inaccessible nodes for limited access circuit test |
| 10/15/2002 | US6467044 On-board clock-control templates for testing integrated circuits |
| 10/15/2002 | US6466885 Line tester |
| 10/15/2002 | US6466882 Integrated system for detecting and repairing semiconductor defects and a method for controlling the same |
| 10/15/2002 | US6466520 Built-in AC self test using pulse generators |
| 10/15/2002 | US6466506 Semiconductor memory device capable of repairing small leak failure |
| 10/15/2002 | US6466490 Semiconductor memory circuit |
| 10/15/2002 | US6466048 Method and apparatus for switchably selecting an integrated circuit operating mode |
| 10/15/2002 | US6466047 System for testing bumped semiconductor components with on-board multiplex circuit for expanding tester resources |
| 10/15/2002 | US6466046 Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor |
| 10/15/2002 | US6466044 Through connector circuit test apparatus |
| 10/15/2002 | US6466038 Non-isothermal electromigration testing of microelectronic packaging interconnects |
| 10/15/2002 | US6466034 Transformer winding movement detection by high frequency internal response analysis |
| 10/15/2002 | US6466032 Method and apparatus for identification of the disconnection of a protection device |
| 10/15/2002 | US6466031 Systems and methods for locating faults on a transmission line with multiple tapped loads |
| 10/15/2002 | US6466030 Systems and methods for locating faults on a transmission line with a single tapped load |
| 10/15/2002 | US6466029 Power line testing device with signal generator and signal detector |
| 10/15/2002 | US6466028 Trailer tether sensor circuit |
| 10/15/2002 | US6466027 Apparatus for measuring electric charge |
| 10/15/2002 | US6466026 Programmable current exciter for measuring AC immittance of cells and batteries |
| 10/15/2002 | US6466025 Alternator tester |
| 10/15/2002 | US6466024 Multi-battery fuel saving and emission reduction system for automotive vehicles |
| 10/15/2002 | US6466009 Flexible printed circuit magnetic flux probe |
| 10/15/2002 | US6466007 Test system for smart card and indentification devices and the like |
| 10/15/2002 | US6465266 Semiconductor device short analysis |
| 10/15/2002 | US6465264 Method for producing semiconductor device and apparatus usable therein |
| 10/10/2002 | WO2002080184A2 On-chip circuits for high speed memory testing with a slow memory tester |
| 10/10/2002 | WO2002080183A2 Memory cell structural test |
| 10/10/2002 | WO2002080046A2 Computer-aided design system to automate scan synthesis at register-transfer level |
| 10/10/2002 | WO2002079887A2 Apparatus and methods with resolution enhancement feature for improving accuracy of conversion of required chemical mechanical polishing pressure to force to be applied by polishing head to wafer |
| 10/10/2002 | WO2002079788A2 Validation fub for an agent |
| 10/10/2002 | WO2002079766A1 Machine for inspecting printed circuit board |
| 10/10/2002 | WO2002039127A3 Test head actuation system with positioning and compliant modes |
| 10/10/2002 | US20020147952 Diagnosis of combinational logic circuit failures |
| 10/10/2002 | US20020147951 Method for scan testing of digital circuit, digital circuit for use therewith and program product for incorporating test methodology into circuit description |
| 10/10/2002 | US20020147950 Method and apparatus for test connectivity, communication, and control |
| 10/10/2002 | US20020147939 On-chip debug system with a data band selector |
| 10/10/2002 | US20020147571 Measuring method and measuring device |
| 10/10/2002 | US20020147561 System and method for intelligent wire testing |
| 10/10/2002 | US20020147560 Method and system for logic verification using mirror interface |
| 10/10/2002 | US20020147555 Method and apparatus for analyzing a source current waveform in a semiconductor integrated circuit |
| 10/10/2002 | US20020147553 Electromagnetic disturbance analysis method and apparatus and semiconductor device manufacturing method using the method |
| 10/10/2002 | US20020146927 Ultrasonic diagnostic equipment |
| 10/10/2002 | US20020146920 Method of soldering contact pins and the contact pins |
| 10/10/2002 | US20020146852 Method to reduce leakage during a semi-conductor burn-in procedure |
| 10/10/2002 | US20020146043 Network transceiver for steering network data to selected paths based on determined link speeds |
| 10/10/2002 | US20020145933 Semiconductor memory device and method for selecting multiple word lines in a semiconductor memory device |
| 10/10/2002 | US20020145925 Semiconductor device capable of simple measurement of oscillation frequency |
| 10/10/2002 | US20020145907 Non-volatile semiconductor memory device having word line defect check circuit |
| 10/10/2002 | US20020145484 Ultrafast sampler with coaxial transition |
| 10/10/2002 | US20020145458 Clock-skew resistant chain of sequential cells |
| 10/10/2002 | US20020145441 Semiconductor integrated circuit and test board |
| 10/10/2002 | US20020145440 Semiconductor device |
| 10/10/2002 | US20020145435 Automated run test system having built-in high voltage switching matrix for interconnection to a safety compliance testing instrument |
| 10/10/2002 | US20020145434 Interconnect package cluster probe short removal apparatus and method |
| 10/10/2002 | US20020145433 An algorithm for finding vectors to stimulate all paths and arcs through an LVS gate |
| 10/10/2002 | US20020145432 Automation of transmission line pulse testing of electrostatic discharge devices |
| 10/10/2002 | US20020145431 Positionable electrostatic discharge plate holder assembly |
| 10/10/2002 | US20020145430 Method and apparatus for estimating terminal voltage of battery, method and apparatus for computing open circuit voltage of battery, and method and apparatus for computing battery capacity |
| 10/10/2002 | US20020145138 Semiconductor integrated circuit device |
| 10/10/2002 | US20020144399 Contact column array template and method of use |
| 10/10/2002 | DE10211894A1 Systeme und Verfahren zum Ermöglichen eines Testens von Anschlußstellenempfängern integrierter Schaltungen Systems and methods for enabling testing of ports receivers of integrated circuits |
| 10/10/2002 | DE10210264A1 Compression method for test vector for integrated circuit tester uses comparison of segments of test vector with corresponding segments of random sequence |
| 10/10/2002 | DE10156849A1 Verfahren und Einrichtung zur Feststellung einer Anormalität für eine Positionsdetektoreinrichtung sowie elektrische Lenkservoeinrichtung Method and apparatus for detecting an abnormality of a position detecting means and electric power steering device |
| 10/10/2002 | DE10119144C1 Semiconductor memory module testing method involves transmitting additional information along with addresses of defect locations in memory bank, to external test device |
| 10/10/2002 | DE10116561A1 Radiation test system has daughter board for components, base board for connection to radiation control unit, near and far monitors connected via short and long transmission cables |
| 10/10/2002 | DE10115879C1 Test data generator for integrated circuit, has test unit that generates multi-row register selection control data vector having number of control data equivalent to frequency multiplication factor of input clock signal |